JPH10282172A - Electronic apparatus and its measuring method - Google Patents
Electronic apparatus and its measuring methodInfo
- Publication number
- JPH10282172A JPH10282172A JP9087812A JP8781297A JPH10282172A JP H10282172 A JPH10282172 A JP H10282172A JP 9087812 A JP9087812 A JP 9087812A JP 8781297 A JP8781297 A JP 8781297A JP H10282172 A JPH10282172 A JP H10282172A
- Authority
- JP
- Japan
- Prior art keywords
- hole
- housing
- cover
- electronic device
- test pin
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/04—Housings; Supporting members; Arrangements of terminals
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/06—Measuring leads; Measuring probes
Abstract
Description
【０００１】[0001]
【発明の属する技術分野】本発明は、テレビチューナ等
に使用される電子機器、並びにその電子機器の検査、或
いは調整等のための測定方法に関する。BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to an electronic device used for a television tuner or the like, and a measuring method for inspecting or adjusting the electronic device.
【０００２】[0002]
【従来の技術】従来におけるチューナ等の電子機器は、
図４に示すように、上下両側に開放部３１ａを有する口
型の枠体３１と、矩形状をなし、下方に折り曲げられた
挟持片３２ａを有する上部のカバー３２と、挟持片３３
ａを有する下部のカバー３３を備えている。そして、枠
体３１の開放部３１ａを塞ぐように、上下のカバー３
２、３３を枠体３１に被せ、挟持片３２ａ、３３ａで枠
体３１を挟持して、箱形の筺体３０が構成されている。2. Description of the Related Art Conventional electronic devices such as tuners are:
As shown in FIG. 4, a mouth-shaped frame body 31 having open portions 31 a on both upper and lower sides, an upper cover 32 having a rectangular shape and holding a holding piece 32 a bent downward, and a holding piece 33
and a lower cover 33 having a. Then, the upper and lower covers 3 are closed so as to close the open portion 31a of the frame 31.
The box-shaped housing 30 is formed by putting the frames 2 and 33 on the frame 31 and holding the frame 31 between the holding pieces 32a and 33a.
【０００３】また、プリント基板３４には、所望の回路
パターン３５が形成され、ここでは図示しないが、コイ
ル、抵抗器、コンデンサ等の電気部品がプリント基板３
４に搭載されて、これらの電気部品が回路パターン３５
に接続された構成となっている。そして、このように電
気部品が搭載されたプリント基板３４は、筺体３０内に
収納されて取り付けられている。また、下部のカバー３
３には、筺体３０内に取り付けられたプリント基板３４
の一部の回路パターン３５と対向する位置に、孔３３ｂ
が設けられた構成となっている。A desired circuit pattern 35 is formed on the printed circuit board 34. Although not shown here, electrical components such as coils, resistors, and capacitors are mounted on the printed circuit board 3.
4 and these electric components are mounted on the circuit pattern 35.
It is configured to be connected to The printed circuit board 34 on which the electric components are mounted as described above is housed and mounted in the housing 30. Also, the lower cover 3
3 includes a printed circuit board 34 mounted in the housing 30.
A hole 33b is provided at a position facing a part of the circuit pattern 35.
Is provided.
【０００４】そして、このような構成を有する電子機器
は、組み立てられた完成後、所望の電気的特性、或いは
性能等を備えているかどうかを、特定の回路の部分で測
定、検査される。そして、この測定、検査により、必要
に応じて、コイル等の調整を行い、所望の特性、性能の
電子機器を得るものである。After the electronic device having such a configuration is assembled and completed, whether or not it has desired electrical characteristics or performance is measured and inspected in a specific circuit portion. Then, the coil and the like are adjusted as necessary by the measurement and inspection to obtain an electronic device having desired characteristics and performance.
【０００５】そして、前述のような測定のための電子機
器の測定装置は、図４に示すように、電子機器を保持す
るための保持台４０には、電子機器を受けるための凹部
４０ａと、孔４０ｂとが設けられている。また、治具
（図示せず）に移動可能に取り付けられた可動部４１に
は、絶縁体４２を介してテストピン４３が取り付けら
れ、手動によって可動体４１を動かし、テストピン４３
を、保持台４０の孔４０ｂに出し入れするようにしてい
る。[0005] As shown in FIG. 4, the measuring device of the electronic device for measurement as described above has a holding table 40 for holding the electronic device, a recess 40 a for receiving the electronic device, A hole 40b is provided. A test pin 43 is attached to a movable portion 41 movably attached to a jig (not shown) via an insulator 42. The movable member 41 is manually moved, and the test pin 43 is moved.
