JPS5441450B2 - - Google Patents

Info

Publication number
JPS5441450B2
JPS5441450B2 JP13829575A JP13829575A JPS5441450B2 JP S5441450 B2 JPS5441450 B2 JP S5441450B2 JP 13829575 A JP13829575 A JP 13829575A JP 13829575 A JP13829575 A JP 13829575A JP S5441450 B2 JPS5441450 B2 JP S5441450B2
Authority
JP
Japan
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
JP13829575A
Other languages
Japanese (ja)
Other versions
JPS5178142A (en:Method
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Publication of JPS5178142A publication Critical patent/JPS5178142A/ja
Publication of JPS5441450B2 publication Critical patent/JPS5441450B2/ja
Expired legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/3183—Generation of test inputs, e.g. test vectors, patterns or sequences
    • G01R31/318385—Random or pseudo-random test pattern
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/3185—Reconfiguring for testing, e.g. LSSD, partitioning
    • G01R31/318533—Reconfiguring for testing, e.g. LSSD, partitioning using scanning techniques, e.g. LSSD, Boundary Scan, JTAG
    • G01R31/318544—Scanning methods, algorithms and patterns
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G11C29/02—Detection or location of defective auxiliary circuits, e.g. defective refresh counters
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G11C29/04—Detection or location of defective memory elements, e.g. cell constructio details, timing of test signals
    • G11C29/08—Functional testing, e.g. testing during refresh, power-on self testing [POST] or distributed testing
    • G11C29/12—Built-in arrangements for testing, e.g. built-in self testing [BIST] or interconnection details
    • G11C29/18—Address generation devices; Devices for accessing memories, e.g. details of addressing circuits
    • G11C29/20—Address generation devices; Devices for accessing memories, e.g. details of addressing circuits using counters or linear-feedback shift registers [LFSR]

Landscapes

  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Test And Diagnosis Of Digital Computers (AREA)
  • Techniques For Improving Reliability Of Storages (AREA)
  • For Increasing The Reliability Of Semiconductor Memories (AREA)
JP13829575A 1974-12-20 1975-11-19 Expired JPS5441450B2 (en:Method)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US05/534,606 US3961252A (en) 1974-12-20 1974-12-20 Testing embedded arrays

Publications (2)

Publication Number Publication Date
JPS5178142A JPS5178142A (en:Method) 1976-07-07
JPS5441450B2 true JPS5441450B2 (en:Method) 1979-12-08

Family

ID=24130783

Family Applications (1)

Application Number Title Priority Date Filing Date
JP13829575A Expired JPS5441450B2 (en:Method) 1974-12-20 1975-11-19

Country Status (7)

Country Link
US (1) US3961252A (en:Method)
JP (1) JPS5441450B2 (en:Method)
CA (1) CA1038079A (en:Method)
DE (1) DE2556822C2 (en:Method)
FR (1) FR2295531A1 (en:Method)
GB (1) GB1525274A (en:Method)
IT (1) IT1043514B (en:Method)

