JPH10311789A - 測光装置 - Google Patents

測光装置

Info

Publication number
JPH10311789A
JPH10311789A JP9121806A JP12180697A JPH10311789A JP H10311789 A JPH10311789 A JP H10311789A JP 9121806 A JP9121806 A JP 9121806A JP 12180697 A JP12180697 A JP 12180697A JP H10311789 A JPH10311789 A JP H10311789A
Authority
JP
Japan
Prior art keywords
photomultiplier
applied voltage
light
photometric
sensitivity
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP9121806A
Other languages
English (en)
Japanese (ja)
Other versions
JPH10311789A5 (enExample
Inventor
Ichiro Maeda
一郎 前田
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Nikon Corp
Original Assignee
Nikon Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Nikon Corp filed Critical Nikon Corp
Priority to JP9121806A priority Critical patent/JPH10311789A/ja
Publication of JPH10311789A publication Critical patent/JPH10311789A/ja
Publication of JPH10311789A5 publication Critical patent/JPH10311789A5/ja
Pending legal-status Critical Current

Links

Landscapes

  • Investigating Or Analysing Materials By Optical Means (AREA)
  • Photometry And Measurement Of Optical Pulse Characteristics (AREA)
JP9121806A 1997-05-13 1997-05-13 測光装置 Pending JPH10311789A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP9121806A JPH10311789A (ja) 1997-05-13 1997-05-13 測光装置

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP9121806A JPH10311789A (ja) 1997-05-13 1997-05-13 測光装置

Publications (2)

Publication Number Publication Date
JPH10311789A true JPH10311789A (ja) 1998-11-24
JPH10311789A5 JPH10311789A5 (enExample) 2005-03-17

Family

ID=14820399

Family Applications (1)

Application Number Title Priority Date Filing Date
JP9121806A Pending JPH10311789A (ja) 1997-05-13 1997-05-13 測光装置

Country Status (1)

Country Link
JP (1) JPH10311789A (enExample)

Cited By (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2003032451A1 (fr) * 2001-10-04 2003-04-17 Nikon Corporation Generateur de lumiere terahertzienne
JP2007064657A (ja) * 2005-08-29 2007-03-15 Arkray Inc 分析用具およびその製造方法
JP2007093249A (ja) * 2005-09-27 2007-04-12 Yokogawa Electric Corp 光量計測装置および光量計測方法
JP2009109407A (ja) * 2007-10-31 2009-05-21 Fujitsu Ltd 赤外線撮像装置
JP2010107418A (ja) * 2008-10-31 2010-05-13 Optex Co Ltd 光測定方法および装置
JP2010281842A (ja) * 2010-09-24 2010-12-16 Yokogawa Electric Corp 光量計測装置および光量計測方法
JP2011017721A (ja) * 2010-09-24 2011-01-27 Yokogawa Electric Corp 光量計測装置および光量計測方法
WO2017126170A1 (ja) * 2016-01-22 2017-07-27 ソニー株式会社 微小粒子測定装置、情報処理装置及び情報処理方法
WO2018221153A1 (ja) * 2017-06-02 2018-12-06 パイオニア株式会社 電磁波検出装置及び検出信号取得タイミングの設定方法
CN111373267A (zh) * 2018-01-26 2020-07-03 株式会社日立高新技术 自动分析装置和自动分析装置的控制方法

Cited By (14)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2003032451A1 (fr) * 2001-10-04 2003-04-17 Nikon Corporation Generateur de lumiere terahertzienne
JP2007064657A (ja) * 2005-08-29 2007-03-15 Arkray Inc 分析用具およびその製造方法
JP2007093249A (ja) * 2005-09-27 2007-04-12 Yokogawa Electric Corp 光量計測装置および光量計測方法
JP2009109407A (ja) * 2007-10-31 2009-05-21 Fujitsu Ltd 赤外線撮像装置
JP2010107418A (ja) * 2008-10-31 2010-05-13 Optex Co Ltd 光測定方法および装置
JP2011017721A (ja) * 2010-09-24 2011-01-27 Yokogawa Electric Corp 光量計測装置および光量計測方法
JP2010281842A (ja) * 2010-09-24 2010-12-16 Yokogawa Electric Corp 光量計測装置および光量計測方法
WO2017126170A1 (ja) * 2016-01-22 2017-07-27 ソニー株式会社 微小粒子測定装置、情報処理装置及び情報処理方法
JPWO2017126170A1 (ja) * 2016-01-22 2018-11-15 ソニー株式会社 微小粒子測定装置、情報処理装置及び情報処理方法
US10942108B2 (en) 2016-01-22 2021-03-09 Sony Corporation Fine particle measurement apparatus, information processing apparatus, and information processing method
WO2018221153A1 (ja) * 2017-06-02 2018-12-06 パイオニア株式会社 電磁波検出装置及び検出信号取得タイミングの設定方法
US10914631B2 (en) 2017-06-02 2021-02-09 Pioneer Corporation Electromagnetic wave detecting apparatus and method of setting acquisition timing of detection signal
CN111373267A (zh) * 2018-01-26 2020-07-03 株式会社日立高新技术 自动分析装置和自动分析装置的控制方法
CN111373267B (zh) * 2018-01-26 2023-10-24 株式会社日立高新技术 自动分析装置和自动分析装置的控制方法

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