KR100266612B1 - Probe for circuit test - Google Patents

Probe for circuit test Download PDF

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Publication number
KR100266612B1
KR100266612B1 KR1019980011570A KR19980011570A KR100266612B1 KR 100266612 B1 KR100266612 B1 KR 100266612B1 KR 1019980011570 A KR1019980011570 A KR 1019980011570A KR 19980011570 A KR19980011570 A KR 19980011570A KR 100266612 B1 KR100266612 B1 KR 100266612B1
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KR
South Korea
Prior art keywords
probe
base plate
circuit
circuit board
probes
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Application number
KR1019980011570A
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Korean (ko)
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KR19990079147A (en
Inventor
황경수
Original Assignee
구자홍
엘지전자주식회사
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Application filed by 구자홍, 엘지전자주식회사 filed Critical 구자홍
Priority to KR1019980011570A priority Critical patent/KR100266612B1/en
Publication of KR19990079147A publication Critical patent/KR19990079147A/en
Application granted granted Critical
Publication of KR100266612B1 publication Critical patent/KR100266612B1/en

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Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/06794—Devices for sensing when probes are in contact, or in position to contact, with measured object
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/073—Multiple probes
    • G01R1/07307—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card
    • G01R1/07314—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card the body of the probe being perpendicular to test object, e.g. bed of nails or probe with bump contacts on a rigid support
    • G01R1/07328—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card the body of the probe being perpendicular to test object, e.g. bed of nails or probe with bump contacts on a rigid support for testing printed circuit boards
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/073—Multiple probes
    • G01R1/07307—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card
    • G01R1/07364—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card with provisions for altering position, number or connection of probe tips; Adapting to differences in pitch
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/073—Multiple probes
    • G01R1/07392—Multiple probes manipulating each probe element or tip individually

Abstract

PURPOSE: A probe device for a circuit test is provided to perform an operation test of various circuit substrates with compatibility by changing the locations of the probe. CONSTITUTION: In a probe device for a circuit test, a plurality of probes(10) are connected with a body of a circuit test apparatus with a lead line(10A). A base plate(20) is manufactured respectively depending on a circuit substrate model(100) by determining a probe location so that the plurality of probes are located corresponding to the respective connection parts of a circuit substrate. A device is provided to connect the probe to the base plate and remove the prove from the base plate. The device has a fixing hole(20A) and a soleplate having an area corresponding to the base plate thereunder.

Description

회로시험용 탐침장치Probe Device for Circuit Test

본 발명은 회로기판 조립후 전체의 동작시험을 하거나 또는 특정부품이나 특정 접속단에서 신호파형 등의 동작특성을 검사하기 위해 회로기판의 요소 및 접속부에 복수의 탐침(探針)(Probe)을 동시에 접촉시키는 회로시험용 탐침 장치에 관한 것으로, 특히 다양한 형태의 회로기판 모델별로 회로시험기 전체를 별도 제작할 필요없이 상기 탐침의 위치만을 변경시켜 사용할 수 있도록 하는 회로시험용 탐침장치에 관한 것이다.According to the present invention, a plurality of probes are simultaneously applied to elements and connections of a circuit board in order to perform an overall operation test after assembling the circuit board, or to examine operating characteristics such as signal waveforms at a specific part or a specific connection end. The present invention relates to a circuit test probe device for contacting, and more particularly, to a circuit test probe device capable of changing the position of the probe without using a separate circuit tester for each type of circuit board model.