Into and out of the hole 40b of the holding table 40.
【０００６】そして、従来における電子機器の測定方法
は、図５に示すように、先ず、電子機器を保持台４０の
凹部４０ａ内に載置する。次に、可動体４１を、図４の
状態から図５に示すように、治具をガイドにして、手動
により上方に移動する。この時、テストピン４３がカバ
ー３３に接触しないように、電子機器を手で移動して調
整しながら、カバー３３の孔３３ｂにテストピン４３を
挿入し、テストピン４３の先端を回路パターン３５に接
触させる。そして、この状態で電子機器の特性、性能等
を測定、検査し、必要に応じて電子機器の調整を行う。
そして、測定、検査後、可動体４１を図４に示すような
状態に移動すると、電子機器の測定が完了する。[0006] In a conventional method for measuring an electronic device, first, as shown in FIG. 5, the electronic device is placed in a recess 40 a of a holding table 40. Next, the movable body 41 is manually moved upward from the state shown in FIG. 4 using the jig as a guide as shown in FIG. At this time, the test pin 43 is inserted into the hole 33 b of the cover 33 while moving and adjusting the electronic device by hand so that the test pin 43 does not contact the cover 33, and the tip of the test pin 43 is connected to the circuit pattern 35. Make contact. Then, in this state, the characteristics, performance, and the like of the electronic device are measured and inspected, and the electronic device is adjusted as necessary.
After the measurement and inspection, when the movable body 41 is moved to a state as shown in FIG. 4, the measurement of the electronic device is completed.
【０００７】[0007]
【発明が解決しようとする課題】従来の電子機器は、カ
バー３３には、回路パターン３５に対向する孔３３ｂだ
けが設けられるものであるため、測定時に、電子機器を
移動、調整せねば成らず、その作業が面倒で、測定作業
に手間がかかるという問題がある。また、従来の測定方
法は、保持台４０に電子機器を載置し、手動による可動
体４１によって、テストピン４３をカバー３３の孔３３
ａに挿入するため、電子機器の位置決めが不確実で、電
子機器の手動による調整が必要で、また、可動体４１が
手動による移動であるため、その作業が面倒で、測定作
業に手間がかかり、生産性が悪いという問題がある。In the conventional electronic device, the cover 33 is provided with only the hole 33b facing the circuit pattern 35, so that the electronic device must be moved and adjusted at the time of measurement. However, there is a problem that the work is troublesome and the measurement work is troublesome. In the conventional measurement method, an electronic device is placed on a holding table 40 and a test pin 43 is manually moved by a movable body 41 to a hole 33 of a cover 33.
a, the positioning of the electronic device is uncertain, manual adjustment of the electronic device is required, and since the movable body 41 is manually moved, the operation is troublesome, and the measurement operation takes time and effort. However, there is a problem that productivity is low.
【０００８】[0008]
【課題を解決するための手段】上記課題を解決するため
に第１の解決手段として、上下両側に開放部を有する四
角枠状の枠体と、該枠体の開放部を覆うカバーとで形成
された箱形の筺体と、前記筺体内に配置され、回路パタ
ーンを有するプリント基板とを備え、該プリント基板の
回路パターンに対向する位置において、前記カバーに孔
を設けると共に、前記筺体の上下方向において直線状
で、前記筺体を貫通する孔を、前記プリント基板と前記
カバーとに設けた構成とした。また、第２の解決手段と
して、開放部と底壁とを有するＵ字型の枠体と、該枠体
の開放部を覆うカバーとで形成された箱形の筺体と、前
記筺体内に配置され、回路パターンを有するプリント基
板とを備え、該プリント基板の回路パターンに対向する
位置において、前記カバー、或いは前記底壁に孔を設け
ると共に、前記筺体の上下方向において直線状で、前記
筺体を貫通する孔を、前記プリント基板と前記カバーと
前記底壁とに設けた構成とした。また、第３の解決手段
として、前記筺体を貫通する前記孔を複数個設けた構成
とした。また、第４の解決手段として、筺体の上下方向
において直線状で、筺体を貫通して設けられた一個、又
は複数個の第１の孔と、前記筺体内に配置されたプリン
ト基板に形成された回路パターンに対向してカバー、又
は底壁に設けられた第２の孔を有する電子機器の、前記
第１の孔にガイド棒を挿入した状態で、前記第２の孔に
テストピンを挿入し、該テストピンを前記回路パターン
に接触させた方法とした。また、第５の解決手段とし
て、前記ガイド棒とテストピンとを支持した支持部材を
駆動して、前記ガイド棒と前記テストピンを同時に駆動
するようにした方法とした。また、第６の解決手段とし
て、前記ガイド棒の先端に設けた円錐状部側から、前記
第１の孔にガイド棒を挿入するようにした方法とした。
更に、第７の解決手段として、前記支持部材に対して前
記テストピンを上下動可能とし、該テストピンが前記回
路パターンに接触した後、テストピンは移動を停止する
と共に、前記支持部材は移動できるようにした方法とし
