JPH11166976A - Ｘ線検出器及びｘ線ｃｔ装置 - Google Patents
Ｘ線検出器及びｘ線ｃｔ装置Info
- Publication number
- JPH11166976A JPH11166976A JP9333838A JP33383897A JPH11166976A JP H11166976 A JPH11166976 A JP H11166976A JP 9333838 A JP9333838 A JP 9333838A JP 33383897 A JP33383897 A JP 33383897A JP H11166976 A JPH11166976 A JP H11166976A
- Authority
- JP
- Japan
- Prior art keywords
- layer
- light
- scintillator
- ray
- ray detector
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 239000004065 semiconductor Substances 0.000 claims abstract description 27
- 229910052751 metal Inorganic materials 0.000 abstract description 37
- 239000002184 metal Substances 0.000 abstract description 37
- 239000010408 film Substances 0.000 abstract description 34
- 239000000463 material Substances 0.000 abstract description 34
- 238000000034 method Methods 0.000 abstract description 29
- 230000000694 effects Effects 0.000 abstract description 3
- 239000010409 thin film Substances 0.000 abstract description 2
- 238000000149 argon plasma sintering Methods 0.000 abstract 2
- 239000010410 layer Substances 0.000 description 155
- 238000006243 chemical reaction Methods 0.000 description 44
- 238000004519 manufacturing process Methods 0.000 description 13
- 239000011521 glass Substances 0.000 description 7
- 238000003825 pressing Methods 0.000 description 7
- 239000000758 substrate Substances 0.000 description 7
- 239000000853 adhesive Substances 0.000 description 6
- 230000001070 adhesive effect Effects 0.000 description 6
- 238000010030 laminating Methods 0.000 description 6
- 229910052782 aluminium Inorganic materials 0.000 description 5
- XAGFODPZIPBFFR-UHFFFAOYSA-N aluminium Chemical compound [Al] XAGFODPZIPBFFR-UHFFFAOYSA-N 0.000 description 5
- 230000000903 blocking effect Effects 0.000 description 5
- 238000010586 diagram Methods 0.000 description 5
- 238000000926 separation method Methods 0.000 description 5
- GWEVSGVZZGPLCZ-UHFFFAOYSA-N Titan oxide Chemical compound O=[Ti]=O GWEVSGVZZGPLCZ-UHFFFAOYSA-N 0.000 description 4
- 238000005520 cutting process Methods 0.000 description 4
- 238000001514 detection method Methods 0.000 description 4
- 239000012790 adhesive layer Substances 0.000 description 3
- 238000003491 array Methods 0.000 description 3
- 238000000151 deposition Methods 0.000 description 3
- 239000003822 epoxy resin Substances 0.000 description 3
- 239000007788 liquid Substances 0.000 description 3
- 229920000647 polyepoxide Polymers 0.000 description 3
- 239000000126 substance Substances 0.000 description 3
- 239000004809 Teflon Substances 0.000 description 2
- 229920006362 Teflon® Polymers 0.000 description 2
- QVQLCTNNEUAWMS-UHFFFAOYSA-N barium oxide Chemical compound [Ba]=O QVQLCTNNEUAWMS-UHFFFAOYSA-N 0.000 description 2
- 230000015572 biosynthetic process Effects 0.000 description 2
- 238000000576 coating method Methods 0.000 description 2
- 230000007423 decrease Effects 0.000 description 2
- 230000008021 deposition Effects 0.000 description 2
- 239000000049 pigment Substances 0.000 description 2
- 229920000728 polyester Polymers 0.000 description 2
- 238000002834 transmittance Methods 0.000 description 2
- WFKWXMTUELFFGS-UHFFFAOYSA-N tungsten Chemical compound [W] WFKWXMTUELFFGS-UHFFFAOYSA-N 0.000 description 2
- 229910052721 tungsten Inorganic materials 0.000 description 2
- 239000010937 tungsten Substances 0.000 description 2
- ZOKXTWBITQBERF-UHFFFAOYSA-N Molybdenum Chemical compound [Mo] ZOKXTWBITQBERF-UHFFFAOYSA-N 0.000 description 1
- 239000003795 chemical substances by application Substances 0.000 description 1
- 239000011248 coating agent Substances 0.000 description 1
- 238000002845 discoloration Methods 0.000 description 1
- 230000009969 flowable effect Effects 0.000 description 1
- 239000011888 foil Substances 0.000 description 1
- 238000003780 insertion Methods 0.000 description 1
- 230000037431 insertion Effects 0.000 description 1
