JPS57201040A - Semiconductor device - Google Patents

Semiconductor device

Info

Publication number
JPS57201040A
JPS57201040A JP8622381A JP8622381A JPS57201040A JP S57201040 A JPS57201040 A JP S57201040A JP 8622381 A JP8622381 A JP 8622381A JP 8622381 A JP8622381 A JP 8622381A JP S57201040 A JPS57201040 A JP S57201040A
Authority
JP
Japan
Prior art keywords
wire
capacitor
circuit
pads
semiconductor device
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP8622381A
Other languages
Japanese (ja)
Inventor
Mamoru Maki
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
NEC Yamagata Ltd
Original Assignee
NEC Yamagata Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by NEC Yamagata Ltd filed Critical NEC Yamagata Ltd
Priority to JP8622381A priority Critical patent/JPS57201040A/en
Publication of JPS57201040A publication Critical patent/JPS57201040A/en
Pending legal-status Critical Current

Links

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L22/00Testing or measuring during manufacture or treatment; Reliability measurements, i.e. testing of parts without further processing to modify the parts as such; Structural arrangements therefor
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/0001Technical content checked by a classifier
    • H01L2924/0002Not covered by any one of groups H01L24/00, H01L24/00 and H01L2224/00

Landscapes

  • Engineering & Computer Science (AREA)
  • Manufacturing & Machinery (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)

Abstract

PURPOSE:To enable to mark on a pellet without breaking the elements or circuits of a semiconductor device by providing elements or wires to be readily broken by application of a voltage or current. CONSTITUTION:A capacitor 6 is charged by the output of a power source circuit 7. When the test result of a semicnductor testing circuit 8 is improper, a signal is applied to a switching circuit 5, and the voltage charged at the capacitor 6 is fed through a measuring probe 4 berween pads 2. An aluminum wire 3 which is narrowed in the intermediate wiring width is connected between the pads 2, and the wire 3 is shortcircuited with capacitor 6 through the circuit 5. Accordingly, the fine part of the wire 3 is instataneously molten and broken. Therefore, the proproity of the wire 3 can be distinguished by observing the wire 3.
JP8622381A 1981-06-04 1981-06-04 Semiconductor device Pending JPS57201040A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP8622381A JPS57201040A (en) 1981-06-04 1981-06-04 Semiconductor device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP8622381A JPS57201040A (en) 1981-06-04 1981-06-04 Semiconductor device

Publications (1)

Publication Number Publication Date
JPS57201040A true JPS57201040A (en) 1982-12-09

Family

ID=13880782

Family Applications (1)

Application Number Title Priority Date Filing Date
JP8622381A Pending JPS57201040A (en) 1981-06-04 1981-06-04 Semiconductor device

Country Status (1)

Country Link
JP (1) JPS57201040A (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS63291429A (en) * 1987-05-25 1988-11-29 New Japan Radio Co Ltd Integrated circuit device
US5264377A (en) * 1990-03-21 1993-11-23 At&T Bell Laboratories Integrated circuit electromigration monitor

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS55107241A (en) * 1979-02-09 1980-08-16 Nec Corp Manufacture of semiconductor device

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS55107241A (en) * 1979-02-09 1980-08-16 Nec Corp Manufacture of semiconductor device

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS63291429A (en) * 1987-05-25 1988-11-29 New Japan Radio Co Ltd Integrated circuit device
US5264377A (en) * 1990-03-21 1993-11-23 At&T Bell Laboratories Integrated circuit electromigration monitor

Similar Documents

Publication Publication Date Title
JPS5610244A (en) Temperature sensor controlling device
ES8704019A1 (en) Method for detecting and obtaining information about changes in variables.
JPS57201040A (en) Semiconductor device
DK333484A (en) Apparatus for the detection of electrical wires on the human body
US4081854A (en) Meter protection circuit
JPS57131071A (en) Nondestructive impedance measuring device
SE8500205D0 (en) DEVICE FOR TESTLESS TESTING THE PRESENCE OF ELECTRIC VOLTAGE
JPS552956A (en) Automatic wiring tester
US3373356A (en) Holding current meter for scr or the like
JPS57208154A (en) Semiconductor device
FR2298194A1 (en) Alkaline battery electrolyte level detector - has wire probe and current sensing circuit to detect low level
JPS57207865A (en) Measuring terminal
JPS57106868A (en) Current measuring device
JPS57203973A (en) Measuring device for electrical conductivity
SU1057890A1 (en) Device for measuring semiconductor gate transitional thermal characteristic
JPS57114866A (en) Measuring device of semiconductor device
SU1001281A2 (en) Device for differential protection of electric installation
SU1170532A1 (en) Device for checking capacitv of chemical source of electric energv
DE3864430D1 (en) MEASURING DEVICE FOR THE DESIGN OF SCREW-SHAPED COMPONENTS.
JPS6488264A (en) In-circuit tester
JPS573019A (en) Burn-out detector for resistance thermometer
JPS6413294A (en) Semiconductor storage device
JPS57162362A (en) Measuring method for latchup withstand amount of complementary mos integrated circuit device
JPS5433768A (en) Tester for insulated resistor
JPS5768043A (en) Measuring method and device for characteristics of semiconductor wafer