JPH10163380A - Manufacture of wiring board - Google Patents

Manufacture of wiring board

Info

Publication number
JPH10163380A
JPH10163380A JP31647296A JP31647296A JPH10163380A JP H10163380 A JPH10163380 A JP H10163380A JP 31647296 A JP31647296 A JP 31647296A JP 31647296 A JP31647296 A JP 31647296A JP H10163380 A JPH10163380 A JP H10163380A
Authority
JP
Japan
Prior art keywords
thermosetting resin
wiring board
wiring conductor
wiring
metal powder
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP31647296A
Other languages
Japanese (ja)
Inventor
Shogo Matsuo
省吾 松尾
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Kyocera Corp
Original Assignee
Kyocera Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Kyocera Corp filed Critical Kyocera Corp
Priority to JP31647296A priority Critical patent/JPH10163380A/en
Publication of JPH10163380A publication Critical patent/JPH10163380A/en
Pending legal-status Critical Current

Links

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/01Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L2224/42Wire connectors; Manufacturing methods related thereto
    • H01L2224/47Structure, shape, material or disposition of the wire connectors after the connecting process
    • H01L2224/48Structure, shape, material or disposition of the wire connectors after the connecting process of an individual wire connector
    • H01L2224/4805Shape
    • H01L2224/4809Loop shape
    • H01L2224/48091Arched
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/01Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L2224/42Wire connectors; Manufacturing methods related thereto
    • H01L2224/47Structure, shape, material or disposition of the wire connectors after the connecting process
    • H01L2224/48Structure, shape, material or disposition of the wire connectors after the connecting process of an individual wire connector
    • H01L2224/481Disposition
    • H01L2224/48151Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive
    • H01L2224/48221Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked
    • H01L2224/48225Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being non-metallic, e.g. insulating substrate with or without metallisation
    • H01L2224/48227Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being non-metallic, e.g. insulating substrate with or without metallisation connecting the wire to a bond pad of the item

Landscapes

  • Parts Printed On Printed Circuit Boards (AREA)
  • Production Of Multi-Layered Print Wiring Board (AREA)
  • Manufacturing Of Printed Wiring (AREA)

Abstract

PROBLEM TO BE SOLVED: To prevent the chipping, cracking, etc., of an insulating substrate even when a wiring board violently comes into collision with another wiring board or part of a semiconductor device. SOLUTION: When a wiring board is constituted by forming wiring conductors 2 formed by coupling metallic particles with a thermosetting resin on an insulating substrate 1 formed by coupling 60-95wt.% inorganic insulator powder with 5-40wt.% thermosetting resin, the surfaces of the metallic particles in the conductors 2 are coated with a silane coupling agent. When the surfaces of the metallic particles are coated with the coupling agent, the coupling between the metallic particles and thermosetting resin in the conductors 2 become extremely strong and part of the conductors 2 is not separated from the conductors nor peeled off from the substrate 1.

Description

【発明の詳細な説明】DETAILED DESCRIPTION OF THE INVENTION

【0001】[0001]

【発明の属する技術分野】本発明は半導体素子を収容す
るための半導体素子収納用パッケージや混成集積回路基
板等に用いられる配線基板及びその製造方法に関するも
のである。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a wiring board used for a semiconductor device housing package for housing a semiconductor element, a hybrid integrated circuit board, and the like, and a method of manufacturing the same.

【0002】[0002]

【従来の技術】従来、配線基板、例えば半導体素子を収
容する半導体素子収納用パッケージに使用される配線基
板は、酸化アルミニウム質焼結体等のセラミックスより
成り、その上面中央部に半導体素子を収容する凹部を有
する絶縁基体と、絶縁基体の凹部周辺から下面にかけて
導出されたタングステンやモリブデン等の高融点金属メ
タライズから成る配線導体とから構成されており、絶縁
基体の凹部底面に半導体素子をガラスや樹脂・ロウ材等
の接着剤により接着固定するとともに半導体素子の各電
極を例えばボンディングワイヤ等の電気的接続手段を介
して配線導体に電気的に接続し、しかる後、金属やセラ
ミックス等から成る蓋体を絶縁基体の上面に凹部を塞ぐ
ようにしてガラスや樹脂・ロウ材等の封止材により接合
させて絶縁基体の凹部内に半導体素子を気密に収容する
ことによって製品としての半導体装置となり、配線導体
の絶縁基体の下面に導出した部位を外部電気回路基板の
配線導体に半田等の電気的接続手段を介して接続するこ
とによって、絶縁基体の凹部に収容した半導体素子の各
電極が外部電気回路基板に電気的に接続されることとな
る。
2. Description of the Related Art Conventionally, a wiring board, for example, a wiring board used for a semiconductor element housing package for housing a semiconductor element is made of ceramics such as an aluminum oxide sintered body, and a semiconductor element is housed in a central portion of an upper surface thereof. And a wiring conductor made of a refractory metal such as tungsten or molybdenum which is led from the periphery of the recess to the lower surface of the insulating base. The electrodes of the semiconductor element are electrically fixed to the wiring conductor through an electrical connection means such as a bonding wire, and then the cover is made of metal, ceramic, or the like. The body is joined to the upper surface of the insulating substrate with a sealing material such as glass, resin, brazing material, etc. A semiconductor device as a product is obtained by hermetically housing the semiconductor element in the unit, and a portion of the wiring conductor led out to the lower surface of the insulating base is connected to the wiring conductor of the external electric circuit board via an electrical connection means such as solder. Thus, each electrode of the semiconductor element housed in the concave portion of the insulating base is electrically connected to the external electric circuit board.

