JPH10126057A - Manufacture of multilayer interconnection board - Google Patents

Manufacture of multilayer interconnection board

Info

Publication number
JPH10126057A
JPH10126057A JP29586196A JP29586196A JPH10126057A JP H10126057 A JPH10126057 A JP H10126057A JP 29586196 A JP29586196 A JP 29586196A JP 29586196 A JP29586196 A JP 29586196A JP H10126057 A JPH10126057 A JP H10126057A
Authority
JP
Japan
Prior art keywords
layer
electroless
hole
plating
wiring board
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP29586196A
Other languages
Japanese (ja)
Inventor
Koichi Noguchi
浩一 野口
Yasuhiro Nakamura
康宏 中村
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Lincstech Circuit Co Ltd
Original Assignee
Hitachi AIC Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hitachi AIC Inc filed Critical Hitachi AIC Inc
Priority to JP29586196A priority Critical patent/JPH10126057A/en
Publication of JPH10126057A publication Critical patent/JPH10126057A/en
Pending legal-status Critical Current

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  • Production Of Multi-Layered Print Wiring Board (AREA)
  • Printing Elements For Providing Electric Connections Between Printed Circuits (AREA)
  • Manufacturing Of Printed Wiring (AREA)

Abstract

PROBLEM TO BE SOLVED: To prevent the permeation of an electroless plating solution into the internal wall of a through hole by only coating the internal surface of the through hole with an electroless-plated nickel layer and forming a plating resist layer on the surface of a multilayered wiring board and, after roughening the surface of an adhesive layer, forming a conductor pattern with electroless-plated copper films including the inside of the through hole. SOLUTION: Protective layers 4 are formed on both surface of a multilayer interconnection board 19 by laminating adhesive films having acid and alkali resistances and through holes 5 are bored at necessary spots. After a catalyst for electroless plating 8 is applied to the entire surface of the board 19 including the internal surfaces of the through holes 5 and the protective layers 4 composed of the adhesive films are removed, nickel layers 6 are formed in the through holes 5 by dipping the board 19 in an electroless nickel plating solution and a plating resist layer 7 is formed on the surface of the board 19 after the surface is polished. Then the surface of an adhesive layer 3 is roughened by dipping the board 19 in a sulfuric acid-based chemical etchant and a plated copper layer 8 is formed on the internal surfaces of the holes 5 and the surface of the multilayer interconnection board 19 by dipping the board 19 in an electroless copper plating solution. The plated nickel player 6 prevents the erosion of the holes 5 by the chemical etchant.

Description

【発明の詳細な説明】DETAILED DESCRIPTION OF THE INVENTION

【0001】[0001]

【発明の属する技術分野】本発明は、フルアディティブ
法による多層配線板の製造方法に関する。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a method for manufacturing a multilayer wiring board by a full additive method.

【0002】[0002]

【従来の技術】従来技術その第1として、図8(a)〜
(b)、図9(c)〜(d)及び図10(e)に基づ
き、エッチドフォイル法に係る多層配線板38の製造工
程を具体的に説明する。
2. Description of the Related Art As a first prior art, FIGS.
(B), the manufacturing process of the multilayer wiring board 38 according to the etched foil method will be specifically described based on FIGS. 9 (c) to 9 (d) and FIG. 10 (e).

【0003】まず、図8(a)に示すように、内層回路
21に絶縁層22、外層銅箔30を積層したガラスエポ
キシ銅張積層板31を用い、この積層板31に選択的な
貫通孔25を穿設し(図8(b))、次に、電気銅めっ
き34層からなる導通接続孔33を形成し(図8
(c))、次に、エッチングレジスト35(感光性ドラ
イフィルム)をラミネートとし、これにネガマスク32
を用い、紫外線露光36を行い(図9(d))、更に、
希アルカリ現像(無水Na2Co3水溶液1±0.3wt
%、温度30±2℃)、塩化第二鉄水溶液中に浸漬し必
要以外の銅箔30をエッチング除去し、エッチングレジ
ストを苛性ソーダ2.5〜3.0wt%水溶液で剥離し、
所望の導体パターン29形成が得られる(図10
(e))。しかし、このエッチドフォイル法38は、サ
イドエッチングによる導体パターン29精度の低下及び
銅マイグレーション等に問題がある。
First, as shown in FIG. 8A, a glass epoxy copper clad laminate 31 in which an insulating layer 22 and an outer copper foil 30 are laminated on an inner layer circuit 21 is used. 25 (FIG. 8 (b)), and then a conductive connection hole 33 made of 34 layers of electrolytic copper plating is formed (FIG. 8 (b)).
(C)) Next, an etching resist 35 (photosensitive dry film) is laminated, and a negative mask 32
UV exposure 36 is performed using (FIG. 9D).
Dilute alkali development (Anhydrous Na 2 Co 3 aqueous solution 1 ± 0.3wt
%, Temperature 30 ± 2 ° C.), immersed in an aqueous ferric chloride solution to remove unnecessary copper foil 30 by etching, and peeled off the etching resist with a 2.5 to 3.0 wt% aqueous solution of caustic soda,
A desired conductor pattern 29 can be formed (FIG. 10).
(E)). However, the etched foil method 38 has a problem in that the precision of the conductor pattern 29 is reduced due to side etching, copper migration, and the like.

【0004】従来技術その第2として、最近、導体パタ
ーン29精度の向上等に効果がある無電解銅めっき28
のみで導体パターン29を形成するフルアディティブ法
39が注目されている。このフルアディティブ法による
多層配線板39の製造方法として、CC−41法が公知
である。以下、図11(a)〜(b)及び図12(c)
〜(e)に基づき、フルアディティブ法に係る多層配線
板39の製造工程を具体的に説明する。
[0004] As a second prior art, recently, an electroless copper plating 28 which is effective for improving the accuracy of the conductor pattern 29 and the like.
Attention has been paid to a full additive method 39 for forming the conductor pattern 29 using only the conductor pattern 29. As a method of manufacturing the multilayer wiring board 39 by the full additive method, a CC-41 method is known. Hereinafter, FIGS. 11A and 11B and FIG.
Based on (e), the manufacturing process of the multilayer wiring board 39 according to the full additive method will be specifically described.

