JPH10197556A - Inspection device for inspected circuit board - Google Patents

Inspection device for inspected circuit board

Info

Publication number
JPH10197556A
JPH10197556A JP9004814A JP481497A JPH10197556A JP H10197556 A JPH10197556 A JP H10197556A JP 9004814 A JP9004814 A JP 9004814A JP 481497 A JP481497 A JP 481497A JP H10197556 A JPH10197556 A JP H10197556A
Authority
JP
Japan
Prior art keywords
board
pin
opening
duct
inspected
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP9004814A
Other languages
Japanese (ja)
Inventor
Tomoki Tobari
智樹 戸張
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
NEC Home Electronics Ltd
NEC Corp
Original Assignee
NEC Home Electronics Ltd
Nippon Electric Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by NEC Home Electronics Ltd, Nippon Electric Co Ltd filed Critical NEC Home Electronics Ltd
Priority to JP9004814A priority Critical patent/JPH10197556A/en
Publication of JPH10197556A publication Critical patent/JPH10197556A/en
Pending legal-status Critical Current

Links

Landscapes

  • Measuring Leads Or Probes (AREA)
  • Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)
  • Supply And Installment Of Electrical Components (AREA)

Abstract

PROBLEM TO BE SOLVED: To provide an inspection device for inspected circuit boards which is capable of cleaning the foremost part of a pin simply while the configuration remains relatively simply and can put the pin in certain contact with a terminal. SOLUTION: A circuit board inspection device is composed of a pin board 1 where a plurality of pins 3, 3A... are implanted in a board 2, an elevation part 8 to move the pin board 1 in the vertical direction, and a mounting device 9A for a circuit board to be inspected P enclosing the pin board 1 and elevation part 8 and having a part 12 for mounting the circuit board P at the opening provided in the oversurface. Within the mounting device, a duct 13 is formed so that the pin board surface at the tip of the pin is included in the wall surface of the duct, and an opening 13a for air delivery is formed at one side of the duct 13 while an opening for exhaust 13c is formed at the other side, and an air sending device 14 is installed at the opening 13a.

Description

【発明の詳細な説明】DETAILED DESCRIPTION OF THE INVENTION

【0001】[0001]

【発明の属する技術分野】この発明は被検査基板の検査
装置に関し、特に電子部品などが実装されたプリント配
線基板(被検査基板)の検査時における被検査基板とピ
ンボ−ドのピンとの接触性の改良に関する。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a device for inspecting a substrate to be inspected, and more particularly, to the contact between a substrate to be inspected and a pin of a pin board when inspecting a printed wiring board (substrate to be inspected) on which electronic components and the like are mounted. Regarding improvement.

【0002】[0002]

【従来の技術】一般に、カ−エレクトロニクス機器,テ
レビジョン受像機,オ−ディオ機器などにはALB回
路,エアバッグ制御回路,電源回路,増幅回路,高周波
回路など各種の回路を有するプリント配線基板が内蔵さ
れている。そして、これらのプリント配線基板は、実際
の機器に組み込む前に、回路が正常に動作するか否か,
電子部品や回路に不具合があるか否かなどが検査装置に
よって検査されている。
2. Description of the Related Art In general, printed circuit boards having various circuits such as an ALB circuit, an airbag control circuit, a power supply circuit, an amplifier circuit, and a high-frequency circuit are used for a car electronics device, a television receiver, an audio device, and the like. Built-in. These printed wiring boards are used to check whether the circuit operates properly before being incorporated into actual equipment.
Whether or not there is a defect in an electronic component or a circuit is inspected by an inspection device.

