JPS57201040A - Semiconductor device - Google Patents
Semiconductor deviceInfo
- Publication number
- JPS57201040A JPS57201040A JP8622381A JP8622381A JPS57201040A JP S57201040 A JPS57201040 A JP S57201040A JP 8622381 A JP8622381 A JP 8622381A JP 8622381 A JP8622381 A JP 8622381A JP S57201040 A JPS57201040 A JP S57201040A
- Authority
- JP
- Japan
- Prior art keywords
- wire
- capacitor
- circuit
- pads
- semiconductor device
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L22/00—Testing or measuring during manufacture or treatment; Reliability measurements, i.e. testing of parts without further processing to modify the parts as such; Structural arrangements therefor
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/0001—Technical content checked by a classifier
- H01L2924/0002—Not covered by any one of groups H01L24/00, H01L24/00 and H01L2224/00
Landscapes
- Engineering & Computer Science (AREA)
- Manufacturing & Machinery (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
Abstract
PURPOSE:To enable to mark on a pellet without breaking the elements or circuits of a semiconductor device by providing elements or wires to be readily broken by application of a voltage or current. CONSTITUTION:A capacitor 6 is charged by the output of a power source circuit 7. When the test result of a semicnductor testing circuit 8 is improper, a signal is applied to a switching circuit 5, and the voltage charged at the capacitor 6 is fed through a measuring probe 4 berween pads 2. An aluminum wire 3 which is narrowed in the intermediate wiring width is connected between the pads 2, and the wire 3 is shortcircuited with capacitor 6 through the circuit 5. Accordingly, the fine part of the wire 3 is instataneously molten and broken. Therefore, the proproity of the wire 3 can be distinguished by observing the wire 3.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP8622381A JPS57201040A (en) | 1981-06-04 | 1981-06-04 | Semiconductor device |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP8622381A JPS57201040A (en) | 1981-06-04 | 1981-06-04 | Semiconductor device |
Publications (1)
Publication Number | Publication Date |
---|---|
JPS57201040A true JPS57201040A (en) | 1982-12-09 |
Family
ID=13880782
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP8622381A Pending JPS57201040A (en) | 1981-06-04 | 1981-06-04 | Semiconductor device |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS57201040A (en) |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS63291429A (en) * | 1987-05-25 | 1988-11-29 | New Japan Radio Co Ltd | Integrated circuit device |
US5264377A (en) * | 1990-03-21 | 1993-11-23 | At&T Bell Laboratories | Integrated circuit electromigration monitor |
Citations (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS55107241A (en) * | 1979-02-09 | 1980-08-16 | Nec Corp | Manufacture of semiconductor device |
-
1981
- 1981-06-04 JP JP8622381A patent/JPS57201040A/en active Pending
Patent Citations (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS55107241A (en) * | 1979-02-09 | 1980-08-16 | Nec Corp | Manufacture of semiconductor device |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS63291429A (en) * | 1987-05-25 | 1988-11-29 | New Japan Radio Co Ltd | Integrated circuit device |
US5264377A (en) * | 1990-03-21 | 1993-11-23 | At&T Bell Laboratories | Integrated circuit electromigration monitor |
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