た。Means for Solving the Problems As a first means for solving the above problems, a square frame having open portions on both upper and lower sides and a cover covering the open portion of the frame are provided. A box-shaped housing, and a printed circuit board arranged in the housing and having a circuit pattern. At a position facing the circuit pattern of the printed circuit board, a hole is provided in the cover, and a vertical direction of the housing is provided. In the above, a configuration in which a hole that is linear and passes through the housing is provided in the printed circuit board and the cover. Further, as a second solution, a box-shaped housing formed of a U-shaped frame having an open portion and a bottom wall, and a cover covering the open portion of the frame, A printed circuit board having a circuit pattern, and a hole is formed in the cover or the bottom wall at a position facing the circuit pattern of the printed circuit board, and the casing is linearly formed in a vertical direction of the casing. The through holes are provided in the printed circuit board, the cover, and the bottom wall. As a third solution, a plurality of the holes penetrating the housing are provided. As a fourth solution, one or a plurality of first holes provided linearly in the vertical direction of the housing and penetrating the housing and formed on a printed circuit board arranged in the housing. The test pin is inserted into the second hole of the electronic device having the cover or the second hole provided on the bottom wall facing the circuit pattern with the guide rod inserted into the first hole. Then, the test pin was brought into contact with the circuit pattern. Further, as a fifth solving means, a method is adopted in which a support member supporting the guide bar and the test pin is driven to drive the guide bar and the test pin simultaneously. As a sixth solution, a guide rod is inserted into the first hole from the conical portion provided at the tip of the guide rod.
Further, as a seventh solution, the test pin can be moved up and down with respect to the support member, and after the test pin comes into contact with the circuit pattern, the test pin stops moving and the support member moves. The method was made possible.
【０００９】[0009]
【発明の実施の形態】次に、本発明の電子機器、並びに
その電子機器の測定方法の一実施例を、図１、図２に基
づいて説明すると、図１は、本発明の電子機器、並びに
電子機器の測定装置を示す要部断面図、図２は、電子機
器の測定方法を示す説明図である。そして、本発明にお
ける電子機器は、図１に示すように、上下両側に開放部
２ａ、２ｂを有する四角枠状の枠体２と、矩形状をな
し、下方に折り曲げられた挟持片３ａを有する上部のカ
バー３と、挟持片４ａを有する下部のカバー４を備えて
いる。そして、枠体２の開放部２ａを塞ぐように上部の
カバー３を、また、枠体２の開放部２ｂを塞ぐように下
部のカバー４を、それぞれ枠体２に被せ、挟持片３ａ、
４ａで枠体２を挟持して、箱形の筺体１が構成されてい
る。DETAILED DESCRIPTION OF THE PREFERRED EMBODIMENTS Next, an embodiment of an electronic device of the present invention and a method of measuring the electronic device will be described with reference to FIGS. 1 and 2. FIG. FIG. 2 is a sectional view of a main part showing a measuring device of an electronic device, and FIG. 2 is an explanatory diagram showing a measuring method of the electronic device. As shown in FIG. 1, the electronic device according to the present invention includes a rectangular frame 2 having open portions 2a and 2b on both upper and lower sides, and a holding piece 3a which is rectangular and bent downward. An upper cover 3 and a lower cover 4 having a holding piece 4a are provided. Then, the upper cover 3 is placed on the frame 2 so as to cover the open portion 2a of the frame 2, and the lower cover 4 is placed on the frame 2 so as to cover the open portion 2b of the frame 2, respectively.
A box-shaped housing 1 is formed by holding the frame 2 at 4a.