【0003】この従来の配線基板は、例えばセラミック
グリーンシート積層法によって製作され、具体的には、
酸化アルミニウムや酸化珪素・酸化マグネシウム・酸化
カルシウム等のセラミック原料粉末に適当な有機バイン
ダや溶剤等を添加混合して泥漿状となすとともにこれを
従来周知のドクターブレード法を採用してシート状とす
ることによって複数のセラミックグリーンシートを得、
しかる後、所定のセラミックグリーンシートに適当な打
ち抜き加工を施すとともに配線導体となる金属ペースト
を所定パターンで印刷塗布し、最後にこれらセラミック
グリーンシートを所定の順に積層して生セラミック成形
体となすとともにこの生セラミック成形体を還元雰囲気
中約1600℃の高温で焼成することによって製作される。
[0003] This conventional wiring board is manufactured by, for example, a ceramic green sheet laminating method.
A ceramic powder such as aluminum oxide, silicon oxide, magnesium oxide, or calcium oxide is mixed with a suitable organic binder, a solvent, and the like to form a slurry, which is then formed into a sheet by using a conventionally known doctor blade method. By obtaining multiple ceramic green sheets,
Thereafter, a predetermined ceramic green sheet is subjected to an appropriate punching process, and a metal paste serving as a wiring conductor is printed and applied in a predetermined pattern, and finally, these ceramic green sheets are laminated in a predetermined order to form a green ceramic molded body. The green ceramic molded body is manufactured by firing at a high temperature of about 1600 ° C. in a reducing atmosphere.

【0004】しかしながら、この従来の配線基板は、絶
縁基体を構成する酸化アルミニウム質焼結体等のセラミ
ックスが硬くて脆い性質を有するため、搬送工程や半導
体装置製作の自動ライン等において配線基板同士あるい
は配線基板と半導体装置製作自動ラインの一部とが激し
く衝突すると絶縁基体に欠けや割れ・クラック等が発生
し、その結果、半導体素子を気密に収容することができ
ず、半導体素子を長期間にわたり正常且つ安定に作動さ
せることができなくなるという欠点を有していた。
However, in this conventional wiring board, since ceramics such as an aluminum oxide sintered body constituting the insulating base have a hard and brittle property, the wiring boards are not connected to each other in a transfer process or an automatic line for manufacturing semiconductor devices. If the wiring board and a part of the semiconductor device manufacturing automatic line collide violently, the insulating substrate may be chipped, cracked, cracked, etc., and as a result, the semiconductor element cannot be housed in an airtight manner, and the semiconductor element cannot be used for a long time. There was a drawback that normal and stable operation could not be achieved.

【0005】また、前述のような配線基板の製造方法に
よれば、生セラミック成形体を焼成する際に生セラミッ
ク成形体に不均一な焼成収縮が発生し、得られる配線基
板に反り等の変形や寸法のばらつきが発生して、その結
果、半導体素子の各電極と配線導体とを、あるいは配線
導体と外部電気回路基板の配線導体とを正確且つ確実に
電気的に接続することが困難であるという欠点を有して
いた。
Further, according to the method for manufacturing a wiring board as described above, when the green ceramic molded body is fired, uneven firing shrinkage occurs in the green ceramic molded body, and the obtained wiring board is deformed such as warpage. As a result, it is difficult to accurately and reliably electrically connect each electrode of the semiconductor element and the wiring conductor or the wiring conductor and the wiring conductor of the external electric circuit board. Had the disadvantage that

【0006】これに対し、配線基板の絶縁基体を従来の
セラミックスに代えて無機絶縁物粉末を熱硬化性樹脂で
結合した材料で形成するとともに、配線導体を従来の高
融点金属メタライズに代えて金属粉末を熱硬化性樹脂で
結合した材料で形成した配線基板が提案されている。
On the other hand, the insulating substrate of the wiring board is formed of a material obtained by bonding inorganic insulating powder with a thermosetting resin instead of the conventional ceramics, and the wiring conductor is formed of a metal instead of the conventional refractory metal metallization. There has been proposed a wiring board formed of a material in which powder is bonded with a thermosetting resin.

【0007】この無機絶縁物粉末を熱硬化性樹脂で結合
して成る絶縁基体と金属粉末を熱硬化性樹脂で結合して
成る配線導体とから成る配線基板は、熱硬化性樹脂前駆
体と無機絶縁物粉末とを混合して成る半硬化状態の前駆
体シートを準備するとともに所定の前駆体シートに適当
な打ち抜き加工を施し、次にこれに熱硬化性樹脂前駆体
と金属粉末とを混合して成る金属ペーストを所定パター
ンで印刷塗布し、最後にこの金属ペーストが印刷塗布さ
れた前駆体シートを必要に応じて積層するとともにこれ
を約100 〜300 ℃の温度で熱硬化させることによって製
作される。
A wiring board composed of an insulating base formed by bonding an inorganic insulating powder with a thermosetting resin and a wiring conductor formed by bonding a metal powder with a thermosetting resin is composed of a thermosetting resin precursor and an inorganic hardening resin. Prepare a precursor sheet in a semi-cured state by mixing with an insulating powder, perform appropriate punching on a given precursor sheet, and then mix a thermosetting resin precursor and metal powder with this. The metal paste is printed and applied in a predetermined pattern, and finally, the precursor sheet on which the metal paste is printed and applied is laminated as necessary and thermally cured at a temperature of about 100 to 300 ° C. You.

【0008】[0008]

【発明が解決しようとする課題】しかしながら、この無
機絶縁物粉末を熱硬化性樹脂で結合して成る絶縁基体と
金属粉末を熱硬化性樹脂で結合して成る配線導体とから
成る配線基板は、配線導体を構成する金属粉末と熱硬化
性樹脂との接合強度が若干弱く、配線基板に半導体素子
の電極を接続する際等において配線導体に大きな外力が
印加されると、この外力によって熱硬化性樹脂による金
属粉末同士の結合が外れて配線導体の一部が配線導体よ
り分離し、絶縁基体から剥離するため、半導体素子等の
電極と配線導体との電気的接続の信頼性が若干劣るとい
う解決すべき課題を有していた。
However, a wiring board comprising an insulating base formed by bonding the inorganic insulating powder with a thermosetting resin and a wiring conductor formed by bonding a metal powder with a thermosetting resin, The bonding strength between the metal powder constituting the wiring conductor and the thermosetting resin is slightly weak, and when a large external force is applied to the wiring conductor when connecting the electrodes of the semiconductor element to the wiring board, the external force causes the thermosetting resin to harden. The solution is that the reliability of the electrical connection between the electrodes such as semiconductor elements and the wiring conductors is slightly inferior because a part of the wiring conductors is separated from the wiring conductors due to the disconnection of the metal powders by the resin and separated from the wiring base. Had to be done.