【0003】このような検査には、例えば図3〜図4に
示すような検査装置が使用されている。同図において、
1は検査用のピンボ−ドであって、例えば絶縁部材より
なるボ−ド2に複数のピン3,3Aを、ボ−ド2の両面
に露呈するように植立して構成されている。このピン
3,3Aは基本的にほぼ同一に構成されており、具体的
には、例えばボ−ド2の孔2aに装着された導電性のス
リ−ブ4と、スリ−ブ4の一方の開口部に摺動自在に挿
入配置された第1のピン体5と、スリ−ブ4の他方の開
口部に挿入して固定された第2のピン体6と、スリ−ブ
内における第1のピン体5と第2のピン体6との間に配
置されたコイル状のスプリング7とから構成されてい
る。特に、このピン3,3Aの主たる相違点は、第1の
ピン体5の先端部分が鋭く尖った先鋭部5aと王冠状の
接触部5bとを有することである。尚、このピン3,3
Aには図示しないリ−ド線を介して測定装置が電気的に
接続されている。
For such an inspection, an inspection apparatus as shown in FIGS. 3 and 4, for example, is used. In the figure,
Reference numeral 1 denotes a pin board for inspection, which is constructed by planting a plurality of pins 3 and 3A on a board 2 made of, for example, an insulating member so as to be exposed on both sides of the board 2. The pins 3 and 3A are basically configured to be substantially the same. Specifically, for example, a conductive sleeve 4 mounted in the hole 2a of the board 2 and one of the sleeves 4 are provided. A first pin body 5 slidably inserted into the opening, a second pin body 6 inserted and fixed into the other opening of the sleeve 4, and a first pin body 6 in the sleeve. And a coiled spring 7 disposed between the pin body 5 and the second pin body 6. In particular, the main difference between the pins 3 and 3A is that the tip of the first pin body 5 has a sharply pointed portion 5a and a crown-shaped contact portion 5b. In addition, these pins 3 and 3
A is electrically connected to a measuring device via a lead wire (not shown).

【0004】そして、ピンボ−ド1には、例えばエアシ
リンダ−などの昇降部8,8が配置されており、検査タ
イミングに関連して一定ストロ−クだけ上下動するよう
に構成されている。このピンボ−ド1及び昇降部8,8
はプリント配線基板(被検査基板)の取付装置9によっ
て覆われている。この取付装置9は主としてピンボ−ド
1及び昇降部8,8を覆う箱形の本体部10から構成さ
れており、本体部10の上面10aにはピンボ−ド1の
複数のピン3,3Aが挿通可能な大きさの開口部11が
形成されており、さらに、開口部11の周辺部分には被
検査基板の、例えば枠状の取付部12が配置されてい
る。
[0004] The pin board 1 is provided with elevating parts 8, 8 such as air cylinders, for example, which are configured to move up and down by a fixed stroke in relation to the inspection timing. The pin board 1 and the elevating units 8, 8
Are covered by a mounting device 9 for a printed wiring board (substrate to be inspected). The mounting device 9 mainly comprises a box-shaped main body 10 which covers the pin board 1 and the elevating portions 8, 8, and a plurality of pins 3 and 3A of the pin board 1 are provided on an upper surface 10a of the main body 10. An opening 11 having a size that can be inserted is formed. Further, a frame-shaped attachment portion 12 of the substrate to be inspected, for example, is arranged around the opening 11.

【0005】[0005]

【発明が解決しようとする課題】ところで、この検査装
置による被検査基板の検査は、次のように行われる。ま
ず、図3に示すように、プリント配線基板(被検査基
板)Pを取付装置9の取付部12にセットする。次に、
昇降部8,8を駆動させてピンボ−ド1を図示点線位置
まで上昇させ、ピン3,3Aをプリント配線基板Pの所
定部分に弾性的に押し付ける。この状態で、ピン3,3
Aにおける第1のピン体5の先端部5a,5bは端子に
押し付けられて電気的に接触されることになる。この状
態で、図示しない測定装置によって各種の検査が行われ
る。
The inspection of a substrate to be inspected by the inspection apparatus is performed as follows. First, as shown in FIG. 3, a printed wiring board (substrate to be inspected) P is set on the mounting portion 12 of the mounting device 9. next,
The pin boards 1 are raised to the positions indicated by the dotted lines in the figure by driving the elevating units 8, 8, and the pins 3, 3A are elastically pressed against predetermined portions of the printed wiring board P. In this state,
The tip portions 5a and 5b of the first pin body 5 in A are pressed against the terminals and are brought into electrical contact therewith. In this state, various inspections are performed by a measuring device (not shown).