【００１０】また、プリント基板５には、所望の配線用
パターン、及び測定用ランドから成る回路パターン６が
形成され、ここでは図示しないが、コイル、抵抗器、コ
ンデンサ等の電気部品がプリント基板５に搭載されて、
これらの電気部品が回路パターン６に接続された構成と
なっている。そして、このように電気部品が搭載された
プリント基板３４は、筺体３０内に収納されて取り付け
られている。また、下部のカバー４には、筺体１内に取
り付けられたプリント基板５の一部の回路パターン６と
対向する位置に、孔４ｂが設けられた構成となってい
る。更に、上下のカバー３と４、及びプリント基板５に
は、筺体１の上下方向において直線状で、筺体１を貫通
する円形の孔３ｃ，４ｃ，５ｃが設けられており、この
孔３ｃ，４ｃ，５ｃは、筺体１に複数個形成されてお
り、この実施例では２個所、設けたものと成っている。On the printed circuit board 5, a circuit pattern 6 composed of a desired wiring pattern and a measurement land is formed. Although not shown here, electrical components such as coils, resistors, and capacitors are formed on the printed circuit board 5. Mounted on
These electric components are connected to the circuit pattern 6. The printed circuit board 34 on which the electric components are mounted as described above is housed and mounted in the housing 30. The lower cover 4 has a configuration in which a hole 4b is provided at a position facing a part of the circuit pattern 6 of the printed circuit board 5 mounted in the housing 1. Further, the upper and lower covers 3 and 4 and the printed circuit board 5 are provided with circular holes 3c, 4c, 5c which are linear in the vertical direction of the housing 1 and penetrate the housing 1, and these holes 3c, 4c are provided. , 5c are formed in the housing 1 in a plural number. In this embodiment, two parts are provided.
【００１１】そして、このような構成を有する電子機器
は、組み立てられた完成後、所望の電気的特性、或いは
性能等を備えているかどうかを、特定の回路の部分で測
定、検査される。そして、この測定、検査により、必要
に応じて、コイル等の調整を行い、所望の特性、性能の
電子機器を得るものである。After the electronic device having such a configuration is assembled and completed, whether or not it has desired electrical characteristics or performance is measured and inspected in a specific circuit portion. Then, the coil and the like are adjusted as necessary by the measurement and inspection to obtain an electronic device having desired characteristics and performance.
【００１２】そして、前述のような測定のための電子機
器の測定装置は、図１に示すように、電子機器を保持す
るための保持台１０には、電子機器を受けるための凹部
１０ａと、孔１０ｂとが設けられている。また、取付部
（図示せず）に移動可能に取り付けられた支持部材１１
には、先端に円錐状部１２ａを有する複数個の円柱のガ
イド棒１２と、テストピン１３を取り付けた絶縁体１４
とが取り付けられている。また、絶縁体１４は、その鍔
部１４ａと支持部材１１との間にバネ１５が設けられ、
支持部材１１を挟んで反対側に留め具１６を設けること
によって、テストピン１３と共に上下動可能に、支持部
材１１に取り付けられている。また、モータ等の駆動部
材１７が設けられ、この駆動部材１７に設けられた可動
部１７ａが支持部材１１と関連づけられ、駆動部材１７
の駆動により、可動部１７ａを介して支持部材１１を上
下動するようになっている。As shown in FIG. 1, the measuring device of the electronic device for measurement as described above has a holding table 10 for holding the electronic device, a concave portion 10a for receiving the electronic device, A hole 10b is provided. Further, a support member 11 movably attached to an attachment portion (not shown).
A plurality of cylindrical guide rods 12 each having a conical portion 12a at the tip thereof, and an insulator 14 having a test pin 13 attached thereto.
And are attached. Further, the insulator 14 is provided with a spring 15 between the flange portion 14a and the support member 11,
By providing a fastener 16 on the opposite side of the support member 11, the support member 11 is attached to the support member 11 so as to be able to move up and down together with the test pin 13. Further, a driving member 17 such as a motor is provided, and a movable portion 17a provided on the driving member 17 is associated with the supporting member 11, and the driving member 17 is provided.
Drives the support member 11 up and down via the movable portion 17a.
【００１３】そして、上述のような構成を有する本発明
の測定装置における電子機器の測定方法は、図２に示す
ように、先ず、電子機器を保持台１０の凹部１０ａ内に
載置、保持する。次に、図１に状態で駆動部材１７を駆
動して、可動部１７ａで支持部材１１を上方に移動す
る。すると、先ず、ガイド棒１２の円錐状部１２ａが、
カバー４の孔４ｃ内に挿入されながら上方に移動して、
このガイド棒１２によって、カバー４の孔４ｂとテスト
ピン１３との位置決めが確実になされる。更に、駆動部
材１７により支持部材１１を上方に移動すると、ガイド
棒１２は順次プリント基板５の孔５ｃ，カバー３の孔３
ｃに挿入、貫通して電子機器の位置決めを正確に行うよ
うになる。そして、その間に、テストピン１３は、カバ
ー４に接触すると無く孔４ｂに挿通されて、その先端が
回路パターン６に接触する。また、このテストピン１３
が回路パターン６に接触した後、支持部材１１が上方に
移動したときは、テストピン１３は、バネ１５によって
その位置を保持できるようになり、図２に示すような状
態となる。そして、この図２の状態で電子機器の特性、
性能等を測定、検査し、必要に応じて電子機器の調整を
行う。そして、測定、検査後、駆動部材１７を駆動し
て、支持部材１１を、図２の状態から図１の状態に移動
すると、電子機器の測定が完了する。As shown in FIG. 2, in the method for measuring an electronic device in the measuring apparatus of the present invention having the above-described configuration, first, the electronic device is placed and held in the concave portion 10a of the holding base 10. . Next, the driving member 17 is driven in the state shown in FIG. 1, and the supporting member 11 is moved upward by the movable portion 17a. Then, first, the conical portion 12a of the guide rod 12
It moves upward while being inserted into the hole 4c of the cover 4, and
The positioning of the test pin 13 with the hole 4b of the cover 4 is ensured by the guide rod 12. Further, when the support member 11 is moved upward by the driving member 17, the guide rods 12 are sequentially turned into the holes 5c of the printed circuit board 5 and the holes 3c of the cover 3.