【0005】まず、図11(a)に示すように、無電解
銅めっき28触媒を含有するガラスエポキシ基材等の内
層回路板21に触媒入り絶縁層22及び接着剤層23を
積層した多層配線板19を用いて、これに選択的に貫通
孔25を穿設し(図11(b))、その後、クロム酸に
よる処理と亜硫酸ナトリウムによる中和からなる工程に
よりスミア除去を行い、次に、孔25内に無電解銅めっ
き28触媒を付与し、めっきレジスト層27を形成し
(図12(c))、更に、クロム酸−硫酸系混合溶液等
の化学エッチング液により接着剤層23を粗面化37し
た後(図12(d))、無電解銅めっき28で孔25内
を含む導体パターン29を形成し、所望のフルアディテ
ィブ法多層配線板39が得られる(図12(e))。
First, as shown in FIG. 11A, a multilayer wiring in which an insulating layer 22 containing a catalyst and an adhesive layer 23 are laminated on an inner circuit board 21 such as a glass epoxy base material containing an electroless copper plating 28 catalyst. Through holes 25 are selectively drilled in the plate 19 using the plate 19 (FIG. 11 (b)), and then smear is removed by a process consisting of treatment with chromic acid and neutralization with sodium sulfite. An electroless copper plating 28 catalyst is applied in the holes 25 to form a plating resist layer 27 (FIG. 12 (c)), and the adhesive layer 23 is further roughened with a chemical etching solution such as a chromic acid-sulfuric acid-based mixed solution. After the surface 37 (FIG. 12D), a conductor pattern 29 including the inside of the hole 25 is formed by electroless copper plating 28, and a desired fully additive multilayer wiring board 39 is obtained (FIG. 12E). .

【0006】[0006]

【発明が解決しようとする課題】従来のフルアディティ
ブ法(CC−41法及びAP−2法等)により多層配線
板39を製造する場合、無電解銅めっき28の前処理工
程として、クロム酸−硫酸系混合溶液等を用いた化学エ
ッチング法による接着剤層23の粗面化37が含まれ
る。
When the multilayer wiring board 39 is manufactured by the conventional full additive method (such as the CC-41 method and the AP-2 method), as a pretreatment step of the electroless copper plating 28, chromic acid Roughening 37 of the adhesive layer 23 by a chemical etching method using a sulfuric acid-based mixed solution or the like is included.

【0007】この際、接着剤層23表面が粗面化37さ
れるだけでなく、貫通孔25内壁の樹脂やガラスクロス
が侵食される。このため無電解銅めっき28際に、めっ
き液がガラスクロス間やガラスクロスと樹脂間にしみ込
み、銅28が析出するために電気絶縁性が低下し、耐電
食性が悪化するという問題がある。
At this time, not only the surface of the adhesive layer 23 is roughened 37, but also the resin and glass cloth on the inner wall of the through hole 25 are eroded. For this reason, in the electroless copper plating 28, there is a problem that the plating solution permeates between the glass cloths or between the glass cloth and the resin, and the copper 28 is deposited, so that the electric insulation property is lowered and the electric corrosion resistance is deteriorated.

【0008】また、AP−2法の場合、貫通孔25内を
含む全面に無電解銅めっき8用触媒を付与し、次に、め
っきレジスト層27を形成するために、めっきレジスト
層27の下に高濃度の触媒が存在し、その結果として表
面抵抗が低下するといった問題がある。
[0008] In the case of the AP-2 method, a catalyst for electroless copper plating 8 is applied to the entire surface including the inside of the through hole 25, and then the plating resist layer 27 is formed under the plating resist layer 27. However, there is a problem that a high concentration of the catalyst exists, and as a result, the surface resistance decreases.

【0009】従って、本発明は貫通孔5内壁への無電解
銅めっき8液のしみ込みによる電気絶縁性及び耐電食性
の低下や表面抵抗の劣化及び接続信頼性低下等の欠点を
解消しようとする多層配線板19の製造方法を提供する
ものである。
Accordingly, the present invention is intended to solve the drawbacks such as a decrease in electrical insulation and corrosion resistance, a decrease in surface resistance and a decrease in connection reliability due to the penetration of the electroless copper plating solution 8 into the inner wall of the through hole 5. It is intended to provide a method for manufacturing the multilayer wiring board 19.

【0010】[0010]

【課題を解決するための手段】本発明は、内層回路板1
に絶縁層2及び無電解銅めっき8用触媒を含有する接着
剤層3を積層した多層配線板19を用いる工法であっ
て、まず、この多層配線板19の両面に保護層4を形成
し、次いで、これに貫通孔5を穿設し、次に、貫通孔5
内を含む全面に無電解銅めっき8用触媒を付与し、前記
保護層4を除去後、孔5内壁だけを無電解ニッケルめっ
き層6で被覆し、めっきレジスト層7を形成し、接着剤
層3表面を粗面化11した後、孔5内を含む導体パター
ン9を無電解銅めっき8で形成することを特徴とする多
層配線板19の製造方法である。
According to the present invention, there is provided an inner circuit board 1 comprising:
Is a method of using a multilayer wiring board 19 in which an insulating layer 2 and an adhesive layer 3 containing a catalyst for electroless copper plating 8 are laminated. First, protective layers 4 are formed on both surfaces of the multilayer wiring board 19, Next, a through hole 5 is formed in this, and then the through hole 5 is formed.
After applying a catalyst for electroless copper plating 8 to the entire surface including the inside and removing the protective layer 4, only the inner wall of the hole 5 is covered with an electroless nickel plating layer 6, a plating resist layer 7 is formed, and an adhesive layer is formed. 3 is a method for manufacturing a multilayer wiring board 19, comprising forming a conductive pattern 9 including the inside of a hole 5 by electroless copper plating 8 after roughening 11 a surface.

【0011】また、前述と同様にして保護層4を除去し
た後、めっきレジスト層7を形成し、孔5内壁のみを無
電解ニッケル層6で被覆し、接着剤層3を粗面化11
し、その後、孔5内を含む導体パターン9を無電解銅め
っき8で形成することを特徴とする多層配線板19の製
造方法である。
After removing the protective layer 4 in the same manner as described above, a plating resist layer 7 is formed, only the inner wall of the hole 5 is covered with the electroless nickel layer 6, and the adhesive layer 3 is roughened.
Thereafter, a conductive pattern 9 including the inside of the hole 5 is formed by electroless copper plating 8, which is a method for manufacturing a multilayer wiring board 19.

