GB2326772A - Electronic device and method for measuring the electronic device - Google Patents
Electronic device and method for measuring the electronic device Download PDFInfo
- Publication number
- GB2326772A GB2326772A GB9805395A GB9805395A GB2326772A GB 2326772 A GB2326772 A GB 2326772A GB 9805395 A GB9805395 A GB 9805395A GB 9805395 A GB9805395 A GB 9805395A GB 2326772 A GB2326772 A GB 2326772A
- Authority
- GB
- United Kingdom
- Prior art keywords
- electronic device
- housing
- test pin
- hole
- measuring
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/04—Housings; Supporting members; Arrangements of terminals
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/06—Measuring leads; Measuring probes
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Tests Of Electronic Circuits (AREA)
- Measuring Leads Or Probes (AREA)
- Mounting Of Printed Circuit Boards And The Like (AREA)
- Testing Electric Properties And Detecting Electric Faults (AREA)
- Testing, Inspecting, Measuring Of Stereoscopic Televisions And Televisions (AREA)
- Casings For Electric Apparatus (AREA)
Description
2326772 ELECTRONIC DEVICE AND METHOD FOR MEASURING THE ELECTRONIC DEVICE
The present invention relates to an electronic device used for a television tuner or the like and a method for measuring the electronic device for an inspection, an adjustment or the like.
An electronic device used for a television tuner or the like according to a related art is provided with, as shown in FIG. 4, a square frame member 31 having open portions 31a on both upper and lower sides thereof, a rectangular upper cover 32 having a gripping member 32a bent downward and a lower cover 33 having a gripping member 33a.
A box-like housing 30 is constituted by placing the upper and lower covers 32 and 33 on the frame member 31 such that they close the open portions 31a of the frame member 31 and by gripping the frame member 31 by the gripping members 32a and 33a.
Further, a desired circuit pattern 35 is formed on a printed circuit board 34 and electric parts such as a coil, a resistor, a condenser and the like are mounted on the printed circuit board 34 and are connected to the circuit pattern 35, 1 although they are not shown in FIG. 4.
A printed circuit board 34 provided with the electric parts in this manner is housed in the housing 3 0 and is fixed thereto.
Furthermore, the lower cover 33 has a circular hole 33b made at a position opposite to a part of circuit pattern 35 of the printed circuit board 34 mounted in the housing 30.
Then, after the electronic device having such a constitution is completely assembled, the specified part of the circuit thereof is measured and inspected to ensure that it has a desired electric characteristic, performance or the like.
Then, according to the results of the measurement and the inspection, the coil and the like are adjusted, if necessary, to provide the electronic device having the desired characteristic or the performance.
In this respect, as shown in FIG. 4, a measuring device for measuring the electronic device in the above-described manner has a holding base 40 for holding the electronic device provided with a recessed portion 40a for receiving the electronic device and a hole 40b.
Moreover, a movable member 41 movably provided on a jig not shown) is provided with a test pin 43 via an insulating member 42 and the test pin 43 can be moved into and out of the hole 40b of the holding base 40 by moving the movable member 2 41 by hand.
In this respect, in a method f or measuring the electronic device according to the related art, as shown in FIG. 5, f irst, the electronic device is placed in the recessed portion 40a of the holding base 40.
Next, as shown in FIG. 5, the movable member 41 is moved up manually f rom a state shown in FIG. 4 with the j ig as a guide.
At this time, the test pin 43 is inserted into the hole 33b of the cover 33 while moving and adjusting the electronic device by hand such that the test pin 43 does not come in contact with the cover 33 to put the tip of the test pin 43 into contact with the circuit pattern 35.
Then the characteristic, the performance or the like of the electronic device is measured and inspected in this state and the electronic device is adjusted, if necessary. After it is measured and inspected, the movable member 41 is moved to the state shown in FIG. 4, whereby the measurement of the electronic device is finished.
The electronic device according to the prior art has a problem that, since only the hole 33b opposite to the circuit pattern 35 is made in the cover 33, when the electronic device is measured, the electronic device is required to be moved and adjusted and hence the work of moving and adjusting the electronic device is troublesome and a measuring work takes much time and labor.