【0006】この検査装置によれば、それぞれのピン
3,3Aにはスプリング7が内蔵されているために、プ
リント配線基板Pのピン接触面に多少の凹凸が生じてい
ても、その凹凸がスプリング7によって吸収される上、
ピンボ−ド1を適宜に上下動させることによって、第1
のピン体5の先端部5a,5bと端子とが接続されるも
のである。
According to this inspection device, since the springs 7 are built in the pins 3 and 3A, even if the pin contact surface of the printed wiring board P has some unevenness, the unevenness is not Absorbed by 7,
By appropriately moving the pin board 1 up and down, the first
And the terminals are connected to the tips 5a, 5b of the pin body 5 of FIG.

【0007】しかしながら、プリント配線基板Pにおけ
る電子部品の表面には、導電ランドへの端子への半田付
け性を促進するために使用したフラックスの残渣が被膜
を形成している関係で、ピンボ−ド1の接触動作によっ
てフラックスの残渣Fが図4に示すように第1のピン体
5の先端部5a,5bに付着するようになり、端子との
電気的に接触性が阻害されるようになるのみならず、検
査の信頼性も損なわれるようになる。
However, on the surface of the electronic component on the printed wiring board P, a residue of the flux used to promote the solderability to the terminal to the conductive land forms a film, so that the pin board is formed. As a result of the contact operation 1, the flux residue F adheres to the tips 5a and 5b of the first pin body 5 as shown in FIG. 4, and the electrical contact with the terminals is impaired. In addition, the reliability of the test is impaired.

【0008】従って、従来においては作業者が定期的に
ピンボ−ド1のピン3,3Aの先端部分をブラシや高圧
空気などを用いたりして掃除したり、或いは検査におい
て疑似欠陥の発生に合わせて清掃したりしているもの
の、前者の方法では清掃用の作業工数が増加し、コスト
が高くなるという問題があるし、又、後者の方法では疑
似欠陥の発生している時期のプリント配線基板の信頼性
を十分に保つことができないという問題がある。
Therefore, conventionally, an operator periodically cleans the tips of the pins 3 and 3A of the pin board 1 by using a brush or high-pressure air, or in response to the occurrence of a pseudo defect in the inspection. Although the former method involves cleaning, the former method has the problem of increasing the number of cleaning work steps and increasing the cost, and the latter method has a problem in that the printed circuit board during the period when pseudo defects are occurring However, there is a problem that the reliability cannot be sufficiently maintained.

【0009】それ故に、本発明の目的は、比較的に簡単
な構成によってピンの先端部分を簡単に清掃でき、ピン
と端子とを確実に接触させることのできる被検査基板の
検査装置を提供することにある。
SUMMARY OF THE INVENTION Therefore, an object of the present invention is to provide an apparatus for inspecting a substrate to be inspected, which can easily clean a tip end portion of a pin with a relatively simple structure and can surely contact a pin with a terminal. It is in.

【0010】[0010]

【課題を解決するための手段】従って、本発明は、上述
の目的を達成するために、ボ−ドに複数のピンを植立し
たピンボ−ドと、ピンボ−ドを上下動する昇降部と、少
なくともピンボ−ドを覆い、かつ上面の開口部分に被検
査基板の取付部を有する被検査基板の取付装置とを具備
し、前記被検査基板の取付装置内にダクトを、ピンの先
端側のピンボ−ド面がダクトの壁面に含まれるように形
成し、このダクトに流体を流すことによりピンに付着し
た絶縁部材を除去することを特徴とする。
SUMMARY OF THE INVENTION Accordingly, in order to achieve the above-mentioned object, the present invention provides a pin board having a plurality of pins planted on the board, and an elevating part for vertically moving the pin board. And a mounting device for the substrate to be inspected which covers at least the pin board and has a mounting portion for the substrate to be inspected in an opening on the upper surface. The pin board surface is formed so as to be included in the wall surface of the duct, and a fluid is caused to flow through the duct to remove an insulating member attached to the pin.