일반적으로 조립 완료된 회로기판 또는 특정 전장부품은 회로시험기를 통해 통전상태 또는 동작특성을 시험한 후에 제품에 적용된다. 도 1은 일반적인 회로시험기의 일 례를 보인 것으로, 이에 도시된 바와 같이 상기 회로시험기는 기기본체(1)와, 상기 기기본체(1)와 회로적으로 연결되면서 별도로 구비되는 탐침장치(2)로 구성되어 있다. 상기 탐침장치(2)는 도 2에 도시된 바와 같이 베이스판(3) 상에 끝이 뾰족한 못과 같은 형상으로 된 복수개의 탐침(4)이 상향으로 돌출되게 일체로 형성되어 있고, 각각의 탐침(4)은 리드선(5)에 의해서 기기본체(1)와 접속 연결된 구조로 되어 있다. 또한 상기 탐침(4)은 회로기판(100)의 각 접속부에 상응하는 베이스판(3) 상에 위치하도록 제작되며, 그 높이는 서로 동일한 높이를 갖도록 형성되어 있다. 이와같이 구성된 종래의 회로시험용 탐침장치는 도 3에 도시된 바와 같이 제품 생산라인 상에서 복수개의 탐침(4) 위에 조립 완료된 시험용 회로기판(100)이 안착되는데, 이때 상기 회로기판(100)의 각 접속부가 각각의 탐침(4)에 동시 접촉되도록 안착된다. 그런 다음 회로시험기를 작동시켜 상기 탐침(4) 및 리드선(5)을 통해 기기본체(1)로 입력된 회로기판(100)의 신호로서 상기 회로기판(100) 전체의 동작시험을 수행하도록 되어 있다.In general, assembled circuit boards or specific electrical components are applied to the product after testing the energization or operating characteristics through a circuit tester. 1 shows an example of a general circuit tester, and as shown therein, the circuit tester includes a device body 1 and a probe device 2 which is separately provided while being connected to the device body 1 in a circuit. Consists of. As shown in FIG. 2, the probe device 2 is integrally formed on the base plate 3 such that a plurality of probes 4 having a pointed nail shape are projected upward, and each probe (4) has a structure in which the lead wire 5 is connected to the apparatus main body 1. In addition, the probe 4 is manufactured to be positioned on the base plate 3 corresponding to each connection portion of the circuit board 100, and the heights are formed to have the same height. In the conventional circuit test probe device configured as described above, a test circuit board 100 assembled on a plurality of probes 4 is seated on a product production line as shown in FIG. 3, wherein each connection portion of the circuit board 100 is mounted. It is seated in simultaneous contact with each probe 4. Then, the circuit tester is operated to perform an operation test of the entire circuit board 100 as a signal of the circuit board 100 input to the device body 1 through the probe 4 and the lead wire 5. .

그러나 이러한 종래의 회로시험용 탐침장치는 리드선으로 기기본체와 접속 연결된 복수개의 탐침이 베이스판 상에 일체로 형성된 구조로 되어 있어 패턴 형태에 따라 다양하게 접속부의 위치가 달라지는 회로기판에 맞추어 호환성을 가지고 사용할 수 없을 뿐만 아니라 회로기판 모델별로 탐침장치를 포함하는 각각의 회로시험기를 구비해야만 됨으로써 이의 구입에 따른 비용 상승과 함께 작업의 불편성 및 비효율성을 초래하는 문제점이 있었다. 따라서 본 발명의 목적은 접속부의 위치가 다른 다양한 회로기판 모델별로 각각의 회로시험기를 별도로 구비할 필요없이 탐침의 위치 변경만으로도 다양한 회로기판의 동작시험을 호환성 있게 수행하도록 하는데 있다.However, such a conventional circuit test probe device has a structure in which a plurality of probes connected to the main body of a lead wire are integrally formed on a base plate, so that they can be used interchangeably for circuit boards where the positions of the connection parts vary depending on the pattern shape. In addition, the circuit tester must include each circuit tester including a probe device for each model of the circuit board, resulting in the inconvenience and inefficiency of the operation along with the increase in the cost of the purchase. Therefore, it is an object of the present invention to perform the operation test of various circuit boards interchangeably only by changing the position of the probe, without having to separately provide a circuit tester for each of various circuit board models having different positions of the connection part.