The electronic device can be accurately positioned by penetrating and penetrating into c. In the meantime, the test pin 13 is inserted into the hole 4 b without contacting the cover 4, and the tip of the test pin 13 contacts the circuit pattern 6. In addition, this test pin 13
When the support member 11 moves upward after the contact of the test pin 13 with the circuit pattern 6, the test pin 13 can be held at the position by the spring 15 and is in a state as shown in FIG. The characteristics of the electronic device in the state of FIG.
Measure and inspect performance, etc., and adjust electronic equipment as necessary. After the measurement and inspection, when the driving member 17 is driven to move the support member 11 from the state of FIG. 2 to the state of FIG. 1, the measurement of the electronic device is completed.
【００１４】図３は、本発明の電子機器の他の実施例を
示し、前記実施例の下部のカバー４に代えて、筺体１を
構成する枠体２に底壁２ｃを設け、この底壁２ｃに、回
路パターン６と対向するテストピン１３の挿通用の孔２
ｄを設けると共に、プリント基板６の孔５ｃに対向する
複数個の孔２ｅを設け、この孔２ｅをガイド棒１２の挿
通用としたもので、その他の構成は前記の実施例と同様
であり、ここでは同一部品に同一番号を付して、その説
明を省略する。そして、このような電子機器において
も、前述した測定装置により同様の方法により、その測
定を行うものである。FIG. 3 shows another embodiment of the electronic apparatus according to the present invention. A bottom wall 2c is provided on a frame 2 constituting a housing 1 in place of the lower cover 4 of the above embodiment. 2c, a hole 2 for inserting the test pin 13 facing the circuit pattern 6 is provided.
d, and a plurality of holes 2e facing the holes 5c of the printed circuit board 6 are provided, and the holes 2e are used for inserting the guide rods 12. Other configurations are the same as those of the above-described embodiment. Here, the same components are denoted by the same reference numerals, and description thereof is omitted. In such an electronic device, the measurement is performed by the above-described measuring device in the same manner.
【００１５】また、電子機器は、種々の大きさのものが
存在し、これに伴い、上下方向の高さの異なる種類が存
在する。そして、筺体１の上下方向で、筺体１を貫通す
る孔を設けることにより、高さが低いものは、ガイド棒
１２が筺体１を貫通し、高さが高いものは、ガイド棒１
２の先端が筺体１内に位置することにより、高さの異な
る筺体１であっても、ガイド棒１２を共用できるものと
成っている。Also, there are electronic devices of various sizes, and accordingly, there are types of electronic devices having different vertical heights. By providing holes that penetrate the housing 1 in the vertical direction of the housing 1, the guide rod 12 penetrates the housing 1 when the height is low and the guide rod 1 when the height is high.
Since the two tips are located in the housing 1, the guide rods 12 can be shared even in the housings 1 having different heights.
