JPS5794636A - Defect detecting device of disk substrate - Google Patents

Defect detecting device of disk substrate

Info

Publication number
JPS5794636A
JPS5794636A JP17082880A JP17082880A JPS5794636A JP S5794636 A JPS5794636 A JP S5794636A JP 17082880 A JP17082880 A JP 17082880A JP 17082880 A JP17082880 A JP 17082880A JP S5794636 A JPS5794636 A JP S5794636A
Authority
JP
Japan
Prior art keywords
output
comparator
disk substrate
monitor
disk
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP17082880A
Other languages
Japanese (ja)
Inventor
Tadatoshi Suenaga
Shoji Ishida
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Fujitsu Ltd
Original Assignee
Fujitsu Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Fujitsu Ltd filed Critical Fujitsu Ltd
Priority to JP17082880A priority Critical patent/JPS5794636A/en
Publication of JPS5794636A publication Critical patent/JPS5794636A/en
Pending legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/95—Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
    • G01N21/9506—Optical discs
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11B—INFORMATION STORAGE BASED ON RELATIVE MOVEMENT BETWEEN RECORD CARRIER AND TRANSDUCER
    • G11B7/00—Recording or reproducing by optical means, e.g. recording using a thermal beam of optical radiation by modifying optical properties or the physical structure, reproducing using an optical beam at lower power by sensing optical properties; Record carriers therefor
    • G11B7/002—Recording, reproducing or erasing systems characterised by the shape or form of the carrier
    • G11B7/0037—Recording, reproducing or erasing systems characterised by the shape or form of the carrier with discs
    • G11B7/00375—Recording, reproducing or erasing systems characterised by the shape or form of the carrier with discs arrangements for detection of physical defects, e.g. of recording layer

Landscapes

  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
  • Manufacturing Of Magnetic Record Carriers (AREA)

Abstract

PURPOSE:To exactly appreciate a disk substrate in a short time, by inputting a scanning output of a video camera provided on a microscope for inspecting a disk to be measured, to a comparator, and detecting a defect by an output exceeding a prescribed level and the number of scanning lines. CONSTITUTION:The surface of a disk 11 to be measured is displayed on a monitor TV14 by a video camera 13 provided with a microscope 12. An output of the monitor TV14 is inputted to a comparator 16 through an amplifier 15, is compared with a slice level, and when it is below its level, an output appears. On the other hand, the output of the monitor TV is inputted to a horizontal synchronizing clock generating circuit 17, its clock pulse C is applied to the comparator 16 through a gate circuit 18, and a signal from the comparator 16 is sent to an MPU25. Also, a signal synchronizing with the clock pulse C is outputted from a generator 20 and a vertical synchronizing clock generating circuit 19, is sent to the MPU25 through adders 21, 22 and registers 23, 24, and the disk substrate 11 is appreciated exactly in a short time.
JP17082880A 1980-12-05 1980-12-05 Defect detecting device of disk substrate Pending JPS5794636A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP17082880A JPS5794636A (en) 1980-12-05 1980-12-05 Defect detecting device of disk substrate

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP17082880A JPS5794636A (en) 1980-12-05 1980-12-05 Defect detecting device of disk substrate

Publications (1)

Publication Number Publication Date
JPS5794636A true JPS5794636A (en) 1982-06-12

Family

ID=15912077

Family Applications (1)

Application Number Title Priority Date Filing Date
JP17082880A Pending JPS5794636A (en) 1980-12-05 1980-12-05 Defect detecting device of disk substrate

Country Status (1)

Country Link
JP (1) JPS5794636A (en)

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS60258729A (en) * 1984-06-04 1985-12-20 Hitachi Ltd Method and apparatus for checking magnetic disc coating film
JPH01297543A (en) * 1988-05-25 1989-11-30 Csk Corp Defect inspecting device
EP0354834A2 (en) * 1988-08-06 1990-02-14 Mitsubishi Denki Kabushiki Kaisha Surface defect inspection apparatus
KR100547108B1 (en) * 2002-11-01 2006-01-26 삼성전자주식회사 Method for determining a damage of an optical disc and apparatus therefor

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS60258729A (en) * 1984-06-04 1985-12-20 Hitachi Ltd Method and apparatus for checking magnetic disc coating film
JPH0352649B2 (en) * 1984-06-04 1991-08-12 Hitachi Ltd
JPH01297543A (en) * 1988-05-25 1989-11-30 Csk Corp Defect inspecting device
EP0354834A2 (en) * 1988-08-06 1990-02-14 Mitsubishi Denki Kabushiki Kaisha Surface defect inspection apparatus
KR100547108B1 (en) * 2002-11-01 2006-01-26 삼성전자주식회사 Method for determining a damage of an optical disc and apparatus therefor

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