- 238000003475 lamination Methods 0.000 description 1
- 238000005259 measurement Methods 0.000 description 1
- 229910052750 molybdenum Inorganic materials 0.000 description 1
- 239000011733 molybdenum Substances 0.000 description 1
- 239000003960 organic solvent Substances 0.000 description 1
- 238000005498 polishing Methods 0.000 description 1
- 230000005855 radiation Effects 0.000 description 1
- 238000002310 reflectometry Methods 0.000 description 1
- 229920005989 resin Polymers 0.000 description 1
- 239000011347 resin Substances 0.000 description 1
- 238000007650 screen-printing Methods 0.000 description 1
- 238000007789 sealing Methods 0.000 description 1
- 230000035945 sensitivity Effects 0.000 description 1
- 229920002545 silicone oil Polymers 0.000 description 1
- 238000005507 spraying Methods 0.000 description 1
- 239000004408 titanium dioxide Substances 0.000 description 1
- 238000005406 washing Methods 0.000 description 1
Landscapes
- Measurement Of Radiation (AREA)
- Apparatus For Radiation Diagnosis (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP9333838A JPH11166976A (ja) | 1997-12-04 | 1997-12-04 | Ｘ線検出器及びｘ線ｃｔ装置 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP9333838A JPH11166976A (ja) | 1997-12-04 | 1997-12-04 | Ｘ線検出器及びｘ線ｃｔ装置 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPH11166976A true JPH11166976A (ja) | 1999-06-22 |
| JPH11166976A5 JPH11166976A5 (https=) | 2005-07-21 |
Family
ID=18270515
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP9333838A Pending JPH11166976A (ja) | 1997-12-04 | 1997-12-04 | Ｘ線検出器及びｘ線ｃｔ装置 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPH11166976A (https=) |
Cited By (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2001296364A (ja) * | 2000-02-07 | 2001-10-26 | General Electric Co <Ge> | シンチレータ間反射体の自己アラインメント式ｘ線損傷シールド及びその製造方法 |
| WO2002101413A1 (en) * | 2001-06-12 | 2002-12-19 | Institute Of Whole Body Metabolism | Particle beam quantative sensor |
| US7053380B2 (en) | 2002-02-08 | 2006-05-30 | Kabushiki Kaisha Toshiba | X-ray detector and method for producing X-ray detector |
| JP2017525938A (ja) * | 2015-01-15 | 2017-09-07 | コーニンクレッカ フィリップス エヌ ヴェＫｏｎｉｎｋｌｉｊｋｅ Ｐｈｉｌｉｐｓ Ｎ．Ｖ． | 撮像検出器モジュールアセンブリ |
| CN110320546A (zh) * | 2018-03-29 | 2019-10-11 | 厦门迈通光电有限公司 | 闪烁体阵列和制备闪烁体阵列的模具及方法 |
| CN112782744A (zh) * | 2020-12-30 | 2021-05-11 | 江苏赛诺格兰医疗科技有限公司 | 一体化粘接SiPM探测器的制作方法及安装平台 |
-
1997
- 1997-12-04 JP JP9333838A patent/JPH11166976A/ja active Pending
Cited By (10)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2001296364A (ja) * | 2000-02-07 | 2001-10-26 | General Electric Co <Ge> | シンチレータ間反射体の自己アラインメント式ｘ線損傷シールド及びその製造方法 |
| WO2002101413A1 (en) * | 2001-06-12 | 2002-12-19 | Institute Of Whole Body Metabolism | Particle beam quantative sensor |
| US7053380B2 (en) | 2002-02-08 | 2006-05-30 | Kabushiki Kaisha Toshiba | X-ray detector and method for producing X-ray detector |
| JP2017525938A (ja) * | 2015-01-15 | 2017-09-07 | コーニンクレッカ フィリップス エヌ ヴェＫｏｎｉｎｋｌｉｊｋｅ Ｐｈｉｌｉｐｓ Ｎ．Ｖ． | 撮像検出器モジュールアセンブリ |
| US10217790B2 (en) | 2015-01-15 | 2019-02-26 | Koninklijke Philips N.V. | Imaging detector module assembly |
| US10680034B2 (en) | 2015-01-15 | 2020-06-09 | Koninklijke Philips N.V. | Imaging detector module assembly |
| CN110320546A (zh) * | 2018-03-29 | 2019-10-11 | 厦门迈通光电有限公司 | 闪烁体阵列和制备闪烁体阵列的模具及方法 |
| CN110320546B (zh) * | 2018-03-29 | 2024-04-19 | 厦门迈通光电有限公司 | 闪烁体阵列和制备闪烁体阵列的模具及方法 |
| CN112782744A (zh) * | 2020-12-30 | 2021-05-11 | 江苏赛诺格兰医疗科技有限公司 | 一体化粘接SiPM探测器的制作方法及安装平台 |
| CN112782744B (zh) * | 2020-12-30 | 2023-12-26 | 江苏赛诺格兰医疗科技有限公司 | 一体化粘接SiPM探测器的制作方法及安装平台 |
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Legal Events
| Date | Code | Title | Description |
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| A521 | Request for written amendment filed |
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| A977 | Report on retrieval |
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