JPS55129772A - Logic block for integrated digital circuit - Google Patents

Logic block for integrated digital circuit

Info

Publication number
JPS55129772A
JPS55129772A JP587680A JP587680A JPS55129772A JP S55129772 A JPS55129772 A JP S55129772A JP 587680 A JP587680 A JP 587680A JP 587680 A JP587680 A JP 587680A JP S55129772 A JPS55129772 A JP S55129772A
Authority
JP
Japan
Prior art keywords
digital circuit
logic block
integrated digital
integrated
logic
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP587680A
Other languages
English (en)
Japanese (ja)
Other versions
JPH0225155B2 (enrdf_load_stackoverflow
Inventor
Keeneman Berunto
Muhiya Yooahimu
Tsuuiihofu Giyuntaa
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Individual
Original Assignee
Individual
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Individual filed Critical Individual
Publication of JPS55129772A publication Critical patent/JPS55129772A/ja
Publication of JPH0225155B2 publication Critical patent/JPH0225155B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00—Error detection; Error correction; Monitoring
    • G06F11/22—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
    • G06F11/26—Functional testing
    • G06F11/27—Built-in tests

Landscapes

  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Theoretical Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Quality & Reliability (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Test And Diagnosis Of Digital Computers (AREA)
  • Logic Circuits (AREA)
JP587680A 1979-01-23 1980-01-23 Logic block for integrated digital circuit Granted JPS55129772A (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
DE19792902375 DE2902375C2 (de) 1979-01-23 1979-01-23 Logikbaustein für integrierte Digitalschaltungen

Publications (2)

Publication Number Publication Date
JPS55129772A true JPS55129772A (en) 1980-10-07
JPH0225155B2 JPH0225155B2 (enrdf_load_stackoverflow) 1990-05-31

Family

ID=6061148

Family Applications (1)

Application Number Title Priority Date Filing Date
JP587680A Granted JPS55129772A (en) 1979-01-23 1980-01-23 Logic block for integrated digital circuit

Country Status (4)

Country Link
JP (1) JPS55129772A (enrdf_load_stackoverflow)
DE (1) DE2902375C2 (enrdf_load_stackoverflow)
FR (1) FR2449945A1 (enrdf_load_stackoverflow)
GB (1) GB2041546B (enrdf_load_stackoverflow)

Cited By (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS57106218A (en) * 1980-12-23 1982-07-02 Fujitsu Ltd Cmos type dff circuit
JPS60147660A (ja) * 1983-12-30 1985-08-03 インタ−ナショナル　ビジネス　マシ−ンズ　コ−ポレ−ション 線形帰環シフトレジスタ
JPS61223675A (ja) * 1985-03-23 1986-10-04 インターナシヨナル　コンピユーターズ　リミテツド デジタル集積回路
JPS62249083A (ja) * 1986-04-21 1987-10-30 Sony Corp 試験回路
JPS6370176A (ja) * 1986-09-11 1988-03-30 Sony Corp Ｉｃ回路
JPS6410184A (en) * 1987-06-18 1989-01-13 Ibm Multi-chip packaging construction and test thereof
JPH01155281A (ja) * 1987-12-11 1989-06-19 Nec Corp 論理テスト回路
JPH01158373A (ja) * 1987-09-14 1989-06-21 Texas Instr Inc <Ti> 解析装置

Families Citing this family (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5618766A (en) * 1979-07-26 1981-02-21 Fujitsu Ltd Testing apparatus for logic circuit
US4357703A (en) * 1980-10-09 1982-11-02 Control Data Corporation Test system for LSI circuits resident on LSI chips
JPS5789154A (en) * 1980-11-25 1982-06-03 Nec Corp Logical integrated circuit
US4551838A (en) * 1983-06-20 1985-11-05 At&T Bell Laboratories Self-testing digital circuits
GB2178175A (en) * 1985-07-18 1987-02-04 British Telecomm Logic testing circuit
JP2770617B2 (ja) * 1991-09-05 1998-07-02 日本電気株式会社 テスト回路
DE19604375C2 (de) * 1996-02-07 1999-04-29 Martin Kuboschek Verfahren zur Auswertung von Testantworten zu prüfender digitaler Schaltungen und Schaltungsanordnung zur Durchführung des Verfahrens

Family Cites Families (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3961252A (en) * 1974-12-20 1976-06-01 International Business Machines Corporation Testing embedded arrays
US3961254A (en) * 1974-12-20 1976-06-01 International Business Machines Corporation Testing embedded arrays

Cited By (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS57106218A (en) * 1980-12-23 1982-07-02 Fujitsu Ltd Cmos type dff circuit
JPS60147660A (ja) * 1983-12-30 1985-08-03 インタ−ナショナル　ビジネス　マシ−ンズ　コ−ポレ−ション 線形帰環シフトレジスタ
JPS61223675A (ja) * 1985-03-23 1986-10-04 インターナシヨナル　コンピユーターズ　リミテツド デジタル集積回路
JPS62249083A (ja) * 1986-04-21 1987-10-30 Sony Corp 試験回路
JPS6370176A (ja) * 1986-09-11 1988-03-30 Sony Corp Ｉｃ回路
JPS6410184A (en) * 1987-06-18 1989-01-13 Ibm Multi-chip packaging construction and test thereof
JPH01158373A (ja) * 1987-09-14 1989-06-21 Texas Instr Inc <Ti> 解析装置
JPH01155281A (ja) * 1987-12-11 1989-06-19 Nec Corp 論理テスト回路

Also Published As

Publication number Publication date
GB2041546A (en) 1980-09-10
FR2449945B1 (enrdf_load_stackoverflow) 1985-03-01
DE2902375A1 (de) 1980-07-31
GB2041546B (en) 1983-04-07
DE2902375C2 (de) 1984-05-17
FR2449945A1 (fr) 1980-09-19
JPH0225155B2 (enrdf_load_stackoverflow) 1990-05-31

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