【0011】又、本発明の第2の発明は、ボ−ドに複数
のピンを植立したピンボ−ドと、ピンボ−ドを上下動す
る昇降部と、少なくともピンボ−ドを覆い、かつ上面の
開口部分に被検査基板の取付部を有する被検査基板の取
付装置とを具備し、前記被検査基板の取付装置内にダク
トを、ピンの先端側のピンボ−ド面がダクトの壁面に含
まれるように形成すると共に、ダクトの一方に送気用の
開口部を、他方に排出用の開口部を形成し、かつ、ダク
トの一方の開口部に送気装置を配置したことを特徴と
し、第3の発明は、前記ダクトの一方の開口部に送気装
置を、他方の開口部に吸引装置をそれぞれ配置したこと
を特徴とし、さらに、第4の発明は、前記ダクトの、他
方の開口部に近い通気経路にフィルタを配置したことを
特徴とする。
According to a second aspect of the present invention, there is provided a pin board having a plurality of pins planted on the board, an elevating portion for vertically moving the pin board, at least a cover for covering the pin board and an upper surface. And a mounting device for the substrate to be inspected having a mounting portion for the substrate to be inspected at an opening portion of the substrate, wherein a duct is included in the mounting device for the substrate to be inspected, and a pin board surface on a tip end side of the pin is included in a wall surface of the duct. And an opening for air supply in one of the ducts, an opening for discharge in the other, and an air supply device arranged in one opening of the duct, A third invention is characterized in that an air supply device is arranged at one opening of the duct, and a suction device is arranged at the other opening, and a fourth invention is characterized in that the other opening of the duct has the other opening. The filter is arranged in a ventilation path close to the part.

【0012】[0012]

【発明の実施の形態】次に、本発明にかかる被検査基板
の検査装置の1実施例について図1〜図2を参照して説
明する。尚、図3〜図4に示す従来例と同一部分には同
一参照符号を付し、その詳細な説明は省略する。同図に
おいて、本実施例の特徴部分は被検査基板(例えばプリ
ント配線基板)Pの取付装置9Aの内部構造及びその周
辺構造にある。
DESCRIPTION OF THE PREFERRED EMBODIMENTS Next, an embodiment of an inspection apparatus for a substrate to be inspected according to the present invention will be described with reference to FIGS. The same parts as those of the conventional example shown in FIGS. 3 and 4 are denoted by the same reference numerals, and detailed description thereof will be omitted. In this figure, the feature of this embodiment lies in the internal structure of the mounting device 9A for the substrate to be inspected (for example, a printed wiring board) P and its peripheral structure.

【0013】この取付装置9Aは、例えばピンボ−ド1
及び昇降部8,8を覆う箱形の本体部10と、本体部1
0の上面10aに形成された開口部11と、開口部11
の周辺部分に配置されたプリント配線基板Pの、例えば
枠状の取付部12と、本体部10の内部空間に、ピン
3,3Aの先端部5a,5bの突出側のピンボ−ド面が
壁面の一部として含むように形成されたダクト13と、
本体部10の一方の側壁10bに開口するように形成さ
れたダクト13の第1の開口部13aと、本体部10の
他方の側壁10cに開口するように形成されたダクト1
3の第2,第3の開口部13b,13cと、第1の開口
部13aに配置された送気装置14と、第2の開口部1
3bに配置された閉塞体15と、第3の開口部13cに
配置された吸引装置16と、ダクト13の、第2の開口
部13bと第3の開口部13cとの間における通気経路
に配置されたフィルタ17とから構成されている。
The mounting device 9A includes, for example, a pin board 1
And a box-shaped main body 10 that covers the lifting and lowering sections 8, 8;
Opening 11 formed on the upper surface 10a of the
In the printed wiring board P arranged in the peripheral portion of the main body 10, for example, the frame-shaped mounting portion 12 and the internal space of the main body 10 are provided with pin board surfaces on the protruding side of the tips 5a, 5b of the pins 3, 3A. A duct 13 formed to include as a part of
A first opening 13a of a duct 13 formed to open on one side wall 10b of the main body 10, and a duct 1 formed to open on the other side wall 10c of the main body 10.
3, the second and third openings 13b and 13c, the air supply device 14 disposed in the first opening 13a, and the second opening 1
3b, a suction device 16 disposed at the third opening 13c, and a ventilation path of the duct 13 between the second opening 13b and the third opening 13c. And a filter 17 which is provided.

