JPS5277792A - Method of analyzing nonconductive specimen by photoelectron polarizing method and plate for holding specimen - Google Patents

Method of analyzing nonconductive specimen by photoelectron polarizing method and plate for holding specimen

Info

Publication number
JPS5277792A
JPS5277792A JP51153289A JP15328976A JPS5277792A JP S5277792 A JPS5277792 A JP S5277792A JP 51153289 A JP51153289 A JP 51153289A JP 15328976 A JP15328976 A JP 15328976A JP S5277792 A JPS5277792 A JP S5277792A
Authority
JP
Japan
Prior art keywords
specimen
photoelectron
analyzing
plate
nonconductive
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP51153289A
Other languages
English (en)
Japanese (ja)
Inventor
Fuebu Rusetsuto
Fuonten Remi
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Commissariat a lEnergie Atomique et aux Energies Alternatives CEA
Original Assignee
Commissariat a lEnergie Atomique CEA
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Commissariat a lEnergie Atomique CEA filed Critical Commissariat a lEnergie Atomique CEA
Publication of JPS5277792A publication Critical patent/JPS5277792A/ja
Pending legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/22—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material
    • G01N23/227—Measuring photoelectric effect, e.g. photoelectron emission microscopy [PEEM]

Landscapes

  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
JP51153289A 1975-12-19 1976-12-20 Method of analyzing nonconductive specimen by photoelectron polarizing method and plate for holding specimen Pending JPS5277792A (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
FR7539096A FR2335839A1 (fr) 1975-12-19 1975-12-19 Procede d'analyse d'echantillons en matiere isolante par spectrometrie photo-electronique et porte-echantillon pour la mise en oeuvre dudit procede

Publications (1)

Publication Number Publication Date
JPS5277792A true JPS5277792A (en) 1977-06-30

Family

ID=9163968

Family Applications (1)

Application Number Title Priority Date Filing Date
JP51153289A Pending JPS5277792A (en) 1975-12-19 1976-12-20 Method of analyzing nonconductive specimen by photoelectron polarizing method and plate for holding specimen

Country Status (8)

Country Link
US (1) US4097738A (cg-RX-API-DMAC7.html)
JP (1) JPS5277792A (cg-RX-API-DMAC7.html)
BE (1) BE849129A (cg-RX-API-DMAC7.html)
DE (1) DE2657439A1 (cg-RX-API-DMAC7.html)
ES (1) ES454412A1 (cg-RX-API-DMAC7.html)
FR (1) FR2335839A1 (cg-RX-API-DMAC7.html)
GB (1) GB1556075A (cg-RX-API-DMAC7.html)
SE (1) SE409906B (cg-RX-API-DMAC7.html)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS58193441A (ja) * 1982-05-07 1983-11-11 Hitachi Ltd 光電子測定装置
WO1993004210A1 (fr) * 1991-08-19 1993-03-04 Tadahiro Ohmi Procede de formation d'un film d'oxyde
US6146135A (en) * 1991-08-19 2000-11-14 Tadahiro Ohmi Oxide film forming method

Families Citing this family (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE3128814A1 (de) * 1981-07-21 1983-02-10 Siemens AG, 1000 Berlin und 8000 München Elektrisch leitende probenhalterung fuer die analysentechnik der sekundaerionen-massenspektrometrie
JPS60121652A (ja) * 1983-12-02 1985-06-29 Hitachi Ltd 質量分析用試料ホルダ−
JPS60135846A (ja) * 1983-12-26 1985-07-19 Anelva Corp 二次イオン質量分析方法
US4590376A (en) * 1984-05-30 1986-05-20 Photo Acoustic Technology, Inc. Apparatus and technique for monitoring photoelectron emission from surfaces
EP0178431B1 (de) * 1984-09-18 1990-02-28 ICT Integrated Circuit Testing Gesellschaft für HalbleiterprÀ¼ftechnik mbH Gegenfeld-Spektrometer für die Elektronenstrahl-Messtechnik
US8307665B2 (en) * 2006-04-06 2012-11-13 National Institute Of Advanced Industrial Science And Technology Sample cooling apparatus
CN114047215B (zh) * 2021-10-20 2023-08-15 北京科技大学顺德研究生院 一种用于消除被测样品表面不均匀荷电的装置及方法

Family Cites Families (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB1282498A (en) * 1969-11-17 1972-07-19 Ass Elect Ind Improvements in or relating to apparatus for use in electron spectroscopy
US3749926A (en) * 1971-08-03 1973-07-31 Du Pont Charged particle energy analysis
US3822383A (en) * 1973-04-13 1974-07-02 Weston Instruments Inc Profile gauging system

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS58193441A (ja) * 1982-05-07 1983-11-11 Hitachi Ltd 光電子測定装置
WO1993004210A1 (fr) * 1991-08-19 1993-03-04 Tadahiro Ohmi Procede de formation d'un film d'oxyde
US6146135A (en) * 1991-08-19 2000-11-14 Tadahiro Ohmi Oxide film forming method
US6949478B2 (en) 1991-08-19 2005-09-27 Tadahiro Ohmi Oxide film forming method

Also Published As

Publication number Publication date
BE849129A (fr) 1977-04-01
US4097738A (en) 1978-06-27
SE7614161L (sv) 1977-06-20
GB1556075A (en) 1979-11-21
DE2657439A1 (de) 1977-07-07
FR2335839B1 (cg-RX-API-DMAC7.html) 1980-01-25
ES454412A1 (es) 1977-12-01
SE409906B (sv) 1979-09-10
FR2335839A1 (fr) 1977-07-15

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