JPS52124859A - Continuous vapor phase growth apparatus - Google Patents
Continuous vapor phase growth apparatusInfo
- Publication number
- JPS52124859A JPS52124859A JP4127176A JP4127176A JPS52124859A JP S52124859 A JPS52124859 A JP S52124859A JP 4127176 A JP4127176 A JP 4127176A JP 4127176 A JP4127176 A JP 4127176A JP S52124859 A JPS52124859 A JP S52124859A
- Authority
- JP
- Japan
- Prior art keywords
- vapor phase
- phase growth
- growth apparatus
- continuous vapor
- thickness
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Classifications
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C16/00—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
- C23C16/44—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating
- C23C16/52—Controlling or regulating the coating process
Landscapes
- Chemical & Material Sciences (AREA)
- General Chemical & Material Sciences (AREA)
- Chemical Kinetics & Catalysis (AREA)
- Engineering & Computer Science (AREA)
- Materials Engineering (AREA)
- Mechanical Engineering (AREA)
- Metallurgy (AREA)
- Organic Chemistry (AREA)
- Crystals, And After-Treatments Of Crystals (AREA)
Abstract
PURPOSE:To obtain desired values of grown film thickness by measuring the thickness of vapor grown film and controlling the volume of the gas supplied according to the difference from required thickness.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP4127176A JPS52124859A (en) | 1976-04-14 | 1976-04-14 | Continuous vapor phase growth apparatus |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP4127176A JPS52124859A (en) | 1976-04-14 | 1976-04-14 | Continuous vapor phase growth apparatus |
Publications (1)
Publication Number | Publication Date |
---|---|
JPS52124859A true JPS52124859A (en) | 1977-10-20 |
Family
ID=12603766
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP4127176A Pending JPS52124859A (en) | 1976-04-14 | 1976-04-14 | Continuous vapor phase growth apparatus |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS52124859A (en) |
Cited By (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5480071A (en) * | 1977-12-09 | 1979-06-26 | Hitachi Ltd | Vapor growth method for semiconductor layer |
JPS6333813A (en) * | 1986-07-28 | 1988-02-13 | Tokyo Electron Ltd | Thin film forming apparatus |
JPH03164497A (en) * | 1989-11-24 | 1991-07-16 | Res Dev Corp Of Japan | Epitaxial growth method of compound crystal |
JPH04247637A (en) * | 1991-02-04 | 1992-09-03 | Nichia Chem Ind Ltd | Method of measuring surface condition of semiconductor crystal film |
-
1976
- 1976-04-14 JP JP4127176A patent/JPS52124859A/en active Pending
Cited By (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5480071A (en) * | 1977-12-09 | 1979-06-26 | Hitachi Ltd | Vapor growth method for semiconductor layer |
JPS5716734B2 (en) * | 1977-12-09 | 1982-04-07 | ||
JPS6333813A (en) * | 1986-07-28 | 1988-02-13 | Tokyo Electron Ltd | Thin film forming apparatus |
JPH03164497A (en) * | 1989-11-24 | 1991-07-16 | Res Dev Corp Of Japan | Epitaxial growth method of compound crystal |
JPH0751478B2 (en) * | 1989-11-24 | 1995-06-05 | 新技術事業団 | Epitaxial growth method of compound crystal |
JPH04247637A (en) * | 1991-02-04 | 1992-09-03 | Nichia Chem Ind Ltd | Method of measuring surface condition of semiconductor crystal film |
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