JPS5142588A - - Google Patents

Info

Publication number
JPS5142588A
JPS5142588A JP50096591A JP9659175A JPS5142588A JP S5142588 A JPS5142588 A JP S5142588A JP 50096591 A JP50096591 A JP 50096591A JP 9659175 A JP9659175 A JP 9659175A JP S5142588 A JPS5142588 A JP S5142588A
Authority
JP
Japan
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP50096591A
Other languages
Japanese (ja)
Inventor
Puraieru Horusuto
Riideru Borufugangu
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Licentia Patent Verwaltungs GmbH
Original Assignee
Licentia Patent Verwaltungs GmbH
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Licentia Patent Verwaltungs GmbH filed Critical Licentia Patent Verwaltungs GmbH
Publication of JPS5142588A publication Critical patent/JPS5142588A/ja
Pending legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
    • G01N21/31—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry
    • G01N21/39—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using tunable lasers

Landscapes

  • Physics & Mathematics (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Analytical Chemistry (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Optics & Photonics (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
JP50096591A 1974-08-09 1975-08-08 Pending JPS5142588A (enExample)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
DE19742438294 DE2438294B2 (de) 1974-08-09 1974-08-09 Infrarotgasanalysator

Publications (1)

Publication Number Publication Date
JPS5142588A true JPS5142588A (enExample) 1976-04-10

Family

ID=5922793

Family Applications (1)

Application Number Title Priority Date Filing Date
JP50096591A Pending JPS5142588A (enExample) 1974-08-09 1975-08-08

Country Status (6)

Country Link
US (1) US4061918A (enExample)
JP (1) JPS5142588A (enExample)
DE (1) DE2438294B2 (enExample)
FR (1) FR2281564A1 (enExample)
GB (1) GB1523605A (enExample)
NL (1) NL175228C (enExample)

Cited By (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5633498A (en) * 1979-08-25 1981-04-03 Toyo Sash Kk Coloring method for anodic oxidation coating of aluminum or aluminum alloy
JPS5810631A (ja) * 1981-07-13 1983-01-21 Ushio Inc 光照射装置
JPS5988645A (ja) * 1982-11-12 1984-05-22 Fujitsu Ltd 赤外線透過率測定装置
JP2013113664A (ja) * 2011-11-28 2013-06-10 Yokogawa Electric Corp レーザガス分析装置
JP2014206541A (ja) * 2014-07-01 2014-10-30 横河電機株式会社 レーザガス分析装置
JP2015129769A (ja) * 2015-03-12 2015-07-16 横河電機株式会社 レーザガス分析装置
JP2015180899A (ja) * 2015-07-14 2015-10-15 横河電機株式会社 レーザガス分析装置
JP2020516336A (ja) * 2017-03-20 2020-06-11 コーニンクレッカ フィリップス エヌ ヴェＫｏｎｉｎｋｌｉｊｋｅ Ｐｈｉｌｉｐｓ Ｎ．Ｖ． 自動化された目立たないフィルタ校正を使用した呼吸ガス監視

Families Citing this family (20)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE2822739C3 (de) * 1978-05-24 1981-07-30 Kaiser, Wolfgang, Prof.Dr.rer.nat., 8011 Baldham Meßvorrichtung zur spektroskopischen Untersuchung von polyatomaren Molekülen
US4310762A (en) * 1980-01-28 1982-01-12 University Of Utah Calorimetric trace analysis by laser induced thermal lens method
US4442349A (en) * 1980-09-15 1984-04-10 Baird Corporation Circuitry for the generation and synchronous detection of optical pulsed signals
US4410273A (en) * 1981-03-09 1983-10-18 Laser Analytics, Inc. Scanning laser spectrometer
CA1179861A (en) * 1981-04-13 1984-12-27 Australian Atomic Energy Commission Method and apparatus for measuring the concentration of gaseous hydrogen fluoride
GB2110818B (en) * 1981-11-14 1985-05-15 Ferranti Ltd Non-dispersive gas analyser
GB2127537B (en) * 1982-09-09 1986-09-10 Laser Applic Limited Gas detection apparatus
US4591718A (en) * 1983-10-25 1986-05-27 The United States Of America As Represented By The United States Department Of Energy Photothermal method for in situ microanalysis of the chemical composition of coal samples
US4586026A (en) * 1983-11-07 1986-04-29 Liston Edwards, Inc. Infrared gas analyzer using count quadrature sampling
US5331409A (en) * 1992-06-12 1994-07-19 George Thurtell Tunable diode laser gas analyzer
US5797682A (en) * 1993-02-10 1998-08-25 Envirotest Systems Corp. Device and method for measuring temperture of vehicle exhaust
IL111809A (en) * 1993-12-09 1998-12-06 Hughes Aircraft Co Integrated detector for laser sensors
US5770156A (en) * 1996-06-04 1998-06-23 In Usa, Inc. Gas detection and measurement system
US6010665A (en) * 1996-10-18 2000-01-04 In Usa, Inc. Multi-wavelength based ozone measurement method and apparatus
JP3343680B2 (ja) * 1999-07-12 2002-11-11 日本酸素株式会社 レーザー分光分析装置
DE10005923C2 (de) * 2000-02-10 2002-06-27 Draeger Safety Ag & Co Kgaa Infrarotoptische Gasmessvorrichtung und Gasmessverfahren
US7884937B2 (en) * 2007-04-19 2011-02-08 Science & Engineering Services, Inc. Airborne tunable mid-IR laser gas-correlation sensor
DE102011075530A1 (de) * 2011-05-09 2012-01-26 WTW Wissenschaftlich-Technische Werkstätten GmbH Fotometer zur In-situ-Messung in Fluiden
CN104458638A (zh) * 2014-12-18 2015-03-25 武汉宇虹环保产业发展有限公司 一种红外光谱双路测量装置及方法
CN109115730A (zh) * 2018-11-02 2019-01-01 天津津航技术物理研究所 基于可调谐激光的光谱透过率测试系统及方法