【0014】次に、この検査装置の動作について図1〜
図2を参照して説明する。まず、図1に示すように、電
子部品などが実装されたプリント配線基板Pを取付装置
9Aの取付部12に、端子がダクト13側となるように
セットする。この状態で、開口部11は閉塞され、ピン
ボ−ド1のピン3,3Aの突出側の面はダクト13の一
部の壁面を構成することになる。次に、昇降部8,8を
駆動し、ピンボ−ド1を図示点線位置まで上昇させる。
これによって、ピンボ−ド1におけるピン3,3Aの先
端部5a,5bがプリント配線基板Pの端子に押し付け
られるように接触する。次に、この状態において、ピン
3,3Aに図示しない測定装置から各種の信号を供給す
ることによって各種検査が行われる。検査の終了後、昇
降部8,8を図示実線位置まで下降させる。この状態
で、送気装置14及び吸引装置16を駆動させ、送気装
置14で発生させた流体(高圧空気)を第1の開口部1
3aからダクト13内に送り込むと、この高圧空気は吸
引装置16の吸引作用と相俟ってダクト内を流れ、フィ
ルタ17,第3の開口部13cを介して吸引装置16か
ら本体部外に放出される。この高圧空気の流動の際に、
ピン3,3Aの先端部5a,5bに付着しているフラッ
クスの残渣Fが除去されると共に、高圧空気の流れに乗
ってフィルタ17の配置部分まで運ばれる。そして、フ
ィルタ17によって捕捉される結果、空気のみが吸引装
置16から本体部外に放出される。尚、フィルタ17に
捕捉されたフラックスなどの残渣Fは、定期的に、閉塞
体15を取り外した後、第2の開口部13bから取り出
すことによって清掃される。
Next, the operation of the inspection apparatus will be described with reference to FIGS.
This will be described with reference to FIG. First, as shown in FIG. 1, the printed wiring board P on which electronic components and the like are mounted is set on the mounting portion 12 of the mounting device 9A such that the terminals are on the duct 13 side. In this state, the opening 11 is closed, and the surface of the pin board 1 on the protruding side of the pins 3 and 3A forms a part of the wall surface of the duct 13. Next, the lifting units 8, 8 are driven to raise the pin board 1 to the position indicated by the dotted line in the figure.
As a result, the tips 5a and 5b of the pins 3 and 3A of the pin board 1 make contact with the terminals of the printed wiring board P so as to be pressed. Next, in this state, various inspections are performed by supplying various signals to the pins 3 and 3A from a measuring device (not shown). After the completion of the inspection, the lifting units 8, 8 are lowered to the position indicated by the solid line in the figure. In this state, the air supply device 14 and the suction device 16 are driven, and the fluid (high-pressure air) generated by the air supply device 14 is supplied to the first opening 1.
When the high-pressure air is sent into the duct 13 through the suction device 3a, the high-pressure air flows in the duct together with the suction operation of the suction device 16, and is discharged from the suction device 16 to the outside of the main body through the filter 17 and the third opening 13c. Is done. When this high pressure air flows,
The flux residue F adhered to the tips 5a and 5b of the pins 3 and 3A is removed, and the flux F is carried to the portion where the filter 17 is arranged by the flow of high-pressure air. Then, as a result of being captured by the filter 17, only air is released from the suction device 16 to the outside of the main body. It should be noted that the residue F such as flux captured by the filter 17 is periodically removed from the second opening 13b after removing the closing member 15, and is cleaned.

【0015】この検査装置によれば、ダクト内に高圧空
気を送り込んだ際に、ダクト13の一部の壁面を構成す
るピンボ−ド面側のピン3,3Aの先端部5a,5bに
は高圧空気が吹き付けられるために、先端部5a,5b
に付着したフラックスの残渣Fを容易に除去することが
できる。従って、ピン3,3Aの先端部5a,5bとプ
リント配線基板Pの端子との電気的な接触性を常に良好
に維持することができ、信頼性の高い検査が可能とな
る。
According to this inspection apparatus, when high-pressure air is sent into the duct, the high-pressure air is applied to the tips 5a and 5b of the pins 3 and 3A on the pinboard surface side which constitute a part of the wall surface of the duct 13. Because the air is blown, the tip portions 5a, 5b
The residue F of the flux adhered to the surface can be easily removed. Therefore, the electrical contact between the tips 5a and 5b of the pins 3 and 3A and the terminals of the printed wiring board P can always be kept good, and a highly reliable inspection can be performed.