3 Moreover, the measuring method according to the related art has a problem that, since the electronic device is placed on the holding base 40 and the test pin 43 is inserted into the hole 33a of the cover 33 by moving the movable member 41 by hand, the electronic device is not positioned reliably and is required to be adjusted by hand and that, since the movable member 41 is moved by hand, the work of moving the movable member 41 is troublesome and a measuring work takes much time and labor and hence productivity is decreased.
As f irst means f or solving the abovedescribed problems, in accordance with one aspect of the present invention, there is provided an electronic device comprising a box-like housing f ormed by a square frame-like frame member having openportions on upper and lower sides thereof and covers covering the open portions of the frame member, a printed circuit board disposed in the housing and having a circuit pattern, wherein one of the covers has a hole made at a position opposite to the circuit pattern of the printed circuit board and wherein each of the printed circuit board and the covers has a hole made through the housing in a straight line in the up-and down directions of the housing, respectively.
As second means for solving the problems, pursuant to another aspect of the features of the present invention, there 4 is provided an electronic device comprising a box-like housing formed by a U-shaped frame member having an open portion and a bottom wall and a cover covering the open portion of the f rame member and a printed circuit board disposed in the housing and having a circuit pattern, wherein the cover or the bottom wall has a hole made at a position opposite to the circuit pattern of the printed circuit board and wherein each of the printed circuit board, the cover and the bottom wall has a hole made through the housing in a straight line in the up-and down directions of the housing, respectively.
As third means for solving the problems, a plurality of groups of holes are made through the housing.
As fourth means for solving the problems, pursuant to still another aspect of the features of the present invention, there is provided a method for measuring an electronic device having a first hole or a plurality of first holes made through the housing of the electronic device in a straight line in the up-and-down directions of the housing and a second hole made through the cover or the bottom wall of the electronic device at a position opposite to a circuit pattern formed on a printed circuit board disposed in the housing, comprising the steps of inserting a guide bar or a plurality of guide bars into the f irst hole/ the plurality of f irst holes, inserting a test pin into the second hole in a state in which the guide bar or the plurality of guide bars is/ are inserted in the first hole/ the plurality of first holes, and putting the test pin into contact with the circuit pattern.
As fifth means for solving the problems, the guide bar and the test pin may be driven at the same time by driving a supporting member for supporting the guide bar and the test pin.
As sixth means for solving the problems, the guide bar may be inserted into the first hole from the side of the cone-like portion made on the tip of the guide bar.
As seventh means for solving the problems, the test pin may be moved up and down with regard to the supporting member and, after the test pin comes in contact with the circuit pattern, the test pin is stopped from being moved and the supporting member can be moved.
Embodiments of the present invention will now be described, by way of example only, with reference to the accompanying drawings, in which:
FIG. 1 is a sectional view of a main portion illustrating an electronic device according to the present invention and a measuring device of the electronic device.
FIG. 2 shows a method for measuring an electronic device according to the present invention.
FIG. 3 is a sectional view of a main portion illustrating another preferred embodiment of an electronic device according to the present invention.
FIG. 4 is a sectional view of a main portion illustrating 6 an electronic device according to a related art and a measuring device of the electronic device.
FIG. 5 shows a method for measuring an electronic device according to a related art.
A preferred embodiment of an electronic device according to the present invention and a method for measuring the electronic device will be described with reference to FIG. 1 and FIG. 2. FIG. 1 is a sectional view of a main portion illustrating an electronic device according to the present invention and a measuring device of the electronic device and FIG. 2 shows a method for measuring an electronic device according to the present invention.
As shown in FIG. 1, the electronic device according to the present invention is provided with a square frame-like frame member 2 having open portions 2a, 2b on both upper and lower sides thereof, a rectangular upper cover 3 having a gripping member 3a bent downward and a lower cover 4 having a gripping member 4a.
A box-like housing 1 is constituted by placing the upper cover 3 on the frame member 2 such that it closes the open portion 2a of the frame member 2 and the lower cover 4 on the frame member 2 such that it closes the open portion 2b of the f rame member 2 and by making the gripping members 3a and 4a 7 grip the frame member 2.
Further, a circuit pattern 6 including a desired pattern for wiring and a land for measuring is formed on a printed circuit board 5 and electric parts such as a coil, a resistor, a condenser and the like are mounted on the printed circuit board 5 and are connected to the circuit pattern 6, although they are not shown in FIG. 1.
In this respect, the printed circuit board 5 provided with the electric parts in this manner is housed in the housing 1 and is fixed thereto.
