JPS5254486A - Nonndestructive inspection apparatus - Google Patents

Nonndestructive inspection apparatus

Info

Publication number
JPS5254486A
JPS5254486A JP50129863A JP12986375A JPS5254486A JP S5254486 A JPS5254486 A JP S5254486A JP 50129863 A JP50129863 A JP 50129863A JP 12986375 A JP12986375 A JP 12986375A JP S5254486 A JPS5254486 A JP S5254486A
Authority
JP
Japan
Prior art keywords
nonndestructive
inspection apparatus
specimen
inspection
perfect
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP50129863A
Other languages
Japanese (ja)
Other versions
JPS5444474B2 (en
Inventor
Mineo Oishi
Masaji Fujii
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Toshiba Corp
Original Assignee
Toshiba Corp
Tokyo Shibaura Electric Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Toshiba Corp, Tokyo Shibaura Electric Co Ltd filed Critical Toshiba Corp
Priority to JP50129863A priority Critical patent/JPS5254486A/en
Publication of JPS5254486A publication Critical patent/JPS5254486A/en
Publication of JPS5444474B2 publication Critical patent/JPS5444474B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/02—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
    • G01N23/06—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and measuring the absorption
    • G01N23/18—Investigating the presence of flaws defects or foreign matter
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/02—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
    • G01N23/06—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and measuring the absorption
    • G01N23/083—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and measuring the absorption the radiation being X-rays

Landscapes

  • Health & Medical Sciences (AREA)
  • Physics & Mathematics (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Toxicology (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)

Abstract

PURPOSE:Two inspection mechanisms are disposed in the specimen carrying direction, whereby perfect flaw inspection is made possible without being affected by the shape or the direction of curved parts of the specimen such as pressed products.
JP50129863A 1975-10-30 1975-10-30 Nonndestructive inspection apparatus Granted JPS5254486A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP50129863A JPS5254486A (en) 1975-10-30 1975-10-30 Nonndestructive inspection apparatus

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP50129863A JPS5254486A (en) 1975-10-30 1975-10-30 Nonndestructive inspection apparatus

Publications (2)

Publication Number Publication Date
JPS5254486A true JPS5254486A (en) 1977-05-02
JPS5444474B2 JPS5444474B2 (en) 1979-12-26

Family

ID=15020126

Family Applications (1)

Application Number Title Priority Date Filing Date
JP50129863A Granted JPS5254486A (en) 1975-10-30 1975-10-30 Nonndestructive inspection apparatus

Country Status (1)

Country Link
JP (1) JPS5254486A (en)

Also Published As

Publication number Publication date
JPS5444474B2 (en) 1979-12-26

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