JPS5520420A - Mtf examination unit - Google Patents
Mtf examination unitInfo
- Publication number
- JPS5520420A JPS5520420A JP9298778A JP9298778A JPS5520420A JP S5520420 A JPS5520420 A JP S5520420A JP 9298778 A JP9298778 A JP 9298778A JP 9298778 A JP9298778 A JP 9298778A JP S5520420 A JPS5520420 A JP S5520420A
- Authority
- JP
- Japan
- Prior art keywords
- chart
- elements
- plate
- examined
- solid
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 239000007787 solid Substances 0.000 abstract 5
- 238000005286 illumination Methods 0.000 abstract 2
- 230000003287 optical effect Effects 0.000 abstract 2
- 238000009792 diffusion process Methods 0.000 abstract 1
Landscapes
- Testing Of Optical Devices Or Fibers (AREA)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP9298778A JPS5520420A (en) | 1978-07-29 | 1978-07-29 | Mtf examination unit |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP9298778A JPS5520420A (en) | 1978-07-29 | 1978-07-29 | Mtf examination unit |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS5520420A true JPS5520420A (en) | 1980-02-13 |
JPS6235052B2 JPS6235052B2 (enrdf_load_stackoverflow) | 1987-07-30 |
Family
ID=14069715
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP9298778A Granted JPS5520420A (en) | 1978-07-29 | 1978-07-29 | Mtf examination unit |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS5520420A (enrdf_load_stackoverflow) |
Cited By (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS56120935A (en) * | 1980-02-29 | 1981-09-22 | Ricoh Co Ltd | Inspecting device for lens array |
JPS58219432A (ja) * | 1982-06-16 | 1983-12-20 | Ricoh Co Ltd | レンズのmtf測定機 |
US5574555A (en) * | 1993-05-14 | 1996-11-12 | Fuji Photo Film Co., Ltd. | Lens inspection method and apparatus |
KR20160117336A (ko) * | 2015-03-31 | 2016-10-10 | 트리옵틱스 게엠베하 | 광학 촬상 시스템의 결상 특성들을 측정하기 위한 디바이스 및 방법 |
-
1978
- 1978-07-29 JP JP9298778A patent/JPS5520420A/ja active Granted
Cited By (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS56120935A (en) * | 1980-02-29 | 1981-09-22 | Ricoh Co Ltd | Inspecting device for lens array |
JPS58219432A (ja) * | 1982-06-16 | 1983-12-20 | Ricoh Co Ltd | レンズのmtf測定機 |
US5574555A (en) * | 1993-05-14 | 1996-11-12 | Fuji Photo Film Co., Ltd. | Lens inspection method and apparatus |
KR20160117336A (ko) * | 2015-03-31 | 2016-10-10 | 트리옵틱스 게엠베하 | 광학 촬상 시스템의 결상 특성들을 측정하기 위한 디바이스 및 방법 |
Also Published As
Publication number | Publication date |
---|---|
JPS6235052B2 (enrdf_load_stackoverflow) | 1987-07-30 |
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