JPS5453562A - Photoelectric detector - Google Patents
Photoelectric detectorInfo
- Publication number
- JPS5453562A JPS5453562A JP11969977A JP11969977A JPS5453562A JP S5453562 A JPS5453562 A JP S5453562A JP 11969977 A JP11969977 A JP 11969977A JP 11969977 A JP11969977 A JP 11969977A JP S5453562 A JPS5453562 A JP S5453562A
- Authority
- JP
- Japan
- Prior art keywords
- light
- scattered
- wafer
- rays
- mask
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 238000001514 detection method Methods 0.000 abstract 2
- 230000003287 optical effect Effects 0.000 abstract 2
- 238000003384 imaging method Methods 0.000 abstract 1
- 230000010287 polarization Effects 0.000 abstract 1
Classifications
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F9/00—Registration or positioning of originals, masks, frames, photographic sheets or textured or patterned surfaces, e.g. automatically
- G03F9/70—Registration or positioning of originals, masks, frames, photographic sheets or textured or patterned surfaces, e.g. automatically for microlithography
- G03F9/7065—Production of alignment light, e.g. light source, control of coherence, polarization, pulse length, wavelength
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Exposure Of Semiconductors, Excluding Electron Or Ion Beam Exposure (AREA)
- Length Measuring Devices By Optical Means (AREA)
- Exposure And Positioning Against Photoresist Photosensitive Materials (AREA)
Priority Applications (3)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP11969977A JPS5453562A (en) | 1977-10-05 | 1977-10-05 | Photoelectric detector |
DE19782843282 DE2843282A1 (de) | 1977-10-05 | 1978-10-04 | Fotoelektrische erfassungsvorrichtung |
US05/948,776 US4251129A (en) | 1977-10-05 | 1978-10-05 | Photoelectric detecting device |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP11969977A JPS5453562A (en) | 1977-10-05 | 1977-10-05 | Photoelectric detector |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS5453562A true JPS5453562A (en) | 1979-04-26 |
JPS638402B2 JPS638402B2 (enrdf_load_stackoverflow) | 1988-02-23 |
Family
ID=14767873
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP11969977A Granted JPS5453562A (en) | 1977-10-05 | 1977-10-05 | Photoelectric detector |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS5453562A (enrdf_load_stackoverflow) |
Cited By (13)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5624504A (en) * | 1979-08-06 | 1981-03-09 | Canon Inc | Photoelectric detector |
JPS5989420A (ja) * | 1982-11-15 | 1984-05-23 | Canon Inc | 位置合わせ装置 |
JPS5999304A (ja) * | 1982-11-30 | 1984-06-08 | Asahi Optical Co Ltd | 顕微鏡系のレーザ光による比較測長装置 |
JPS59125009A (ja) * | 1982-12-29 | 1984-07-19 | Fujitsu Ltd | パタ−ン検知法 |
JPS6052021A (ja) * | 1983-08-31 | 1985-03-23 | Canon Inc | 位置検出方法 |
JPS60261138A (ja) * | 1984-06-08 | 1985-12-24 | Canon Inc | 位置合わせ装置 |
JPS6193454A (ja) * | 1984-08-28 | 1986-05-12 | エルエスアイ・ロジツク・コ−ポレイシヨン | 写真平板式マスク整合装置 |
JPS61230114A (ja) * | 1985-04-04 | 1986-10-14 | Nippon Kogaku Kk <Nikon> | アライメント光学装置 |
JPS6238303A (ja) * | 1985-08-13 | 1987-02-19 | Nippon Kogaku Kk <Nikon> | 物体位置検出光学装置 |
JPS62216231A (ja) * | 1987-01-24 | 1987-09-22 | Nippon Kogaku Kk <Nikon> | アライメント装置 |
JPS6376427A (ja) * | 1986-09-19 | 1988-04-06 | Canon Inc | 露光方法 |
US4834540A (en) * | 1986-07-04 | 1989-05-30 | Canon Kabushiki Kaisha | Projection exposure apparatus |
JPH01503493A (ja) * | 1987-03-27 | 1989-11-22 | ザ ボード オブ トラスティーズ オブ ザ リーランド スタンフォード ジュニア ユニバーシティ | 走査式共焦点型光学顕微鏡 |
-
1977
- 1977-10-05 JP JP11969977A patent/JPS5453562A/ja active Granted
Cited By (13)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5624504A (en) * | 1979-08-06 | 1981-03-09 | Canon Inc | Photoelectric detector |
JPS5989420A (ja) * | 1982-11-15 | 1984-05-23 | Canon Inc | 位置合わせ装置 |
JPS5999304A (ja) * | 1982-11-30 | 1984-06-08 | Asahi Optical Co Ltd | 顕微鏡系のレーザ光による比較測長装置 |
JPS59125009A (ja) * | 1982-12-29 | 1984-07-19 | Fujitsu Ltd | パタ−ン検知法 |
JPS6052021A (ja) * | 1983-08-31 | 1985-03-23 | Canon Inc | 位置検出方法 |
JPS60261138A (ja) * | 1984-06-08 | 1985-12-24 | Canon Inc | 位置合わせ装置 |
JPS6193454A (ja) * | 1984-08-28 | 1986-05-12 | エルエスアイ・ロジツク・コ−ポレイシヨン | 写真平板式マスク整合装置 |
JPS61230114A (ja) * | 1985-04-04 | 1986-10-14 | Nippon Kogaku Kk <Nikon> | アライメント光学装置 |
JPS6238303A (ja) * | 1985-08-13 | 1987-02-19 | Nippon Kogaku Kk <Nikon> | 物体位置検出光学装置 |
US4834540A (en) * | 1986-07-04 | 1989-05-30 | Canon Kabushiki Kaisha | Projection exposure apparatus |
JPS6376427A (ja) * | 1986-09-19 | 1988-04-06 | Canon Inc | 露光方法 |
JPS62216231A (ja) * | 1987-01-24 | 1987-09-22 | Nippon Kogaku Kk <Nikon> | アライメント装置 |
JPH01503493A (ja) * | 1987-03-27 | 1989-11-22 | ザ ボード オブ トラスティーズ オブ ザ リーランド スタンフォード ジュニア ユニバーシティ | 走査式共焦点型光学顕微鏡 |
Also Published As
Publication number | Publication date |
---|---|
JPS638402B2 (enrdf_load_stackoverflow) | 1988-02-23 |
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