【0009】本発明は上記事情に鑑みて案出されたもの
であり、その目的は、無機絶縁物粉末を熱硬化性樹脂で
結合して成る絶縁基体と金属粉末を熱硬化性樹脂で結合
して成る配線導体とから成る配線基板について、大きな
外力が印加されても配線導体が配線導体から分離するこ
とがなく、搭載される半導体素子の電極を配線導体に確
実且つ強固に電気的に接続することができる配線基板及
びその製造方法を提供することにある。
SUMMARY OF THE INVENTION The present invention has been made in view of the above circumstances, and has as its object to combine an insulating base formed by bonding an inorganic insulating powder with a thermosetting resin and a metal powder with a thermosetting resin. A wiring board made up of a wiring conductor made of a semiconductor device and a wiring conductor is not separated from the wiring conductor even when a large external force is applied, and the electrodes of the semiconductor element to be mounted are securely and firmly electrically connected to the wiring conductor. And a method of manufacturing the same.

【0010】[0010]

【課題を解決するための手段】本発明の配線基板は、60
乃至95重量%の無機絶縁物粉末を5乃至40重量%の熱硬
化性樹脂により結合して成る絶縁基体に金属粉末を熱硬
化性樹脂により結合した配線導体を被着形成して成る配
線基板であって、前記金属粉末の表面がシランカップリ
ング剤で被覆されていることを特徴とするものである。
According to the present invention, there is provided a wiring board comprising:
A wiring board formed by applying a wiring conductor formed by bonding a metal powder with a thermosetting resin to an insulating base formed by bonding 5 to 40% by weight of an inorganic insulating powder with a thermosetting resin of 5 to 40% by weight. In addition, the surface of the metal powder is coated with a silane coupling agent.

【0011】また本発明の配線基板は、上記構成におい
て前記シランカップリング剤の金属粉末に対する被覆量
が0.1 乃至5.0 重量%であることを特徴とするものであ
る。
In the wiring board according to the present invention, the coating amount of the silane coupling agent with respect to the metal powder is 0.1 to 5.0% by weight.

【0012】また、本発明の配線基板の製造方法は、熱
硬化性樹脂前駆体と無機絶縁物粉末とを混合して成る、
硬化後に絶縁基体となる前駆体シートを準備する工程
と、熱硬性樹脂前駆体と表面がシランカップリング剤で
被覆された金属粉末とを混合して成る、硬化後に配線導
体となる金属ペーストを前記前駆体シートに所定パター
ンで印刷塗布する工程と、前記前駆体シート及び金属ペ
ーストを熱硬化させる工程とを具備することを特徴とす
るものである。
Further, a method of manufacturing a wiring board according to the present invention comprises mixing a thermosetting resin precursor and an inorganic insulating powder.
A step of preparing a precursor sheet to be an insulating substrate after curing; and mixing a thermosetting resin precursor and a metal powder whose surface is coated with a silane coupling agent. The method includes a step of printing and applying the precursor sheet in a predetermined pattern, and a step of thermally curing the precursor sheet and the metal paste.

【0013】本発明の配線基板によれば、絶縁基体が無
機絶縁物粉末を靭性に優れる熱硬化性樹脂で結合するこ
とによって形成されていることから、配線基板同士ある
いは配線基板と半導体装置製作ラインの一部とが激しく
衝突したとしても絶縁基体に欠けや割れ・クラック等を
発生することはない。
According to the wiring board of the present invention, since the insulating base is formed by bonding the inorganic insulating powder with the thermosetting resin having excellent toughness, the wiring boards are connected to each other or the wiring board and the semiconductor device manufacturing line. Even if a part of the insulating substrate collides violently, chipping, cracking or cracking of the insulating substrate does not occur.

【0014】また本発明の配線基板によれば、配線導体
を構成する金属粉末の表面を金属粉末及び熱硬化性樹脂
の両方に対して結合性の強いシランカップリング剤で被
覆したことから、配線導体中の金属粉末と熱硬化性樹脂
との結合が極めて強いものとなり、その結果、配線導体
に半導体素子の電極を接続する際等において配線導体に
大きな外力が印加されても配線導体の一部が配線導体か
ら分離することはなく、また絶縁基体から剥離すること
もなくなり、半導体素子等の電極を配線導体に確実且つ
強固に電気的に接続することが可能となる。
Further, according to the wiring board of the present invention, the surface of the metal powder constituting the wiring conductor is coated with a silane coupling agent having a strong binding property to both the metal powder and the thermosetting resin. The bonding between the metal powder in the conductor and the thermosetting resin becomes extremely strong. As a result, even when a large external force is applied to the wiring conductor when connecting the electrode of the semiconductor element to the wiring conductor, a part of the wiring conductor is Is not separated from the wiring conductor and does not peel off from the insulating base, so that electrodes of a semiconductor element or the like can be securely and firmly electrically connected to the wiring conductor.

【0015】更に本発明の配線基板の製造方法によれ
ば、熱硬化性樹脂前駆体と無機絶縁物粉末とを混合して
なる、硬化後に絶縁基体となる前駆体シートを準備する
工程と、熱硬性樹脂前駆体と表面がシランカップリング
剤で被覆された金属粉末とを混合して成る、硬化後に配
線導体となる金属ペーストを前記前駆体シートに所定パ
ターンで印刷する工程と、前記前駆体シート及び金属ペ
ーストを熱硬化させる工程とを具備した工程で製作され
ることから、前駆体シートや金属ペーストの熱硬化性樹
脂前駆体は熱硬化時に殆ど収縮しないため、不均一な収
縮による変形や寸法のばらつきが配線基板に発生するこ
ともない。
Further, according to the method of manufacturing a wiring board of the present invention, there is provided a step of preparing a precursor sheet which is a mixture of a thermosetting resin precursor and an inorganic insulating powder and which becomes an insulating substrate after curing; Printing a metal paste to be a wiring conductor after curing in a predetermined pattern on the precursor sheet, comprising mixing a hard resin precursor and a metal powder whose surface is coated with a silane coupling agent; and And the step of thermally curing the metal paste, so that the thermosetting resin precursor of the precursor sheet or the metal paste hardly shrinks at the time of thermosetting, so that deformation and dimensions due to uneven shrinkage are caused. Does not occur on the wiring board.