【0012】また貫通孔5内壁を被覆する本発明の無電
解ニッケルめっき層6は、接着剤層3を粗面化11する
のに用いるクロム酸−硫酸系混合溶液等の化学エッチン
グ液が孔5内壁を侵食するのを防ぐと共に、後工程の無
電解銅めっき8の触媒として作用する役きがある。無電
解ニッケル層6の厚みは、前述の役きを満足するめっき
膜組成及び厚みであればよく、厚みは通常0.1μm以
上が好ましい。0.1μmに満たない場合は、化学エッ
チング液に対する耐久性が劣ることが多い。
The electroless nickel plating layer 6 of the present invention covering the inner wall of the through-hole 5 is made of a chemical etching solution such as a chromic acid-sulfuric acid-based mixed solution used to roughen the adhesive layer 3. It serves to prevent erosion of the inner wall and to act as a catalyst for electroless copper plating 8 in a later step. The thickness of the electroless nickel layer 6 may be any plating film composition and thickness satisfying the above-mentioned role, and the thickness is usually preferably 0.1 μm or more. When the thickness is less than 0.1 μm, the durability to a chemical etching solution is often poor.

【0013】接着剤層3を粗面化11した後、無電解銅
めっき8を行う前に、孔5内壁のニッケル膜6表面を活
性化処理することにより、ニッケル膜6上への無電解銅
めっき8の析出性やめっき層間の密着性を更に高めるこ
とができる。この活性化処理には、一般的なニッケル活
性化剤、例えば、塩酸、硝酸、リン酸等の他に、過硫酸
アンモニウムや過硫酸ナトリウム等の過硫酸塩溶液、フ
ッ化物を含有する固型酸溶液、フッ化物を含有する硝酸
溶液等があげられる。
After the surface of the adhesive layer 3 is roughened 11 and before the electroless copper plating 8 is performed, the surface of the nickel film 6 on the inner wall of the hole 5 is activated so that the electroless copper The deposition property of the plating 8 and the adhesion between the plating layers can be further enhanced. This activation treatment includes, in addition to a general nickel activator, for example, hydrochloric acid, nitric acid, phosphoric acid, etc., a persulfate solution such as ammonium persulfate or sodium persulfate, or a solid acid solution containing fluoride. And a nitric acid solution containing fluoride.

【0014】従って、本発明の多層配線板19の製造方
法を用いることにより、孔5内壁への無電解銅めっき8
液のしみ込みによる電気絶縁性及び耐電食性の低下や表
面抵抗の劣化及び信頼性低下等の問題点を解決をでき得
るものである。
Therefore, by using the method for manufacturing the multilayer wiring board 19 of the present invention, the inner wall of the hole 5 can be electrolessly plated with copper.
It is possible to solve problems such as a decrease in electrical insulation and electrolytic corrosion resistance, a decrease in surface resistance and a decrease in reliability due to liquid seepage.

【0015】[0015]

【発明の実施の形態】本発明の保護層4は、スミア除去
及び触媒付与工程で侵されることがなく、かつ、除去可
能な保護膜4を接着剤層3上に設けることにより、無電
解銅めっき8用触媒が接着剤層3表面に付着するのを防
ぐことができる。また、ニッケルめっき層6は、耐食性
に優れているために、化学エッチング液による侵食をほ
とんど受けない。このため、化学エッチング液による接
着剤層3表面の粗面化11の前に、孔5内壁をニッケル
めっき層6で被覆することにより、化学エッチング液に
より孔5内壁の樹脂やガラスクロスが侵食されるのを防
ぐことが可能となる。
BEST MODE FOR CARRYING OUT THE INVENTION The protective layer 4 of the present invention is formed by providing a protective film 4 on the adhesive layer 3 which is not affected by the smear removing and catalyst applying steps and which can be removed by electroless copper. The plating 8 catalyst can be prevented from adhering to the surface of the adhesive layer 3. Further, since the nickel plating layer 6 is excellent in corrosion resistance, it is hardly eroded by the chemical etching solution. Therefore, before the surface 11 of the adhesive layer 3 is roughened by the chemical etching solution, the inner wall of the hole 5 is covered with the nickel plating layer 6 so that the chemical etching solution erodes the resin and glass cloth on the inner wall of the hole 5. Can be prevented.

【0016】孔5内壁のガラスクロス間やガラスクロス
−樹脂間にニッケルめっき6液がしみ込んだ場合でも、
ニッケルは銅に比べ、比抵抗が高いだけでなく、イオン
化傾向が小さい、また、銅イオンの移動によるマイグレ
ーションが発生しにくいため、貫通孔5内壁の耐電食性
低下が起こりにくい。また、ニッケルめっき6は、銅め
っき8に比べめっきのつきまわり性が優れているため
に、孔5内壁面との密着性が向上する。
Even if the nickel plating solution 6 permeates between the glass cloth on the inner wall of the hole 5 or between the glass cloth and the resin,
Nickel not only has a higher specific resistance than copper, but also has a low ionization tendency, and migration due to migration of copper ions is less likely to occur. Further, since the nickel plating 6 has better throwing power of the plating than the copper plating 8, the adhesion to the inner wall surface of the hole 5 is improved.

【0017】更に、化学エッチング液による接着剤層3
の粗面化11後に、孔5内壁のニッケル膜6表面を活性
化処理することにより、ニッケル膜6上への無電解銅め
っき8の析出性やめっき間の密着力をさらに高めること
ができる。
Further, the adhesive layer 3 made of a chemical etching solution is used.
After the surface roughening 11, the surface of the nickel film 6 on the inner wall of the hole 5 is activated to further enhance the deposition property of the electroless copper plating 8 on the nickel film 6 and the adhesion between the platings.

【0018】前述の本発明により、多層配線板19の電
気絶縁性、耐電食性及び表面抵抗等の信頼性向上が可能
になり得るものである(図1参照)。
According to the present invention described above, it is possible to improve the reliability of the multilayer wiring board 19 such as electrical insulation, electric corrosion resistance and surface resistance (see FIG. 1).

【0019】[0019]

【実施例】以下、本発明の実施例を示す図2(a)〜
(b)、図3(c)〜(e)及び図4(f)に基づいて
更に詳細に説明する。
FIG. 2A to FIG. 2C show an embodiment of the present invention.
(B), and will be described in further detail with reference to FIGS. 3 (c) to 3 (e) and FIG. 4 (f).

