JPS55134346A - Method for measuring thermal property of matter by arbitrary heating - Google Patents
Method for measuring thermal property of matter by arbitrary heatingInfo
- Publication number
- JPS55134346A JPS55134346A JP4155979A JP4155979A JPS55134346A JP S55134346 A JPS55134346 A JP S55134346A JP 4155979 A JP4155979 A JP 4155979A JP 4155979 A JP4155979 A JP 4155979A JP S55134346 A JPS55134346 A JP S55134346A
- Authority
- JP
- Japan
- Prior art keywords
- samples
- temperature
- test piece
- test
- uniformly
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Landscapes
- Investigating Or Analyzing Materials Using Thermal Means (AREA)
Abstract
PURPOSE: To obtain a thermal property of matter precisely with a simple device by making a test sample contact with a reference sample to measure the temperature responses on the contacting surface and each surface of both the samples and by obtaining their Laplace integrals.
CONSTITUTION: The hot junction of the thermocouple for measuring temperature are set to required positions of both the test and reference samples 1, 2, the Teflon plates 4 are applied to both sides of samples to make both the samples uniformly contact with each other, the entire objects are uniformly pressed with brass plates 6, 6 the central parts of which are slightly convexed, and are uniformly tightened with clamps 8 to obtain a test piece. The test piece a is set in the central part of the thermostatic box 10 the upper and lower surface of which are glass window 9, its temperature is kept a fixed level by the Slidac 11, other Slidacs 12, 13 are operated to give energy of the infrared ray lamps 14, 15 to the test piece, thermoelectromotive force from the temperature measuring thermocouple is recorded in the recorder 18 through the changeover switch 16 and voltage compensator 17, or an indication of the digital voltmeter 19 is recorded by the printer 20.
COPYRIGHT: (C)1980,JPO&Japio
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP4155979A JPS6020697B2 (en) | 1979-04-07 | 1979-04-07 | Measuring method of thermophysical properties by arbitrary heating |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP4155979A JPS6020697B2 (en) | 1979-04-07 | 1979-04-07 | Measuring method of thermophysical properties by arbitrary heating |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS55134346A true JPS55134346A (en) | 1980-10-20 |
JPS6020697B2 JPS6020697B2 (en) | 1985-05-23 |
Family
ID=12611781
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP4155979A Expired JPS6020697B2 (en) | 1979-04-07 | 1979-04-07 | Measuring method of thermophysical properties by arbitrary heating |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS6020697B2 (en) |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2017090454A (en) * | 2015-11-04 | 2017-05-25 | ネッチ ゲレーテバウ ゲーエムベーハー | Method and apparatus for photothermal analysis of sample |
JP2019007858A (en) * | 2017-06-26 | 2019-01-17 | 京都電子工業株式会社 | Needle probe of thermophysical property measuring device |
-
1979
- 1979-04-07 JP JP4155979A patent/JPS6020697B2/en not_active Expired
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2017090454A (en) * | 2015-11-04 | 2017-05-25 | ネッチ ゲレーテバウ ゲーエムベーハー | Method and apparatus for photothermal analysis of sample |
JP2019007858A (en) * | 2017-06-26 | 2019-01-17 | 京都電子工業株式会社 | Needle probe of thermophysical property measuring device |
Also Published As
Publication number | Publication date |
---|---|
JPS6020697B2 (en) | 1985-05-23 |
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