JPS54111854A - Measuring method of plating thicknesses of intermediate layers of multiplayer plated products - Google Patents

Measuring method of plating thicknesses of intermediate layers of multiplayer plated products

Info

Publication number
JPS54111854A
JPS54111854A JP1844478A JP1844478A JPS54111854A JP S54111854 A JPS54111854 A JP S54111854A JP 1844478 A JP1844478 A JP 1844478A JP 1844478 A JP1844478 A JP 1844478A JP S54111854 A JPS54111854 A JP S54111854A
Authority
JP
Japan
Prior art keywords
plating
film thickness
layer
same
multiplayer
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP1844478A
Other languages
Japanese (ja)
Inventor
Hideaki Konishi
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Hitachi Ltd
Original Assignee
Hitachi Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hitachi Ltd filed Critical Hitachi Ltd
Priority to JP1844478A priority Critical patent/JPS54111854A/en
Publication of JPS54111854A publication Critical patent/JPS54111854A/en
Pending legal-status Critical Current

Links

Abstract

PURPOSE: To make possible the highly accurate and rapid measurement of the intermediate plating layer by regarding the plating element of the upper layer same as the element of the lower layer and measuring the film thicknesses of both plating layers, then measuring the film thickness of the upper layer separately and independently, converting the same to the film thickness viewed from the plating element of the lower layer and subtracting the same from the abovementioned measurement value.
CONSTITUTION: The total equivalent film thickness D01 of both layers 11, 12 viewing the plating element Au of the upper plating layer 12 from the same plating element Ni as that of the lower plating layer 11 is measured through fluorescent X-ray analysis by making use of the attenuation effect of the X-ray intensity from the underlying 10 metal. Next, the independent film thickness D12 of the upper plating layer 12 is measured similarly by the fluorescent X-ray analysis method. The film thickness D12 of the upper layer obtained by this measurement is converted to the film thickness D12' viewed from the plating element Ni of the underlying layer 11 and this is subtracted from the abovementioned total equivalent film thickness D01. From the difference thereof, the film thickness D11 of the lower plating layer 11 may be obtained.
COPYRIGHT: (C)1979,JPO&Japio
JP1844478A 1978-02-22 1978-02-22 Measuring method of plating thicknesses of intermediate layers of multiplayer plated products Pending JPS54111854A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP1844478A JPS54111854A (en) 1978-02-22 1978-02-22 Measuring method of plating thicknesses of intermediate layers of multiplayer plated products

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP1844478A JPS54111854A (en) 1978-02-22 1978-02-22 Measuring method of plating thicknesses of intermediate layers of multiplayer plated products

Publications (1)

Publication Number Publication Date
JPS54111854A true JPS54111854A (en) 1979-09-01

Family

ID=11971793

Family Applications (1)

Application Number Title Priority Date Filing Date
JP1844478A Pending JPS54111854A (en) 1978-02-22 1978-02-22 Measuring method of plating thicknesses of intermediate layers of multiplayer plated products

Country Status (1)

Country Link
JP (1) JPS54111854A (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE3921825A1 (en) * 1988-07-01 1990-01-11 Fuji Photo Film Co Ltd METHOD FOR MEASURING THE THICKNESS OF A MAGNETIC RECORDING MEDIA
US5173929A (en) * 1991-10-28 1992-12-22 General Electric Company Method for determining the thickness of a metallic coating on a gas turbine blade

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE3921825A1 (en) * 1988-07-01 1990-01-11 Fuji Photo Film Co Ltd METHOD FOR MEASURING THE THICKNESS OF A MAGNETIC RECORDING MEDIA
DE3921825C2 (en) * 1988-07-01 1999-02-25 Fuji Photo Film Co Ltd Method of measuring the thickness of a magnetic recording medium
US5173929A (en) * 1991-10-28 1992-12-22 General Electric Company Method for determining the thickness of a metallic coating on a gas turbine blade

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