【0020】[0020]

【実施例1】まず、図2(a)は、ガラスエポキシ基材
からなる内層回路板1に絶縁層2及び無電解銅めっき触
媒を含有する接着剤層3を積層した多層配線板19を用
い、
Embodiment 1 First, FIG. 2A shows a multilayer wiring board 19 in which an insulating layer 2 and an adhesive layer 3 containing an electroless copper plating catalyst are laminated on an inner circuit board 1 made of a glass epoxy substrate. ,

【0021】次に、図2(b)に示すように、この多層
配線板19の両面に耐酸及び耐アルカリ性を有する粘着
フィルムをラミネートし、保護層4を形成する。
Next, as shown in FIG. 2B, an adhesive film having acid resistance and alkali resistance is laminated on both surfaces of the multilayer wiring board 19 to form a protective layer 4.

【0022】図3(c)に示すように、必要箇所に、ド
リングの手段により貫通孔5を穿設する。
As shown in FIG. 3 (c), a through hole 5 is formed in a necessary portion by means of a drill.

【0023】次に、図3(d)に示すように、スミア除
去(アルカリ性過マンガン酸ナトリウム溶液に浸漬)し
た後、アルカリ性イオンタイプの触媒(パラジウム−ア
ミン錯体)溶液を用いて孔5内壁を含む全面に無電解用
めっき8触媒を付与し、前記保護層4の粘着フィルムを
剥離した後、無電解ニッケル6液(日本カニゼン製シュ
ーマーS754、めっき液温度75〜80℃)に5分間
浸漬し、貫通孔5内壁に厚さ約1μmのニッケル層6を
形成する。
Next, as shown in FIG. 3D, after the smear is removed (immersed in an alkaline sodium permanganate solution), the inner wall of the hole 5 is removed using an alkaline ion type catalyst (palladium-amine complex) solution. After applying an electroless plating 8 catalyst to the entire surface including the protective layer 4 and peeling off the adhesive film of the protective layer 4, it was immersed in an electroless nickel 6 solution (Nippon Kanigen Shumer S754, plating solution temperature 75 to 80 ° C) for 5 minutes. Then, a nickel layer 6 having a thickness of about 1 μm is formed on the inner wall of the through hole 5.

【0024】更に、図3(e)に示すように、めっきレ
ジスト層7の密着性を高めるために多層配線板19表面
をベルトサンダーの手段で研摩し、めっきレジスト層7
を形成する。
Further, as shown in FIG. 3E, the surface of the multilayer wiring board 19 is polished by means of a belt sander in order to enhance the adhesion of the plating resist layer 7, and the plating resist layer 7 is polished.
To form

【0025】次いで、図4(f)に示すように、クロム
酸−硫酸系化学エッチング液に浸漬し、接着剤層3表面
を粗面化11し、前記無電解銅めっき8液に浸漬後、貫
通孔5内壁と表面に銅めっき層8及び導体パターン9等
を形成し、所望の多層配線板19が得られる。
Next, as shown in FIG. 4 (f), the surface of the adhesive layer 3 is roughened 11 by immersion in a chromic acid-sulfuric acid based chemical etching solution, and then immersed in the electroless copper plating 8 solution. By forming the copper plating layer 8 and the conductor pattern 9 on the inner wall and the surface of the through hole 5, a desired multilayer wiring board 19 is obtained.

【0026】[0026]

【実施例2】実施例1の無電解ニッケル6液を奥野製薬
製トップニコロンE(めっき液温度80〜85℃、めっ
き浸漬時間7分)に代えた他は、同製造工程にして多層
配線板19が得られる。
Example 2 Multilayer wiring was performed in the same manufacturing process as in Example 1, except that the electroless nickel 6 solution was replaced by Okuno Pharmaceutical's Top Nicolon E (plating solution temperature 80-85 ° C, plating immersion time 7 minutes). A plate 19 is obtained.

【0027】[0027]

【実施例3】実施例1と同製造工程において、内層回路
板1、絶縁層2及び接着剤層3を積層した多層配線板1
9を用い(図2(a))、アルカリ剥離型耐酸インキを
印刷し、保護層4を形成する(図2(b))。次に、必
要箇所に、ドリング(ドリル)の手段により貫通孔5を
穿設し(図3(c))、前記多層配線板19をスミア除
去(無水クロム酸溶液に浸漬)した後、パラジウム−ス
ズ合金コロイド液を用い、孔5内を含む全面に無電解銅
めっき8用触媒を付与する。
Embodiment 3 In the same manufacturing process as in Embodiment 1, a multilayer wiring board 1 in which an inner circuit board 1, an insulating layer 2 and an adhesive layer 3 are laminated
9 (FIG. 2A), an alkaline peeling type acid-resistant ink is printed to form a protective layer 4 (FIG. 2B). Next, through holes 5 are drilled in necessary places by means of drilling (drill) (FIG. 3C), and the multilayer wiring board 19 is smeared (immersed in a chromic anhydride solution). A catalyst for electroless copper plating 8 is applied to the entire surface including the inside of the hole 5 using a tin alloy colloid solution.

【0028】次いで、5wt%水酸化ナトリウム水溶液で
保護層4を剥離した後、無電解ニッケルめっき6液(奥
野製薬製トップニコロンE、めっき液温度80〜85
℃)に15分間浸漬し、孔5内壁に厚さ約2μmのニッ
ケル層6を形成する(図3(d))。以下、実施例1と
同製造工程(図3(e)及び図4(f)参照)にして多
層配線板19が得られる。
Next, after the protective layer 4 was peeled off with a 5 wt% aqueous solution of sodium hydroxide, the electroless nickel plating 6 solution (Top Nicolon E manufactured by Okuno Pharmaceutical Co., Ltd., plating solution temperature 80-85)
C.) for 15 minutes to form a nickel layer 6 having a thickness of about 2 μm on the inner wall of the hole 5 (FIG. 3D). Hereinafter, a multilayer wiring board 19 is obtained through the same manufacturing steps as in Example 1 (see FIGS. 3E and 4F).

【0029】[0029]

【実施例4】無電解銅めっき8触媒を含有するガラスエ
ポキシ基材からなる内層回路板1に触媒入り絶縁層2及
び接着剤層3を積層した多層配線板19を用いて、実施
例3と同製造工程にて多層配線板19が得られる(図4
(f))。
Example 4 An electroless copper plating 8 was prepared by using a multilayer wiring board 19 in which an insulating layer 2 containing a catalyst and an adhesive layer 3 were laminated on an inner circuit board 1 made of a glass epoxy base material containing a catalyst. The multilayer wiring board 19 is obtained in the same manufacturing process.
(F)).