【0016】[0016]

【発明の実施の形態】次に、本発明を添付の図面に基づ
き詳細に説明する。図1は、本発明の配線基板を半導体
素子を収容する半導体素子収納用パッケージに適用した
場合を示す実施の形態の例を示す断面図であり、同図に
おいて1は絶縁基体、2は配線導体、3は半導体素子で
ある。
DETAILED DESCRIPTION OF THE PREFERRED EMBODIMENTS Next, the present invention will be described in detail with reference to the accompanying drawings. FIG. 1 is a cross-sectional view showing an example of an embodiment in which a wiring board according to the present invention is applied to a semiconductor element housing package for housing a semiconductor element. In FIG. 1, 1 is an insulating base, and 2 is a wiring conductor. Reference numeral 3 denotes a semiconductor element.

【0017】本例における絶縁基体1は、3枚の絶縁基
板1a・1b・1cを積層することによって形成されて
おり、その上面中央部に半導体素子を収容するための凹
部1dを有し、この凹部1d底面には半導体素子3が樹
脂等の接着剤を介して接着固定される。
The insulating substrate 1 in this embodiment is formed by laminating three insulating substrates 1a, 1b and 1c, and has a concave portion 1d for accommodating a semiconductor element in the center of the upper surface thereof. The semiconductor element 3 is bonded and fixed to the bottom of the recess 1d via an adhesive such as a resin.

【0018】絶縁基体1を構成する絶縁基板1a・1b
・1cは、例えば酸化珪素や酸化アルミニウム・窒化ア
ルミニウム・炭化珪素・チタン酸バリウム・チタン酸ス
トロンチウム・チタン酸カルシウム・酸化チタン・ゼオ
ライト等の無機絶縁物粉末をエポキシ樹脂やポリイミド
樹脂・フェノール樹脂・熱硬化性ポリフェニレンエーテ
ル樹脂・ポリイミドアミド樹脂・ビスマレイミドトリア
ジン樹脂等の熱硬化性樹脂により結合することによって
形成されており、絶縁基体1を構成する3枚の絶縁基板
1a・1b・1cはその各々が無機絶縁物粉末を靭性に
優れるエポキシ樹脂等の熱硬化性樹脂で結合することに
よって形成されていることから、絶縁基体1に外力が印
加されてもこの外力によって絶縁基体1に欠けや割れ・
クラック等が発生することはない。
The insulating substrates 1a and 1b constituting the insulating base 1
1c is a powder of an inorganic insulating material such as silicon oxide, aluminum oxide, aluminum nitride, silicon carbide, barium titanate, strontium titanate, calcium titanate, titanium oxide, zeolite, epoxy resin, polyimide resin, phenol resin, heat It is formed by bonding with a thermosetting resin such as a curable polyphenylene ether resin, a polyimide amide resin, and a bismaleimide triazine resin. Since the inorganic insulating powder is formed by bonding the inorganic insulating powder with a thermosetting resin such as an epoxy resin having excellent toughness, even if an external force is applied to the insulating base 1, the insulating base 1 may be chipped or cracked by the external force.
There is no crack or the like.

【0019】なお、無機絶縁物粉末を熱硬化性樹脂で結
合して成る絶縁基体1を構成する3枚の絶縁基板1a・
1b・1cは、これに含有される無機絶縁物粉末の含有
量が60重量%未満であると絶縁基体1の熱膨張係数が半
導体素子3の熱膨張係数に対して大きく相違するため、
半導体素子3が作動時に熱を発してこの熱が半導体素子
3と絶縁基体1の両者に印加されると両者間に両者の熱
膨張係数の相違に起因する大きな熱応力が発生し、この
大きな熱応力によって半導体素子3が絶縁基体1から剥
離したり、半導体素子3に割れや欠けが発生してしまう
傾向がある。一方、無機絶縁物粉末の含有量が95重量%
を超えると、無機絶縁物粉末を熱硬化性樹脂で強固に結
合して所定の絶縁基体1を形成することが困難となる傾
向にある。従って、絶縁基体1を構成する絶縁基板1a
・1b・1cの各々の内部に含有される無機絶縁物粉末
の量は60乃至95重量%の範囲に設定することが必要であ
る。
It is to be noted that three insulating substrates 1a and 3a constituting an insulating base 1 formed by bonding inorganic insulating powder with a thermosetting resin.
1b and 1c are such that if the content of the inorganic insulating powder contained therein is less than 60% by weight, the thermal expansion coefficient of the insulating base 1 is significantly different from the thermal expansion coefficient of the semiconductor element 3.
When the semiconductor element 3 emits heat during operation and this heat is applied to both the semiconductor element 3 and the insulating base 1, a large thermal stress is generated between the two due to a difference in the coefficient of thermal expansion between the two. The stress tends to cause the semiconductor element 3 to peel off from the insulating base 1 or cause the semiconductor element 3 to crack or chip. On the other hand, the content of the inorganic insulating powder is 95% by weight.
When the ratio exceeds the above, it tends to be difficult to form a predetermined insulating substrate 1 by firmly bonding the inorganic insulating powder with a thermosetting resin. Therefore, the insulating substrate 1a constituting the insulating base 1
It is necessary to set the amount of the inorganic insulating powder contained in each of 1b and 1c in the range of 60 to 95% by weight.

【0020】また絶縁基体1には、その凹部1d周辺か
ら下面にかけて、例えば銅や銀・表面が銀で被覆された
銅・銀−銅合金・金等の金属粉末をエポキシ樹脂等の熱
硬化性樹脂により結合した配線導体2が形成されてい
る。
The insulating substrate 1 is coated with a metal powder such as copper, silver, a copper-silver-copper alloy or gold whose surface is coated with silver from the periphery of the concave portion 1d to the lower surface thereof by thermosetting epoxy resin or the like. The wiring conductor 2 joined by the resin is formed.

【0021】配線導体2は半導体素子3の各電極を外部
電気回路に電気的に接続する作用を為し、その絶縁基体
1の凹部1d周辺に位置する部位には半導体素子3の各
電極がボンディングワイヤ4を介して電気的に接続さ
れ、また絶縁基体1の下面に導出する部位は半田等の電
気的接続手段を介して外部電気回路に電気的に接続され
る。
The wiring conductor 2 functions to electrically connect each electrode of the semiconductor element 3 to an external electric circuit. Each electrode of the semiconductor element 3 is bonded to a portion of the insulating base 1 located around the concave portion 1d. A portion electrically connected via the wire 4 and a portion led out to the lower surface of the insulating base 1 is electrically connected to an external electric circuit via an electric connection means such as solder.

