JPH11287739A5 - - Google Patents

Info

Publication number
JPH11287739A5
JPH11287739A5 JP1999034281A JP3428199A JPH11287739A5 JP H11287739 A5 JPH11287739 A5 JP H11287739A5 JP 1999034281 A JP1999034281 A JP 1999034281A JP 3428199 A JP3428199 A JP 3428199A JP H11287739 A5 JPH11287739 A5 JP H11287739A5
Authority
JP
Japan
Prior art keywords
optical element
optical
wavelength
measurements
different wavelengths
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP1999034281A
Other languages
English (en)
Japanese (ja)
Other versions
JPH11287739A (ja
Filing date
Publication date
Priority claimed from EP98102584A external-priority patent/EP0872721B1/en
Application filed filed Critical
Publication of JPH11287739A publication Critical patent/JPH11287739A/ja
Publication of JPH11287739A5 publication Critical patent/JPH11287739A5/ja
Pending legal-status Critical Current

Links

JP11034281A 1998-02-14 1999-02-12 光学素子に関する波長依存情報の測定システム及びその測定方法 Pending JPH11287739A (ja)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
EP98102584A EP0872721B1 (en) 1998-02-14 1998-02-14 Remote measurement of wavelength dependent information about optical components
DE98102584.4 1998-02-14

Publications (2)

Publication Number Publication Date
JPH11287739A JPH11287739A (ja) 1999-10-19
JPH11287739A5 true JPH11287739A5 (enExample) 2006-03-30

Family

ID=8231414

Family Applications (1)

Application Number Title Priority Date Filing Date
JP11034281A Pending JPH11287739A (ja) 1998-02-14 1999-02-12 光学素子に関する波長依存情報の測定システム及びその測定方法

Country Status (4)

Country Link
US (1) US6067150A (enExample)
EP (1) EP0872721B1 (enExample)
JP (1) JPH11287739A (enExample)
DE (1) DE69800853T2 (enExample)

Families Citing this family (23)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0905490B1 (en) * 1998-04-21 2001-01-17 Hewlett-Packard Company Optical component tester
DE19948378C1 (de) * 1999-10-07 2001-05-17 Siemens Ag Einrichtung und Verfahren zur Bestimmung des Übertragungsverhaltens von opto-elektronischen Verbindungen sowie deren Verwendung
EP1305589A1 (en) 2000-07-21 2003-05-02 Agilent Technologies, Inc. (a Delaware corporation) Reflectometric insertion loss measurements for optical components
EP1189367A1 (en) * 2000-07-27 2002-03-20 Alcatel System and method for determining wavelength dependent information in an optical communication system
JP2002071511A (ja) * 2000-08-31 2002-03-08 Ando Electric Co Ltd 光学部品測定装置及び光学部品の試験方法
US6570894B2 (en) 2001-01-30 2003-05-27 Tektronix, Inc. Real-time wavelength calibration for swept lasers
US6757456B2 (en) * 2001-06-19 2004-06-29 Corning Incorporated System for selecting an appropriate optical fiber type for a communication network
US6947147B2 (en) 2002-08-21 2005-09-20 Agilent Technologies, Inc. De-embedment of optical component characteristics and calibration of optical receivers using rayleigh backscatter
AU2005225034B2 (en) * 2005-10-18 2011-08-11 The Australian National University Interferometric sensor
DE102007015900A1 (de) * 2007-04-02 2008-10-09 Fraunhofer-Gesellschaft zur Förderung der angewandten Forschung e.V. Konzept zur Anpassung von optischen Filterwellenlängen
US8416416B2 (en) * 2007-11-29 2013-04-09 National Center For Nanoscience And Technology Measuring method for SPR and system thereof
US8971704B2 (en) * 2009-12-03 2015-03-03 Telefonaktiebolaget L M Ericsson (Publ) Optical networks
JP5735755B2 (ja) * 2010-05-17 2015-06-17 株式会社アドバンテスト 試験装置及び試験方法
US8565618B2 (en) * 2010-10-05 2013-10-22 Verizon Patent And Licensing Inc. Automatic wavelength configuration
GB201020827D0 (en) 2010-12-08 2011-01-19 Fotech Solutions Ltd Distrubuted optical fibre sensor
WO2014022956A1 (zh) * 2012-08-06 2014-02-13 华为技术有限公司 在线标定可配置站点波长相关衰减的方法、装置及系统
KR20150113730A (ko) * 2014-03-31 2015-10-08 한국전자통신연구원 비반사 장애를 구분하는 광링크 장애 분석 장치 및 방법
CN104655591B (zh) * 2015-01-20 2017-03-08 北京奥普维尔科技有限公司 一种检测敲击位置的光缆普查装置及方法
US11125647B2 (en) 2019-04-09 2021-09-21 Viavi Solutions France SAS Fiber optic virtual sensing system and method
US20230160779A1 (en) * 2020-04-14 2023-05-25 Jabiil Inc. Optical back reflection diagnostics for micro optical components
US11650128B2 (en) * 2020-06-30 2023-05-16 Exfo Inc. Optical fiber recognition using backscattering pattern
US11879802B2 (en) 2020-10-22 2024-01-23 Exfo Inc. Testing optical fiber link continuity using OTDR backscattering patterns
CN112994788B (zh) * 2021-04-22 2021-08-17 南京英田光学工程股份有限公司 激光通信终端隔离度测试方法

Family Cites Families (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5096277A (en) * 1982-08-06 1992-03-17 Kleinerman Marcos Y Remote measurement of physical variables with fiber optic systems
JPH068773B2 (ja) * 1984-06-29 1994-02-02 住友電気工業株式会社 単一モ−ド光フアイバの構造測定方法
AU5952190A (en) * 1989-06-19 1991-01-08 Lansco, Inc. Authentication apparatus using resonance absorption of light
JPH0425243A (ja) * 1990-05-18 1992-01-29 Hitachi Cable Ltd 波長多重信号受信方法
US5130535A (en) * 1990-10-10 1992-07-14 At&T Bell Laboratories Methods of and apparatus for measuring bending loss along a length of optical fiber
US5179420A (en) * 1991-06-07 1993-01-12 Bell Canada Optical time domain reflectometer using a tunable optical source
US5305078A (en) * 1992-01-21 1994-04-19 Exfo Electro-Optical Engineering Inc. Measurement of attenuation of optical fibers using transmitted wavelength and power information
US5375011A (en) * 1993-08-18 1994-12-20 National Research Council Of Canada Non-linear, real-time, micrometer resolution optical time domain reflectometers for optoelectronic circuits diagnostic and sensing applications
EP0841552B1 (en) * 1997-01-16 1999-04-07 Hewlett-Packard Company Optical time domain reflectometer for measurement in optical networks with currently applied traffic signals

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