Furthermore, a hole 4b is made in the lower cover 4 at a position opposite to a part of circuit pattern 6 of the printed circuit board 5 fixed to the housing 1.
Still further, the upper and lower covers 3 and 4 and the printed circuit board 5 have circular holes 3c, 4c and 5c which are made through the housing 1 in a straight line in the up-and-down directions of the housing 1. In this respect, a plurality of groups of the circular holes 3c, 4c and 5c are made in the housing 1 and two groups of the circular holes 3c, 4c and 5c are made in the present embodiment.
Then, after the electronic device having such a constitution is completely assembled, the specified part of the circuit thereof is measured and inspected to ensure that it has a desired electric characteristic, performance or the like.
8 Then, according to the results of the measurement and the inspection, the coil and the like are adjusted, if necessary, to provide the electronic device having the desired characteristic or the performance.
In this respect, as shown in FIG. 1, a measuring device for measuring the electronic device in the above-described manner has a holding base 10 for holding the electronic device provided with a recessed portion 10a for receiving the electronic device and a hole 10b.
Moreover, a supporting member 11 movably provided on a mounting portion ( not shown) is provided with a plurality of cylindrical guide bars 12 having a cone-shaped portion 12a at the tip thereof and an insulating member 14 provided with a test pin 13.
Further, since the insulating member 14 is provided with a spring 15 between a collar portion 14a and the supporting member 11 and is provided with a fastening member 16 at the opposite side across the supporting member 11, the insulating member 14 is mounted on the supporting member 11 such that it can be moved with the test pin 13 in up-and-down directions.
Still further, the supporting member 11 is provided with a driving member 17 such as a motor or the like via a movable member 17a fixed to the driving member 17 and is moved up and down by driving the driving member 17 via the movable member 17a.
9 In this respect, in a method f or measuring the electronic device in the measuring device according to the present invention having the above-described constitution, as shown in FIG. 2, first, the electronic device is placed and held in the recessed portion 10a of the holding base 10.
Next, the driving member 17 is driven in a state shown in FIG. I to move up the supporting member 11 by the movable member 17a.
Then, first, the cone-shaped portion 12a of the guide bar 12 is inserted into the hole 4c of the cover 4 and is moved up to surely position the test pin 13 by the guide bar 12 in regard to the hole 4b of the cover 4.
Further, if the supporting member 11 is moved up by the driving member 17, the guide bar 12 is inserted into and passed through the hole 5c of the printed circuit board 5 and then the hole 3c of the cover 3 to precisely position the electronic device.
At the same time, the test pin 13 is inserted into the hole 4b without coming in contact with the cover 4 and the tip of the test pin 13 is put into contact with the circuit pattern 6. Furthermore, af ter the test pin 13 is put into contact with the circuit pattern 6, when the supporting member 11 is moved up, the test pin 13 can hold the position thereof in a state shown in FIG. 2 by the spring 15.
Then the characteristic, the performance or the like of the electronic device is measured and inspected in the state shown in FIG. 2 and the electronic device is adjusted, if necessary. Then, after the electronic device is measured and inspected, the driving member 17 is driven to move the supporting member 11 from the state shown in FIG. 2 to the state shown in FIG. 1, whereby the measurement of the electronic device is finished.
FIG. 3 shows another preferred embodiment of the present invention. The frame member 2 for constituting the housing I is provided with a bottom wall 2c instead of the lower cover 4 of the above-described embodiment and in the bottom wall 2c are made a hole 2d through which the test pin 13 opposite to the circuit pattern 6 is passed and a plurality of holes 2e which are opposite to the holes Sc of the printed circuit board 6 and through which the guide bar 12 is inserted and passed. The other constitution thereof is the same as that of the above-described embodiment and like numbers designate like parts and the description thereof will be omitted.
In this respect, the above-described electronic device can be measured by the like method using the above-described measuring device.
Further, there are a variety of electronic devices of different sizes and hence there are a variety of electronic devices of different heights in the up-and-down directions thereof.
11 In this respect, since the holes passing through the housing 1 in the up- and-down directions of the housing 1 are made, the guide bar 12 is passed through the housing 1 for the housing 1 having a small height and the tip of the guide bar 12 is in the housing 1 for the housing I having a large height, whereby the guide bar 12 can be shared by the housings 1 having different heights.
