JPS54105967A - Defect test system for pattern featuring directivity - Google Patents
Defect test system for pattern featuring directivityInfo
- Publication number
- JPS54105967A JPS54105967A JP1236678A JP1236678A JPS54105967A JP S54105967 A JPS54105967 A JP S54105967A JP 1236678 A JP1236678 A JP 1236678A JP 1236678 A JP1236678 A JP 1236678A JP S54105967 A JPS54105967 A JP S54105967A
- Authority
- JP
- Japan
- Prior art keywords
- pattern
- defect
- directivity
- obtaining
- optical lens
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Landscapes
- Preparing Plates And Mask In Photomechanical Process (AREA)
- Exposure And Positioning Against Photoresist Photosensitive Materials (AREA)
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
- Length Measuring Devices By Optical Means (AREA)
- Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP1236678A JPS54105967A (en) | 1978-02-08 | 1978-02-08 | Defect test system for pattern featuring directivity |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP1236678A JPS54105967A (en) | 1978-02-08 | 1978-02-08 | Defect test system for pattern featuring directivity |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS54105967A true JPS54105967A (en) | 1979-08-20 |
| JPS5616542B2 JPS5616542B2 (enExample) | 1981-04-16 |
Family
ID=11803262
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP1236678A Granted JPS54105967A (en) | 1978-02-08 | 1978-02-08 | Defect test system for pattern featuring directivity |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS54105967A (enExample) |
Cited By (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS56117106A (en) * | 1980-02-20 | 1981-09-14 | Dainippon Printing Co Ltd | Inspecting device for pattern defect |
| JPS572522A (en) * | 1980-06-05 | 1982-01-07 | Dainippon Printing Co Ltd | Defect inspecting device for regular pattern |
| JPS58158921A (ja) * | 1982-03-16 | 1983-09-21 | Dainippon Printing Co Ltd | 規則性パタ−ンの欠陥検査装置 |
| FR2706048A1 (fr) * | 1993-06-04 | 1994-12-09 | Marelli Autronica | Collimateur facilement contrôlable. |
Families Citing this family (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH0682102B2 (ja) * | 1987-02-27 | 1994-10-19 | 三菱電機株式会社 | パターン欠陥検査装置及びパターン欠陥検査方法 |
-
1978
- 1978-02-08 JP JP1236678A patent/JPS54105967A/ja active Granted
Cited By (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS56117106A (en) * | 1980-02-20 | 1981-09-14 | Dainippon Printing Co Ltd | Inspecting device for pattern defect |
| JPS572522A (en) * | 1980-06-05 | 1982-01-07 | Dainippon Printing Co Ltd | Defect inspecting device for regular pattern |
| JPS58158921A (ja) * | 1982-03-16 | 1983-09-21 | Dainippon Printing Co Ltd | 規則性パタ−ンの欠陥検査装置 |
| FR2706048A1 (fr) * | 1993-06-04 | 1994-12-09 | Marelli Autronica | Collimateur facilement contrôlable. |
Also Published As
| Publication number | Publication date |
|---|---|
| JPS5616542B2 (enExample) | 1981-04-16 |
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