【0022】配線導体2に含有される金属粉末は、配線
導体2に導電性を付与する作用を為し、配線導体2にお
ける含有量が70重量%未満では配線導体2の電気抵抗が
高いものとなり、また95重量%を超えると金属粉末を熱
硬化性樹脂で強固に結合して所定の配線導体2を形成す
ることが困難となる傾向にある。従って、配線導体2の
内部に含有される金属粉末の量は、配線導体2に対して
70乃至95重量%の範囲としておくことが好ましい。
The metal powder contained in the wiring conductor 2 acts to impart conductivity to the wiring conductor 2. When the content in the wiring conductor 2 is less than 70% by weight, the electric resistance of the wiring conductor 2 becomes high. If it exceeds 95% by weight, it tends to be difficult to form a predetermined wiring conductor 2 by firmly bonding the metal powder with a thermosetting resin. Therefore, the amount of metal powder contained in the wiring conductor 2 is
It is preferable to set it in the range of 70 to 95% by weight.

【0023】また、本発明の配線基板においては、配線
導体2に含有される金属粉末が、その表面がアミノプロ
ピルトリメトキシシランやグリシドキシプロピルトリメ
トキシシラン・メタクリロキシプロピルトリメトキシシ
ラン等のシランカップリング剤で被覆されていることを
特徴とする。
Further, in the wiring board of the present invention, the metal powder contained in the wiring conductor 2 is made of a silane such as aminopropyltrimethoxysilane or glycidoxypropyltrimethoxysilane / methacryloxypropyltrimethoxysilane. It is characterized by being coated with a coupling agent.

【0024】これらの金属粉末の表面を被覆するシラン
カップリング剤は、そのシランカップリング剤を介して
金属粉末と熱硬化性樹脂とを強固に結合する作用を為
し、シランカップリング剤に含まれるアルコキシ基が加
水分解されて生成されるシラノール基と金属粉末とが化
学的及び物理的に強固に結合するとともにシランカップ
リング剤に含まれる有機反応基と熱硬化性樹脂に含まれ
る有機反応基とが化学結合により強固に結合することに
よって、配線導体2中の金属粉末と熱硬化性樹脂とを極
めて強固に結合する。
The silane coupling agent that coats the surface of the metal powder acts to firmly bind the metal powder and the thermosetting resin via the silane coupling agent, and is included in the silane coupling agent. The silanol group formed by hydrolysis of the alkoxy group is chemically and physically strongly bonded to the metal powder, and the organic reactive group contained in the silane coupling agent and the organic reactive group contained in the thermosetting resin Is strongly bonded by a chemical bond, so that the metal powder in the wiring conductor 2 and the thermosetting resin are extremely strongly bonded.

【0025】金属粉末を被覆するシランカップリング剤
は、その被覆量が金属粉末に対して0.1 重量%未満では
このシランカップリング剤を介して配線導体中の金属粉
末と熱硬化性樹脂とを極めて強固に結合することが困難
となる傾向にあり、また5.0重量%を超えると後述する
ように配線導体2となる金属ペーストを絶縁基体1とな
る前駆体シートに印刷塗布する際に金属ペーストの流動
性が悪いものとなり、所定パターンに正確に印刷塗布す
ることが困難となる傾向にある。従って、金属粉末を被
覆するシランカップリング剤は、その被覆量を金属粉末
に対して0.1 乃至5.0 重量%の範囲とすることが好まし
い。
When the coating amount of the silane coupling agent for coating the metal powder is less than 0.1% by weight with respect to the metal powder, the metal powder in the wiring conductor and the thermosetting resin are extremely separated via the silane coupling agent. When the content exceeds 5.0% by weight, the flow of the metal paste when printing and applying the metal paste to be the wiring conductor 2 to the precursor sheet to be the insulating substrate 1 will be described below if it exceeds 5.0% by weight. This tends to result in poor properties, making it difficult to accurately print and apply a predetermined pattern. Therefore, the coating amount of the silane coupling agent for coating the metal powder is preferably in the range of 0.1 to 5.0% by weight based on the metal powder.

【0026】また、配線導体2に含有される熱硬化性樹
脂は、配線導体2に含有される金属粉末を結合するとと
もに配線導体2を絶縁基体1に被着させる作用を為し、
配線導体2における含有量が5重量%未満では金属粉末
同士を強固に結合して配線導体2を形成することが困難
となる傾向にあり、また30重量%を超えると配線導体2
の電気抵抗が大きなものとなる傾向にある。従って、配
線導体2に含有される熱硬化性樹脂の含有量は5乃至30
重量%の範囲とすることが好ましい。
Further, the thermosetting resin contained in the wiring conductor 2 serves to bind the metal powder contained in the wiring conductor 2 and to adhere the wiring conductor 2 to the insulating base 1.
When the content in the wiring conductor 2 is less than 5% by weight, it tends to be difficult to form the wiring conductor 2 by firmly bonding the metal powders to each other.
Tend to have a large electric resistance. Therefore, the content of the thermosetting resin contained in the wiring conductor 2 is 5 to 30.
It is preferably in the range of% by weight.

【0027】なお、配線導体2の露出する表面には、ニ
ッケルや金等の耐食性に優れ且つ良導電性の金属をメッ
キ法により1乃至20μmの厚みに層着させておくと、配
線導体2の酸化腐食を有効に防止することができるとと
もに配線導体2とボンディングワイヤ4とを強固に電気
的に接続させることができる。従って、配線導体2は、
その露出する表面にニッケルや金等の耐食性に優れ且つ
良導電性の金属をメッキ法により1乃至20μmの厚みに
層着させておくことが好ましい。
If a metal having excellent corrosion resistance and good conductivity, such as nickel or gold, is coated on the exposed surface of the wiring conductor 2 to a thickness of 1 to 20 μm by plating, the wiring conductor 2 can be formed. Oxidation corrosion can be effectively prevented, and the wiring conductor 2 and the bonding wire 4 can be firmly and electrically connected. Therefore, the wiring conductor 2
It is preferable to coat a metal having excellent corrosion resistance and good conductivity, such as nickel or gold, on the exposed surface to a thickness of 1 to 20 μm by plating.

