JPS5329790A - Nonndestructive inspecting apparatus - Google Patents

Nonndestructive inspecting apparatus

Info

Publication number
JPS5329790A
JPS5329790A JP10356876A JP10356876A JPS5329790A JP S5329790 A JPS5329790 A JP S5329790A JP 10356876 A JP10356876 A JP 10356876A JP 10356876 A JP10356876 A JP 10356876A JP S5329790 A JPS5329790 A JP S5329790A
Authority
JP
Japan
Prior art keywords
nonndestructive
inspecting apparatus
inspecting
irradiating
conduct
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP10356876A
Other languages
English (en)
Other versions
JPS5422316B2 (ja
Inventor
Masaji Fujii
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Toshiba Corp
Original Assignee
Toshiba Corp
Tokyo Shibaura Electric Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Toshiba Corp, Tokyo Shibaura Electric Co Ltd filed Critical Toshiba Corp
Priority to JP10356876A priority Critical patent/JPS5329790A/ja
Publication of JPS5329790A publication Critical patent/JPS5329790A/ja
Publication of JPS5422316B2 publication Critical patent/JPS5422316B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/02—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
    • G01N23/06—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and measuring the absorption
    • G01N23/18—Investigating the presence of flaws defects or foreign matter
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/02—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
    • G01N23/06—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and measuring the absorption
    • G01N23/083—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and measuring the absorption the radiation being X-rays

Landscapes

  • Health & Medical Sciences (AREA)
  • Physics & Mathematics (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Toxicology (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
JP10356876A 1976-09-01 1976-09-01 Nonndestructive inspecting apparatus Granted JPS5329790A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP10356876A JPS5329790A (en) 1976-09-01 1976-09-01 Nonndestructive inspecting apparatus

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP10356876A JPS5329790A (en) 1976-09-01 1976-09-01 Nonndestructive inspecting apparatus

Publications (2)

Publication Number Publication Date
JPS5329790A true JPS5329790A (en) 1978-03-20
JPS5422316B2 JPS5422316B2 (ja) 1979-08-06

Family

ID=14357395

Family Applications (1)

Application Number Title Priority Date Filing Date
JP10356876A Granted JPS5329790A (en) 1976-09-01 1976-09-01 Nonndestructive inspecting apparatus

Country Status (1)

Country Link
JP (1) JPS5329790A (ja)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2003085391A1 (fr) * 2002-04-05 2003-10-16 Kabushiki Kaisha Bridgestone Technique d'inspection aux rayons x d'un pneumatique et appareil a cet effet
JP2016085199A (ja) * 2014-10-29 2016-05-19 三菱重工業株式会社 き裂評価方法

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2003085391A1 (fr) * 2002-04-05 2003-10-16 Kabushiki Kaisha Bridgestone Technique d'inspection aux rayons x d'un pneumatique et appareil a cet effet
US7076022B2 (en) 2002-04-05 2006-07-11 Kabushiki Kaisha Bridgestone Method and device for X-ray inspection of tire
JP2016085199A (ja) * 2014-10-29 2016-05-19 三菱重工業株式会社 き裂評価方法

Also Published As

Publication number Publication date
JPS5422316B2 (ja) 1979-08-06

Similar Documents

Publication Publication Date Title
IT7822771A0 (it) Apparato per la rivelazione e la localizzazione in sito di difetti di saldatura.
IT1057087B (it) Procedimento di prova per la rilevazione separata di differenti difetti superficiali nei pezzi e dispositivo per l esecuzione del procedimento
FR2344833A1 (fr) Procede et appareil de controle non destructif des soudures
ES450531A1 (es) Procedimiento y aparato para inspeccionar el fondo de cris- taleria para detectar la presencia de vidrio irregular y vi-drio fundido en su fondo interior.
MX149115A (es) Mejoras en aparato para detectar la presencia de defectos en un articulo de material translucido
JPS5329790A (en) Nonndestructive inspecting apparatus
JPS51136478A (en) Defect inspection device
JPS5214477A (en) Method to detect a defect in a transparent test object
JPS52146685A (en) Inspecting apparatus of glass bottle etc.
JPS539186A (en) Discrimination level setter of defect inspecting apparatus
JPS5254483A (en) Method of inspecting photo mask patterns, etc.
JPS5249880A (en) Defect inspecting apparatus
JPS5344075A (en) Ultrasonic inspecting method
JPS53102792A (en) Simultaneous inspecting apparatus of inside and outside of body to be inspected
JPS5317383A (en) Non-contactive detecting method and apparatus for defect in shape of strip type inspected body
JPS5238382A (en) Apparatus for inspecting eggs
JPS5326185A (en) Defect inspecting apparatus
JPS5428185A (en) Defect inspecting apparatus
JPS5337489A (en) Inspecting apparatus by ultrasonic wave
JPS5254486A (en) Nonndestructive inspection apparatus
JPS5257878A (en) Nonndestructive inspection device
JPS5224553A (en) Surface inspection device
JPS5381182A (en) Magnetic flaw detector for steel material
JPS5218387A (en) Material defect inspecting apparatus
JPS55144533A (en) Apparatus for inspecting bottle