JPS55166927A - Dry etching apparatus - Google Patents
Dry etching apparatusInfo
- Publication number
- JPS55166927A JPS55166927A JP7529579A JP7529579A JPS55166927A JP S55166927 A JPS55166927 A JP S55166927A JP 7529579 A JP7529579 A JP 7529579A JP 7529579 A JP7529579 A JP 7529579A JP S55166927 A JPS55166927 A JP S55166927A
- Authority
- JP
- Japan
- Prior art keywords
- electrode
- upper electrode
- processed
- products
- vacuum chamber
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/32—Gas-filled discharge tubes
- H01J37/32431—Constructional details of the reactor
- H01J37/3244—Gas supply means
Landscapes
- Physics & Mathematics (AREA)
- Engineering & Computer Science (AREA)
- Plasma & Fusion (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Drying Of Semiconductors (AREA)
Abstract
PURPOSE:To make uniform etched region available by a method wherein products to be processed is fastened on one electrode which is faced by each other in a vacuum chamber which has an evacuation tap and another electrode which is provided with gas ejecting holes is driven to rotate with an inclined angle. CONSTITUTION:An upper electrode 2 and a lower electrode 3 are provided within a vacuum chamber 1 which is evacuated from a evacuation tap 7, and high frequency voltage or d.c. voltage is applied between two electrodes 2, 3. And products 5 to be processed such as semiconductor wafers is retained on the lower electrode 3, and ejecting holes 4 which eject etching gas such as Ar or Fr are provided on the lower surface of the upper electrode 2. The upper electrode 2 is disposed to be inclined refering to the lower electrode 3 and can be rotated around a central axis 8. By this method distance between two electrodes varies at every succeeding minute by dependence on the position of the electrode, and by strength of electric field and gas supply varying periodically, uniform etching is performed with proper rotational speed selected.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP7529579A JPS55166927A (en) | 1979-06-15 | 1979-06-15 | Dry etching apparatus |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP7529579A JPS55166927A (en) | 1979-06-15 | 1979-06-15 | Dry etching apparatus |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS55166927A true JPS55166927A (en) | 1980-12-26 |
JPS5719568B2 JPS5719568B2 (en) | 1982-04-23 |
Family
ID=13572103
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP7529579A Granted JPS55166927A (en) | 1979-06-15 | 1979-06-15 | Dry etching apparatus |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS55166927A (en) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4718976A (en) * | 1982-03-31 | 1988-01-12 | Fujitsu Limited | Process and apparatus for plasma treatment |
-
1979
- 1979-06-15 JP JP7529579A patent/JPS55166927A/en active Granted
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4718976A (en) * | 1982-03-31 | 1988-01-12 | Fujitsu Limited | Process and apparatus for plasma treatment |
Also Published As
Publication number | Publication date |
---|---|
JPS5719568B2 (en) | 1982-04-23 |
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