【0030】[0030]

【比較例1】実施例4と同製造工程にして、内層回路板
1、絶縁層2及び接着剤層3を積層した多層配線板19
を用いて、ドリングの手段により必要箇所に貫通孔5を
穿設する。
Comparative Example 1 A multilayer wiring board 19 having an inner circuit board 1, an insulating layer 2, and an adhesive layer 3 laminated in the same manufacturing process as in Example 4.
Then, through holes 5 are formed at necessary places by means of drilling.

【0031】次に、スミア除去(無水クロム酸溶液に浸
漬)し、次いで、パラジウム−スズ合金コロイド液を用
い、孔5内壁を含む全面に無電解銅めっき8用触媒を付
与し、表面の触媒除去及びめっきレジスト層7の密着性
を高めるためにこの多層配線板19の表面をベルトサン
ダーで研摩し、めっきレジスト層7を形成する。以下、
実施例1と同様にして、多層配線板が得られる。
Next, the smear is removed (immersed in a chromic anhydride solution), and then a catalyst for electroless copper plating 8 is applied to the entire surface including the inner wall of the hole 5 using a palladium-tin alloy colloidal solution. The surface of the multilayer wiring board 19 is polished with a belt sander in order to remove and enhance the adhesion of the plating resist layer 7 to form the plating resist layer 7. Less than,
A multilayer wiring board is obtained in the same manner as in the first embodiment.

【0032】以上、得られた多層配線板19について、
孔10内壁への無電解銅めっき8液のしみ込み量、隣り
合った孔10−孔10間の耐電食性及び表面回路間の絶
縁抵抗を測定し、その結果(表1)を下記に記載する。
As described above, with respect to the obtained multilayer wiring board 19,
The penetration amount of the electroless copper plating solution 8 into the inner wall of the hole 10, the electric corrosion resistance between the adjacent holes 10 and the insulation resistance between the surface circuits were measured, and the results (Table 1) are described below. .

【0033】[0033]

【表1】表1にめっきしみ込み量(μm)、電食性
(Ω)及び絶縁抵抗(Ω)等の測定結果を示す。 導通接続孔10断面を光学顕微鏡で観察し測定した。 孔10−孔10間(0.4mm)にDC50V印加し、85℃、85%RH で1000時間放置した後の絶縁抵抗値。 回路−回路間(0.2mm)の絶縁抵抗値。
Table 1 shows the measurement results of the amount of plating penetration (μm), electrolytic corrosion (Ω), insulation resistance (Ω), and the like. The cross section of the conductive connection hole 10 was observed and measured with an optical microscope. Insulation resistance value after applying DC 50 V between the holes 10 to 10 (0.4 mm) and leaving it to stand at 85 ° C. and 85% RH for 1000 hours. Insulation resistance between circuits (0.2 mm).

【0034】表1から明らかなように、本発明によれ
ば、孔5内壁への無電解銅めっき8液のしみ込みがなく
なり、電食試験後の絶縁抵抗や回路−回路間の絶縁抵抗
等の諸特性の信頼性向上をさせることができる多層配線
板19が得られるものである。
As is clear from Table 1, according to the present invention, the penetration of the electroless copper plating solution 8 into the inner wall of the hole 5 is eliminated, and the insulation resistance after the electrolytic corrosion test, the insulation resistance between circuits, etc. Thus, a multilayer wiring board 19 capable of improving the reliability of the various characteristics described above can be obtained.

【0035】[0035]

【実施例5】実施例3と同様にして、内層回路板1、絶
縁層2、接着剤層3(図5(a))紫外線硬化型アルカ
リ溶解型インキの保護層4を積層した多層配線板19を
用い(図5(b))、ドリルにより貫通孔5を穿設する
(図6(c))。
Fifth Embodiment In the same manner as in the third embodiment, a multilayer wiring board in which an inner circuit board 1, an insulating layer 2, an adhesive layer 3 (FIG. 5 (a)) and a protective layer 4 of an ultraviolet-curable alkali-soluble ink are laminated. Using FIG. 19 (FIG. 5 (b)), a through hole 5 is formed by a drill (FIG. 6 (c)).

【0036】次いで、CrO3濃度940〜960g/
lのクロム酸溶液を用いて、温度30〜34℃で20分
間処理後、水洗、亜硫酸水素ナトリウム溶液による中和
・還元処理、水洗を行うスミア除去工程を2回くり返し
て行う。その後、パラジウム−スズ合金コロイド液を用
いて孔5内を含む全面に無電解銅めっき8用触媒を付与
する。次いで、5%水酸化ナトリウム水溶液で保護層4
を剥離した後、めっきレジスト層7の密着性を高めるた
めにこの多層配線板19の表面をベルトサンダーで研摩
し、めっきレジスト層7を形成する(図6(d))。
Next, a CrO 3 concentration of 940 to 960 g /
After performing treatment at a temperature of 30 to 34 ° C. for 20 minutes using 1 chromic acid solution, the smear removing step of washing with water, neutralizing / reducing treatment with a sodium bisulfite solution, and washing with water is repeated twice. Thereafter, a catalyst for electroless copper plating 8 is applied to the entire surface including the inside of the hole 5 using a palladium-tin alloy colloid solution. Then, the protective layer 4 was treated with a 5% aqueous sodium hydroxide solution.
After peeling off, the surface of the multilayer wiring board 19 is polished with a belt sander in order to enhance the adhesion of the plating resist layer 7, thereby forming the plating resist layer 7 (FIG. 6D).

【0037】その後、無電解ニッケルめっき6液(日本
カニゼン製シューマーS−754、めっき液温度78〜
81℃)に12分間浸漬し、孔5内壁に厚さ約2μmの
ニッケル層6を形成する(図6(e))。
Thereafter, six electroless nickel plating solutions (Schumer S-754 manufactured by Nippon Kanigen Co., Ltd., plating solution temperature 78-
(81 ° C.) for 12 minutes to form a nickel layer 6 having a thickness of about 2 μm on the inner wall of the hole 5 (FIG. 6E).

【0038】次いで、クロム酸−硫酸系化学エッチング
液に浸漬し、接着剤層3表面を粗面化11した後、12
0〜170g/l過硫酸アンモニウム溶液(温度25
℃)に5分間浸漬し、孔5内壁のニッケル膜6表面を活
性化し、次いで、無電解銅めっき8に浸漬して孔5内壁
及び表面に35μmの銅めっき層8を形成して、本発明
の多層配線板19が得られる(図7(f))。
Next, the adhesive layer 3 is immersed in a chromic acid-sulfuric acid type chemical etching solution to roughen the surface of the adhesive layer 3.
0 to 170 g / l ammonium persulfate solution (temperature 25
C) for 5 minutes to activate the surface of the nickel film 6 on the inner wall of the hole 5, and then dipped in electroless copper plating 8 to form a 35 μm copper plating layer 8 on the inner wall and surface of the hole 5. Is obtained (FIG. 7F).

