JPS5566766A - Wire bundle testing device - Google Patents
Wire bundle testing deviceInfo
- Publication number
- JPS5566766A JPS5566766A JP14060478A JP14060478A JPS5566766A JP S5566766 A JPS5566766 A JP S5566766A JP 14060478 A JP14060478 A JP 14060478A JP 14060478 A JP14060478 A JP 14060478A JP S5566766 A JPS5566766 A JP S5566766A
- Authority
- JP
- Japan
- Prior art keywords
- terminal
- wire
- gate
- make
- wire bundle
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 230000004907 flux Effects 0.000 abstract 3
- 239000004020 conductor Substances 0.000 abstract 1
- 238000001514 detection method Methods 0.000 abstract 1
Landscapes
- Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP14060478A JPS5566766A (en) | 1978-11-15 | 1978-11-15 | Wire bundle testing device |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP14060478A JPS5566766A (en) | 1978-11-15 | 1978-11-15 | Wire bundle testing device |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS5566766A true JPS5566766A (en) | 1980-05-20 |
| JPS6155066B2 JPS6155066B2 (enrdf_load_stackoverflow) | 1986-11-26 |
Family
ID=15272562
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP14060478A Granted JPS5566766A (en) | 1978-11-15 | 1978-11-15 | Wire bundle testing device |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS5566766A (enrdf_load_stackoverflow) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS6010183A (ja) * | 1983-06-30 | 1985-01-19 | Fujitsu Denso Ltd | 布線試験器 |
-
1978
- 1978-11-15 JP JP14060478A patent/JPS5566766A/ja active Granted
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS6010183A (ja) * | 1983-06-30 | 1985-01-19 | Fujitsu Denso Ltd | 布線試験器 |
Also Published As
| Publication number | Publication date |
|---|---|
| JPS6155066B2 (enrdf_load_stackoverflow) | 1986-11-26 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| DE3773645D1 (de) | Vorrichtung und verfahren zur messung des batteriezustandes. | |
| JPS5566766A (en) | Wire bundle testing device | |
| JPS57113377A (en) | Semiconductor testing device | |
| JPS552956A (en) | Automatic wiring tester | |
| JPS5293361A (en) | Automatic tester | |
| JPS57127862A (en) | Tester apparatus | |
| JPS6443773A (en) | Propagation delay testing method for logic circuit | |
| JPS52143708A (en) | Signal line test system | |
| JPS5739361A (en) | Cable disconnection tester | |
| JPS5539075A (en) | Cable inspecting device | |
| JPS5313967A (en) | Measuring method for characteristic of vibration gauge | |
| SU676950A2 (ru) | Устройство дл определени места повреждени изол ции силовых кабелей | |
| JPS5442701A (en) | Automatic vehicle testing apparatus | |
| JPS5246876A (en) | Thermcouple fault detecting device | |
| JPS5727498A (en) | Ic memory test method | |
| JPS53106597A (en) | Circuit continuity testing system | |
| JPS57201040A (en) | Semiconductor device | |
| JPS57133365A (en) | Inspecting device for continuity and short circuit | |
| JPS55164947A (en) | Test system for logic circuit | |
| JPS52116895A (en) | Wiring order tester | |
| JPS5524658A (en) | Inspecting circuit for electronic watch | |
| JPS52119891A (en) | Indicator element tester | |
| KR910005062A (ko) | 반도체 시험방법 | |
| JPS536803A (en) | Automatic comparison tester for motor characteristics | |
| JPS6448137A (en) | Input/output method for loop back testing data |