【0028】かくして本発明の配線基板によれば、絶縁
基体1の凹部1d底面に半導体素子3を樹脂等の接着剤
により接着固定するとともに半導体素子3の各電極をボ
ンディングワイヤ4を介して配線導体2に電気的に接続
し、その後、絶縁基体1の上面に凹部1dを覆うように
樹脂等から成る封止材により蓋体5を接合させ、絶縁基
体1と蓋体5とから成る容器内部に半導体素子3を気密
に収容することにより製品としての半導体装置が完成す
る。
Thus, according to the wiring board of the present invention, the semiconductor element 3 is bonded and fixed to the bottom surface of the concave portion 1d of the insulating base 1 with an adhesive such as a resin, and each electrode of the semiconductor element 3 is connected to the wiring conductor via the bonding wire 4. 2, and then the lid 5 is joined to the upper surface of the insulating substrate 1 with a sealing material made of resin or the like so as to cover the concave portion 1d. A semiconductor device as a product is completed by housing the semiconductor element 3 in an airtight manner.

【0029】次に、前記半導体素子収納用パッケージに
使用される配線基板の製造方法について図2に基づき説
明する。図2(a)〜(c)は、本発明の配線基板の製
造方法の例を示す工程毎の分解断面図である。
Next, a method of manufacturing a wiring board used in the package for housing a semiconductor element will be described with reference to FIG. FIGS. 2A to 2C are exploded cross-sectional views for respective steps illustrating an example of a method for manufacturing a wiring board according to the present invention.

【0030】先ず、図2(a)に示すように、無機絶縁
物粉末を熱硬化性樹脂前駆体で結合して成る、硬化後に
絶縁基体となる3枚の前駆体シート11a・11b・11cを
準備する。
First, as shown in FIG. 2A, three precursor sheets 11a, 11b, and 11c, which are formed by bonding an inorganic insulating powder with a thermosetting resin precursor and serve as an insulating base after curing, are formed. prepare.

【0031】これら3枚の前駆体シート11a・11b・11
cは、例えば酸化珪素や酸化アルミニウム・窒化アルミ
ニウム・炭化珪素・チタン酸バリウム・チタン酸ストロ
ンチウム・酸化チタン等の無機絶縁物粉末をエポキシ樹
脂やポリイミド樹脂・熱硬化性ポリフェニレンエーテル
樹脂・ビスマレイミドトリアジン樹脂等の熱硬化性樹脂
の前駆体で結合することによって形成されており、例え
ば粒径が0.1 〜100 μm程度の酸化珪素粉末にビスフェ
ノールA型エポキシ樹脂やビスフェノールF型エポキシ
樹脂・ノボラック型エポキシ樹脂・グリシジルエステル
型エポキシ樹脂等の熱硬化性樹脂及びアミン系硬化剤や
イミダゾール系硬化剤・酸無水物系硬化剤等の硬化剤を
添加混合して得たペーストをドクターブレード法等のシ
ート成形法を採用してシート状となすとともに約25〜10
0 ℃の温度で半硬化させることによって製作される。
The three precursor sheets 11a, 11b, 11
c is, for example, an inorganic insulating powder such as silicon oxide, aluminum oxide, aluminum nitride, silicon carbide, barium titanate, strontium titanate, and titanium oxide, epoxy resin, polyimide resin, thermosetting polyphenylene ether resin, bismaleimide triazine resin It is formed by bonding with a precursor of a thermosetting resin such as, for example, a silicon oxide powder having a particle size of about 0.1 to 100 μm, a bisphenol A epoxy resin, a bisphenol F epoxy resin, a novolak epoxy resin, A paste obtained by adding and mixing a thermosetting resin such as a glycidyl ester type epoxy resin and a curing agent such as an amine-based curing agent, an imidazole-based curing agent and an acid anhydride-based curing agent is subjected to a sheet forming method such as a doctor blade method. Approximately 25 ~ 10 with sheet form
Manufactured by semi-curing at a temperature of 0 ° C.

【0032】次に、図2(b)に示すように、3枚の前
駆体シート11a・11b・11cのうち2枚の前駆体シート
11a・11bに凹部1dとなる開口A・A’を、2枚の前
駆体シート11b・11cに配線導体2を引き回すための貫
通孔B・B’を各々形成する。
Next, as shown in FIG. 2B, two precursor sheets out of the three precursor sheets 11a, 11b and 11c are used.
Openings A and A 'to be recesses 1d are formed in 11a and 11b, and through holes B and B' for routing the wiring conductor 2 are formed in the two precursor sheets 11b and 11c.

【0033】これら開口A・A’及び貫通孔B・B’
は、例えば前駆体シート11a・11b・11cに従来周知の
パンチング加工法を施して各々に所定形状の孔を穿孔す
ることによって形成される。
The openings A and A 'and the through holes B and B'
Is formed, for example, by subjecting the precursor sheets 11a, 11b, and 11c to a well-known punching method, and punching holes of a predetermined shape in each of them.

【0034】次に、図2(c)に示すように、半硬化さ
せた前駆体シート11b・11cの上下面及び貫通孔B・
B’内に、硬化後に配線導体2となる金属ペースト12を
従来周知のスクリーン印刷法及び充填法を採用して所定
パターンに印刷塗布するとともに、これを約25〜100 ℃
の温度で約1〜60分間加熱して半硬化させる。
Next, as shown in FIG. 2C, the upper and lower surfaces of the semi-cured precursor sheets 11b and 11c and the through holes B and
In B ′, a metal paste 12 which becomes the wiring conductor 2 after curing is printed and applied in a predetermined pattern by using a conventionally known screen printing method and a filling method, and this is applied at about 25 to 100 ° C.
And semi-cured at a temperature of about 1 to 60 minutes.

