JPS5560869A - Device for measuring spreading resistance - Google Patents
Device for measuring spreading resistanceInfo
- Publication number
- JPS5560869A JPS5560869A JP13597178A JP13597178A JPS5560869A JP S5560869 A JPS5560869 A JP S5560869A JP 13597178 A JP13597178 A JP 13597178A JP 13597178 A JP13597178 A JP 13597178A JP S5560869 A JPS5560869 A JP S5560869A
- Authority
- JP
- Japan
- Prior art keywords
- probes
- spreading resistance
- thermoelectromotive force
- probe
- semiconductor
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Landscapes
- Measurement Of Resistance Or Impedance (AREA)
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP13597178A JPS5560869A (en) | 1978-10-31 | 1978-10-31 | Device for measuring spreading resistance |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP13597178A JPS5560869A (en) | 1978-10-31 | 1978-10-31 | Device for measuring spreading resistance |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS5560869A true JPS5560869A (en) | 1980-05-08 |
JPS627983B2 JPS627983B2 (ko) | 1987-02-20 |
Family
ID=15164135
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP13597178A Granted JPS5560869A (en) | 1978-10-31 | 1978-10-31 | Device for measuring spreading resistance |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS5560869A (ko) |
Cited By (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS6217130U (ko) * | 1985-07-16 | 1987-02-02 | ||
US5214389A (en) * | 1992-01-06 | 1993-05-25 | Motorola, Inc. | Multi-dimensional high-resolution probe for semiconductor measurements including piezoelectric transducer arrangement for controlling probe position |
US5369372A (en) * | 1990-12-13 | 1994-11-29 | Interuniversitair Micro Elektronica Centrum Vzw | Method for resistance measurements on a semiconductor element with controlled probe pressure |
US5585734A (en) * | 1990-07-09 | 1996-12-17 | Interuniversitair Micro Elektronica Centrum Vzw | Method for determining the resistance and carrier profile of a semiconductor element using a scanning proximity microscope |
US5723981A (en) * | 1994-08-29 | 1998-03-03 | Imec Vzw | Method for measuring the electrical potential in a semiconductor element |
CN105116229A (zh) * | 2015-07-21 | 2015-12-02 | 中国船舶重工集团公司第七一二研究所 | 一种燃料电池电阻测量装置 |
-
1978
- 1978-10-31 JP JP13597178A patent/JPS5560869A/ja active Granted
Cited By (8)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS6217130U (ko) * | 1985-07-16 | 1987-02-02 | ||
JPH0528769Y2 (ko) * | 1985-07-16 | 1993-07-23 | ||
US5585734A (en) * | 1990-07-09 | 1996-12-17 | Interuniversitair Micro Elektronica Centrum Vzw | Method for determining the resistance and carrier profile of a semiconductor element using a scanning proximity microscope |
US5369372A (en) * | 1990-12-13 | 1994-11-29 | Interuniversitair Micro Elektronica Centrum Vzw | Method for resistance measurements on a semiconductor element with controlled probe pressure |
US5214389A (en) * | 1992-01-06 | 1993-05-25 | Motorola, Inc. | Multi-dimensional high-resolution probe for semiconductor measurements including piezoelectric transducer arrangement for controlling probe position |
US5723981A (en) * | 1994-08-29 | 1998-03-03 | Imec Vzw | Method for measuring the electrical potential in a semiconductor element |
CN105116229A (zh) * | 2015-07-21 | 2015-12-02 | 中国船舶重工集团公司第七一二研究所 | 一种燃料电池电阻测量装置 |
CN105116229B (zh) * | 2015-07-21 | 2018-03-16 | 中国船舶重工集团公司第七一二研究所 | 一种燃料电池电阻测量装置 |
Also Published As
Publication number | Publication date |
---|---|
JPS627983B2 (ko) | 1987-02-20 |
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