JPS50126175A - - Google Patents

Info

Publication number
JPS50126175A
JPS50126175A JP3239574A JP3239574A JPS50126175A JP S50126175 A JPS50126175 A JP S50126175A JP 3239574 A JP3239574 A JP 3239574A JP 3239574 A JP3239574 A JP 3239574A JP S50126175 A JPS50126175 A JP S50126175A
Authority
JP
Japan
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP3239574A
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP3239574A priority Critical patent/JPS50126175A/ja
Publication of JPS50126175A publication Critical patent/JPS50126175A/ja
Pending legal-status Critical Current

Links

Landscapes

  • Warehouses Or Storage Devices (AREA)
  • Attitude Control For Articles On Conveyors (AREA)
JP3239574A 1974-03-22 1974-03-22 Pending JPS50126175A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP3239574A JPS50126175A (ja) 1974-03-22 1974-03-22

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP3239574A JPS50126175A (ja) 1974-03-22 1974-03-22

Publications (1)

Publication Number Publication Date
JPS50126175A true JPS50126175A (ja) 1975-10-03

Family

ID=12357753

Family Applications (1)

Application Number Title Priority Date Filing Date
JP3239574A Pending JPS50126175A (ja) 1974-03-22 1974-03-22

Country Status (1)

Country Link
JP (1) JPS50126175A (ja)

Cited By (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5464479A (en) * 1977-10-31 1979-05-24 Tokyo Seimitsu Co Ltd Device for inspecting wafer
JPS5539021A (en) * 1978-09-14 1980-03-18 Hitachi Electronics Eng Co Ltd Automatic plate tester
JPS5662329A (en) * 1979-10-26 1981-05-28 Toshiba Corp Conveying direction turning device for semiconductor wafer
JPS5860552A (ja) * 1981-10-05 1983-04-11 Tokyo Denshi Kagaku Kabushiki 縦型自動プラズマ処理装置
JPS6097621A (ja) * 1983-11-02 1985-05-31 Hitachi Ltd 分子線エピタキシ装置における基板搬送装置
JP2008260607A (ja) * 2007-04-11 2008-10-30 Takachiho Takeda センタリングユニット
WO2009119323A1 (ja) * 2008-03-25 2009-10-01 株式会社トクヤマ 円形部材の心出し装置及びこれを備えたコーティング装置

Cited By (13)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5464479A (en) * 1977-10-31 1979-05-24 Tokyo Seimitsu Co Ltd Device for inspecting wafer
JPS5824946B2 (ja) * 1977-10-31 1983-05-24 株式会社東京精密 ウエハ−検査装置
JPS6146971B2 (ja) * 1978-09-14 1986-10-16 Hitachi Electr Eng
JPS5539021A (en) * 1978-09-14 1980-03-18 Hitachi Electronics Eng Co Ltd Automatic plate tester
JPS5662329A (en) * 1979-10-26 1981-05-28 Toshiba Corp Conveying direction turning device for semiconductor wafer
JPS6318325B2 (ja) * 1979-10-26 1988-04-18 Tokyo Shibaura Electric Co
JPS5860552A (ja) * 1981-10-05 1983-04-11 Tokyo Denshi Kagaku Kabushiki 縦型自動プラズマ処理装置
JPS6325500B2 (ja) * 1981-10-05 1988-05-25 Tokyo Ohka Kogyo Co Ltd
JPS6097621A (ja) * 1983-11-02 1985-05-31 Hitachi Ltd 分子線エピタキシ装置における基板搬送装置
JPH0469413B2 (ja) * 1983-11-02 1992-11-06 Hitachi Ltd
JP2008260607A (ja) * 2007-04-11 2008-10-30 Takachiho Takeda センタリングユニット
WO2009119323A1 (ja) * 2008-03-25 2009-10-01 株式会社トクヤマ 円形部材の心出し装置及びこれを備えたコーティング装置
JP5279819B2 (ja) * 2008-03-25 2013-09-04 株式会社トクヤマ レンズの心出し装置を備えたコーティング装置及びコーティング方法

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