JPS5451863A - Surface roughness measuring apparatus - Google Patents
Surface roughness measuring apparatusInfo
- Publication number
- JPS5451863A JPS5451863A JP11832777A JP11832777A JPS5451863A JP S5451863 A JPS5451863 A JP S5451863A JP 11832777 A JP11832777 A JP 11832777A JP 11832777 A JP11832777 A JP 11832777A JP S5451863 A JPS5451863 A JP S5451863A
- Authority
- JP
- Japan
- Prior art keywords
- measured
- light
- roughness
- mean contrast
- radiated
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 230000003746 surface roughness Effects 0.000 title abstract 3
- 230000001427 coherent effect Effects 0.000 abstract 2
- 230000000052 comparative effect Effects 0.000 abstract 2
- 238000007689 inspection Methods 0.000 abstract 2
- 230000005855 radiation Effects 0.000 abstract 2
- 238000005259 measurement Methods 0.000 abstract 1
- 230000003287 optical effect Effects 0.000 abstract 1
Landscapes
- Length Measuring Devices By Optical Means (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP11832777A JPS5451863A (en) | 1977-09-30 | 1977-09-30 | Surface roughness measuring apparatus |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP11832777A JPS5451863A (en) | 1977-09-30 | 1977-09-30 | Surface roughness measuring apparatus |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS5451863A true JPS5451863A (en) | 1979-04-24 |
| JPS6122762B2 JPS6122762B2 (enrdf_load_stackoverflow) | 1986-06-03 |
Family
ID=14733914
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP11832777A Granted JPS5451863A (en) | 1977-09-30 | 1977-09-30 | Surface roughness measuring apparatus |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS5451863A (enrdf_load_stackoverflow) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN100394162C (zh) * | 2003-01-23 | 2008-06-11 | 友达光电股份有限公司 | 分析薄膜表面粗糙度的方法 |
Families Citing this family (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH0263381U (enrdf_load_stackoverflow) * | 1988-11-01 | 1990-05-11 |
-
1977
- 1977-09-30 JP JP11832777A patent/JPS5451863A/ja active Granted
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN100394162C (zh) * | 2003-01-23 | 2008-06-11 | 友达光电股份有限公司 | 分析薄膜表面粗糙度的方法 |
Also Published As
| Publication number | Publication date |
|---|---|
| JPS6122762B2 (enrdf_load_stackoverflow) | 1986-06-03 |
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