【0016】特に、プリント配線基板Pの検査前ないし
検査後に必ずダクト13に高圧空気を流動させれば、常
にピン3,3Aの先端部5a,5bを清浄に保つことが
でき、一層に検査の信頼性を向上できるのみならず、作
業者による清掃作業を省略でき、コスト面での改善が期
待できる。
In particular, if high-pressure air is caused to flow through the duct 13 before or after the inspection of the printed wiring board P, the tips 5a and 5b of the pins 3 and 3A can be kept clean at all times. Not only the reliability can be improved, but also the cleaning work by the operator can be omitted, and an improvement in cost can be expected.

【0017】又、高圧空気によって除去されたフラック
スの残渣Fはフィルタ17によって捕捉され、本体部外
に排出されないために、環境への影響を皆無にできる
し、フィルタ17の近傍の側壁10cには第2の開口部
13bが形成されており、この開口部13bを利用する
ことにより、フィルタ17に蓄積された残渣Fを容易に
排出・除去できる。
Further, the flux residue F removed by the high-pressure air is captured by the filter 17 and is not discharged out of the main body, so that there is no influence on the environment. The second opening 13b is formed, and by using the opening 13b, the residue F accumulated in the filter 17 can be easily discharged and removed.

【0018】特に、第1の開口部13aに送気装置14
を、第3の開口部13cに吸引装置16を配置すれば、
高圧空気がピン3,3Aの先端部5a,5bに強く吹き
付けられるようになり、残渣Fを一層効果的に除去する
ことができる。
In particular, the air supply device 14 is provided in the first opening 13a.
If the suction device 16 is arranged in the third opening 13c,
The high-pressure air is strongly blown to the tips 5a and 5b of the pins 3 and 3A, so that the residue F can be more effectively removed.

【0019】尚、本発明は何ら上記実施例にのみ制約さ
れることなく、例えば送気装置は工場に布設されている
高圧空気配管に接続することにより、省略することもで
きる。又、吸引装置も省略することもできる。さらに、
流体は高圧空気以外のものも利用可能であり、ダクト内
に複数個所から供給することもできる。
The present invention is not limited to the above-described embodiment, but may be omitted, for example, by connecting the air supply device to a high-pressure air pipe laid in a factory. Further, the suction device can be omitted. further,
A fluid other than high-pressure air can be used, and the fluid can be supplied from a plurality of locations in the duct.

【0020】[0020]

【発明の効果】以上のように、本発明によれば、ダクト
内に流体を送り込んだ際に、ダクトの一部の壁面を構成
するピンボ−ド面側のピンの先端部には流体が吹き付け
られるために、ピン先端部に付着したフラックスの残渣
を容易に除去することができる。従って、ピンの先端部
と被検査基板の端子との電気的な接触性を常に良好に維
持することができ、信頼性の高い検査が可能となる。
As described above, according to the present invention, when a fluid is fed into the duct, the fluid is sprayed on the tip of the pin board side pin constituting a part of the wall surface of the duct. Therefore, the residue of the flux attached to the tip of the pin can be easily removed. Therefore, the electrical contact between the tip of the pin and the terminal of the substrate to be inspected can always be kept good, and a highly reliable inspection can be performed.

【0021】特に、被検査基板の検査に連動して検査前
ないし検査後に必ずダクトに流体を流動させれば、常に
ピンの先端部を清浄に保つことができ、一層に検査の信
頼性を向上できるのみならず、作業者による清掃作業を
省略でき、コスト面での改善が期待できる。
In particular, if a fluid is caused to flow through the duct before or after the inspection in conjunction with the inspection of the substrate to be inspected, the tip of the pin can be kept clean at all times, further improving the reliability of the inspection. Not only can it be done, but the cleaning work by the operator can be omitted, and improvement in cost can be expected.

【0022】又、流体によって除去されたフラックスの
残渣はフィルタによって捕捉され、本体部外に排出され
ないために、環境への影響を皆無にできるし、フィルタ
の近傍の側壁には第2の開口部が形成されており、この
開口部を利用することにより、フィルタに蓄積された残
渣Fを容易に排出・除去できる。
Further, the residue of the flux removed by the fluid is captured by the filter and is not discharged out of the main body, so that there is no influence on the environment, and the second opening is formed in the side wall near the filter. Are formed, and by using this opening, the residue F accumulated in the filter can be easily discharged and removed.

