JPH02312295A - Manufacture of printed board - Google Patents

Manufacture of printed board

Info

Publication number
JPH02312295A
JPH02312295A JP13261589A JP13261589A JPH02312295A JP H02312295 A JPH02312295 A JP H02312295A JP 13261589 A JP13261589 A JP 13261589A JP 13261589 A JP13261589 A JP 13261589A JP H02312295 A JPH02312295 A JP H02312295A
Authority
JP
Japan
Prior art keywords
plating
resist
chemical copper
layer
copper
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP13261589A
Other languages
Japanese (ja)
Other versions
JP2664246B2 (en
Inventor
Kanji Murakami
敢次 村上
Haruo Akaboshi
晴夫 赤星
Mineo Kawamoto
川本 峰雄
Ritsuji Toba
鳥羽 律司
Motoyo Wajima
和嶋 元世
Masashi Miyazaki
政志 宮崎
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Hitachi Ltd
Original Assignee
Hitachi Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hitachi Ltd filed Critical Hitachi Ltd
Priority to JP1132615A priority Critical patent/JP2664246B2/en
Publication of JPH02312295A publication Critical patent/JPH02312295A/en
Application granted granted Critical
Publication of JP2664246B2 publication Critical patent/JP2664246B2/en
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Abstract

PURPOSE:To prevent a plating resist from separating or swelling so as to enable the formation of a fine pattern by a method wherein a pattern chemical copper plating is executed at a certain potential specified to that of a reference hydrogen electrode. CONSTITUTION:A second metal layer 3 is provided onto a copper layer 2 on an insulating board 1, which is masked with a plating resist 4 excluding a circuit forming part, and a pattern chemical copper plating 5 is carried out onto the required circuit forming part. The pattern chemical copper plating 5 is executed at a plating reaction potential higher than the potential of a reference hydrogen electrode by -550mV. After plating, an etching resist is formed through solder plating 6, then the plating resist 4 is removed, the parts of the second metal layer 3 and the copper layer 2 covered with the plating resist 4 are removed through etching, the solder plating layer 6 is removed, and the circuit pattern of a printed board is formed. By this setup, a plating resist can be prevented from separating or swelling, and a fine pattern can be formed.

Description

【発明の詳細な説明】 〔産業上の利用分野〕 本発明はプリント板の回路形成法に係り、特に、高密度
で微細な回路形成に適したプリント板の回路形成法に関
する。
DETAILED DESCRIPTION OF THE INVENTION [Field of Industrial Application] The present invention relates to a method for forming a circuit on a printed board, and particularly to a method for forming a circuit on a printed board suitable for forming a high-density and fine circuit.

〔従来の技術〕[Conventional technology]

従来、両面プリント板や多層プリント板などの高密度プ
リント板は銅張積層板を出発材料とし、パネル電気銅め
っきによりスルーホールを形成した後2回路部分以外の
銅をエツチング除去することによって得る方法が主流で
あった。しかし、この方法は、厚さのばらつきの大きい
電気銅めっきを用いること1回路部度がエツチングレジ
ストの形成精度と銅エツチング精度の両方に依存するこ
となどにより、高密度、微細回路形成には不向きである
。そこで、高密度化、微細化に適した回路形成法が種々
提供されてきた。その一つにパターン化学銅めっき法が
ある。これは、銅張積層板を使用し1回路形成予定部分
以外を感光性めっきしシストでマスクし1次いで、回路
形成予定部分のみに選択的に化学銅めっきを行った後、
めっきレジストを除去し、レジストを除去した部分、す
なわち、回路形成予定部分以外の銅をエツチング除去し
て回路を形成する方法である。しかし、この方法ではめ
つきレジストがめつき中に剥離しやすく、良好な回路形
成が出来ないという問題がある。
Conventionally, high-density printed boards such as double-sided printed boards and multilayer printed boards are obtained by using copper-clad laminates as the starting material, forming through holes by panel electroplating, and then etching away the copper except for the two circuit parts. was the mainstream. However, this method is unsuitable for forming high-density, fine circuits because it uses electrolytic copper plating with large variations in thickness, and the accuracy of each circuit depends on both etching resist formation precision and copper etching precision. It is. Therefore, various circuit formation methods suitable for high density and miniaturization have been provided. One of them is patterned chemical copper plating. This involves using a copper-clad laminate, masking the area other than the area where the circuit is to be formed with photosensitive plating cyst, and then selectively applying chemical copper plating only to the area where the circuit is to be formed.
This is a method of forming a circuit by removing the plating resist and etching away the copper in the areas where the resist was removed, that is, in areas other than the areas where the circuit is to be formed. However, this method has the problem that the plating resist easily peels off during plating, making it impossible to form a good circuit.