도 1은 일반적인 회로시험기의 일 례를 개략적으로 보인 구성도.1 is a schematic view showing an example of a general circuit tester.

도 2는 종래의 회로시험용 탐침장치의 구조를 보인 사시도.Figure 2 is a perspective view showing the structure of a conventional circuit test probe.

도 3은 종래의 회로시험용 탐침장치의 사용상태를 보인 단면도.Figure 3 is a cross-sectional view showing a state of use of the conventional circuit test probe.

도 4는 본 발명의 일 실시예 구성을 보인 사시도.Figure 4 is a perspective view showing the configuration of one embodiment of the present invention.

도 5는 본 발명의 사용상태를 보인 단면도.5 is a cross-sectional view showing a state of use of the present invention.

도 6은 본 발명의 다른 실시예를 보인 단면도.Figure 6 is a cross-sectional view showing another embodiment of the present invention.

**도면의주요부분에대한부호의설명**** description of the symbols for the main parts of the drawings **

10:탐침 10A:리드선10: probe 10A: lead wire

11:접촉돌부 12:지지부11: contact protrusion 12: support portion

20,120:베이스판 20A:고정공20,120: Base plate 20A: Fixed hole

20B:손잡이 30:보조밑판20B: Handle 30: Auxiliary Bottom Plate

120A:고정홈120A: Fixed groove

이러한 본 발명의 목적을 달성하기 위하여 회로시험기의 본체와 리드선으로 연결된 복수개의 탐침과; 상기 복수개의 탐침이 회로기판의 각 접속부에 상응하게 위치되도록 탐침 위치를 결정하여 회로기판 모델별로 각각 제작되는 베이스판과; 상기 탐침을 베이스판에 착탈시키기 위한 수단으로 구성된 것을 특징으로 한 회로시험용 탐침장치가 제공된다. 상기 착탈수단은 베이스판의 탐침 위치에 탐침의 하부측이 삽입 고정되도록 고정공을 형성하고, 이의 하부측에는 상기 베이스판에 상응하는 면적을 갖는 보조밑판을 구비하여서 된 것을 특징으로 한다. 또한 상기 착탈수단은 베이스판의 탐침 위치에 탐침의 하부측이 삽입 고정되도록 고정홈을 형성하여서 된 것을 특징으로 한다. 그리고 상기 베이스판의 상면 양측에 손잡이를 형성하여서 된 것을 특징으로 한다.In order to achieve the object of the present invention and a plurality of probes connected by a lead wire and the main body of the circuit tester; A base plate which is manufactured for each circuit board model by determining a probe position such that the plurality of probes are positioned corresponding to each connection part of the circuit board; Provided is a probe for circuit test, comprising a means for attaching and detaching the probe to a base plate. The detachable means is characterized in that the fixing hole is formed so that the lower side of the probe is fixed to the probe position of the base plate, and the lower side thereof is provided with an auxiliary bottom plate having an area corresponding to the base plate. In addition, the detachable means is characterized in that to form a fixing groove so that the lower side of the probe is inserted into the probe position of the base plate. And characterized in that the handle is formed on both sides of the upper surface of the base plate.

이하 첨부된 도면을 참조로 하여 본 발명의 구성을 실시예에 따라 상세히 설명한다.Hereinafter, the configuration of the present invention will be described in detail with reference to the accompanying drawings.

