JPS54100668A - Electron-beam exposure unit - Google Patents

Electron-beam exposure unit

Info

Publication number
JPS54100668A
JPS54100668A JP671178A JP671178A JPS54100668A JP S54100668 A JPS54100668 A JP S54100668A JP 671178 A JP671178 A JP 671178A JP 671178 A JP671178 A JP 671178A JP S54100668 A JPS54100668 A JP S54100668A
Authority
JP
Japan
Prior art keywords
chamber
temperature
constant
wall
stand
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP671178A
Other languages
Japanese (ja)
Inventor
Kohei Hori
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Toshiba Corp
Original Assignee
Toshiba Corp
Tokyo Shibaura Electric Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Toshiba Corp, Tokyo Shibaura Electric Co Ltd filed Critical Toshiba Corp
Priority to JP671178A priority Critical patent/JPS54100668A/en
Publication of JPS54100668A publication Critical patent/JPS54100668A/en
Pending legal-status Critical Current

Links

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J37/00Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
    • H01J37/32Gas-filled discharge tubes
    • H01J37/34Gas-filled discharge tubes operating with cathodic sputtering
    • H01J37/3411Constructional aspects of the reactor
    • H01J37/3435Target holders (includes backing plates and endblocks)

Landscapes

  • Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Plasma & Fusion (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Electron Beam Exposure (AREA)

Abstract

PURPOSE:To draw patterns on several exposed materials by an electron beam with high precision by holding exposed materials in respective chambers at constant temperature with an exposure chamber linked with a stand-by chamber. CONSTITUTION:Constant-temperature water from constant-temperature water bath 9 of 25 deg.C flows from intake 10 into wall 22 of exposure chamber 2 and the water channel in desk 21, thereby holding the wall at constant temperature. The wall of stand-by chamber 6 is adjusted to the constant temperature from intake 12. Chambers 2 and 3 are evacuated highly and exposed material 3 can be controlled at approximate + or -0.1 deg.C through thermal conducting radiation from the wall. The constant-temperature water returns from outlets 11 and 13 to bath 9. Into the upper wall of chamber 2 and the flank of chamber 6, temperature sensors 31 and 32 are inserted to detect the temperature, thereby controlling. the flow of the constant-temperature water and its temperature. From the opening part of sluice valve 5, material 3 in exposure chamber 2 is taken out into stand-by chamber 6, and placed into magazine 8, and a waiting material mounted on desk 4, by operation rod 14 so that a pattern will be drawn with valve 5 closed. A material on which a pattern is drawn next is held at the constant temperature in the stand-by chamber, so that drawing can be attained immediately and efficiently.
JP671178A 1978-01-26 1978-01-26 Electron-beam exposure unit Pending JPS54100668A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP671178A JPS54100668A (en) 1978-01-26 1978-01-26 Electron-beam exposure unit

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP671178A JPS54100668A (en) 1978-01-26 1978-01-26 Electron-beam exposure unit

Publications (1)

Publication Number Publication Date
JPS54100668A true JPS54100668A (en) 1979-08-08

Family

ID=11645862

Family Applications (1)

Application Number Title Priority Date Filing Date
JP671178A Pending JPS54100668A (en) 1978-01-26 1978-01-26 Electron-beam exposure unit

Country Status (1)

Country Link
JP (1) JPS54100668A (en)

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5630725A (en) * 1979-08-22 1981-03-27 Fujitsu Ltd Electronic exposing device
JPS57194531A (en) * 1981-05-26 1982-11-30 Toshiba Corp Electron beam transfer device
JPS5815232A (en) * 1981-07-20 1983-01-28 Toshiba Corp Apparatus for exposing charged particle beam
JPS5873119A (en) * 1981-10-28 1983-05-02 Toshiba Corp Electron-beam lithography device
JPS5873120A (en) * 1981-10-28 1983-05-02 Toshiba Corp Electron-beam lithography device

Cited By (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5630725A (en) * 1979-08-22 1981-03-27 Fujitsu Ltd Electronic exposing device
JPS57194531A (en) * 1981-05-26 1982-11-30 Toshiba Corp Electron beam transfer device
JPS5815232A (en) * 1981-07-20 1983-01-28 Toshiba Corp Apparatus for exposing charged particle beam
JPS634698B2 (en) * 1981-07-20 1988-01-30 Tokyo Shibaura Electric Co
JPS5873119A (en) * 1981-10-28 1983-05-02 Toshiba Corp Electron-beam lithography device
JPS5873120A (en) * 1981-10-28 1983-05-02 Toshiba Corp Electron-beam lithography device

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