JPS54877A - Marking method for semiconductor chip - Google Patents

Marking method for semiconductor chip

Info

Publication number
JPS54877A
JPS54877A JP6549577A JP6549577A JPS54877A JP S54877 A JPS54877 A JP S54877A JP 6549577 A JP6549577 A JP 6549577A JP 6549577 A JP6549577 A JP 6549577A JP S54877 A JPS54877 A JP S54877A
Authority
JP
Japan
Prior art keywords
semiconductor chip
marking method
marks
plural
substrate
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP6549577A
Other languages
Japanese (ja)
Inventor
Minoru Yamamoto
Masaichi Shinoda
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Fujitsu Ltd
Original Assignee
Fujitsu Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Fujitsu Ltd filed Critical Fujitsu Ltd
Priority to JP6549577A priority Critical patent/JPS54877A/en
Publication of JPS54877A publication Critical patent/JPS54877A/en
Pending legal-status Critical Current

Links

Landscapes

  • Testing Or Measuring Of Semiconductors Or The Like (AREA)

Abstract

PURPOSE: To enable an attachment of plural large marks and thus to facilitate an easy visible selection, by measuring the characteristics of plural elements formed on one primary surface of the semiconductor substrate and then attaching the marks showing the characterisitics on the rear surface of the substrate.
COPYRIGHT: (C)1979,JPO&Japio
JP6549577A 1977-06-03 1977-06-03 Marking method for semiconductor chip Pending JPS54877A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP6549577A JPS54877A (en) 1977-06-03 1977-06-03 Marking method for semiconductor chip

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP6549577A JPS54877A (en) 1977-06-03 1977-06-03 Marking method for semiconductor chip

Publications (1)

Publication Number Publication Date
JPS54877A true JPS54877A (en) 1979-01-06

Family

ID=13288719

Family Applications (1)

Application Number Title Priority Date Filing Date
JP6549577A Pending JPS54877A (en) 1977-06-03 1977-06-03 Marking method for semiconductor chip

Country Status (1)

Country Link
JP (1) JPS54877A (en)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH01189908A (en) * 1988-01-26 1989-07-31 Seiko Instr & Electron Ltd Marking apparatus
JPH05326653A (en) * 1992-05-15 1993-12-10 Mitsubishi Electric Corp Discriminating method of failed ic and tester therefor
JP2006351772A (en) * 2005-06-15 2006-12-28 Fujifilm Holdings Corp Method for recording identification information of semiconductor chip and imaging apparatus

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH01189908A (en) * 1988-01-26 1989-07-31 Seiko Instr & Electron Ltd Marking apparatus
JPH05326653A (en) * 1992-05-15 1993-12-10 Mitsubishi Electric Corp Discriminating method of failed ic and tester therefor
JP2006351772A (en) * 2005-06-15 2006-12-28 Fujifilm Holdings Corp Method for recording identification information of semiconductor chip and imaging apparatus

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