JPS553622A - Electronic beam exposure device - Google Patents
Electronic beam exposure deviceInfo
- Publication number
- JPS553622A JPS553622A JP7460078A JP7460078A JPS553622A JP S553622 A JPS553622 A JP S553622A JP 7460078 A JP7460078 A JP 7460078A JP 7460078 A JP7460078 A JP 7460078A JP S553622 A JPS553622 A JP S553622A
- Authority
- JP
- Japan
- Prior art keywords
- specimine
- electronic beam
- opening
- decelerating
- electrodes
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/30—Electron-beam or ion-beam tubes for localised treatment of objects
- H01J37/3002—Details
- H01J37/3007—Electron or ion-optical systems
Landscapes
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Electron Beam Exposure (AREA)
Abstract
PURPOSE:To reduce the shade-off around the projected image caused by the interaction of space charges by accelerating an electronic beam at high temperatures around exposure materials and by decelerating the electronic beam at the close proximity of the exposure materials by the use of decelerating electrodes. CONSTITUTION:An electronic beam from an electronic beam source G is focussed by a focusing lens L0, passed through an opening in a mask M1, and deflected by a deflecting means D1. Then, after the beam is again passed through an opening in a mask M2, it is focussed by a lens L2, deflected by a deflecting means D2, and illuminated on a specimine W. In this constitution, accelerating electrodes are provided adjacent to the masks M1 and M2 on the path of the beam to the specimine W, and decelerating electrodes E with an opening is additionally provided over the specimine, whereby an electric field opposite to the acceleating field is given to decelerate the beam. In this way, the beam which will not generate backward scattering or secondary electrons is formed and illuminates the specimine W. As a result, the shape of the beam-cross section becomes sharp and shade-off is not generated.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP7460078A JPS553622A (en) | 1978-06-20 | 1978-06-20 | Electronic beam exposure device |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP7460078A JPS553622A (en) | 1978-06-20 | 1978-06-20 | Electronic beam exposure device |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS553622A true JPS553622A (en) | 1980-01-11 |
JPS5622364B2 JPS5622364B2 (en) | 1981-05-25 |
Family
ID=13551803
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP7460078A Granted JPS553622A (en) | 1978-06-20 | 1978-06-20 | Electronic beam exposure device |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS553622A (en) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS59198721A (en) * | 1983-04-26 | 1984-11-10 | Toshiba Corp | Electron beam drawing device |
-
1978
- 1978-06-20 JP JP7460078A patent/JPS553622A/en active Granted
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS59198721A (en) * | 1983-04-26 | 1984-11-10 | Toshiba Corp | Electron beam drawing device |
Also Published As
Publication number | Publication date |
---|---|
JPS5622364B2 (en) | 1981-05-25 |
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