JPS54157669A - Method of obtaining fixed point at low temperature region and fixed point cell - Google Patents

Method of obtaining fixed point at low temperature region and fixed point cell

Info

Publication number
JPS54157669A
JPS54157669A JP6495978A JP6495978A JPS54157669A JP S54157669 A JPS54157669 A JP S54157669A JP 6495978 A JP6495978 A JP 6495978A JP 6495978 A JP6495978 A JP 6495978A JP S54157669 A JPS54157669 A JP S54157669A
Authority
JP
Japan
Prior art keywords
fixed point
gas
sealed
temperature
thermometer
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP6495978A
Other languages
Japanese (ja)
Other versions
JPS588730B2 (en
Inventor
Kiyoto Mitsui
Juichi Ishii
Minoru Morita
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Japan Oxygen Co Ltd
Nippon Sanso Corp
National Institute of Advanced Industrial Science and Technology AIST
Original Assignee
Agency of Industrial Science and Technology
Japan Oxygen Co Ltd
Nippon Sanso Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Agency of Industrial Science and Technology, Japan Oxygen Co Ltd, Nippon Sanso Corp filed Critical Agency of Industrial Science and Technology
Priority to JP6495978A priority Critical patent/JPS588730B2/en
Publication of JPS54157669A publication Critical patent/JPS54157669A/en
Publication of JPS588730B2 publication Critical patent/JPS588730B2/en
Expired legal-status Critical Current

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  • Measuring Temperature Or Quantity Of Heat (AREA)

Abstract

PURPOSE: To enable the triple point temperature of seal gas to be reproduced on the outside of a fixed point cell and the temperature fixed point necessary for thermometer calibration to be readily obtained by controlling the outside temperature of the fixed point cell of a pressure resistant construction wherein high purity gas is beforehand pressure-sealed.
CONSTITUTION: The fixed point cell consists of an outer tube 1 and an inner tube 2 these being constituted by material of good heat conductivity. A desired sample gas of well known properties is introduced into a gas well part 3 and fixed point part 4 and is sealed after it has been filled up to the specified pressure. After the thermometer to be calibrated is inserted into the hollow part 6 of the fixed point part 4, the fixed point part is cooled to liquefy the sealed gas then solidify the same. Next, while the solid of the sealed sample gas is being gradually melted with a heater or the like, the temperature of the thermometer to by calibrated is measured and a melting curve is drawn, whereby the calibration of the triple point temperatures is accomplished.
COPYRIGHT: (C)1979,JPO&Japio
JP6495978A 1978-06-01 1978-06-01 Method of obtaining fixed point in low temperature region and fixed point cell Expired JPS588730B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP6495978A JPS588730B2 (en) 1978-06-01 1978-06-01 Method of obtaining fixed point in low temperature region and fixed point cell

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP6495978A JPS588730B2 (en) 1978-06-01 1978-06-01 Method of obtaining fixed point in low temperature region and fixed point cell

Publications (2)

Publication Number Publication Date
JPS54157669A true JPS54157669A (en) 1979-12-12
JPS588730B2 JPS588730B2 (en) 1983-02-17

Family

ID=13273082

Family Applications (1)

Application Number Title Priority Date Filing Date
JP6495978A Expired JPS588730B2 (en) 1978-06-01 1978-06-01 Method of obtaining fixed point in low temperature region and fixed point cell

Country Status (1)

Country Link
JP (1) JPS588730B2 (en)

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS629140U (en) * 1985-07-02 1987-01-20
US6324894B1 (en) * 1998-05-25 2001-12-04 Korea Research Institute Of Standards And Science Device and method for measuring argon impurity by utilizing the triple point and the γ-β transition temperatures of oxygen
US6939035B2 (en) 2001-06-13 2005-09-06 The Secretary Of State Of Her Majesty's Britannic Government System for calibrating thermometers
JP2007248277A (en) * 2006-03-16 2007-09-27 National Institute Of Advanced Industrial & Technology Low temperature calibrating device for thermometer

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS629140U (en) * 1985-07-02 1987-01-20
US6324894B1 (en) * 1998-05-25 2001-12-04 Korea Research Institute Of Standards And Science Device and method for measuring argon impurity by utilizing the triple point and the γ-β transition temperatures of oxygen
US6939035B2 (en) 2001-06-13 2005-09-06 The Secretary Of State Of Her Majesty's Britannic Government System for calibrating thermometers
JP2007248277A (en) * 2006-03-16 2007-09-27 National Institute Of Advanced Industrial & Technology Low temperature calibrating device for thermometer
JP4714850B2 (en) * 2006-03-16 2011-06-29 独立行政法人産業技術総合研究所 Thermometer low temperature calibration device

Also Published As

Publication number Publication date
JPS588730B2 (en) 1983-02-17

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