Families Citing this family (63)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
IN146507B (en:Method) * 1975-09-29 1979-06-23 Ericsson Telefon Ab L M
US4055754A (en) * 1975-12-22 1977-10-25 Chesley Gilman D Memory device and method of testing the same
US4066880A (en) * 1976-03-30 1978-01-03 Engineered Systems, Inc. System for pretesting electronic memory locations and automatically identifying faulty memory sections
DE2824224A1 (de) * 1978-06-02 1979-12-20 Standard Elektrik Lorenz Ag Monolithisch integrierte grosschaltung
AU530415B2 (en) * 1978-06-02 1983-07-14 International Standard Electric Corp. Integrated circuits
DE2904874A1 (de) * 1979-02-09 1980-08-14 Standard Elektrik Lorenz Ag Monolithisch integrierte grosschaltung und deren betriebsschaltung
FR2432175A1 (fr) * 1978-07-27 1980-02-22 Cii Honeywell Bull Procede pour tester un systeme logique et systeme logique pour la mise en oeuvre de ce procede
US4225957A (en) * 1978-10-16 1980-09-30 International Business Machines Corporation Testing macros embedded in LSI chips
DE2902375C2 (de) * 1979-01-23 1984-05-17 Siemens AG, 1000 Berlin und 8000 München Logikbaustein für integrierte Digitalschaltungen
EP0019150B1 (en) * 1979-05-15 1984-07-18 Mostek Corporation Method of testing the operation of an internal refresh counter in a random access memory and circuit for the testing thereof
JPS5614357A (en) * 1979-07-16 1981-02-12 Matsushita Electric Ind Co Ltd Diagnostic control unit
GB2070779B (en) * 1980-02-28 1984-02-15 Solartron Electronic Group Apparatus for testing digital electronic circuits
DE3029883A1 (de) * 1980-08-07 1982-03-11 Ibm Deutschland Gmbh, 7000 Stuttgart Schieberegister fuer pruef- und test-zwecke
DE3030299A1 (de) 1980-08-09 1982-04-08 Ibm Deutschland Gmbh, 7000 Stuttgart Schieberegister fuer pruef- und test-zwecke
WO1982000917A1 (en) * 1980-09-08 1982-03-18 Proebsting R Tape burn-in circuit
US4380805A (en) * 1980-09-08 1983-04-19 Mostek Corporation Tape burn-in circuit
US4404519A (en) * 1980-12-10 1983-09-13 International Business Machine Company Testing embedded arrays in large scale integrated circuits
US4433412A (en) * 1981-05-15 1984-02-21 Rockwell International Corporation Method and apparatus for testing and verifying the operability of register based state machine apparatus
US4441182A (en) * 1981-05-15 1984-04-03 Rockwell International Corporation Repetitious logic state signal generation apparatus
US4441075A (en) * 1981-07-02 1984-04-03 International Business Machines Corporation Circuit arrangement which permits the testing of each individual chip and interchip connection in a high density packaging structure having a plurality of interconnected chips, without any physical disconnection
US4481627A (en) * 1981-10-30 1984-11-06 Honeywell Information Systems Inc. Embedded memory testing method and apparatus
US4556840A (en) * 1981-10-30 1985-12-03 Honeywell Information Systems Inc. Method for testing electronic assemblies
US4808915A (en) * 1981-10-30 1989-02-28 Honeywell Bull, Inc. Assembly of electronic components testable by a reciprocal quiescent testing technique
US4503386A (en) * 1982-04-20 1985-03-05 International Business Machines Corporation Chip partitioning aid (CPA)-A structure for test pattern generation for large logic networks
US4527115A (en) * 1982-12-22 1985-07-02 Raytheon Company Configurable logic gate array
US4499579A (en) * 1983-03-10 1985-02-12 Honeywell Information Systems Inc. Programmable logic array with dynamic test capability in the unprogrammed state
EP0146661B1 (fr) * 1983-12-28 1988-03-02 International Business Machines Corporation Procédé de diagnostic électrique pour identifier une cellule défectueuse dans une chaîne de cellules formant un registre à décalage
US4608669A (en) * 1984-05-18 1986-08-26 International Business Machines Corporation Self contained array timing
JPH073865B2 (ja) * 1984-08-07 1995-01-18 富士通株式会社 半導体集積回路及び半導体集積回路の試験方法
US4715034A (en) * 1985-03-04 1987-12-22 John Fluke Mfg. Co., Inc. Method of and system for fast functional testing of random access memories
GB8507613D0 (en) * 1985-03-23 1985-05-01 Int Computers Ltd Testing digital integrated circuits
GB8511187D0 (en) * 1985-05-02 1985-06-12 Int Computers Ltd Testing digital integrated circuits
GB8511188D0 (en) * 1985-05-02 1985-06-12 Int Computers Ltd Testing digital integrated circuits
US4719411A (en) * 1985-05-13 1988-01-12 California Institute Of Technology Addressable test matrix for measuring analog transfer characteristics of test elements used for integrated process control and device evaluation
JPS6238600A (ja) * 1985-08-14 1987-02-19 Fujitsu Ltd 半導体記憶装置
US4783782A (en) * 1985-12-12 1988-11-08 Alcatel U.S.A. Corporation Manufacturing test data storage apparatus for dynamically reconfigurable cellular array processor chip
US4669081A (en) * 1986-02-04 1987-05-26 Raytheon Company LSI fault insertion
US4726023A (en) * 1986-05-14 1988-02-16 International Business Machines Corporation Determination of testability of combined logic end memory by ignoring memory
DE3619255A1 (de) * 1986-06-07 1987-12-10 Ant Nachrichtentech Einrichtung zur pruefung von schreib-/lesespeichern
US4853628A (en) * 1987-09-10 1989-08-01 Gazelle Microcircuits, Inc. Apparatus for measuring circuit parameters of a packaged semiconductor device
US4841485A (en) * 1987-11-05 1989-06-20 International Business Machines Corporation Read/write memory device with an embedded read-only pattern and method for providing same
US4852094A (en) * 1987-11-10 1989-07-25 Eaton Corporation Dual path switch gate array
US4878209A (en) * 1988-03-17 1989-10-31 International Business Machines Corporation Macro performance test
US4875209A (en) * 1988-04-04 1989-10-17 Raytheon Company Transient and intermittent fault insertion
US4975641A (en) * 1988-07-14 1990-12-04 Sharp Kabushiki Kaisha Integrated circuit and method for testing the integrated circuit
KR920001079B1 (ko) * 1989-06-10 1992-02-01 삼성전자 주식회사 직렬데이타 통로가 내장된 메모리소자의 테스트방법
FR2653913B1 (fr) * 1989-10-31 1992-01-03 Sgs Thomson Microelectronics Systeme de test d'un microprocesseur.
US5228040A (en) * 1990-03-09 1993-07-13 At&T Bell Laboratories Testable implementations of finite state machines and methods for producing them
US5254940A (en) * 1990-12-13 1993-10-19 Lsi Logic Corporation Testable embedded microprocessor and method of testing same
US5369648A (en) * 1991-11-08 1994-11-29 Ncr Corporation Built-in self-test circuit
US5442640A (en) * 1993-01-19 1995-08-15 International Business Machines Corporation Test and diagnosis of associated output logic for products having embedded arrays
US5371748A (en) * 1993-03-26 1994-12-06 Vlsi Technology, Inc. Technique and apparatus for testing an electrically programmable ROM embedded among other digital circuitry on an IC chip
JPH0773699A (ja) * 1993-09-02 1995-03-17 Sony Corp デュアルポートメモリの埋込みテスト回路
GB9417266D0 (en) * 1994-08-26 1994-10-19 Inmos Ltd Testing a non-volatile memory
GB2295700B (en) * 1994-12-02 1999-04-21 Westinghouse Brake & Signal Data testing
US5847561A (en) * 1994-12-16 1998-12-08 Texas Instruments Incorporated Low overhead input and output boundary scan cells
US6041007A (en) * 1998-02-02 2000-03-21 Motorola, Inc. Device with programmable memory and method of programming
GB2345976B (en) 1999-01-22 2003-06-25 Sgs Thomson Microelectronics Test circuit for memory
US6928581B1 (en) 1999-09-14 2005-08-09 International Business Machines Corporation Innovative bypass circuit for circuit testing and modification
US6931580B1 (en) 2000-03-13 2005-08-16 International Business Machines Corporation Rapid fail analysis of embedded objects
US7707472B1 (en) * 2004-05-17 2010-04-27 Altera Corporation Method and apparatus for routing efficient built-in self test for on-chip circuit blocks
US7257745B2 (en) * 2005-01-31 2007-08-14 International Business Machines Corporation Array self repair using built-in self test techniques
US7908532B2 (en) * 2008-02-16 2011-03-15 International Business Machines Corporation Automated system and processing for expedient diagnosis of broken shift registers latch chains

