JPS5571937A - Method of and device for inspecting surface - Google Patents

Method of and device for inspecting surface

Info

Publication number
JPS5571937A
JPS5571937A JP14572878A JP14572878A JPS5571937A JP S5571937 A JPS5571937 A JP S5571937A JP 14572878 A JP14572878 A JP 14572878A JP 14572878 A JP14572878 A JP 14572878A JP S5571937 A JPS5571937 A JP S5571937A
Authority
JP
Japan
Prior art keywords
inspected
area
foreign material
pattern
inspecting
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP14572878A
Other languages
English (en)
Japanese (ja)
Other versions
JPS57940B2 (OSRAM
Inventor
Toshihiro Kajiura
Norio Taneda
Masahiro Mori
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Kanebo Ltd
Original Assignee
Kanebo Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Kanebo Ltd filed Critical Kanebo Ltd
Priority to JP14572878A priority Critical patent/JPS5571937A/ja
Priority to US06/071,354 priority patent/US4319269A/en
Priority to DE2937335A priority patent/DE2937335C2/de
Publication of JPS5571937A publication Critical patent/JPS5571937A/ja
Publication of JPS57940B2 publication Critical patent/JPS57940B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B21/00—Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant
    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B07—SEPARATING SOLIDS FROM SOLIDS; SORTING
    • B07C—POSTAL SORTING; SORTING INDIVIDUAL ARTICLES, OR BULK MATERIAL FIT TO BE SORTED PIECE-MEAL, e.g. BY PICKING
    • B07C5/00—Sorting according to a characteristic or feature of the articles or material being sorted, e.g. by control effected by devices which detect or measure such characteristic or feature; Sorting by manually actuated devices, e.g. switches
    • B07C5/04—Sorting according to size
    • B07C5/10—Sorting according to size measured by light-responsive means
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
JP14572878A 1978-11-24 1978-11-24 Method of and device for inspecting surface Granted JPS5571937A (en)

Priority Applications (3)

Application Number Priority Date Filing Date Title
JP14572878A JPS5571937A (en) 1978-11-24 1978-11-24 Method of and device for inspecting surface
US06/071,354 US4319269A (en) 1978-11-24 1979-08-30 External appearance inspecting system
DE2937335A DE2937335C2 (de) 1978-11-24 1979-09-14 Verfahren und Vorrichtung zur optischen Prüfung von Gegenständen

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP14572878A JPS5571937A (en) 1978-11-24 1978-11-24 Method of and device for inspecting surface

Publications (2)

Publication Number Publication Date
JPS5571937A true JPS5571937A (en) 1980-05-30
JPS57940B2 JPS57940B2 (OSRAM) 1982-01-08

Family

ID=15391753

Family Applications (1)

Application Number Title Priority Date Filing Date
JP14572878A Granted JPS5571937A (en) 1978-11-24 1978-11-24 Method of and device for inspecting surface

Country Status (3)

Country Link
US (1) US4319269A (OSRAM)
JP (1) JPS5571937A (OSRAM)
DE (1) DE2937335C2 (OSRAM)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS61107143A (ja) * 1984-10-30 1986-05-26 Mitsubishi Electric Corp 光学的表面検査装置
JPS61258149A (ja) * 1985-05-10 1986-11-15 Hajime Sangyo Kk 物体検査装置