Since the printed circuit board and the cover of the electronic device according to the present invention have the hole made through the housing in the up-and-down directions of the housing, the hole can be used for positioning the electronic device when the electronic device is measured, whereby the measuring work can be made easy and be shortened.
Moreover, since the hole is made through the housing, the same measuring device can be shared by the housings having different heights.
Furthermore, since the printed circuit board and the bottom wall of the frame member have the hole made through the housing in the up-and-down directions of the housing, the hole can be used for measuring the electronic device when the electronic device is measured, whereby the measuring work can be made easy and be shortened.
Further, since the hole is made through the housing, the same measuring device can be shared by the housings having different heights.
12 Further, if a plurality of holes are made through the housing, the housing can be positioned further correctly and, in addition, a positioning work can be performed reliably and be shortened.
Further, according to the present invention, the guide bar is inserted into the hole made through the housing to measure the electronic device and hence the housing can be positioned by the guide bar, whereby a measuring work can be made easy and shortened.
Further, since the guide bar and the test pin are moved by the supporting member at the same time, the test pin can be put into contact with the circuit pattern while the housing is positioned at a desired position and hence a positioning work can be extremely made simple and easy, which can improve workability.
Further, since the cone-shaped portion is made at the tip of the guide bar, the guide bar can be easily inserted into the hole made in the housing and the inserting action of the guide bar into the hole can be performed further surely.
In addition, since the test pin can be moved up and down with regard to the supporting member, the test pin can follow the circuit pattern and be put into contact with the supporting member even if there is an error in mounting the printed circuit board or even when the mounting position of the printed circuit board is slightly changed and, even after the test pin is put 13 into contact with the circuit pattern, the supporting member can be moved flexibly and hence the printed circuit board can be surely positioned and the test pin can be surely put into contact with the circuit pattern.
14
Claims (13)
1. An electronic device comprising: a box-like housing formedbya square frame-like frame member having open portions on upper and lower sides thereof and covers covering the open portions of the frame member; and a printed circuit board disposed in the housing and having a circuit pattern, wherein one of the covers has a hole made at a position opposite to the circuit pattern of the printed circuit board and wherein each of the printed circuit board and the covers has a hole made through the housing in a straight line in the up-and down directions of the housing, respectively.
2. An electronic device according to claim 1, wherein a plurality of holes are made through the housing.
3. An electronic device comprising: a box-like housing formed by a 13shaped frame member having an open portion and a bottom wall and a cover covering the open portion of the f rame member; and a printed circuit board disposed in the housing and having a circuit pattern, wherein the cover or the bottom wall has a hole made at a position opposite to the circuit pattern of the printed circuit board and wherein each of the printed circuit board, the cover and the bottom wall has a hole made through the housing in a straight line in the up-and down directions of the housing, respectively.
4. An electronic device according to claim 3, wherein a plurality of holes are made through the housing.
5. A method for measuring an electronic device having a first hole or a plurality of first holes made through the housing of the electronic device in a straight line in the up-and-down directions of the housing and a second hole made through the cover or the bottom wall of the electronic device at a position opposite to a circuit pattern formed on a printed circuit board disposed in the housing, comprising the steps of: inserting a guide bar or a plurality of guide bars into the first hole/ the plurality of first holes; inserting a test pin into the second hole in a state in which the guide bar or the plurality of guide bars is/ are inserted in the first hole/ the plurality of first holes; and putting the test pin into contact with the circuit pattern.
6. A method f or measuring an electronic device according to claim 5, wherein the guide bar and the test pin are driven at the same time by driving a supporting member f or supporting the guide bar and the test pin.
7. A method f or measuring an electronic device according to claim 6, wherein the guide bar is inserted into the f irst hole from the cone-like portion made on the tip of the guide bar.
8. A method f or measuring an electronic device according to claim 7, wherein the test pin can be moved up and down with regard to the supporting member and, after the test pin comes in contact with the circuit pattern, the test pin is stopped 16 from being moved and the supporting member can be moved.
9. A method for measuring an electronic device according to claim 6, wherein the test pin can be moved up and down with regard to the supporting member and, after the test pin comes in contact with the circuit pattern, the test pin is stopped from being moved and the supporting member can be moved-
10. A method f or measuring an electronic device according to claim 5, wherein the guide bar is inserted into the first hole from the cone-like portion made on the tip of the guide bar.