Family Cites Families (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
FR1382401A (fr) * 1962-12-08 1964-12-18 Olympia Werke Ag Procédé et dispositif pour la détection d'erreurs dans une mémoire de calculatrice
US3387276A (en) * 1965-08-13 1968-06-04 Sperry Rand Corp Off-line memory test
US3631229A (en) * 1970-09-30 1971-12-28 Ibm Monolithic memory array tester
US3758761A (en) * 1971-08-17 1973-09-11 Texas Instruments Inc Self-interconnecting/self-repairable electronic systems on a slice
US3790885A (en) * 1972-03-27 1974-02-05 Ibm Serial test patterns for mosfet testing
US3789205A (en) * 1972-09-28 1974-01-29 Ibm Method of testing mosfet planar boards
US3761695A (en) * 1972-10-16 1973-09-25 Ibm Method of level sensitive testing a functional logic system
JPS4992970A (en:Method) * 1972-10-31 1974-09-04
US3781670A (en) * 1972-12-29 1973-12-25 Ibm Ac performance test for large scale integrated circuit chips
FR2256706A5 (en:Method) * 1973-12-27 1975-07-25 Cii

Also Published As

Publication number Publication date
IT1043514B (it) 1980-02-29
FR2295531A1 (fr) 1976-07-16
CA1038079A (en) 1978-09-05
US3961252A (en) 1976-06-01
DE2556822A1 (de) 1976-06-24
JPS5178142A (en:Method) 1976-07-07
FR2295531B1 (en:Method) 1978-05-12
GB1525274A (en) 1978-09-20
DE2556822C2 (de) 1982-10-21

Similar Documents

Publication Publication Date Title
FR2295531B1 (en:Method)
DK83375A (en:Method)
CS171980B1 (en:Method)
AU474179B2 (en:Method)
CS169389B1 (en:Method)
FI751349A7 (en:Method)
DK73174A (en:Method)
CS167763B1 (en:Method)
DK103374A (en:Method)
BG20492A1 (en:Method)
BG20445A1 (en:Method)
AU480977A (en:Method)
CH607303A5 (en:Method)
CH595121A5 (en:Method)
CH592788A5 (en:Method)
BG19712A1 (en:Method)
CH582413A5 (en:Method)
CH569335A5 (en:Method)
BG20648A1 (en:Method)
BG20639A1 (en:Method)
BG20520A1 (en:Method)
BG20518A1 (en:Method)
BE829576A (en:Method)
AU480463A (en:Method)
AU480401A (en:Method)