JPS5077080A - - Google Patents

Info

Publication number
JPS5077080A
JPS5077080A JP49101450A JP10145074A JPS5077080A JP S5077080 A JPS5077080 A JP S5077080A JP 49101450 A JP49101450 A JP 49101450A JP 10145074 A JP10145074 A JP 10145074A JP S5077080 A JPS5077080 A JP S5077080A
Authority
JP
Japan
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP49101450A
Other versions
JPS6059679B2 (ja
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Publication of JPS5077080A publication Critical patent/JPS5077080A/ja
Publication of JPS6059679B2 publication Critical patent/JPS6059679B2/ja
Expired legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G11C29/04—Detection or location of defective memory elements, e.g. cell constructio details, timing of test signals
    • G11C29/08—Functional testing, e.g. testing during refresh, power-on self testing [POST] or distributed testing
    • G11C29/10—Test algorithms, e.g. memory scan [MScan] algorithms; Test patterns, e.g. checkerboard patterns 
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G11C29/04—Detection or location of defective memory elements, e.g. cell constructio details, timing of test signals
    • G11C29/08—Functional testing, e.g. testing during refresh, power-on self testing [POST] or distributed testing
    • G11C29/12—Built-in arrangements for testing, e.g. built-in self testing [BIST] or interconnection details
    • G11C29/36—Data generation devices, e.g. data inverters
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G11C29/04—Detection or location of defective memory elements, e.g. cell constructio details, timing of test signals
    • G11C29/08—Functional testing, e.g. testing during refresh, power-on self testing [POST] or distributed testing
    • G11C29/12—Built-in arrangements for testing, e.g. built-in self testing [BIST] or interconnection details
    • G11C29/38—Response verification devices

Landscapes

  • Techniques For Improving Reliability Of Storages (AREA)
  • For Increasing The Reliability Of Semiconductor Memories (AREA)
  • Tests Of Electronic Circuits (AREA)
JP49101450A 1973-09-05 1974-09-05 作業用記憶領域内の欠陥場所を見付ける方法と装置 Expired JPS6059679B2 (ja)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
FR7332062A FR2246023B1 (ja) 1973-09-05 1973-09-05
FR7332062 1973-09-05

Publications (2)

Publication Number Publication Date
JPS5077080A true JPS5077080A (ja) 1975-06-24
JPS6059679B2 JPS6059679B2 (ja) 1985-12-26

Family

ID=9124672

Family Applications (1)

Application Number Title Priority Date Filing Date
JP49101450A Expired JPS6059679B2 (ja) 1973-09-05 1974-09-05 作業用記憶領域内の欠陥場所を見付ける方法と装置

Country Status (5)

Country Link
US (1) US3940601A (ja)
JP (1) JPS6059679B2 (ja)
DE (1) DE2442191C2 (ja)
FR (1) FR2246023B1 (ja)
GB (1) GB1495749A (ja)

