JPS5218387A - Material defect inspecting apparatus - Google Patents
Material defect inspecting apparatusInfo
- Publication number
- JPS5218387A JPS5218387A JP9443375A JP9443375A JPS5218387A JP S5218387 A JPS5218387 A JP S5218387A JP 9443375 A JP9443375 A JP 9443375A JP 9443375 A JP9443375 A JP 9443375A JP S5218387 A JPS5218387 A JP S5218387A
- Authority
- JP
- Japan
- Prior art keywords
- inspecting apparatus
- material defect
- defect inspecting
- light
- pattemed
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/95—Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
- G01N21/956—Inspecting patterns on the surface of objects
Landscapes
- Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- General Physics & Mathematics (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
Abstract
PURPOSE:To light up a pattemed object of a sheet form to be inspected, then divide the light beam into two beams, reflected and transmitted, and measure the light at varying color-photo sensitivities through filters thereby detecting the defect of materials.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP9443375A JPS5218387A (en) | 1975-08-01 | 1975-08-01 | Material defect inspecting apparatus |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP9443375A JPS5218387A (en) | 1975-08-01 | 1975-08-01 | Material defect inspecting apparatus |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS5218387A true JPS5218387A (en) | 1977-02-10 |
JPS5612817B2 JPS5612817B2 (en) | 1981-03-24 |
Family
ID=14110099
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP9443375A Granted JPS5218387A (en) | 1975-08-01 | 1975-08-01 | Material defect inspecting apparatus |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS5218387A (en) |
Citations (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5077083A (en) * | 1973-11-08 | 1975-06-24 |
-
1975
- 1975-08-01 JP JP9443375A patent/JPS5218387A/en active Granted
Patent Citations (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5077083A (en) * | 1973-11-08 | 1975-06-24 |
Also Published As
Publication number | Publication date |
---|---|
JPS5612817B2 (en) | 1981-03-24 |
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