【0039】[0039]

【実施例6】実施例5のスミア除去工程を、CrO3
度15〜20g/l、硫酸濃度380〜420ml/l、
フッ化ナトリウム濃度5〜10g/lのクロム酸−硫酸
−フッ化物混合溶液を用いて、温度36℃で5分間処理
後、水洗、亜硫酸水素ナトリウム溶液による中和・還元
処理、水洗を行うスミア除去工程に代えたほかは、同様
にして多層配線板19が得られる(図7(f))。
Embodiment 6 The smear removing step of the embodiment 5 is carried out by a CrO 3 concentration of 15 to 20 g / l, a sulfuric acid concentration of 380 to 420 ml / l,
Using a mixed solution of chromic acid-sulfuric acid-fluoride having a sodium fluoride concentration of 5 to 10 g / l at a temperature of 36 ° C. for 5 minutes, washing with water, neutralizing / reducing treatment with a sodium hydrogen sulfite solution, and washing with water to remove smears A multilayer wiring board 19 is obtained in the same manner except that the process is replaced (FIG. 7F).

【0040】[0040]

【実施例7】実施例5のスミア除去工程を、CrO3
度940〜960g/lのクロム酸溶液(温度30〜3
4℃、時間20分)による処理、水洗、中和・還元処
理、水洗を行った後、CrO3濃度5〜10g/l、硫
酸濃度380〜420ml/l、フッ化ナトリウム濃度5
〜10g/lのクロム酸−硫酸−フッ化物混合溶液(温
度36℃、時間3分間)による処理、水洗、中和・還元
処理、水洗を行うスミア除去工程に代えたほかは、同様
にして多層配線板19が得られる(図7(f))。
EXAMPLE 7 The smear removing step of Example 5 was carried out using a chromic acid solution having a CrO 3 concentration of 940 to 960 g / l (temperature 30 to 3).
4 ° C., time 20 minutes), water washing, neutralization / reduction treatment, and water washing, followed by a CrO 3 concentration of 5 to 10 g / l, a sulfuric acid concentration of 380 to 420 ml / l, and a sodium fluoride concentration of 5
A multilayer was prepared in the same manner except that a treatment with a chromic acid-sulfuric acid-fluoride mixed solution of 10 to 10 g / l (temperature: 36 ° C., time: 3 minutes), water washing, neutralization / reduction treatment, and a smear removing step of water washing were performed. The wiring board 19 is obtained (FIG. 7F).

【実施例8】実施例5のニッケル膜6表面の活性化処理
を省いた他は、同様に多層配線板19が得られる(図7
(f))。
Embodiment 8 A multilayer wiring board 19 is obtained in the same manner as in Embodiment 5, except that the activation treatment of the surface of the nickel film 6 is omitted.
(F)).

【0041】以上、実施例5〜8及び比較例1で得られ
た多層配線板19について、孔10内壁への無電解銅め
っき8液のしみ込み量、隣り合った孔10−孔10の電
食性、絶縁抵抗の測定及び孔10内壁面とめっき層との
密着性、ホットオイル試験による接続信頼性を評価し、
その結果(表2)を下記に記載する。 以下余白。
As described above, with respect to the multilayer wiring boards 19 obtained in Examples 5 to 8 and Comparative Example 1, the penetration amount of the electroless copper plating solution 8 into the inner wall of the hole 10 and the electric current between the adjacent holes 10 to 10 were measured. Evaluation of corrosion resistance, insulation resistance, adhesion between inner wall surface of hole 10 and plating layer, connection reliability by hot oil test,
The results (Table 2) are described below. Margin below.

【0042】表2に接続信頼性の評価結果を示す。Table 2 shows the evaluation results of connection reliability.

【表2】 孔10断面を光学顕微鏡で観察し測定した。 孔10−孔10間(0.4mm)にDC50V印加し、85℃、85%RH で1000時間放置した後の絶縁抵抗値。 回路−回路間(0.2mm)の絶縁抵抗値。 260℃はんだ浴に20秒浸漬、10秒放置を3回くり返した後、孔10 の断面を顕微鏡(倍率400倍)にて観察した。 ホットオイル試験(260℃オイル5秒浸漬、常温水中5秒浸漬を1サイ クルとする)で、800孔のシリーズ抵抗値を測定し、抵抗値が初期値の1 0%以上上昇したサイクル数を不合格とした。[Table 2] The cross section of the hole 10 was observed and measured with an optical microscope. Insulation resistance value after applying DC 50 V between the holes 10 to 10 (0.4 mm) and leaving it to stand at 85 ° C. and 85% RH for 1000 hours. Insulation resistance between circuits (0.2 mm). After being immersed in a 260 ° C. solder bath for 20 seconds and left standing for 10 seconds three times, the cross section of the hole 10 was observed with a microscope (400 × magnification). In a hot oil test (immersion in oil at 260 ° C for 5 seconds, immersion in normal temperature water for 5 seconds as one cycle), the series resistance of 800 holes was measured, and the number of cycles at which the resistance increased by 10% or more of the initial value was determined. I failed.

【0043】表2から明らかなように、本発明によれ
ば、孔5内壁への無電解銅めっき8液のしみ込みがなく
なり、電食試験後の絶縁抵抗や回路−回路間の絶縁抵抗
も向上させることができる他、孔10内めっき層の密着
性及び接続信頼性を向上させることができる多層配線板
19を得ることができる。
As is apparent from Table 2, according to the present invention, the penetration of the electroless copper plating solution 8 into the inner wall of the hole 5 is eliminated, and the insulation resistance after the electrolytic corrosion test and the insulation resistance between circuits are also reduced. In addition to being able to improve, it is possible to obtain the multilayer wiring board 19 that can improve the adhesion of the plating layer in the hole 10 and the connection reliability.

【0044】図1に本発明の実施例において、導通接続
孔10の貫通孔5内壁にニッケルめっき層6を形成し、
その後、ニッケルめっき層6面上を活性化し、無電解銅
めっき層8を形成した多層配線板19である。
FIG. 1 shows an embodiment of the present invention in which a nickel plating layer 6 is formed on the inner wall of a through hole 5 of a conductive connection hole 10.
Thereafter, the surface of the nickel plating layer 6 is activated to form the multilayer wiring board 19 on which the electroless copper plating layer 8 is formed.