Families Citing this family (29)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS55110905A (en) * 1979-02-20 1980-08-27 Hajime Sangyo Kk Defect detecting device
JPS5684088A (en) * 1979-12-12 1981-07-09 Stanley Electric Co Ltd Picture signal transmitting method
DE3021072A1 (de) * 1980-06-04 1981-12-10 Fuji Electric Co., Ltd., Kawasaki, Kanagawa Verfahren und vorrichtung zur automatischen pruefung von produkten
US4493420A (en) * 1981-01-29 1985-01-15 Lockwood Graders (U.K.) Limited Method and apparatus for detecting bounded regions of images, and method and apparatus for sorting articles and detecting flaws
DE3115634A1 (de) * 1981-04-18 1982-11-04 Feldmühle AG, 4000 Düsseldorf Verfahren und vorrichtung zum pruefen von durch kreislinien begrenzten flaechen
JPS57198851A (en) * 1981-05-30 1982-12-06 Nippon Kogaku Kk <Nikon> Inspecting device for defect of pattern
JPS5821546A (ja) * 1981-07-31 1983-02-08 Dainippon Printing Co Ltd 自動表面検査装置
EP0089212B1 (en) * 1982-03-13 1987-10-28 Kabushiki Kaisha Ishida Koki Seisakusho Method and apparatus for sorting articles
US4818380A (en) * 1982-03-13 1989-04-04 Ishida Scales Mfg. Co., Ltd. Method and apparatus for sorting articles
US4642813A (en) * 1983-04-18 1987-02-10 Object Recognition Systems, Inc. Electro-optical quality control inspection of elements on a product
FR2566218B1 (fr) * 1984-06-15 1988-06-24 Sfim Procede de traitement d'une image video pour la poursuite d'un objet lumineux et la protection de cette poursuite a l'encontre de brouilleurs en forme d'autres objets lumineux
DE3587927T2 (de) * 1984-07-23 1995-03-02 Mutual Corp Verfahren und Vorrichtung zur automatischen Untersuchung von Tabletten.
US4577796A (en) * 1984-10-10 1986-03-25 Kaiser Steel Corporation Method and apparatus for tracking seam welds on pipes and the like
DE3607767C1 (de) * 1986-03-08 1987-04-02 Wolf Gmbh Richard Videoendoskop
IT1207600B (it) * 1987-01-20 1989-05-25 Gd Spa Metodo per il controllo elettricoottico di pacchetti
US5085510A (en) * 1990-08-28 1992-02-04 Pfizer Inc. Pharmaceutical tablet vision inspection system
DE4221107A1 (de) * 1992-06-26 1994-01-05 Scherer Gmbh R P Verfahren und Vorrichtung zum Sortieren von Kapseln
US5659624A (en) * 1995-09-01 1997-08-19 Fazzari; Rodney J. High speed mass flow food sorting appartus for optically inspecting and sorting bulk food products
SE0000314D0 (sv) * 2000-01-31 2000-01-31 Astrazeneca Ab Apparatus and method for analysing
JP4561944B2 (ja) 2000-06-16 2010-10-13 株式会社サタケ 粒状物選別装置
JP2003205269A (ja) * 2001-11-09 2003-07-22 Satake Corp 粒状物色彩選別機における光学検出手段
JP2003170122A (ja) * 2001-12-06 2003-06-17 Satake Corp 粒状物色彩選別機
TWI267623B (en) * 2002-08-01 2006-12-01 Ming-Liau Yang Component monitoring method
JP4344164B2 (ja) * 2003-04-18 2009-10-14 株式会社サタケ 圧電式エアバルブおよび複合圧電式エアバルブ
JP4438358B2 (ja) * 2003-09-04 2010-03-24 株式会社サタケ 表示調整機構を具えた粒状物色彩選別機
DE102004051301A1 (de) * 2004-10-20 2006-06-01 Ief Werner Gmbh Vorrichtung zur optischen Prüfung von Bauteilen
US10379062B2 (en) * 2015-02-19 2019-08-13 Marchesini Group S.P.A. Detection system for detecting and determining an integrity of pharmaceutical/parapharmaceutical articles
KR102618759B1 (ko) * 2016-04-01 2023-12-28 주식회사 에이치엘클레무브 물체의 이동경로감지장치, 이동경로감지방법 및 그에 포함되는 물체감지장치
CN116698860B (zh) * 2023-08-08 2023-10-27 山东鲁地源天然药物有限公司 基于图像处理实现批量实心根类中药切片质量分析的方法

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS4829482A (OSRAM) * 1971-08-16 1973-04-19

Family Cites Families (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US2798603A (en) * 1955-05-09 1957-07-09 Grinspoon Harold Carton for cans and similar objects
US3598907A (en) * 1968-05-20 1971-08-10 Emhart Corp Article inspection by successively televised images
US3775556A (en) * 1972-07-31 1973-11-27 K Nagamatsu Ampoule inspector using a television camera
US4002823A (en) * 1974-11-01 1977-01-11 Ball Corporation Method and apparatus for video inspection of articles of manufacture
DE2607360A1 (de) * 1976-02-24 1977-08-25 Fraunhofer Ges Forschung Verfahren zur automatischen optischen pruefung von massenteilen und verschleissteilen
DE2720865A1 (de) * 1977-05-10 1978-11-23 Philips Patentverwaltung Anordnung zur untersuchung von objekten

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS4829482A (OSRAM) * 1971-08-16 1973-04-19

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS61107143A (ja) * 1984-10-30 1986-05-26 Mitsubishi Electric Corp 光学的表面検査装置
JPS61258149A (ja) * 1985-05-10 1986-11-15 Hajime Sangyo Kk 物体検査装置

Also Published As

Publication number Publication date
JPS57940B2 (OSRAM) 1982-01-08
DE2937335A1 (de) 1980-05-29
US4319269A (en) 1982-03-09
DE2937335C2 (de) 1984-12-13

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