JPS54877A - Marking method for semiconductor chip - Google Patents
Marking method for semiconductor chipInfo
- Publication number
- JPS54877A JPS54877A JP6549577A JP6549577A JPS54877A JP S54877 A JPS54877 A JP S54877A JP 6549577 A JP6549577 A JP 6549577A JP 6549577 A JP6549577 A JP 6549577A JP S54877 A JPS54877 A JP S54877A
- Authority
- JP
- Japan
- Prior art keywords
- semiconductor chip
- marking method
- marks
- plural
- substrate
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Landscapes
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
Abstract
PURPOSE: To enable an attachment of plural large marks and thus to facilitate an easy visible selection, by measuring the characteristics of plural elements formed on one primary surface of the semiconductor substrate and then attaching the marks showing the characterisitics on the rear surface of the substrate.
COPYRIGHT: (C)1979,JPO&Japio
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP6549577A JPS54877A (en) | 1977-06-03 | 1977-06-03 | Marking method for semiconductor chip |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP6549577A JPS54877A (en) | 1977-06-03 | 1977-06-03 | Marking method for semiconductor chip |
Publications (1)
Publication Number | Publication Date |
---|---|
JPS54877A true JPS54877A (en) | 1979-01-06 |
Family
ID=13288719
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP6549577A Pending JPS54877A (en) | 1977-06-03 | 1977-06-03 | Marking method for semiconductor chip |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS54877A (en) |
Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH01189908A (en) * | 1988-01-26 | 1989-07-31 | Seiko Instr & Electron Ltd | Marking apparatus |
JPH05326653A (en) * | 1992-05-15 | 1993-12-10 | Mitsubishi Electric Corp | Discriminating method of failed ic and tester therefor |
JP2006351772A (en) * | 2005-06-15 | 2006-12-28 | Fujifilm Holdings Corp | Method for recording identification information of semiconductor chip and imaging apparatus |
-
1977
- 1977-06-03 JP JP6549577A patent/JPS54877A/en active Pending
Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH01189908A (en) * | 1988-01-26 | 1989-07-31 | Seiko Instr & Electron Ltd | Marking apparatus |
JPH05326653A (en) * | 1992-05-15 | 1993-12-10 | Mitsubishi Electric Corp | Discriminating method of failed ic and tester therefor |
JP2006351772A (en) * | 2005-06-15 | 2006-12-28 | Fujifilm Holdings Corp | Method for recording identification information of semiconductor chip and imaging apparatus |
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