JPS542168A - Detecting method of electromagnetic field characteristic - Google Patents

Detecting method of electromagnetic field characteristic

Info

Publication number
JPS542168A
JPS542168A JP6745677A JP6745677A JPS542168A JP S542168 A JPS542168 A JP S542168A JP 6745677 A JP6745677 A JP 6745677A JP 6745677 A JP6745677 A JP 6745677A JP S542168 A JPS542168 A JP S542168A
Authority
JP
Japan
Prior art keywords
electromagnetic field
detecting method
field characteristic
reaidly
deflections
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP6745677A
Other languages
Japanese (ja)
Other versions
JPS5619917B2 (en
Inventor
Fushinobu Wakamoto
Masayoshi Koba
Masaya Hijikigawa
Toshiaki Miyajima
Etsuji Minami
Atsushi Kudo
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Sharp Corp
Original Assignee
Sharp Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Sharp Corp filed Critical Sharp Corp
Priority to JP6745677A priority Critical patent/JPS542168A/en
Publication of JPS542168A publication Critical patent/JPS542168A/en
Publication of JPS5619917B2 publication Critical patent/JPS5619917B2/ja
Granted legal-status Critical Current

Links

Abstract

PURPOSE: To perform characteristics measurement reaidly, rapidly and accurately by displaying and reading the deflections by the electromagnetic field of a mesh form electron beam group.
COPYRIGHT: (C)1979,JPO&Japio
JP6745677A 1977-06-07 1977-06-07 Detecting method of electromagnetic field characteristic Granted JPS542168A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP6745677A JPS542168A (en) 1977-06-07 1977-06-07 Detecting method of electromagnetic field characteristic

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP6745677A JPS542168A (en) 1977-06-07 1977-06-07 Detecting method of electromagnetic field characteristic

Publications (2)

Publication Number Publication Date
JPS542168A true JPS542168A (en) 1979-01-09
JPS5619917B2 JPS5619917B2 (en) 1981-05-11

Family

ID=13345449

Family Applications (1)

Application Number Title Priority Date Filing Date
JP6745677A Granted JPS542168A (en) 1977-06-07 1977-06-07 Detecting method of electromagnetic field characteristic

Country Status (1)

Country Link
JP (1) JPS542168A (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4414509A (en) * 1980-11-26 1983-11-08 The United States Of America As Represented By The Administrator Of The National Aeronautics And Space Administration Low energy electron magnetometer using a monoenergetic electron beam

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5884514A (en) * 1981-11-16 1983-05-20 Matsushita Electric Ind Co Ltd Automatic gain control circuit
JPS5922417A (en) * 1982-07-28 1984-02-04 Fujitsu Ten Ltd Muting control circuit

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5111082U (en) * 1974-07-11 1976-01-27

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5111082U (en) * 1974-07-11 1976-01-27

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4414509A (en) * 1980-11-26 1983-11-08 The United States Of America As Represented By The Administrator Of The National Aeronautics And Space Administration Low energy electron magnetometer using a monoenergetic electron beam

Also Published As

Publication number Publication date
JPS5619917B2 (en) 1981-05-11

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