【0023】特に、第1の開口部に送気装置を、第3の
開口部に吸引装置を配置すると共に、流体として高圧空
気を利用すれば、高圧空気がピンの先端部に強く吹き付
けられるようになり、残渣を一層効果的に除去すること
ができる。
In particular, if an air supply device is arranged in the first opening and a suction device is arranged in the third opening, and high-pressure air is used as the fluid, the high-pressure air can be strongly blown to the tip of the pin. And the residue can be more effectively removed.

【図面の簡単な説明】[Brief description of the drawings]

【図1】本発明にかかる被検査基板の検査装置の1実施
例を示す側断面図である。
FIG. 1 is a side sectional view showing one embodiment of a device for inspecting a substrate to be inspected according to the present invention.

【図2】図1の平面図である。FIG. 2 is a plan view of FIG.

【図3】従来の検査装置の側断面図である。FIG. 3 is a side sectional view of a conventional inspection device.

【図4】図3の要部断面図である。FIG. 4 is a sectional view of a main part of FIG. 3;

【符号の説明】[Explanation of symbols]

P 被検査基板(プリント基板) F フラックスの残渣 1 ピンボ−ド 2 ボ−ド 3,3A ピン 5a,5b ピン先端部 8 昇降部 9A 被検査基板の取付装置 10 本体部 10a 上面 10b,10c 側壁 11 開口部 12 取付部 13 ダクト 13a,13b,13c 開口部 14 送気装置 15 閉塞体 16 吸引装置 17 フィルタ P Board to be inspected (printed board) F Residue of flux 1 Pin board 2 Board 3, 3A pin 5a, 5b Pin tip 8 Elevating section 9A Mounting device for board to be inspected 10 Main body 10a Top surface 10b, 10c Side wall 11 Opening 12 Mounting part 13 Duct 13a, 13b, 13c Opening 14 Air supply device 15 Closure 16 Suction device 17 Filter

Claims (4)

【特許請求の範囲】[Claims] 【請求項1】 ボ−ドに複数のピンを植立したピンボ−
ドと、ピンボ−ドを上下動する昇降部と、ピンボ−ド及
び昇降部を覆い、かつ上面の開口部分に被検査基板の取
付部を有する被検査基板の取付装置とを具備し、前記被
検査基板の取付装置内にダクトを、ピンの先端側のピン
ボ−ド面がダクトの壁面に含まれるように形成し、この
ダクトに流体を流すことによりピンに付着した絶縁部材
を除去することを特徴とする被検査基板の検査装置。
A pin board having a plurality of pins erected on the board.
A board for moving the pin board up and down, and a mounting device for the board to be inspected which covers the pin board and the lifting and lowering section and has a mounting portion for the board to be inspected in an opening on the upper surface. A duct is formed in the mounting device for the inspection board so that the pin board surface on the tip end side of the pin is included in the wall surface of the duct, and a fluid is caused to flow through the duct to remove the insulating member attached to the pin. Characteristic inspection device for inspected substrates.
【請求項2】 ボ−ドに複数のピンを植立したピンボ−
ドと、ピンボ−ドを上下動する昇降部と、ピンボ−ド及
び昇降部を覆い、かつ上面の開口部分に被検査基板の取
付部を有する被検査基板の取付装置とを具備し、前記被
検査基板の取付装置内にダクトを、ピンの先端側のピン
ボ−ド面がダクトの壁面に含まれるように形成すると共
に、ダクトの一方に送気用の開口部を、他方に排出用の
開口部を形成し、かつ、ダクトの一方の開口部に送気装
置を配置したことを特徴とする被検査基板の検査装置。
2. A pin board having a plurality of pins erected on the board.
A board for moving the pin board up and down, and a mounting device for the board to be inspected which covers the pin board and the lifting and lowering section and has a mounting portion for the board to be inspected in an opening on the upper surface. A duct is formed in the mounting device of the inspection board so that the pin board surface on the tip end side of the pin is included in the wall surface of the duct, and one of the ducts has an air supply opening and the other has a discharge opening. An inspection apparatus for inspecting a substrate to be inspected, wherein an air supply device is formed in one of the openings of the duct.
【請求項3】 前記ダクトの一方の開口部に送気装置
を、他方の開口部に吸引装置をそれぞれ配置したことを
特徴とする請求項2記載の被検査基板の検査装置。
3. The inspection apparatus for inspecting a substrate to be inspected according to claim 2, wherein an air supply device is arranged in one opening of the duct and a suction device is arranged in the other opening.
【請求項4】 前記ダクトの、他方の開口部に近い通気
経路にフィルタを配置したことを特徴とする請求項2又
は3記載の被検査基板の検査方法。
4. The method for inspecting a substrate to be inspected according to claim 2, wherein a filter is disposed in a ventilation path near the other opening of the duct.
JP9004814A 1997-01-14 1997-01-14 Inspection device for inspected circuit board Pending JPH10197556A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP9004814A JPH10197556A (en) 1997-01-14 1997-01-14 Inspection device for inspected circuit board