도 4는 본 발명의 일 실시예 구성을 보인 사시도이고, 도 5는 본 발명의 사용상태를 보인 단면도이다. 이에 도시된 바와 같이 본 발명은 복수개의 탐침(10)과, 상기 탐침(10)과 별도로 회로기판(100)보다 큰 면적을 갖는 베이스판(20)이 구비된다. 상기 탐침(10)은 도전체로서, 끝이 뾰족한 못과 같은 형상으로 된 접촉돌부(11)의 하부측으로 안정감을 갖도록 상기 접촉돌부(11)보다 다소 큰 직경으로 다단의 지지부(12)가 일체로 형성되고, 상기 지지부(12)는 리드선(10A)으로 회로시험기의 본체(도시되지 않음)와 연결된다. 또한 상기 베이스판(20)은 각각 접속부의 위치가 다르게 형성되는 회로기판(100)의 모델별로 탐침위치를 결정하여 각각 제작 및 구비되고, 상기 탐침위치에는 탐침(10)의 하부측이 삽입 고정되는 고정공(20A)이 형성된다. 즉, 회로기판(100)의 각 모델별 접속부의 위치에 따라 고정공(20A)을 형성하여 탐침(10) 위치를 결정하는 것이다. 그리고 상기 고정공(20A)에는 상기한 바와 같이 탐침(10)의 지지부(12)가 삽입 및 고정되는 것으로, 상기 탐침(10)의 고정공(20A) 삽입 및 빼냄으로 베이스판(20)에 대한 상기 탐침(10)의 착탈이 이루어지도록 구성한 것이다. 이와함께 상기 베이스판(20)의 하부측에는 고정공(20A)에 삽입된 복수개의 탐침(10)이 하부측으로 빠져 이탈되지 않도록 베이스판(20)에 상응하는 면적을 갖는 보조밑판(30)이 구비된다. 또한 상기 베이스판(20)의 상면 양측에는 손잡이(20B)가 돌출 형성되어 작업자가 베이스판(20)의 운반이 용이하도록 구성된다. 이와 같이 구성된 본 발명은 먼저, 제품 생산라인 상에 보조밑판(30)을 올려 놓는다. 그리고 시험 대상 회로기판(100)에 해당하는 베이스판(20)을 상기 보조밑판(30) 위에 다시 올려 놓은 다음, 상기 베이스판(20)의 고정공(20A)에 복수개의 탐침(10)을 각각 삽입 및 고정시킴으로써 일련의 회로기판 시험을 위한 준비를 완료하게 된다. 그런 후에 상기 복수개의 탐침(10) 위에 시험 대상 회로기판(100)의 각 접속부가 동시에 접촉하도록 상기 회로기판(100)을 안착시킴으로써 회로시험기의 작동에 의한 회로기판 전체의 동작시험을 수행하게 되는 것이다. 한편, 도 6은 본 발명의 다른 실시예로서, 이는 베이스판(120)의 탐침 위치에 고정홈(120A)을 형성하여 복수개의 탐침(10)이 삽입 및 고정되도록 구성한 것으로, 이는 별도의 보조밑판(30)이 불필요하므로 부품수를 줄일 수 있는 장점이 있다.4 is a perspective view showing an embodiment configuration of the present invention, Figure 5 is a cross-sectional view showing a use state of the present invention. As shown in the present invention, a plurality of probes 10 and a base plate 20 having an area larger than that of the circuit board 100 are provided separately from the probes 10. The probe 10 is a conductor, the support 12 of the multistage integrally with a diameter slightly larger than the contact protrusion 11 so as to have a sense of stability toward the lower side of the contact protrusion 11 in the shape of a pointed nail. And the support 12 is connected to a main body (not shown) of the circuit tester by a lead wire 10A. In addition, the base plate 20 is manufactured and provided by determining the probe position for each model of the circuit board 100 in which the positions of the connection portions are different, respectively, and the lower side of the probe 10 is inserted into and fixed to the probe position. The fixing hole 20A is formed. That is, the position of the probe 10 is determined by forming the fixing hole 20A according to the position of the connection part for each model of the circuit board 100. The support 12 of the probe 10 is inserted and fixed in the fixing hole 20A as described above, and the base plate 20 is inserted into and removed from the fixing hole 20A of the probe 10. The probe 10 is configured to be detachable. In addition, the lower side of the base plate 20 is provided with an auxiliary bottom plate 30 having an area corresponding to the base plate 20 so that the plurality of probes 10 inserted into the fixing holes 20A do not fall out of the lower side. do. In addition, the handle 20B is protruded on both sides of the upper surface of the base plate 20 is configured to facilitate the operator to carry the base plate 20. In the present invention configured as described above, the auxiliary base 30 is placed on the product production line. Then, the base plate 20 corresponding to the test circuit board 100 is placed on the auxiliary base plate 30 again, and then the plurality of probes 10 are respectively provided in the fixing holes 20A of the base plate 20. Insertion and fixation complete the preparation for a series of circuit board tests. Thereafter, the circuit board 100 is placed on the plurality of probes 10 so that each connection portion of the circuit board 100 to be tested may be simultaneously contacted to perform an operation test of the entire circuit board by the operation of the circuit tester. . On the other hand, Figure 6 is another embodiment of the present invention, which is configured to be inserted and fixed a plurality of probes 10 by forming a fixing groove (120A) in the probe position of the base plate 120, which is a separate auxiliary base plate Since 30 is unnecessary, there is an advantage that the number of parts can be reduced.