【0035】金属ペースト12としては、例えば表面がア
ミノプロピルトリメトキシシランやグリシドキシプロピ
ルトリメトキシシラン・メタクリロキシプロピルトリメ
トキシシラン等のシランカップリング剤で被覆された粒
径が0.1 〜20μm程度の銅等粉末にビスフェノールA型
エポキシ樹脂やビスフェノールF型エポキシ樹脂・ノボ
ラック型エポキシ樹脂・グリシジルエステル型エポキシ
樹脂等のエポキシ樹脂及びアミン系硬化剤やイミダゾー
ル系硬化剤・酸無水物系硬化剤等の硬化剤等の硬化剤を
添加混合しペースト状となしたものが使用される。
As the metal paste 12, for example, the surface is coated with a silane coupling agent such as aminopropyltrimethoxysilane or glycidoxypropyltrimethoxysilane / methacryloxypropyltrimethoxysilane and has a particle size of about 0.1 to 20 μm. Epoxy resin such as bisphenol A type epoxy resin, bisphenol F type epoxy resin, novolak type epoxy resin, glycidyl ester type epoxy resin etc. and amine type curing agent, imidazole type curing agent, acid anhydride type curing agent etc. A paste obtained by adding and mixing a curing agent such as an agent is used.

【0036】なお、金属粉末をシランカップリング剤で
被覆するには、シランカップリング剤をメタノール等の
溶媒中に溶かした溶液中に金属粉末を浸漬した後、これ
を乾燥する方法等が採用される。
In order to coat the metal powder with a silane coupling agent, a method of immersing the metal powder in a solution in which the silane coupling agent is dissolved in a solvent such as methanol and then drying the same is adopted. You.

【0037】そして、これら3枚の半硬化された前駆体
シート11a・11b・11cを上下に積層するとともにこれ
を約80〜300 ℃の温度で約10秒〜24時間加熱し、前駆体
シート11a・11b・11c及び前駆体シート11b・11cに
所定パターンで印刷塗布された金属ペースト12を熱硬化
させることによって、図1に示すような絶縁基体1に配
線導体2を被着させた配線基板が完成する。この場合、
前駆体シート11a・11b・11c及び金属ペースト12は熱
硬化時に収縮することは殆どなく、従って、得られる配
線基板に変形や寸法のばらつきが発生することはほぼ皆
無であるので、半導体素子3と配線導体2とを正確に接
続することが可能となる。
Then, the three semi-cured precursor sheets 11a, 11b, 11c are vertically stacked and heated at a temperature of about 80 to 300 ° C. for about 10 seconds to 24 hours to form a precursor sheet 11a. A wiring board having a wiring conductor 2 adhered to an insulating base 1 as shown in FIG. 1 is obtained by thermally curing a metal paste 12 printed and applied in a predetermined pattern on the precursor sheets 11b and 11c and the precursor sheets 11b and 11c. Complete. in this case,
The precursor sheets 11a, 11b, 11c and the metal paste 12 hardly shrink during thermosetting, and therefore, there is almost no deformation or dimensional variation in the obtained wiring board. The wiring conductor 2 can be accurately connected.

【0038】なお、本発明は上述の実施の形態に限定さ
れるものではなく、本発明の要旨を逸脱しない範囲であ
れば種々の変更は可能である。例えば、上述の実施例で
は本発明の配線基板を半導体素子を収容する半導体素子
収納用パッケージに適用した場合を例に採って説明した
が、例えば混成集積回路等、他の用途に使用される配線
基板に適用してもよい。
It should be noted that the present invention is not limited to the above embodiment, and various changes can be made without departing from the gist of the present invention. For example, in the above embodiment, the case where the wiring board of the present invention is applied to a semiconductor element housing package for housing a semiconductor element has been described as an example. However, for example, wiring used for other purposes, such as a hybrid integrated circuit. It may be applied to a substrate.

【0039】また、上述の実施の形態では3枚の前駆体
シートを積層することによって配線基板を製作したが、
1枚や2枚、あるいは4枚以上の前駆体シートを使用し
て配線基板を製作してもよい。
In the above embodiment, the wiring board is manufactured by laminating three precursor sheets.
A wiring board may be manufactured using one, two, or four or more precursor sheets.

【0040】更に、上述の実施の形態では絶縁基体は無
機絶縁物粉末と熱硬化性樹脂とから成っていたが、これ
らに更にガラス繊維やカーボン繊維・アラミド繊維・ア
ルミナ繊維・チタン酸カリウムウィスカー・ホウ酸アル
ミニウムウィスカー等の短繊維を配合させてもよい。
Further, in the above-described embodiment, the insulating base is made of the inorganic insulating powder and the thermosetting resin. However, the insulating base is further made of glass fiber, carbon fiber, aramid fiber, alumina fiber, potassium titanate whisker, Short fibers such as aluminum borate whiskers may be blended.

【0041】更にまた、上述の実施例では配線導体は金
属粉末を熱硬化性樹脂により結合することにより形成さ
れていたが、この配線導体に更に低融点金属を配合する
とともにその低融点金属により金属粉末同士を結合する
ことによって配線導体を形成してもよい。この場合、配
線導体となる金属ペースト中に低融点金属として例えば
錫−鉛半田等から成る低融点金属粉末を配合し、これを
絶縁基体となる前駆体シートに印刷塗布した後、これを
加熱し、必要に応じて圧力を加えて、低融点金属粉末を
溶融させてその溶融した低融点金属により金属粉末を結
合する方法を採用すると、金属粉末同士の電気的接続が
確実且つ強固なものとなって配線導体の電気抵抗を極め
て小さくできるものとなる。
Further, in the above-described embodiment, the wiring conductor is formed by bonding metal powder with a thermosetting resin. The wiring conductor may be formed by combining powders. In this case, a low-melting-point metal powder composed of, for example, tin-lead solder or the like is blended as a low-melting-point metal in a metal paste to be a wiring conductor, and the resultant is printed and applied to a precursor sheet to be an insulating base, and then heated. If a method of applying pressure as needed to melt the low-melting metal powder and bonding the metal powder with the melted low-melting metal is adopted, the electrical connection between the metal powders becomes reliable and strong. Thus, the electric resistance of the wiring conductor can be extremely reduced.

【0042】[0042]

【発明の効果】本発明の配線基板によれば、絶縁基体が
無機絶縁物粉末を靱性に優れる熱硬化性樹脂で結合する
ことにより形成されていることから、配線基板同士ある
いは配線基板と半導体装置の一部とが激しく衝突しても
絶縁基体に欠けや割れ・クラック等が発生することはな
い。
According to the wiring board of the present invention, since the insulating base is formed by bonding the inorganic insulating powder with the thermosetting resin having excellent toughness, the wiring boards or the wiring board and the semiconductor device are formed. Even if a part of the insulating base material collides violently, the insulating substrate will not be chipped, cracked or cracked.

