JPS57201040A - Semiconductor device - Google Patents

Semiconductor device

Info

Publication number
JPS57201040A
JPS57201040A JP8622381A JP8622381A JPS57201040A JP S57201040 A JPS57201040 A JP S57201040A JP 8622381 A JP8622381 A JP 8622381A JP 8622381 A JP8622381 A JP 8622381A JP S57201040 A JPS57201040 A JP S57201040A
Authority
JP
Japan
Prior art keywords
wire
capacitor
circuit
pads
semiconductor device
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP8622381A
Other languages
Japanese (ja)
Inventor
Mamoru Maki
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
NEC Yamagata Ltd
Original Assignee
NEC Yamagata Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by NEC Yamagata Ltd filed Critical NEC Yamagata Ltd
Priority to JP8622381A priority Critical patent/JPS57201040A/en
Publication of JPS57201040A publication Critical patent/JPS57201040A/en
Pending legal-status Critical Current

Links

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L22/00—Testing or measuring during manufacture or treatment; Reliability measurements, i.e. testing of parts without further processing to modify the parts as such; Structural arrangements therefor
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/0001—Technical content checked by a classifier
    • H01L2924/0002—Not covered by any one of groups H01L24/00, H01L24/00 and H01L2224/00

Landscapes

  • Engineering & Computer Science (AREA)
  • Manufacturing & Machinery (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)

Abstract

PURPOSE:To enable to mark on a pellet without breaking the elements or circuits of a semiconductor device by providing elements or wires to be readily broken by application of a voltage or current. CONSTITUTION:A capacitor 6 is charged by the output of a power source circuit 7. When the test result of a semicnductor testing circuit 8 is improper, a signal is applied to a switching circuit 5, and the voltage charged at the capacitor 6 is fed through a measuring probe 4 berween pads 2. An aluminum wire 3 which is narrowed in the intermediate wiring width is connected between the pads 2, and the wire 3 is shortcircuited with capacitor 6 through the circuit 5. Accordingly, the fine part of the wire 3 is instataneously molten and broken. Therefore, the proproity of the wire 3 can be distinguished by observing the wire 3.
JP8622381A 1981-06-04 1981-06-04 Semiconductor device Pending JPS57201040A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP8622381A JPS57201040A (en) 1981-06-04 1981-06-04 Semiconductor device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP8622381A JPS57201040A (en) 1981-06-04 1981-06-04 Semiconductor device

Publications (1)

Publication Number Publication Date
JPS57201040A true JPS57201040A (en) 1982-12-09

Family

ID=13880782

Family Applications (1)

Application Number Title Priority Date Filing Date
JP8622381A Pending JPS57201040A (en) 1981-06-04 1981-06-04 Semiconductor device

Country Status (1)

Country Link
JP (1) JPS57201040A (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS63291429A (en) * 1987-05-25 1988-11-29 New Japan Radio Co Ltd Integrated circuit device
US5264377A (en) * 1990-03-21 1993-11-23 At&T Bell Laboratories Integrated circuit electromigration monitor

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS55107241A (en) * 1979-02-09 1980-08-16 Nec Corp Manufacture of semiconductor device

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS55107241A (en) * 1979-02-09 1980-08-16 Nec Corp Manufacture of semiconductor device

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS63291429A (en) * 1987-05-25 1988-11-29 New Japan Radio Co Ltd Integrated circuit device
US5264377A (en) * 1990-03-21 1993-11-23 At&T Bell Laboratories Integrated circuit electromigration monitor

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