【0045】[0045]

【発明の効果】以上、説明したように、本発明によれ
ば、多層配線板19において、接着剤層3表面への無電
解銅めっき8液用触媒の付着及び孔5内壁への無電解銅
めっき8のしみ込みを防ぎ、電気絶縁性、耐電食性及び
接続信頼性等が向上でき得たために、以下に記載する特
有な効果を奏する。
As described above, according to the present invention, in the multilayer wiring board 19, the catalyst for the electroless copper plating eight-solution is attached to the surface of the adhesive layer 3 and the electroless copper is Since the penetration of the plating 8 can be prevented and the electrical insulation, the corrosion resistance, the connection reliability, and the like can be improved, the following specific effects can be obtained.

【0046】(1)本発明によれば、スミア除去及び触
媒付与工程で侵されることなく、かつ剥離可能な保護層
4を接着剤層3上に設け、更に化学エッチング液による
接着剤層3表面の粗面化11工程の前に、孔5内壁をニ
ッケルめっき層6で被覆し、無電解銅めっき8液を行う
ことにより、孔5内壁への無電解銅めっき8のしみ込み
がなくなり、耐電食性、電気絶縁性及び接続信頼性等に
優れた多層配線板19の製造方法が得られ、産業上寄与
する効果は極めて大きい。
(1) According to the present invention, a protective layer 4 that can be peeled off without being affected by the smear removal and catalyst application steps is provided on the adhesive layer 3, and the surface of the adhesive layer 3 is further etched with a chemical etching solution. Before the surface roughening 11 step, the inner wall of the hole 5 is covered with a nickel plating layer 6 and electroless copper plating 8 solution is applied, so that the electroless copper plating 8 does not seep into the inner wall of the hole 5 and A method for manufacturing the multilayer wiring board 19 having excellent corrosion resistance, electrical insulation properties, connection reliability, and the like is obtained, and the effect of contributing to industry is extremely large.

【0047】(2)本発明によれば、スミア除去工程と
して、アルカリ性過マンガン酸塩溶液、クロム酸溶液、
クロム酸−硫酸−フッ化物混合溶液を用いた処理を行う
ことにより、良好な孔5内壁面状態とすることが可能と
なり得る多層配線板19が得られる。
(2) According to the present invention, as the smear removing step, an alkaline permanganate solution, a chromic acid solution,
By performing the treatment using the mixed solution of chromic acid-sulfuric acid-fluoride, the multilayer wiring board 19 capable of forming a good inner wall surface state of the hole 5 is obtained.

【0048】(3)本発明によれば、クロム酸−硫酸系
化学エッチング液による接着剤層3の粗面化11後に、
孔5内壁のニッケル膜6表面を活性化処理することによ
り、ニッケル膜6上への無電解銅めっき8の析出性やめ
っき間の密着力を更に高めることができ、接続信頼性が
更に向上でき得る多層配線板19が得られる。
(3) According to the present invention, after roughening the adhesive layer 3 with a chromic acid-sulfuric acid-based chemical etching solution, 11
By activating the surface of the nickel film 6 on the inner wall of the hole 5, the deposition property of the electroless copper plating 8 on the nickel film 6 and the adhesion between the platings can be further increased, and the connection reliability can be further improved. The obtained multilayer wiring board 19 is obtained.

【図面の簡単な説明】[Brief description of the drawings]

【図1】本発明の実施例を示す断面図。FIG. 1 is a sectional view showing an embodiment of the present invention.

【図2】(a)〜(b)は、本発明の製造工程を示す断
面図。
FIGS. 2A and 2B are cross-sectional views illustrating a manufacturing process of the present invention.

【図3】(c)〜(e)は、本発明の製造工程を示す断
面図。
FIGS. 3 (c) to 3 (e) are cross-sectional views illustrating a manufacturing process of the present invention.

【図4】(f)は、本発明の製造工程を示す断面図。FIG. 4 (f) is a sectional view showing a manufacturing step of the present invention.

【図5】(a)〜(b)は、本発明の製造工程を示す断
面図。
FIGS. 5A and 5B are cross-sectional views illustrating a manufacturing process of the present invention.

【図6】(c)〜(e)は、本発明の製造工程を示す断
面図。
FIGS. 6 (c) to 6 (e) are cross-sectional views showing a manufacturing process of the present invention.

【図7】(f)は、本発明の製造工程を示す断面図。FIG. 7 (f) is a sectional view showing a manufacturing step of the present invention.

【図8】(a)〜(b)は、従来の製造工程を示す断面
図。
8A and 8B are cross-sectional views showing a conventional manufacturing process.

【図9】(c)〜(d)は、従来の製造工程を示す断面
図。
FIGS. 9C to 9D are cross-sectional views illustrating a conventional manufacturing process.

【図10】(e)は、従来の製造工程を示す断面図。FIG. 10E is a cross-sectional view showing a conventional manufacturing process.

【図11】(a)〜(b)は、従来の製造工程を示す断
面図。
11A and 11B are cross-sectional views showing a conventional manufacturing process.

【図12】(c)〜(e)は、従来の製造工程を示す断
面図。
12 (c) to 12 (e) are cross-sectional views showing a conventional manufacturing process.

【符号の説明】[Explanation of symbols]

1…内層回路板 2…絶縁層 3…接着剤層 4…保護
層 5…貫通孔 6…ニッケルめっき層(無電解) 7…めっきレジスト
層 8…銅めっき層(無電解) 9…導体パターン 10…
導通接続孔 11…粗面化 12…内層銅箔 19…本発明の多層配
線板 21…内層回路板 22…絶縁層 23…接着剤層 2
4…保護層 25…貫通孔 26…内層銅箔 27…めっきレジスト
層 28…銅めっき層(無電解) 29…導体パターン 3
0…外層銅箔 31…銅張積層板 32…ネガマスク 33…導通接続
孔 34…電気銅めっき層 35…エッチングレジスト(ド
ライフィルム) 36…紫外線露光 37…粗面化 38…従来技術のサブトラク(エッチドフォイル)工法
多層配線板 39…従来技術のフルアディティブ工法多層配線板
REFERENCE SIGNS LIST 1 inner circuit board 2 insulating layer 3 adhesive layer 4 protective layer 5 through hole 6 nickel plating layer (electroless) 7 plating resist layer 8 copper plating layer (electroless) 9 conductor pattern 10 …
Conductive connection hole 11 ... Roughening 12 ... Inner copper foil 19 ... Multilayer wiring board 21 of the present invention 21 ... Inner circuit board 22 ... Insulating layer 23 ... Adhesive layer 2
4 Protective layer 25 Through hole 26 Inner layer copper foil 27 Plating resist layer 28 Copper plating layer (electroless) 29 Conductor pattern 3
0 ... Outer layer copper foil 31 ... Copper clad laminate 32 ... Negative mask 33 ... Conduction connection hole 34 ... Electric copper plating layer 35 ... Etching resist (dry film) 36 ... Ultraviolet exposure 37 ... Roughening 38 ... Conventional subtract (etch) Dofoil) Multi-layer wiring board 39 ... Full-additive multi-layer wiring board of the prior art

