JPS55121679A - Short channel v-mos-fet - Google Patents
Short channel v-mos-fetInfo
- Publication number
- JPS55121679A JPS55121679A JP2823379A JP2823379A JPS55121679A JP S55121679 A JPS55121679 A JP S55121679A JP 2823379 A JP2823379 A JP 2823379A JP 2823379 A JP2823379 A JP 2823379A JP S55121679 A JPS55121679 A JP S55121679A
- Authority
- JP
- Japan
- Prior art keywords
- substrate
- short channel
- specific resistance
- fet
- mos
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 239000000758 substrate Substances 0.000 abstract 4
- 230000003247 decreasing effect Effects 0.000 abstract 2
- 239000004065 semiconductor Substances 0.000 abstract 1
- 238000004904 shortening Methods 0.000 abstract 1
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L29/00—Semiconductor devices adapted for rectifying, amplifying, oscillating or switching, or capacitors or resistors with at least one potential-jump barrier or surface barrier, e.g. PN junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof ; Multistep manufacturing processes therefor
- H01L29/66—Types of semiconductor device ; Multistep manufacturing processes therefor
- H01L29/68—Types of semiconductor device ; Multistep manufacturing processes therefor controllable by only the electric current supplied, or only the electric potential applied, to an electrode which does not carry the current to be rectified, amplified or switched
- H01L29/76—Unipolar devices, e.g. field effect transistors
- H01L29/772—Field effect transistors
- H01L29/78—Field effect transistors with field effect produced by an insulated gate
- H01L29/7801—DMOS transistors, i.e. MISFETs with a channel accommodating body or base region adjoining a drain drift region
- H01L29/7802—Vertical DMOS transistors, i.e. VDMOS transistors
- H01L29/7813—Vertical DMOS transistors, i.e. VDMOS transistors with trench gate electrode, e.g. UMOS transistors
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L29/00—Semiconductor devices adapted for rectifying, amplifying, oscillating or switching, or capacitors or resistors with at least one potential-jump barrier or surface barrier, e.g. PN junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof ; Multistep manufacturing processes therefor
- H01L29/66—Types of semiconductor device ; Multistep manufacturing processes therefor
- H01L29/68—Types of semiconductor device ; Multistep manufacturing processes therefor controllable by only the electric current supplied, or only the electric potential applied, to an electrode which does not carry the current to be rectified, amplified or switched
- H01L29/76—Unipolar devices, e.g. field effect transistors
- H01L29/772—Field effect transistors
- H01L29/78—Field effect transistors with field effect produced by an insulated gate
- H01L29/7827—Vertical transistors
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L29/00—Semiconductor devices adapted for rectifying, amplifying, oscillating or switching, or capacitors or resistors with at least one potential-jump barrier or surface barrier, e.g. PN junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof ; Multistep manufacturing processes therefor
- H01L29/02—Semiconductor bodies ; Multistep manufacturing processes therefor
- H01L29/06—Semiconductor bodies ; Multistep manufacturing processes therefor characterised by their shape; characterised by the shapes, relative sizes, or dispositions of the semiconductor regions ; characterised by the concentration or distribution of impurities within semiconductor regions
- H01L29/08—Semiconductor bodies ; Multistep manufacturing processes therefor characterised by their shape; characterised by the shapes, relative sizes, or dispositions of the semiconductor regions ; characterised by the concentration or distribution of impurities within semiconductor regions with semiconductor regions connected to an electrode carrying current to be rectified, amplified or switched and such electrode being part of a semiconductor device which comprises three or more electrodes
- H01L29/0843—Source or drain regions of field-effect devices
- H01L29/0847—Source or drain regions of field-effect devices of field-effect transistors with insulated gate
Landscapes
- Engineering & Computer Science (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Physics & Mathematics (AREA)
- Ceramic Engineering (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Computer Hardware Design (AREA)
- Electrodes Of Semiconductors (AREA)
- Non-Volatile Memory (AREA)
Abstract
PURPOSE:To reduce the operating resistance of a short channel V-MOS-FET without increasing the area of the chip by shortening the channel length without decreasing the punch through withstand voltage thereof. CONSTITUTION:A semiconductor region 8 having the same conducting type as an n<+>type low specific resistance layer substrate 1 and substantially equal specific resistance thereto is formed at the projected region disposed at the n<+>type low specific resistance layer substrate 1 side of the groove formed to reach the substrate 1 through the substrate 1 and a channel forming layer 2. When the projected height of the region 8 and the width thereof are set at suitable values, it can set the short channel length between the source and the drain without decreasing the punch through withstand voltage thereof.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2823379A JPS55121679A (en) | 1979-03-13 | 1979-03-13 | Short channel v-mos-fet |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2823379A JPS55121679A (en) | 1979-03-13 | 1979-03-13 | Short channel v-mos-fet |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS55121679A true JPS55121679A (en) | 1980-09-18 |
JPS6152588B2 JPS6152588B2 (en) | 1986-11-13 |
Family
ID=12242869
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP2823379A Granted JPS55121679A (en) | 1979-03-13 | 1979-03-13 | Short channel v-mos-fet |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS55121679A (en) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS60128864A (en) * | 1983-12-15 | 1985-07-09 | Seiko Epson Corp | Voltage converter circuit |
-
1979
- 1979-03-13 JP JP2823379A patent/JPS55121679A/en active Granted
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS60128864A (en) * | 1983-12-15 | 1985-07-09 | Seiko Epson Corp | Voltage converter circuit |
JPH0532984B2 (en) * | 1983-12-15 | 1993-05-18 | Seiko Epson Corp |
Also Published As
Publication number | Publication date |
---|---|
JPS6152588B2 (en) | 1986-11-13 |
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