【００１６】[0016]
【発明の効果】本発明の電子機器は、プリント基板とカ
バーに、筺体の上下方向で、筺体を貫通する孔を設けた
ため、この孔を測定時の位置決め用として利用できて、
測定作業を容易にし、作業の短縮化を図ることが出来
る。また、筺体を貫通する孔を設けることより、筺体の
高さの異なるものにおいても、同じ測定装置が共用でき
る。また、プリント基板と枠体の底壁に、筺体の上下方
向で、筺体を貫通する孔を設けたため、この孔を測定時
の位置決め用として利用できて、測定作業を容易にし、
作業の短縮化を図ることが出来る。また、筺体を貫通す
る孔を設けることより、筺体の高さの異なるものにおい
ても、同じ測定装置が共用できる。また、筺体を貫通す
る孔を複数個設けることにより、筺体の位置決めを、よ
り正確に出来、更に、作業の確実性と短縮化を図ること
が出来る。また、本発明の測定方法は、筺体を貫通する
孔にガイド棒を挿入して、測定を行うようにしたため、
ガイド棒で筺体の位置決めが出来、測定作業を容易に
し、作業の短縮化を図ることが出来る。また、ガイド棒
とテストピンを同時に支持部材で移動するようにしたた
め、筺体を所定の位置に位置決めしながら、テストピン
が回路パターンに接触することが出来、その作業が極め
て簡単、容易となり、作業性を向上することが出来る。
また、ガイド棒の先端に円錐状部を設けることにより、
ガイド棒の孔への挿入を容易にし、孔へのガイド棒の挿
入動作をより確実に行うことが出来る。更に、支持部材
に対してテストピンを上下動可能にすることによって、
プリント基板の取付誤差、或いは若干の取付位置の変更
においても、テストピンが回路パターンに追従して接触
させることが出来ると共に、テストピンが回路パターン
に接触した後でも、支持部材の移動が可能となり、ガイ
ド棒の移動に融通性を持たせることが出来、位置決めと
接触を確実にすることが出来る。According to the electronic apparatus of the present invention, the printed circuit board and the cover are provided with holes penetrating the housing in the up-down direction of the housing, and these holes can be used for positioning at the time of measurement.
The measurement operation can be facilitated and the operation can be shortened. Further, by providing a hole that penetrates through the housing, the same measuring device can be shared even when the height of the housing is different. In addition, since holes are provided in the bottom wall of the printed circuit board and the frame in the vertical direction of the housing, the holes can be used for positioning during measurement, facilitating the measurement work,
Work can be shortened. Further, by providing a hole that penetrates through the housing, the same measuring device can be shared even when the height of the housing is different. In addition, by providing a plurality of holes penetrating the housing, the positioning of the housing can be performed more accurately, and the reliability and shortening of the operation can be achieved. In addition, in the measurement method of the present invention, a guide rod is inserted into a hole that penetrates the housing, and the measurement is performed.
The housing can be positioned by the guide bar, which facilitates the measurement work and shortens the work. In addition, since the guide rod and the test pin are simultaneously moved by the support member, the test pin can come into contact with the circuit pattern while the housing is positioned at a predetermined position, making the operation extremely simple and easy. Performance can be improved.
Also, by providing a conical portion at the tip of the guide rod,
The guide rod can be easily inserted into the hole, and the operation of inserting the guide rod into the hole can be performed more reliably. Furthermore, by allowing the test pin to move up and down with respect to the support member,
The test pin can follow the circuit pattern even if the mounting error of the printed circuit board or the mounting position is slightly changed, and the support member can be moved even after the test pin contacts the circuit pattern. In addition, flexibility in the movement of the guide rod can be provided, and positioning and contact can be ensured.
【図１】本発明の電子機器、並びにその電子機器の測定
装置を示す要部断面図。FIG. 1 is an essential part cross-sectional view showing an electronic device of the present invention and a measuring device of the electronic device.
【図２】本発明の電子機器の測定方法を示す説明図。FIG. 2 is an explanatory diagram showing a method for measuring an electronic device of the present invention.
【図３】本発明の電子機器の他の実施例を示す要部断面
図。FIG. 3 is a sectional view of a main part showing another embodiment of the electronic apparatus of the present invention.
【図４】従来の電子機器、並びにその電子機器の測定装
置を示す要部断面図。FIG. 4 is an essential part cross-sectional view showing a conventional electronic device and a measuring device of the electronic device.
【図５】従来の電子機器の測定方法を示す説明図。FIG. 5 is an explanatory view showing a conventional method for measuring an electronic device.
