JPS5474678A - Detection method of chip location on semiconductor wafer - Google Patents

Detection method of chip location on semiconductor wafer

Info

Publication number
JPS5474678A
JPS5474678A JP14164377A JP14164377A JPS5474678A JP S5474678 A JPS5474678 A JP S5474678A JP 14164377 A JP14164377 A JP 14164377A JP 14164377 A JP14164377 A JP 14164377A JP S5474678 A JPS5474678 A JP S5474678A
Authority
JP
Japan
Prior art keywords
detection
chip
location
illumination
wafer
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP14164377A
Other languages
Japanese (ja)
Other versions
JPS5610787B2 (en
Inventor
Yukio Kenbo
Tomohiro Kuji
Hiroshi Makihira
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Hitachi Ltd
Original Assignee
Hitachi Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hitachi Ltd filed Critical Hitachi Ltd
Priority to JP14164377A priority Critical patent/JPS5474678A/en
Priority to US05/964,353 priority patent/US4213117A/en
Publication of JPS5474678A publication Critical patent/JPS5474678A/en
Publication of JPS5610787B2 publication Critical patent/JPS5610787B2/ja
Granted legal-status Critical Current

Links

Landscapes

  • Dicing (AREA)

Abstract

PURPOSE: To enable to simple detection for the chip location on a semiconductor wafer not by complicated electric method but by changing the method of illumina- tion merely.
CONSTITUTION: The detection area 7 on the wafer 1 is image-formed on the primary dimension image elment 26 with the condition of light flux compressed toward a given direction via the otical system consisting of the objective lens 8, cylindrical lens 25, and the location of the chip 2 is calculated with the location detection circuit 27 from the image signal photo electric converted, and the alignment of the chip 2 on the wafer 1 is made by moving the table 14 via the motor control circuit 12 and motor drive mechanism 18 based on this detection value. The detection is made with the circuit 27 by using the coarseness detection illumination 28 which is tilt illumination from orthogonal direction to the pick up element 26, it is changed over to the fine detection illumination 29 tilt from the left and fright direction in parallel with the pick up element 26, fine detection is made with the coarse and fine detection, performing alignment.
COPYRIGHT: (C)1979,JPO&Japio
JP14164377A 1977-11-28 1977-11-28 Detection method of chip location on semiconductor wafer Granted JPS5474678A (en)

Priority Applications (2)

Application Number Priority Date Filing Date Title
JP14164377A JPS5474678A (en) 1977-11-28 1977-11-28 Detection method of chip location on semiconductor wafer
US05/964,353 US4213117A (en) 1977-11-28 1978-11-28 Method and apparatus for detecting positions of chips on a semiconductor wafer

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP14164377A JPS5474678A (en) 1977-11-28 1977-11-28 Detection method of chip location on semiconductor wafer

Publications (2)

Publication Number Publication Date
JPS5474678A true JPS5474678A (en) 1979-06-14
JPS5610787B2 JPS5610787B2 (en) 1981-03-10

Family

ID=15296808

Family Applications (1)

Application Number Title Priority Date Filing Date
JP14164377A Granted JPS5474678A (en) 1977-11-28 1977-11-28 Detection method of chip location on semiconductor wafer

Country Status (1)

Country Link
JP (1) JPS5474678A (en)

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5742179A (en) * 1980-08-27 1982-03-09 Nec Corp Semiconductor device with recognition pattern
JPS5758332A (en) * 1980-09-24 1982-04-08 Fujitsu Ltd Manufacture of semiconductor device
JPS57113244A (en) * 1980-12-29 1982-07-14 Yoshie Hasegawa Inspecting device of wafer surface
KR20200013008A (en) 2017-03-31 2020-02-05 제이엑스금속주식회사 Laminated body and method of producing shaped article

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5742179A (en) * 1980-08-27 1982-03-09 Nec Corp Semiconductor device with recognition pattern
JPS5758332A (en) * 1980-09-24 1982-04-08 Fujitsu Ltd Manufacture of semiconductor device
JPS57113244A (en) * 1980-12-29 1982-07-14 Yoshie Hasegawa Inspecting device of wafer surface
KR20200013008A (en) 2017-03-31 2020-02-05 제이엑스금속주식회사 Laminated body and method of producing shaped article

Also Published As

Publication number Publication date
JPS5610787B2 (en) 1981-03-10

Similar Documents

Publication Publication Date Title
JPS56142509A (en) Lighting device of microscope
JPS5596933A (en) Overhead projector
JPS5474678A (en) Detection method of chip location on semiconductor wafer
JPS52147430A (en) Focus detection device
JPS5773709A (en) Focusing-point detector
JPS51149004A (en) Optical apparatus
JPS52140333A (en) Optical device
JPS5332728A (en) Focus control device for camera
JPS56143425A (en) Camera with magnifier
JPS5564218A (en) Focus detector
JPS57148718A (en) Illumination system of optical device
JPS5629110A (en) Distance measurement unit
JPS52110037A (en) Electric source switch for detection circuit for focusing state
JPS5315144A (en) Exposure device for variable magnification type electrophotographic copier
JPS57204068A (en) Exposure controller
JPS54134982A (en) Detector for street position on semiconductor wafer
JPS55144211A (en) Focus detector of camera
JPS5327439A (en) Focus measuring device
JPS5370431A (en) Lens shift device with mechanism interlocked with diaphragm
JPS5622455A (en) Reciprocating reader
JPS5383621A (en) Control mechanism for intensity of illumination on the focal plane
JPS534536A (en) Microfilm reader printer
JPS53126924A (en) Control method for original document illumination of slit exposure copier
JPS51137426A (en) Image rotating device
JPS54133140A (en) Photoreceptor exposure adjusting method in copying machine