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP9004814A JPH10197556A (en) 1997-01-14 1997-01-14 Inspection device for inspected circuit board

Publications (1)

Publication Number Publication Date
JPH10197556A true JPH10197556A (en) 1998-07-31

Family

ID=11594221

Family Applications (1)

Application Number Title Priority Date Filing Date
JP9004814A Pending JPH10197556A (en) 1997-01-14 1997-01-14 Inspection device for inspected circuit board

Country Status (1)

Country Link
JP (1) JPH10197556A (en)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2002286751A (en) * 2001-03-22 2002-10-03 Hioki Ee Corp Probe unit and inspection device for circuit board
KR100835467B1 (en) 2006-12-08 2008-06-04 동부일렉트로닉스 주식회사 Air cleaning unit for probe card
CN113030694A (en) * 2021-01-06 2021-06-25 苏州凌创电子系统有限公司 Floating testing device for multiple groups of PCB boards

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2002286751A (en) * 2001-03-22 2002-10-03 Hioki Ee Corp Probe unit and inspection device for circuit board
KR100835467B1 (en) 2006-12-08 2008-06-04 동부일렉트로닉스 주식회사 Air cleaning unit for probe card
CN113030694A (en) * 2021-01-06 2021-06-25 苏州凌创电子系统有限公司 Floating testing device for multiple groups of PCB boards
CN113030694B (en) * 2021-01-06 2023-02-28 苏州凌创电子系统有限公司 Floating testing device for multiple groups of PCB (printed circuit board)

Similar Documents

Publication Publication Date Title
JP4491459B2 (en) Flat display panel substrate cleaning device
JPH03184355A (en) Wafer prober
US6499215B1 (en) Processing of circuit boards with protective, adhesive-less covers on area array bonding sites
JPH10197556A (en) Inspection device for inspected circuit board
JP2001021615A (en) Contact probe of socket for inspecting bga
JP2008147705A (en) Electronic component mounting apparatus
JP2012159359A (en) Checkup device and checkup method
US20030056365A1 (en) Coupon registration mechanism and method
JP3389809B2 (en) Plasma cleaning equipment for substrates
US20020186016A1 (en) Electrification quantity measurement apparatus, electrification quantity measurement method, static electricity discharge detection apparatus, and static electricity discharge detection method
JP2002094215A (en) Printed board test device
JPH06314899A (en) Apparatus and method for insertion and extraction of semiconductor
KR19980019657A (en) Burn-in socket cleaning device of burn-in board and its method
KR20050071117A (en) System for cleaning probe card needle
JP2897438B2 (en) Wafer prober
JP3189828B2 (en) Circuit module manufacturing method
JPH11233220A (en) Method for repairing defective contact of open-type socket for semiconductor evaluation test device and grinding sheet for repairing defective contact
JP2001246523A (en) Method of mounting electronic part, mounting device and method of manufacturing electro-optical device
KR200144292Y1 (en) PBGA Package
KR100350711B1 (en) The rubber mat dust removal device for testing of an electron parts and therefore socket construction
JPH09102478A (en) Method and mechanism for cleaning of face to be loaded with solder ball as well as solder-ball loading device
WO2006134901A1 (en) Coaxial cable unit, device interface apparatus and electronic component testing apparatus
JP3842506B2 (en) Manufacturing method of submergence detection sensor for vehicle
JP3838593B2 (en) Semiconductor device inspection method and semiconductor device inspection device
KR100835467B1 (en) Air cleaning unit for probe card