JPS502591A - - Google Patents

Info

Publication number
JPS502591A
JPS502591A JP48049789A JP4978973A JPS502591A JP S502591 A JPS502591 A JP S502591A JP 48049789 A JP48049789 A JP 48049789A JP 4978973 A JP4978973 A JP 4978973A JP S502591 A JPS502591 A JP S502591A
Authority
JP
Japan
Prior art keywords
ion beam
uniform magnetic
magnetic field
entrance
electrostatic field
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP48049789A
Other languages
Japanese (ja)
Other versions
JPS5520637B2 (en
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP4978973A priority Critical patent/JPS5520637B2/ja
Priority to US467788A priority patent/US3920988A/en
Publication of JPS502591A publication Critical patent/JPS502591A/ja
Publication of JPS5520637B2 publication Critical patent/JPS5520637B2/ja
Expired legal-status Critical Current

Links

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/26—Mass spectrometers or separator tubes
    • H01J49/28—Static spectrometers
    • H01J49/32—Static spectrometers using double focusing

Landscapes

  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Electron Tubes For Measurement (AREA)
  • Other Investigation Or Analysis Of Materials By Electrical Means (AREA)

Abstract

A mass spectrometer which has a toroidal electrostatic field and a uniform magnetic field with non-zero entrance and exit angles, and which is so constructed that the incident end surface of an ion beam on the toroidal electrostatic field defines a concave surface and that the entrance angle and the exit angle of the ion beam relative to the uniform magnetic field are in the positive direction and the negative direction, respectively, thereby to make the elimination of second-order aberrations and axial focusing possible.
JP4978973A 1973-05-07 1973-05-07 Expired JPS5520637B2 (en)

Priority Applications (2)

Application Number Priority Date Filing Date Title
JP4978973A JPS5520637B2 (en) 1973-05-07 1973-05-07
US467788A US3920988A (en) 1973-05-07 1974-05-07 Mass spectrometer

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP4978973A JPS5520637B2 (en) 1973-05-07 1973-05-07

Publications (2)

Publication Number Publication Date
JPS502591A true JPS502591A (en) 1975-01-11
JPS5520637B2 JPS5520637B2 (en) 1980-06-04

Family

ID=12840911

Family Applications (1)

Application Number Title Priority Date Filing Date
JP4978973A Expired JPS5520637B2 (en) 1973-05-07 1973-05-07

Country Status (2)

Country Link
US (1) US3920988A (en)
JP (1) JPS5520637B2 (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5193279A (en) * 1975-02-14 1976-08-16

Families Citing this family (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0016561A1 (en) * 1979-03-15 1980-10-01 University Of Manchester Institute Of Science And Technology Mass spectrometers
JPS5829577B2 (en) * 1980-06-13 1983-06-23 日本電子株式会社 Double convergence mass spectrometer
JPS6037642A (en) * 1983-08-10 1985-02-27 Hitachi Ltd Mass separator for ion implantation equipment
US5317151A (en) * 1992-10-30 1994-05-31 Sinha Mahadeva P Miniaturized lightweight magnetic sector for a field-portable mass spectrometer
US8723114B2 (en) * 2011-11-17 2014-05-13 National University Of Singapore Sequential radial mirror analyser
CN114709129B (en) * 2022-03-16 2025-06-24 中国核电工程有限公司 A mass analyzer system and mass spectrometer

Family Cites Families (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3061720A (en) * 1960-02-29 1962-10-30 Ewald Heinz Spectrograph
US3194961A (en) * 1962-02-28 1965-07-13 Ewald Heinz Double deflection system for focusing ions of selected mass and charge at a predetermined point
US3671737A (en) * 1969-05-07 1972-06-20 Bell & Howell Co Method for focusing a double focusing mass spectrometer

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5193279A (en) * 1975-02-14 1976-08-16

Also Published As

Publication number Publication date
US3920988A (en) 1975-11-18
JPS5520637B2 (en) 1980-06-04

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