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3614431A (en) * 1970-10-01 1971-10-19 Nasa Miniature carbon dioxide sensor and methods

Family Cites Families (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
FR2123035B1 (enExample) * 1969-07-21 1973-03-16 Cameca
US3887473A (en) * 1971-09-07 1975-06-03 Bergishagen & Associates Method and system for the infrared analysis of gases
US3790797A (en) * 1971-09-07 1974-02-05 S Sternberg Method and system for the infrared analysis of gases
US3783284A (en) * 1971-10-28 1974-01-01 Texas Instruments Inc Method and apparatus for detection of petroleum products
US3805074A (en) * 1973-01-02 1974-04-16 Texas Instruments Inc Spectral scan air monitor
US3820901A (en) * 1973-03-06 1974-06-28 Bell Telephone Labor Inc Measurement of concentrations of components of a gaseous mixture
US3853407A (en) * 1973-04-23 1974-12-10 Sensores Corp Multiple path spectrophotometer method and apparatus
US3893771A (en) * 1974-08-22 1975-07-08 Diax Corp Laser absorption spectroscopy

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3614431A (en) * 1970-10-01 1971-10-19 Nasa Miniature carbon dioxide sensor and methods

Cited By (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5633498A (en) * 1979-08-25 1981-04-03 Toyo Sash Kk Coloring method for anodic oxidation coating of aluminum or aluminum alloy
JPS5810631A (ja) * 1981-07-13 1983-01-21 Ushio Inc 光照射装置
JPS5988645A (ja) * 1982-11-12 1984-05-22 Fujitsu Ltd 赤外線透過率測定装置
JP2013113664A (ja) * 2011-11-28 2013-06-10 Yokogawa Electric Corp レーザガス分析装置
US9347877B2 (en) 2011-11-28 2016-05-24 Yokogawa Electric Corporation Laser gas analyzer
US9671333B2 (en) 2011-11-28 2017-06-06 Yokogawa Electric Corporation Laser gas analyzer
JP2014206541A (ja) * 2014-07-01 2014-10-30 横河電機株式会社 レーザガス分析装置
JP2015129769A (ja) * 2015-03-12 2015-07-16 横河電機株式会社 レーザガス分析装置
JP2015180899A (ja) * 2015-07-14 2015-10-15 横河電機株式会社 レーザガス分析装置
JP2020516336A (ja) * 2017-03-20 2020-06-11 コーニンクレッカ フィリップス エヌ ヴェＫｏｎｉｎｋｌｉｊｋｅ Ｐｈｉｌｉｐｓ Ｎ．Ｖ． 自動化された目立たないフィルタ校正を使用した呼吸ガス監視

Also Published As

Publication number Publication date
US4061918A (en) 1977-12-06
DE2438294A1 (de) 1976-02-26
NL175228B (nl) 1984-05-01
GB1523605A (en) 1978-09-06
DE2438294B2 (de) 1977-05-18
NL175228C (nl) 1984-10-01
FR2281564B1 (enExample) 1977-12-16
NL7509470A (nl) 1976-02-11
FR2281564A1 (fr) 1976-03-05

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