JPS54100668A - Electron-beam exposure unit - Google Patents
Electron-beam exposure unitInfo
- Publication number
- JPS54100668A JPS54100668A JP671178A JP671178A JPS54100668A JP S54100668 A JPS54100668 A JP S54100668A JP 671178 A JP671178 A JP 671178A JP 671178 A JP671178 A JP 671178A JP S54100668 A JPS54100668 A JP S54100668A
- Authority
- JP
- Japan
- Prior art keywords
- chamber
- temperature
- constant
- wall
- stand
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/32—Gas-filled discharge tubes
- H01J37/34—Gas-filled discharge tubes operating with cathodic sputtering
- H01J37/3411—Constructional aspects of the reactor
- H01J37/3435—Target holders (includes backing plates and endblocks)
Landscapes
- Physics & Mathematics (AREA)
- Engineering & Computer Science (AREA)
- Plasma & Fusion (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Electron Beam Exposure (AREA)
Abstract
PURPOSE:To draw patterns on several exposed materials by an electron beam with high precision by holding exposed materials in respective chambers at constant temperature with an exposure chamber linked with a stand-by chamber. CONSTITUTION:Constant-temperature water from constant-temperature water bath 9 of 25 deg.C flows from intake 10 into wall 22 of exposure chamber 2 and the water channel in desk 21, thereby holding the wall at constant temperature. The wall of stand-by chamber 6 is adjusted to the constant temperature from intake 12. Chambers 2 and 3 are evacuated highly and exposed material 3 can be controlled at approximate + or -0.1 deg.C through thermal conducting radiation from the wall. The constant-temperature water returns from outlets 11 and 13 to bath 9. Into the upper wall of chamber 2 and the flank of chamber 6, temperature sensors 31 and 32 are inserted to detect the temperature, thereby controlling. the flow of the constant-temperature water and its temperature. From the opening part of sluice valve 5, material 3 in exposure chamber 2 is taken out into stand-by chamber 6, and placed into magazine 8, and a waiting material mounted on desk 4, by operation rod 14 so that a pattern will be drawn with valve 5 closed. A material on which a pattern is drawn next is held at the constant temperature in the stand-by chamber, so that drawing can be attained immediately and efficiently.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP671178A JPS54100668A (en) | 1978-01-26 | 1978-01-26 | Electron-beam exposure unit |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP671178A JPS54100668A (en) | 1978-01-26 | 1978-01-26 | Electron-beam exposure unit |
Publications (1)
Publication Number | Publication Date |
---|---|
JPS54100668A true JPS54100668A (en) | 1979-08-08 |
Family
ID=11645862
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP671178A Pending JPS54100668A (en) | 1978-01-26 | 1978-01-26 | Electron-beam exposure unit |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS54100668A (en) |
Cited By (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5630725A (en) * | 1979-08-22 | 1981-03-27 | Fujitsu Ltd | Electronic exposing device |
JPS57194531A (en) * | 1981-05-26 | 1982-11-30 | Toshiba Corp | Electron beam transfer device |
JPS5815232A (en) * | 1981-07-20 | 1983-01-28 | Toshiba Corp | Apparatus for exposing charged particle beam |
JPS5873119A (en) * | 1981-10-28 | 1983-05-02 | Toshiba Corp | Electron-beam lithography device |
JPS5873120A (en) * | 1981-10-28 | 1983-05-02 | Toshiba Corp | Electron-beam lithography device |
-
1978
- 1978-01-26 JP JP671178A patent/JPS54100668A/en active Pending
Cited By (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5630725A (en) * | 1979-08-22 | 1981-03-27 | Fujitsu Ltd | Electronic exposing device |
JPS57194531A (en) * | 1981-05-26 | 1982-11-30 | Toshiba Corp | Electron beam transfer device |
JPS5815232A (en) * | 1981-07-20 | 1983-01-28 | Toshiba Corp | Apparatus for exposing charged particle beam |
JPS634698B2 (en) * | 1981-07-20 | 1988-01-30 | Tokyo Shibaura Electric Co | |
JPS5873119A (en) * | 1981-10-28 | 1983-05-02 | Toshiba Corp | Electron-beam lithography device |
JPS5873120A (en) * | 1981-10-28 | 1983-05-02 | Toshiba Corp | Electron-beam lithography device |
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