１ 筺体 ２ 枠体 ２ａ 開放部 ２ｂ 開放部 ２ｃ 底壁 ２ｄ 孔 ２ｅ 孔 ３ カバー ３ａ 挟持片 ３ｃ 孔 ４ カバー ４ａ 挟持片 ４ｂ 孔 ４ｃ 孔 ５ プリント基板 ５ｃ 孔 ６ 回路パターン １０ 保持台 １０ａ 凹部 １０ｂ 孔 １１ 支持部材 １２ ガイド棒 １２ａ 円錐状部 １３ テストピン １４ 絶縁体 １４ａ 鍔部 １５ バネ １６ 留め具 １７ 駆動部材 １７ａ 可動部 DESCRIPTION OF SYMBOLS 1 Housing 2 Frame 2a Open part 2b Open part 2c Bottom wall 2d hole 2e hole 3 Cover 3a Nipping piece 3c hole 4 Cover 4a Nipping piece 4b hole 4c hole 5 Printed circuit board 5c hole 6 Circuit pattern 10 Holder 10a recess 10b hole Support member 12 Guide rod 12a Conical part 13 Test pin 14 Insulator 14a Flange part 15 Spring 16 Fastener 17 Drive member 17a Movable part
───────────────────────────────────────────────────── フロントページの続き (72)発明者 小関 正彦 東京都大田区雪谷大塚町１番７号 アルプ ス電気株式会社内 ────────────────────────────────────────────────── ─── Continuing on the front page (72) Inventor Masahiko Koseki 1-7 Yukitani Otsuka-cho, Ota-ku, Tokyo Alps Electric Co., Ltd.
Claims (7)
体と、該枠体の開放部を覆うカバーとで形成された箱形
の筺体と、前記筺体内に配置され、回路パターンを有す
るプリント基板とを備え、該プリント基板の回路パター
ンに対向する位置において、前記カバーに孔を設けると
共に、前記筺体の上下方向において直線状で、前記筺体
を貫通する孔を、前記プリント基板と前記カバーとに設
けたことを特徴とする電子機器。1. A box-shaped housing formed by a square frame having an opening on both the upper and lower sides, a cover covering the opening of the frame, and a circuit pattern disposed in the housing and having a circuit pattern formed therein. And a hole in the cover at a position facing the circuit pattern of the printed board, and a hole that passes through the housing in a straight line in the up-down direction of the housing. An electronic device, wherein the electronic device is provided on a cover.
と、該枠体の開放部を覆うカバーとで形成された箱形の
筺体と、前記筺体内に配置され、回路パターンを有する
プリント基板とを備え、該プリント基板の回路パターン
に対向する位置において、前記カバー、或いは前記底壁
に孔を設けると共に、前記筺体の上下方向において直線
状で、前記筺体を貫通する孔を、前記プリント基板と前
記カバーと前記底壁とに設けたことを特徴とする電子機
器。2. A box-shaped housing formed by a U-shaped frame having an open portion and a bottom wall, a cover covering the open portion of the frame, and a circuit pattern disposed in the housing. And a hole in the cover or the bottom wall at a position facing the circuit pattern of the printed circuit board, and a hole that passes through the housing in a straight line in the vertical direction of the housing. An electronic device provided on the printed circuit board, the cover, and the bottom wall.
たことを特徴とする請求項１、又は２記載の電子機器。3. The electronic device according to claim 1, wherein a plurality of the holes penetrating the housing are provided.
を貫通して設けられた一個、又は複数個の第１の孔と、
前記筺体内に配置されたプリント基板に形成された回路
パターンに対向してカバー、又は底壁に設けられた第２
の孔を有する電子機器の、前記第１の孔にガイド棒を挿
入した状態で、前記第２の孔にテストピンを挿入し、該
テストピンを前記回路パターンに接触させたことを特徴
とする電子機器の測定方法。4. One or more first holes provided linearly in the vertical direction of the housing and penetrating the housing,
A second cover provided on a cover or a bottom wall facing a circuit pattern formed on a printed circuit board disposed in the housing.
A test pin is inserted into the second hole with the guide rod inserted into the first hole, and the test pin is brought into contact with the circuit pattern in the electronic device having the hole How to measure electronic equipment.
支持部材を駆動して、前記ガイド棒と前記テストピンを
同時に駆動するようにしたことを特徴とする請求項４記
載の電子機器の測定方法。5. The method for measuring an electronic device according to claim 4, wherein a supporting member that supports the guide bar and the test pin is driven to simultaneously drive the guide bar and the test pin. .
から、前記第１の孔にガイド棒を挿入するようにしたこ
とを特徴とする請求項４、又は５記載の電子機器の測定
方法。6. The measurement of an electronic device according to claim 4, wherein the guide rod is inserted into the first hole from the side of the conical part provided at the tip of the guide rod. Method.