Families Citing this family (34)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5552581A (en) * 1978-10-11 1980-04-17 Advantest Corp Pattern generator
US4271512A (en) * 1979-03-30 1981-06-02 Lyhus Arlan J Information collection and storage system with memory test circuit
US4363125A (en) * 1979-12-26 1982-12-07 International Business Machines Corporation Memory readback check method and apparatus
US4319355A (en) * 1979-12-28 1982-03-09 Compagnia Internationale Pour L'informatique Method of and apparatus for testing a memory matrix control character
US4344155A (en) * 1979-12-31 1982-08-10 Compagnie Internationale Pour L'informatique Cii-Honeywell Bull (Societe Anonyme) Method of and apparatus for inscribing a control character in a memory
FR2474226B1 (fr) * 1980-01-22 1985-10-11 Thomson Csf Dispositif de test pour enregistreur numerique multipiste
NL8004598A (nl) * 1980-08-14 1982-03-16 Philips Nv Werkwijze voor het inschrijven in, respektievelijk uitlezen uit, een registratiedragerlichaam, van sektorsgewijs georganiseerde informatie, en inrichting daarvoor.
JPS5764397A (en) * 1980-10-03 1982-04-19 Olympus Optical Co Ltd Memory device
US4365332A (en) * 1980-11-03 1982-12-21 Fairchild Camera And Instrument Corp. Method and circuitry for correcting errors in recirculating memories
JPS57105897A (en) * 1980-12-23 1982-07-01 Fujitsu Ltd Semiconductor storage device
US4441182A (en) * 1981-05-15 1984-04-03 Rockwell International Corporation Repetitious logic state signal generation apparatus
JPS5815730A (ja) * 1981-07-21 1983-01-29 Nippon Denso Co Ltd 車両用速度制御装置
US4736373A (en) * 1981-08-03 1988-04-05 Pacific Western Systems, Inc. Memory tester having concurrent failure data readout and memory repair analysis
US4449182A (en) * 1981-10-05 1984-05-15 Digital Equipment Corporation Interface between a pair of processors, such as host and peripheral-controlling processors in data processing systems
DE3176883D1 (en) * 1981-12-17 1988-10-27 Ibm Apparatus for high speed fault mapping of large memories
US4456995A (en) * 1981-12-18 1984-06-26 International Business Machines Corporation Apparatus for high speed fault mapping of large memories
US4524444A (en) * 1982-01-12 1985-06-18 Discovision Associates Analyzing the signal transfer characteristics of a signal processing unit
US5126990A (en) * 1982-01-12 1992-06-30 Discovision Associates Method of evaluating a storage medium by recirculating a test sample of a signal
US4682246A (en) * 1982-01-12 1987-07-21 Discovision Associates Characterizing the information transfer characteristics of a recording medium
JPS59119443A (ja) * 1982-12-27 1984-07-10 Toshiba Corp 論理回路
JPS59185097A (ja) * 1983-04-04 1984-10-20 Oki Electric Ind Co Ltd 自己診断機能付メモリ装置
JPS59185098A (ja) * 1983-04-04 1984-10-20 Oki Electric Ind Co Ltd 自己診断回路内蔵型半導体メモリ装置
US4559626A (en) * 1983-04-05 1985-12-17 Brown Carleston O Portable minicomputer for testing memories
US4567593A (en) * 1983-10-06 1986-01-28 Honeywell Information Systems Inc. Apparatus for verification of a signal transfer in a preselected path in a data processing system
US4608669A (en) * 1984-05-18 1986-08-26 International Business Machines Corporation Self contained array timing
US4623837A (en) 1985-06-14 1986-11-18 Discovision Associates Audio/video quality monitoring system
US4912710A (en) * 1988-02-29 1990-03-27 Harris Corporation Self-checking random access memory
US4910728A (en) * 1988-06-27 1990-03-20 United Technologies Corporation Multiplexer diagnostic input patterns
US5200960A (en) * 1990-09-21 1993-04-06 Xerox Corporation Streaming tape diagnostic
US5185883A (en) * 1990-10-26 1993-02-09 Data Translation, Inc. System for locating failure signals by comparing input data with stored threshold value and storing failure addresses in alternating buffers
JPH0696599A (ja) * 1992-02-26 1994-04-08 Nec Corp 半導体集積回路
US5633878A (en) * 1995-01-20 1997-05-27 Telefonaktiebolaget Lm Ericsson Self-diagnostic data buffers
US6484168B1 (en) * 1996-09-13 2002-11-19 Battelle Memorial Institute System for information discovery
FR2851075B1 (fr) * 2003-02-11 2005-04-22 St Microelectronics Sa Procede pour tester l'integrite d'un circuit de decodage et d'une memoire y associee

Family Cites Families (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3581074A (en) * 1968-02-19 1971-05-25 Burroughs Corp Automatic checkout apparatus
US3633016A (en) * 1970-03-04 1972-01-04 Digital General Corp Apparatus and method for testing electrical systems having a plurality of terminals
US3751649A (en) * 1971-05-17 1973-08-07 Marcrodata Co Memory system exerciser
DE2134529A1 (de) * 1971-07-10 1973-01-25 Ibm Deutschland Verfahren zur fehlererkennung und -korrektur in aus dem speicher einer programmgesteuerten datenverarbeitungsanlage ausgelesenen informationswoertern
US3719929A (en) * 1971-08-11 1973-03-06 Litton Systems Inc Memory analyzers
US3714403A (en) * 1971-09-01 1973-01-30 Gte Automatic Electric Lab Inc Computer implemented method of detecting and isolating electrical faults in core memory systems
DE2158433C3 (de) * 1971-11-25 1975-07-31 Ibm Deutschland Gmbh, 7000 Stuttgart Verfahren und Einrichtung zur Fehlerprüfung und Fehlerlokalisierung in einer moduleren Datenverarbeitungsanlage
US3790885A (en) * 1972-03-27 1974-02-05 Ibm Serial test patterns for mosfet testing
US3832535A (en) * 1972-10-25 1974-08-27 Instrumentation Engineering Digital word generating and receiving apparatus

Also Published As

Publication number Publication date
DE2442191A1 (de) 1975-03-06
GB1495749A (en) 1977-12-21
FR2246023B1 (ja) 1976-10-01
JPS6059679B2 (ja) 1985-12-26
US3940601A (en) 1976-02-24
DE2442191C2 (de) 1984-01-19
FR2246023A1 (ja) 1975-04-25

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