JPS5551350A - Ultrasonic flaw detector - Google Patents

Ultrasonic flaw detector

Info

Publication number
JPS5551350A
JPS5551350A JP12528578A JP12528578A JPS5551350A JP S5551350 A JPS5551350 A JP S5551350A JP 12528578 A JP12528578 A JP 12528578A JP 12528578 A JP12528578 A JP 12528578A JP S5551350 A JPS5551350 A JP S5551350A
Authority
JP
Japan
Prior art keywords
reflected wave
memorized
maximum value
maximum
probe
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP12528578A
Other languages
Japanese (ja)
Inventor
Haruji Sato
Giichi Takazawa
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Mitsubishi Electric Corp
Original Assignee
Mitsubishi Electric Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Mitsubishi Electric Corp filed Critical Mitsubishi Electric Corp
Priority to JP12528578A priority Critical patent/JPS5551350A/en
Publication of JPS5551350A publication Critical patent/JPS5551350A/en
Pending legal-status Critical Current

Links

Abstract

PURPOSE: To obtain quickly the accurate information as well as to secure a big reduction of the load for the workers by adding the pseudo signal generator which is excited by the contents of two memory units memorizing the maximum reflected wave height and the maximum wave position each.
CONSTITUTION: The pulse sent from transmission part 1 is converted into the ultrasonic pulse via probe 2 and then thrown into material 3 to be tested. The reflected wave from defect F of welded part 4 is converted into the pulse via probe 2 and then supplied to CRT6 after amplification 5. In this case, the output of amplifier 5 is sent to memory unit 8 along with selection of only the reflected wave obtained between the markers which are set previously at gate part 7 and can be erased with the optional change secured for their positions. And the maximum value is always memorized among the variations of the height of the reflected waves obtained during the scan of probe 2. By the output of the memorized maximum value, the reflected wave position showing the maximum value is memorized in memory unit 9. And pseudo signal generator 10 is excited based on the contents of both memory units 8 and 9 to supply the pseudo signals to CRT6 via switch S.
COPYRIGHT: (C)1980,JPO&Japio
JP12528578A 1978-10-12 1978-10-12 Ultrasonic flaw detector Pending JPS5551350A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP12528578A JPS5551350A (en) 1978-10-12 1978-10-12 Ultrasonic flaw detector

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP12528578A JPS5551350A (en) 1978-10-12 1978-10-12 Ultrasonic flaw detector

Publications (1)

Publication Number Publication Date
JPS5551350A true JPS5551350A (en) 1980-04-15

Family

ID=14906285

Family Applications (1)

Application Number Title Priority Date Filing Date
JP12528578A Pending JPS5551350A (en) 1978-10-12 1978-10-12 Ultrasonic flaw detector

Country Status (1)

Country Link
JP (1) JPS5551350A (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5872053A (en) * 1981-10-05 1983-04-28 クラウトクレーマー・ゲーエムベーハー・ウント・コンパニー Ultrasonic testing device
JPS631363U (en) * 1986-06-19 1988-01-07

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5085385A (en) * 1973-11-27 1975-07-09
JPS5264983A (en) * 1975-11-26 1977-05-28 Hitachi Ltd Ultrasonic defectoscope

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5085385A (en) * 1973-11-27 1975-07-09
JPS5264983A (en) * 1975-11-26 1977-05-28 Hitachi Ltd Ultrasonic defectoscope

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5872053A (en) * 1981-10-05 1983-04-28 クラウトクレーマー・ゲーエムベーハー・ウント・コンパニー Ultrasonic testing device
JPH0136904B2 (en) * 1981-10-05 1989-08-03 Kurautokuramaa Gmbh Unto Co
JPS631363U (en) * 1986-06-19 1988-01-07

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