JPS5487189A - Test method for lsi - Google Patents

Test method for lsi

Info

Publication number
JPS5487189A
JPS5487189A JP15512077A JP15512077A JPS5487189A JP S5487189 A JPS5487189 A JP S5487189A JP 15512077 A JP15512077 A JP 15512077A JP 15512077 A JP15512077 A JP 15512077A JP S5487189 A JPS5487189 A JP S5487189A
Authority
JP
Japan
Prior art keywords
circuit
lsi
test
clock
data
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP15512077A
Other languages
Japanese (ja)
Inventor
Shozo Toda
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Fujitsu Ltd
Original Assignee
Fujitsu Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Fujitsu Ltd filed Critical Fujitsu Ltd
Priority to JP15512077A priority Critical patent/JPS5487189A/en
Publication of JPS5487189A publication Critical patent/JPS5487189A/en
Pending legal-status Critical Current

Links

Landscapes

  • Tests Of Electronic Circuits (AREA)
  • Test And Diagnosis Of Digital Computers (AREA)

Abstract

PURPOSE: To reduce the number of probes, by providing LSI and the additional circuit located at the circumference on one semiconductor wafer, performing the logic test of LSI trough the connection between the terminals of the additional circuit and the test equipment, and by separating LSI from the additional circuit after the end of test.
CONSTITUTION: At the circumference of LSI 2 placed on the semiconductor wafer 1, the additinal circufit 3 consistng of the test data input circuit 5, registers 6 and 8, output data circuit 7, and clock terminals 16, 17 and 18 is formed. With this constitution, the test equipment 4 and the terminals of the circuit 3 are connected with probes, and the test data from the test equipment 4 are fed to the circuit 5 and stored. Next, clock is given to the terminal 16, the data stored in the circuit 5 are set parallelly to the register 6, and LSI clock is given to the terminal 18. After that, clock is fed to the terminal 17, the output data from LSI2 are set to the register 8, and this content is read out with the circuit 7 and is fed to the test equipment 4. Thus, when the data are in agreement with the expected value, the LSI2 is disconnected from the dotted line part.
COPYRIGHT: (C)1979,JPO&Japio
JP15512077A 1977-12-23 1977-12-23 Test method for lsi Pending JPS5487189A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP15512077A JPS5487189A (en) 1977-12-23 1977-12-23 Test method for lsi

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP15512077A JPS5487189A (en) 1977-12-23 1977-12-23 Test method for lsi

Publications (1)

Publication Number Publication Date
JPS5487189A true JPS5487189A (en) 1979-07-11

Family

ID=15599000

Family Applications (1)

Application Number Title Priority Date Filing Date
JP15512077A Pending JPS5487189A (en) 1977-12-23 1977-12-23 Test method for lsi

Country Status (1)

Country Link
JP (1) JPS5487189A (en)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS57166044A (en) * 1981-03-27 1982-10-13 Ibm Method of testing programmable circuit
JPS63317838A (en) * 1987-06-22 1988-12-26 Matsushita Electronics Corp Totalizer for inspection data on semiconductor probe
JPH04301782A (en) * 1991-03-29 1992-10-26 Nec Eng Ltd Circuit to make test easier

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS57166044A (en) * 1981-03-27 1982-10-13 Ibm Method of testing programmable circuit
JPH028663B2 (en) * 1981-03-27 1990-02-26 Intaanashonaru Bijinesu Mashiinzu Corp
JPS63317838A (en) * 1987-06-22 1988-12-26 Matsushita Electronics Corp Totalizer for inspection data on semiconductor probe
JPH04301782A (en) * 1991-03-29 1992-10-26 Nec Eng Ltd Circuit to make test easier

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