【0043】また本発明の配線基板によれば、配線導体
を構成する金属粉末の表面を金属粉末及び熱硬化性樹脂
の両方に対して結合性の強いシランカップリング剤で被
覆したことから、配線導体中の金属粉末と熱硬化性樹脂
との結合が極めて強いものとなり、その結果、配線導体
に半導体素子の電極を接続する際等において配線導体に
大きな外力が印加されても配線導体の一部が配線導体か
ら分離したり絶縁基体から剥離することはなく、配線基
板上に搭載した半導体素子等の電極を配線導体に確実且
つ強固に電気的接続することが可能となる。
Further, according to the wiring board of the present invention, the surface of the metal powder constituting the wiring conductor is coated with a silane coupling agent having a strong binding property to both the metal powder and the thermosetting resin. The bonding between the metal powder in the conductor and the thermosetting resin becomes extremely strong. As a result, even when a large external force is applied to the wiring conductor when connecting the electrode of the semiconductor element to the wiring conductor, a part of the wiring conductor is Is not separated from the wiring conductor or peeled off from the insulating base, and the electrodes of the semiconductor element or the like mounted on the wiring substrate can be securely and firmly electrically connected to the wiring conductor.

【0044】更に本発明の配線基板は、熱硬化性樹脂前
駆体と無機絶縁物粉末とを混合してなる硬化後に絶縁基
体となる前駆体シートを準備する工程と、熱硬性樹脂前
駆体と表面がシランカップリング剤で被覆された金属粉
末とを混合して成る硬化後に配線導体となる金属ペース
トを前記前駆体シートに所定パターンで印刷する工程
と、前記前駆体シート及び金属ペーストを熱硬化させる
工程とを具備する工程で製作され、前駆体シート及び金
属ペーストの熱硬化性樹脂前駆体は熱硬化時に殆ど収縮
しないことから、配線基板に不均一な収縮による変形や
寸法のばらつきが発生することもない。
Further, the wiring board of the present invention comprises a step of preparing a precursor sheet to be an insulating substrate after curing by mixing a thermosetting resin precursor and an inorganic insulating powder; Mixing a metal powder coated with a silane coupling agent with a metal powder, which is to be a wiring conductor after curing, and printing the metal paste on the precursor sheet in a predetermined pattern, and thermally curing the precursor sheet and the metal paste. Since the thermosetting resin precursor of the precursor sheet and the metal paste hardly shrinks at the time of thermosetting, the wiring board may be deformed due to non-uniform shrinkage and dimensional variations may occur. Nor.

【図面の簡単な説明】[Brief description of the drawings]

【図1】本発明の配線基板を半導体素子収納用パッケー
ジに適用した場合を示す実施の形態の例の断面図であ
る。
FIG. 1 is a cross-sectional view of an example of an embodiment showing a case where a wiring board of the present invention is applied to a package for housing a semiconductor element.

【図2】(a)〜(c)は、それぞれ本発明の配線基板
の製造方法の例を示す工程毎の分解断面図である。
FIGS. 2 (a) to 2 (c) are exploded cross-sectional views for respective steps showing an example of a method of manufacturing a wiring board according to the present invention.

【符号の説明】 1・・・・・・・・・・絶縁基体 2・・・・・・・・・・配線導体 11a、11b、11c・・・前駆体シート 12・・・・・・・・・・・・金属ペースト[Description of Signs] 1 ... Insulating base 2 ... Wiring conductors 11a, 11b, 11c ... Precursor sheet 12 ... ..... Metal paste

Claims (3)

【特許請求の範囲】[Claims] 【請求項1】 60乃至95重量%の無機絶縁物粉末を
5乃至40重量%の熱硬化性樹脂により結合して成る絶
縁基体に金属粉末を熱硬化性樹脂により結合した配線導
体を被着形成して成る配線基板であって、前記金属粉末
の表面がシランカップリング剤で被覆されていることを
特徴とする配線基板。
1. A wiring conductor formed by bonding a metal powder with a thermosetting resin to an insulating substrate formed by bonding 60 to 95% by weight of an inorganic insulating powder with a thermosetting resin of 5 to 40% by weight. A wiring board, comprising: a metal powder coated on a surface thereof with a silane coupling agent.
【請求項2】 前記シランカップリング剤の金属粉末に
対する被覆量が0.1乃至5.0重量%であることを特
徴とする請求項1記載の配線基板。
2. The wiring board according to claim 1, wherein the coating amount of the silane coupling agent with respect to the metal powder is 0.1 to 5.0% by weight.
【請求項3】 熱硬化性樹脂前駆体と無機絶縁物粉末と
を混合して成る、硬化後に絶縁基体となる前駆体シート
を準備する工程と、熱硬性樹脂前駆体と表面がシランカ
ップリング剤で被覆された金属粉末とを混合して成る、
硬化後に配線導体となる金属ペーストを前記前駆体シー
トに所定パターンで印刷塗布する工程と、前記前駆体シ
ート及び金属ペーストを熱硬化させる工程とを具備する
ことを特徴とする配線基板の製造方法。
3. A step of preparing a precursor sheet which is a mixture of a thermosetting resin precursor and an inorganic insulating powder and which becomes an insulating substrate after curing; and a step of preparing a thermosetting resin precursor and a silane coupling agent on the surface. Mixed with a metal powder coated with
A method for manufacturing a wiring board, comprising: a step of printing and applying a metal paste to become a wiring conductor after curing in a predetermined pattern on the precursor sheet; and a step of thermally curing the precursor sheet and the metal paste.
JP31647296A 1996-11-27 1996-11-27 Manufacture of wiring board Pending JPH10163380A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP31647296A JPH10163380A (en) 1996-11-27 1996-11-27 Manufacture of wiring board

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP31647296A JPH10163380A (en) 1996-11-27 1996-11-27 Manufacture of wiring board

Publications (1)

Publication Number Publication Date
JPH10163380A true JPH10163380A (en) 1998-06-19

Family

ID=18077484

Family Applications (1)

Application Number Title Priority Date Filing Date
JP31647296A Pending JPH10163380A (en) 1996-11-27 1996-11-27 Manufacture of wiring board

Country Status (1)

Country Link
JP (1) JPH10163380A (en)

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