11, A method f or measuring an electronic device according to claim 10, wherein the test pin can be moved up and down with regard to the supporting member and, after the test pin comes in contact with the circuit pattern, the test pin is stopped from being moved and the supporting member can be moved.
12. An electronic device substantially as hereinbefore described with reference to, and as illustrated by, the accompanying drawings.
13. A method for measuring an electronic device substantially as hereinbefore described with reference to the accompanying drawings.
17
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP9087812A JPH10282172A (en) | 1997-04-07 | 1997-04-07 | Electronic apparatus and its measuring method |
Publications (3)
Publication Number | Publication Date |
---|---|
GB9805395D0 GB9805395D0 (en) | 1998-05-06 |
GB2326772A true GB2326772A (en) | 1998-12-30 |
GB2326772B GB2326772B (en) | 2001-07-11 |
Family
ID=13925398
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
GB9805395A Expired - Fee Related GB2326772B (en) | 1997-04-07 | 1998-03-16 | Electronic device and method for measuring the electronic device |
Country Status (5)
Country | Link |
---|---|
JP (1) | JPH10282172A (en) |
KR (1) | KR19980081120A (en) |
CN (1) | CN1102019C (en) |
GB (1) | GB2326772B (en) |
MY (1) | MY129515A (en) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
GB2335548A (en) * | 1998-03-20 | 1999-09-22 | Capital Formation Inc | Floating spring probe pcb test fixture |
Families Citing this family (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN1294787C (en) * | 1998-12-04 | 2007-01-10 | 佛姆法克特股份有限公司 | Method for mounting an electronic component |
JP2006080435A (en) * | 2004-09-13 | 2006-03-23 | Mitsubishi Electric Corp | Inspection device for circuit board |
CN101784166A (en) * | 2010-03-05 | 2010-07-21 | 苏州工业园区时代华龙科技有限公司 | PCB (Printed Circuit Board) art border structure |
CN112711244B (en) * | 2020-12-18 | 2022-01-14 | 上海勤达科技有限公司 | Quick detection equipment for automobile electric tail gate control unit |
Citations (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
EP0262371A2 (en) * | 1986-08-29 | 1988-04-06 | Siemens Aktiengesellschaft | Contacting device in the form of a so-called pin-card for testing micro-electronic multipole components |
Family Cites Families (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5928348A (en) * | 1982-08-09 | 1984-02-15 | Hitachi Ltd | Detecting device for product containable quantity |
JPH0775817B2 (en) * | 1989-02-27 | 1995-08-16 | 富士機械製造株式会社 | Electronic component holding position detector |
JP2937785B2 (en) * | 1995-02-02 | 1999-08-23 | ヤマハ発動機株式会社 | Component state detection device for mounting machine |
-
1997
- 1997-04-07 JP JP9087812A patent/JPH10282172A/en active Pending
-
1998
- 1998-03-13 MY MYPI9801112 patent/MY129515A/en unknown
- 1998-03-16 GB GB9805395A patent/GB2326772B/en not_active Expired - Fee Related
- 1998-04-03 CN CN98101241A patent/CN1102019C/en not_active Expired - Fee Related
- 1998-04-06 KR KR1019980012028A patent/KR19980081120A/en not_active Application Discontinuation
Patent Citations (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
EP0262371A2 (en) * | 1986-08-29 | 1988-04-06 | Siemens Aktiengesellschaft | Contacting device in the form of a so-called pin-card for testing micro-electronic multipole components |
Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US6066957A (en) * | 1997-09-11 | 2000-05-23 | Delaware Capital Formation, Inc. | Floating spring probe wireless test fixture |
GB2335548A (en) * | 1998-03-20 | 1999-09-22 | Capital Formation Inc | Floating spring probe pcb test fixture |
GB2335548B (en) * | 1998-03-20 | 2000-01-26 | Capital Formation Inc | Floating spring probe test fixture |
Also Published As
Publication number | Publication date |
---|---|
MX9802725A (en) | 1998-12-31 |
KR19980081120A (en) | 1998-11-25 |
GB2326772B (en) | 2001-07-11 |
CN1195964A (en) | 1998-10-14 |
MY129515A (en) | 2007-04-30 |
JPH10282172A (en) | 1998-10-23 |
GB9805395D0 (en) | 1998-05-06 |
CN1102019C (en) | 2003-02-19 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
PCNP | Patent ceased through non-payment of renewal fee |
Effective date: 20080316 |