上下動可能とし、該テストピンが前記回路パターンに接
触した後、テストピンは移動を停止すると共に、前記支
持部材は移動できるようにしたことを特徴とする請求項
５、又は６記載の電子機器の測定方法。7. The test pin can be moved up and down with respect to the support member, and after the test pin comes into contact with the circuit pattern, the test pin stops moving and the support member can move. 7. The method for measuring an electronic device according to claim 5, wherein:
Priority Applications (6)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP9087812A JPH10282172A (en) | 1997-04-07 | 1997-04-07 | Electronic apparatus and its measuring method |
| MYPI9801112 MY129515A (en) | 1997-04-07 | 1998-03-13 | Electronic device and method for measuring the electronic device |
| GB9805395A GB2326772B (en) | 1997-04-07 | 1998-03-16 | Electronic device and method for measuring the electronic device |
| CN98101241A CN1102019C (en) | 1997-04-07 | 1998-04-03 | Electronic device and detecting method thereof |
| KR1019980012028A KR19980081120A (en) | 1997-04-07 | 1998-04-06 | Electronic device and measuring method of the electronic device |
| MXPA/A/1998/002725A MXPA98002725A (en) | 1997-04-07 | 1998-04-06 | Electronic device and method for measuring the electron device |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP9087812A JPH10282172A (en) | 1997-04-07 | 1997-04-07 | Electronic apparatus and its measuring method |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPH10282172A true JPH10282172A (en) | 1998-10-23 |
Family
ID=13925398
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP9087812A Pending JPH10282172A (en) | 1997-04-07 | 1997-04-07 | Electronic apparatus and its measuring method |
Country Status (5)
| Country | Link |
|---|---|
| JP (1) | JPH10282172A (en) |
| KR (1) | KR19980081120A (en) |
| CN (1) | CN1102019C (en) |
| GB (1) | GB2326772B (en) |
| MY (1) | MY129515A (en) |
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| WO2006030573A1 (en) * | 2004-09-13 | 2006-03-23 | Mitsubishi Denki Kabushiki Kaisha | Circuit board inspecting apparatus |
| CN112711244A (en) * | 2020-12-18 | 2021-04-27 | 张雪梅 | Quick detection equipment for automobile electric tail gate control unit |
Families Citing this family (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US6066957A (en) * | 1997-09-11 | 2000-05-23 | Delaware Capital Formation, Inc. | Floating spring probe wireless test fixture |
| JP3648455B2 (en) * | 1998-12-04 | 2005-05-18 | フォームファクター，インコーポレイテッド | Electronic component mounting method |
| CN101784166A (en) * | 2010-03-05 | 2010-07-21 | 苏州工业园区时代华龙科技有限公司 | PCB (Printed Circuit Board) art border structure |
Family Cites Families (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS5928348A (en) * | 1982-08-09 | 1984-02-15 | Hitachi Ltd | Detecting device for product containable quantity |
| DE3723570A1 (en) * | 1986-08-29 | 1989-01-26 | Siemens Ag | CONTACTING DEVICE IN THE FORM OF A SOCIAL NEEDLE CARD FOR HIGH-POLE COMPONENTS OF MICROELECTRONICS TO BE TESTED |
| JPH0775817B2 (en) * | 1989-02-27 | 1995-08-16 | 富士機械製造株式会社 | Electronic component holding position detector |
| JP2937785B2 (en) * | 1995-02-02 | 1999-08-23 | ヤマハ発動機株式会社 | Component state detection device for mounting machine |
-
1997
- 1997-04-07 JP JP9087812A patent/JPH10282172A/en active Pending
-
1998
- 1998-03-13 MY MYPI9801112 patent/MY129515A/en unknown
- 1998-03-16 GB GB9805395A patent/GB2326772B/en not_active Expired - Fee Related
- 1998-04-03 CN CN98101241A patent/CN1102019C/en not_active Expired - Fee Related
- 1998-04-06 KR KR1019980012028A patent/KR19980081120A/en not_active Application Discontinuation
Cited By (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| WO2006030573A1 (en) * | 2004-09-13 | 2006-03-23 | Mitsubishi Denki Kabushiki Kaisha | Circuit board inspecting apparatus |
| JP2006080435A (en) * | 2004-09-13 | 2006-03-23 | Mitsubishi Electric Corp | Inspection device for circuit board |
| CN112711244A (en) * | 2020-12-18 | 2021-04-27 | 张雪梅 | Quick detection equipment for automobile electric tail gate control unit |
| CN112711244B (en) * | 2020-12-18 | 2022-01-14 | 上海勤达科技有限公司 | Quick detection equipment for automobile electric tail gate control unit |
Also Published As
| Publication number | Publication date |
|---|---|
| CN1102019C (en) | 2003-02-19 |
| GB2326772A (en) | 1998-12-30 |
| KR19980081120A (en) | 1998-11-25 |
| GB2326772B (en) | 2001-07-11 |
| MY129515A (en) | 2007-04-30 |
| GB9805395D0 (en) | 1998-05-06 |
| MX9802725A (en) | 1998-12-31 |
| CN1195964A (en) | 1998-10-14 |
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