JPS5560826A - Photometry - Google Patents

Photometry

Info

Publication number
JPS5560826A
JPS5560826A JP13376078A JP13376078A JPS5560826A JP S5560826 A JPS5560826 A JP S5560826A JP 13376078 A JP13376078 A JP 13376078A JP 13376078 A JP13376078 A JP 13376078A JP S5560826 A JPS5560826 A JP S5560826A
Authority
JP
Japan
Prior art keywords
light
circuit
luminance signal
maximum
center
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP13376078A
Other languages
English (en)
Inventor
Masabumi Yamazaki
Shuichi Takayama
Kosaku Tsuboshima
Yoshio Nakajima
Teruo Iwazawa
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Olympus Corp
Original Assignee
Olympus Optical Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Olympus Optical Co Ltd filed Critical Olympus Optical Co Ltd
Priority to JP13376078A priority Critical patent/JPS5560826A/ja
Priority to US06/090,082 priority patent/US4302780A/en
Priority to DE2944158A priority patent/DE2944158C2/de
Publication of JPS5560826A publication Critical patent/JPS5560826A/ja
Pending legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J1/00—Photometry, e.g. photographic exposure meter
    • G01J1/42—Photometry, e.g. photographic exposure meter using electric radiation detectors
    • G01J1/44—Electric circuits

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Photometry And Measurement Of Optical Pulse Characteristics (AREA)
  • Exposure Control For Cameras (AREA)
JP13376078A 1978-11-01 1978-11-01 Photometry Pending JPS5560826A (en)

Priority Applications (3)

Application Number Priority Date Filing Date Title
JP13376078A JPS5560826A (en) 1978-11-01 1978-11-01 Photometry
US06/090,082 US4302780A (en) 1978-11-01 1979-10-31 Photometric system
DE2944158A DE2944158C2 (de) 1978-11-01 1979-11-02 Fotometer für Bildaufnahmegeräte

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP13376078A JPS5560826A (en) 1978-11-01 1978-11-01 Photometry

Publications (1)

Publication Number Publication Date
JPS5560826A true JPS5560826A (en) 1980-05-08

Family

ID=15112298

Family Applications (1)

Application Number Title Priority Date Filing Date
JP13376078A Pending JPS5560826A (en) 1978-11-01 1978-11-01 Photometry

Country Status (3)

Country Link
US (1) US4302780A (ja)
JP (1) JPS5560826A (ja)
DE (1) DE2944158C2 (ja)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS58160946A (ja) * 1982-03-19 1983-09-24 Hitachi Medical Corp Ｘ線自動露出装置
JP2003065848A (ja) * 2001-08-29 2003-03-05 Fuji Electric Co Ltd 被写体の明暗による順位付け方法およびその光センサ装置

Families Citing this family (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
NL8204260A (nl) * 1982-11-03 1984-06-01 Oce Nederland Bv Meetinrichting voor het meten van de optische dichtheid van zowel de ondergrond als van de beeldpartijen in een orgineel.
JP2501782B2 (ja) * 1983-09-16 1996-05-29 株式会社ニコン 画像走査装置
JPH0773335B2 (ja) * 1983-10-24 1995-08-02 株式会社ニコン 光電変換装置
US4570184A (en) * 1984-11-09 1986-02-11 North American Philips Corporation Optimization of vidicon bias lighting
US4670787A (en) * 1985-07-31 1987-06-02 Rca Corporation Suppression of field-rate brightness variations for a television camera
JP2859351B2 (ja) * 1990-02-07 1999-02-17 三菱電機株式会社 半導体装置の製造方法

Family Cites Families (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4037254A (en) * 1975-12-10 1977-07-19 Harris Corporation Automatic digital iris correction
US4176955A (en) * 1976-08-04 1979-12-04 Minolta Camera Kabushiki Kaisha Exposure meter

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS58160946A (ja) * 1982-03-19 1983-09-24 Hitachi Medical Corp Ｘ線自動露出装置
JP2003065848A (ja) * 2001-08-29 2003-03-05 Fuji Electric Co Ltd 被写体の明暗による順位付け方法およびその光センサ装置
JP4617623B2 (ja) * 2001-08-29 2011-01-26 富士電機システムズ株式会社 被写体の明暗による順位付け方法およびその光センサ装置

Also Published As

Publication number Publication date
DE2944158C2 (de) 1984-01-12
US4302780A (en) 1981-11-24
DE2944158A1 (de) 1980-05-08

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