JPS5218387A - Material defect inspecting apparatus - Google Patents

Material defect inspecting apparatus

Info

Publication number
JPS5218387A
JPS5218387A JP9443375A JP9443375A JPS5218387A JP S5218387 A JPS5218387 A JP S5218387A JP 9443375 A JP9443375 A JP 9443375A JP 9443375 A JP9443375 A JP 9443375A JP S5218387 A JPS5218387 A JP S5218387A
Authority
JP
Japan
Prior art keywords
inspecting apparatus
material defect
defect inspecting
light
pattemed
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP9443375A
Other languages
Japanese (ja)
Other versions
JPS5612817B2 (en
Inventor
Hideo Ohara
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Omron Corp
Original Assignee
Tateisi Electronics Co
Omron Tateisi Electronics Co
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Tateisi Electronics Co, Omron Tateisi Electronics Co filed Critical Tateisi Electronics Co
Priority to JP9443375A priority Critical patent/JPS5218387A/en
Publication of JPS5218387A publication Critical patent/JPS5218387A/en
Publication of JPS5612817B2 publication Critical patent/JPS5612817B2/ja
Granted legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84Systems specially adapted for particular applications
    • G01N21/88Investigating the presence of flaws or contamination
    • G01N21/95Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
    • G01N21/956Inspecting patterns on the surface of objects

Landscapes

  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)

Abstract

PURPOSE:To light up a pattemed object of a sheet form to be inspected, then divide the light beam into two beams, reflected and transmitted, and measure the light at varying color-photo sensitivities through filters thereby detecting the defect of materials.
JP9443375A 1975-08-01 1975-08-01 Material defect inspecting apparatus Granted JPS5218387A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP9443375A JPS5218387A (en) 1975-08-01 1975-08-01 Material defect inspecting apparatus

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP9443375A JPS5218387A (en) 1975-08-01 1975-08-01 Material defect inspecting apparatus

Publications (2)

Publication Number Publication Date
JPS5218387A true JPS5218387A (en) 1977-02-10
JPS5612817B2 JPS5612817B2 (en) 1981-03-24

Family

ID=14110099

Family Applications (1)

Application Number Title Priority Date Filing Date
JP9443375A Granted JPS5218387A (en) 1975-08-01 1975-08-01 Material defect inspecting apparatus

Country Status (1)

Country Link
JP (1) JPS5218387A (en)

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5077083A (en) * 1973-11-08 1975-06-24

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5077083A (en) * 1973-11-08 1975-06-24

Also Published As

Publication number Publication date
JPS5612817B2 (en) 1981-03-24

Similar Documents

Publication Publication Date Title
MX149115A (en) IMPROVEMENTS IN APPARATUS TO DETECT THE PRESENCE OF DEFECTS IN AN ARTICLE OF TRANSLUCENT MATERIAL
JPS5223986A (en) Method of detecting surface flaws
JPS52138183A (en) Inspecting apparatus for flaw
JPS5365777A (en) Surface defect detector
JPS5218387A (en) Material defect inspecting apparatus
JPS51136478A (en) Defect inspection device
JPS5213378A (en) Automatic measuring device for reflexibility distribution
JPS5214477A (en) Method to detect a defect in a transparent test object
JPS5658636A (en) Measuring method for diameter of particle
JPS5344075A (en) Ultrasonic inspecting method
JPS5440686A (en) Defect inspector
JPS51126887A (en) Automatic detection method of surface flaw and the apparatus
JPS5326185A (en) Defect inspecting apparatus
JPS5249880A (en) Defect inspecting apparatus
JPS52139485A (en) Follow-up apparatus for use in high-speed ultrasonic flaw detection
JPS545785A (en) Non-destructive inspecting apparatus
JPS5522157A (en) Testing method for material surface
JPS539186A (en) Discrimination level setter of defect inspecting apparatus
JPS5329790A (en) Nonndestructive inspecting apparatus
JPS52146685A (en) Inspecting apparatus of glass bottle etc.
JPS549689A (en) Dryness detecting method
JPS528884A (en) No reflow detector unit
JPS5382492A (en) Surface inspecting method
JPS5599046A (en) Continuous measuring apparatus for organic pollutant
JPS5340584A (en) Bottle inspector by elliptically focusing system