JPS5343596A - Microanalyzer of x ray and its similar device - Google Patents

Microanalyzer of x ray and its similar device

Info

Publication number
JPS5343596A
JPS5343596A JP11805176A JP11805176A JPS5343596A JP S5343596 A JPS5343596 A JP S5343596A JP 11805176 A JP11805176 A JP 11805176A JP 11805176 A JP11805176 A JP 11805176A JP S5343596 A JPS5343596 A JP S5343596A
Authority
JP
Japan
Prior art keywords
ray
microanalyzer
similar device
detector
installing
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP11805176A
Other languages
English (en)
Japanese (ja)
Other versions
JPS62451B2 (enrdf_load_stackoverflow
Inventor
Hiroyoshi Soejima
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Shimadzu Corp
Original Assignee
Shimadzu Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Shimadzu Corp filed Critical Shimadzu Corp
Priority to JP11805176A priority Critical patent/JPS5343596A/ja
Publication of JPS5343596A publication Critical patent/JPS5343596A/ja
Publication of JPS62451B2 publication Critical patent/JPS62451B2/ja
Granted legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/22Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material
    • G01N23/225Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material using electron or ion

Landscapes

  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
JP11805176A 1976-09-30 1976-09-30 Microanalyzer of x ray and its similar device Granted JPS5343596A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP11805176A JPS5343596A (en) 1976-09-30 1976-09-30 Microanalyzer of x ray and its similar device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP11805176A JPS5343596A (en) 1976-09-30 1976-09-30 Microanalyzer of x ray and its similar device

Publications (2)

Publication Number Publication Date
JPS5343596A true JPS5343596A (en) 1978-04-19
JPS62451B2 JPS62451B2 (enrdf_load_stackoverflow) 1987-01-08

Family

ID=14726798

Family Applications (1)

Application Number Title Priority Date Filing Date
JP11805176A Granted JPS5343596A (en) 1976-09-30 1976-09-30 Microanalyzer of x ray and its similar device

Country Status (1)

Country Link
JP (1) JPS5343596A (enrdf_load_stackoverflow)

Also Published As

Publication number Publication date
JPS62451B2 (enrdf_load_stackoverflow) 1987-01-08

Similar Documents

Publication Publication Date Title
NL7604553A (nl) Met corpusculaire stralen werkende doorstraal- rastermicroscoop met energie-analysator.
JPS5261987A (en) Ultrasonic detector
JPS5343596A (en) Microanalyzer of x ray and its similar device
JPS5324990A (en) Burnup measuring method in irradiated
JPS52140384A (en) Flaw detector
JPS5258373A (en) Inspection for defects of pattern forming film
ES459712A1 (es) Procedimiento y dispositivo para detectar y prelocalizar unarotura de funda dentro de un reactor nuclear de neutrones rapidos.
JPS5217886A (en) Multikind ion detector
JPS52122183A (en) Detector of secondary electron
JPS536095A (en) Radiant ray applied measurement device
JPS57104807A (en) Edge detector for object
JPS5340578A (en) Analyzer for charged particle ray.s energy
JPS5226150A (en) Secondary electron multiplier
JPS5276985A (en) Flaw detector
JPS522184A (en) Radioactive ray detector
JPS5371884A (en) Radiation detector
JPS53113480A (en) Reflecting electron beam detector
JPS5414291A (en) Neutron detector assembly
JPS5391788A (en) Illuminance detector
JPS52116066A (en) Cathode-ray tube
JPS5359948A (en) High frequency heater
JPS53148400A (en) Radiant ray detector of semiconductor
JPS52127390A (en) Energy analyzer for secondary electron
JPS5313981A (en) Ionization type smoke detector with binary ion rooms
JPS5326192A (en) Compound analyzer