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【手続補正書】[Procedure amendment]

【提出日】平成8年11月1日[Submission date] November 1, 1996

【手続補正1】[Procedure amendment 1]

【補正対象書類名】明細書[Document name to be amended] Statement

【補正対象項目名】全図[Correction target item name] All figures

【補正方法】変更[Correction method] Change

【補正内容】[Correction contents]

【書類名】 図面[Document Name] Drawing

【図1】 FIG.

【図2】 FIG. 2

【図3】 FIG. 3

【図4】 FIG. 4

【図5】 FIG. 5

【図6】 FIG. 6

【図7】 FIG. 7

【図8】 FIG. 8

【図9】 FIG. 9

【図10】 FIG. 10

【図11】 FIG. 11

【図12】 FIG.

Claims (4)

【特許請求の範囲】[Claims] 【請求項1】 内層回路板(1)の表面に絶縁層(2)
及び無電解銅めっき(8)触媒を含有する接着剤層
(3)を積層した多層配線板(19)を製造する方法に
おいて、この多層配線板(19)の両面に保護層(4)
を形成し、これらを貫通する孔(5)を穿設し、次い
で、保護層(4)を除去し、無電解ニッケルめっき
(6)を施し、孔(5)内壁をニッケル層(6)で被覆
し、前記接着剤層(3)の表面に無電解用めっきレジス
ト層(7)を形成し、上記接着剤層(3)表面を粗面化
(11)する。次に無電解銅めっき(8)で孔(5)内
を含む導体パターン(9)を形成することを特徴とする
多層配線板(19)の製造方法。
1. An insulating layer (2) on a surface of an inner circuit board (1).
And a method for producing a multilayer wiring board (19) in which an adhesive layer (3) containing a catalyst is laminated by electroless copper plating (8).
Are formed, holes (5) penetrating these are formed, then the protective layer (4) is removed, electroless nickel plating (6) is applied, and the inner wall of the holes (5) is coated with a nickel layer (6). After coating, a plating resist layer (7) for electroless plating is formed on the surface of the adhesive layer (3), and the surface of the adhesive layer (3) is roughened (11). Next, a method for manufacturing a multilayer wiring board (19), comprising forming a conductor pattern (9) including the inside of a hole (5) by electroless copper plating (8).
【請求項2】 内層回路板(1)の表面に絶縁層(2)
及び無電解銅めっき(8)触媒を含有する接着剤層
(3)を積層した多層配線板(19)を製造する方法に
おいて、この多層配線板(19)の両面に保護層(4)
を形成し、これらを貫通する孔(5)を設け、次いで、
保護層(4)を除去し、前記接着剤層(3)の表面に無
電解用めっきレジスト層(7)を形成し、無電解ニッケ
ル(6)を施し孔(5)内壁をニッケル層(6)で被覆
し、前記接着剤層(3)を粗面化(11)する。次に無
電解銅めっき(8)で孔(5)内を含む導体パターン
(9)を形成することを特徴とする多層配線板(19)
の製造方法。
2. An insulating layer (2) on a surface of an inner circuit board (1).
And a method for producing a multilayer wiring board (19) in which an adhesive layer (3) containing a catalyst is laminated by electroless copper plating (8).
And providing a hole (5) therethrough,
The protective layer (4) is removed, an electroless plating resist layer (7) is formed on the surface of the adhesive layer (3), electroless nickel (6) is applied, and the inner wall of the hole (5) is coated with a nickel layer (6). ), And the adhesive layer (3) is roughened (11). Next, a conductive pattern (9) including the inside of the hole (5) is formed by electroless copper plating (8).
Manufacturing method.
【請求項3】 請求項1または請求項2において、保護
層(4)に耐酸及び耐アルカリ性を有する粘着フィルム
を用いることを特徴とする多層配線板(19)の製造方
法。
3. The method for manufacturing a multilayer wiring board (19) according to claim 1, wherein an adhesive film having acid resistance and alkali resistance is used for the protective layer (4).
【請求項4】 請求項1または請求項2において、保護
層(4)にアルカリ剥離型又は耐熱インキを用いること
を特徴とする多層配線板(19)の製造方法。
4. The method for manufacturing a multilayer wiring board (19) according to claim 1, wherein the protective layer (4) is made of an alkali-peelable or heat-resistant ink.
JP29586196A 1996-10-18 1996-10-18 Manufacture of multilayer interconnection board Pending JPH10126057A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP29586196A JPH10126057A (en) 1996-10-18 1996-10-18 Manufacture of multilayer interconnection board

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP29586196A JPH10126057A (en) 1996-10-18 1996-10-18 Manufacture of multilayer interconnection board

Publications (1)

Publication Number Publication Date
JPH10126057A true JPH10126057A (en) 1998-05-15

Family

ID=17826143

Family Applications (1)

Application Number Title Priority Date Filing Date
JP29586196A Pending JPH10126057A (en) 1996-10-18 1996-10-18 Manufacture of multilayer interconnection board

Country Status (1)

Country Link
JP (1) JPH10126057A (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR100861619B1 (en) 2007-05-07 2008-10-07 삼성전기주식회사 Radiant heat printed circuit board and fabricating method of the same
US7452749B2 (en) * 2005-03-02 2008-11-18 Nec Electronics Corporation Method for manufacturing flip-chip type semiconductor device featuring nickel electrode pads, and plating apparatus used in such method

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7452749B2 (en) * 2005-03-02 2008-11-18 Nec Electronics Corporation Method for manufacturing flip-chip type semiconductor device featuring nickel electrode pads, and plating apparatus used in such method
KR100861619B1 (en) 2007-05-07 2008-10-07 삼성전기주식회사 Radiant heat printed circuit board and fabricating method of the same

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