이같이 본 발명은 회로기판 모델별로 회로시험기 전체를 제작 및 구비할 필요없이 탐침의 위치만을 변경하여 호환성 있게 회로기판 전체의 동작시험을 수행할 수 있도록 함으로써 비용절감 효과와 함께 작업의 간편성 및 효율성을 한층 증대시킬 수 있는 효과를 갖게 된다.As described above, the present invention enables the operation test of the entire circuit board to be carried out interchangeably by changing only the position of the probe without the need to manufacture and equip the entire circuit tester for each circuit board model, thereby further reducing the cost and simplicity and efficiency of the operation. It has an effect that can be increased.

Claims (4)

회로시험기의 본체와 리드선으로 연결된 복수개의 탐침과; 상기 복수개의 탐침이 회로기판의 각 접속부에 상응하게 위치되도록 탐침 위치를 결정하여 회로기판 모델별로 각각 제작되는 베이스판과; 상기 탐침을 베이스판에 착탈시키기 위한 수단으로 구성된 것을 특징으로 한 회로시험용 탐침장치.A plurality of probes connected to a main body of the circuit tester by a lead wire; A base plate which is manufactured for each circuit board model by determining a probe position such that the plurality of probes are positioned corresponding to each connection part of the circuit board; Probe device for circuit test, characterized in that configured as a means for attaching and detaching the probe to the base plate. 제 1 항에 있어서, 상기 착탈수단은 베이스판의 탐침 위치에 탐침의 하부측이 삽입 고정되도록 고정공을 형성하고, 이의 하부측에는 상기 베이스판에 상응하는 면적을 갖는 보조밑판을 구비하여서 된 것을 특징으로 한 회로시험용 탐침장치.The method of claim 1, wherein the detachable means is formed in the fixing hole so that the lower side of the probe is fixed to the probe position of the base plate, the lower side is provided with an auxiliary bottom plate having an area corresponding to the base plate Probe apparatus for circuit testing. 제 1 항에 있어서, 상기 착탈수단은 베이스판의 탐침 위치에 탐침의 하부측이 삽입 고정되도록 고정홈을 형성하여서 된 것을 특징으로 한 회로시험용 탐침장치.2. The circuit test probe according to claim 1, wherein the detachable means is provided with a fixing groove so that the lower side of the probe is inserted and fixed at the probe position of the base plate. 제 1 항에 있어서, 상기 베이스판의 상면 양측에 손잡이를 형성하여서 된 것을 특징으로 한 회로시험용 탐침장치.The circuit test probe according to claim 1, wherein handles are formed on both sides of an upper surface of the base plate.
KR1019980011570A 1998-04-02 1998-04-02 Probe for circuit test KR100266612B1 (en)

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KR100266612B1 true KR100266612B1 (en) 2000-09-15

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