この問題は、めっき厚さのばらつきがほとんどない化学
銅めっきで顕著であり、電気鋼めっきではあまり問題に
ならない場合が多い。すなわち、Ti電気銅つきはめつ
き速度が速く短時間でめっきが終了するのに対して、化
学銅めっきはめつき速度が遅いため、長時間のめっきが
必要であり、剥離が進行する。例えば、30μmの化学
銅めっきを行うには10〜30時間かかつてしまい、電
気鋼めっきの十倍以上時間がかかる。このように、長時
間めっきを行うため、めっきレジストはダメージを受け
る6例えば、めっきレジストと下地との界面、あるいは
、レジスト膜を通して化学銅めっき液が浸み込み、下地
との界面で(1)式の反応によって水酸イオン 2I4ZO十oz+4e−+408−     ・=(
1)が生成し、界面を破壊すると言われている。また、
化学銅めっき液はpH12前後の高アルカリ性であるた
め、めっきレジストと下地との界面破壊が生じやすいと
考えられる。
This problem is noticeable in chemical copper plating, where there is almost no variation in plating thickness, and is often less of a problem in electrical steel plating. That is, whereas Ti electrolytic copper plating has a fast plating speed and completes plating in a short time, chemical copper plating has a slow plating speed and requires a long plating time, resulting in progressive peeling. For example, chemical copper plating of 30 μm takes 10 to 30 hours, which is more than ten times longer than electrical steel plating. As plating is carried out for a long period of time, the plating resist is damaged6.For example, the chemical copper plating solution seeps through the resist film, or at the interface between the plating resist and the base (1). Hydroxyl ion 2I4ZO10oz+4e-+408- ・=(
1) is generated and is said to destroy the interface. Also,
Since the chemical copper plating solution is highly alkaline with a pH of around 12, it is thought that the interface between the plating resist and the base is likely to break down.

このような問題を解決するため、上述の文献18Mジャ
ーナル オブ リサーチ アンド デベロップメン82
29巻、Nα1,27ページ〜36ページ(1985)
に記載されているように、銅張積層板の表面を軽石など
で研磨して平滑にした後、ベンゾトリアゾールなどでこ
の表面を処理して感光性めっきレジストで回路予定部分
以外をマスクする方法が提案されている。また、化学銅
めっきの代わりに電気銅めっきを用いた場合については
、特公昭50−9177号公報に記載されているように
、ベンゾトリアゾールなどを感光性めっきレジストに添
加する方法が提供されている。これらにより、めっきレ
ジストが下地から剥離する問題は大幅に改善されるに至
った。
In order to solve such problems, the above-mentioned document 18M Journal of Research and Development 82
Volume 29, Nα1, pages 27-36 (1985)
As described in , there is a method of polishing the surface of a copper-clad laminate with pumice to make it smooth, then treating this surface with benzotriazole, etc., and masking the area other than the planned circuit area with a photosensitive plating resist. Proposed. Furthermore, when electrolytic copper plating is used instead of chemical copper plating, a method is provided in which benzotriazole or the like is added to the photosensitive plating resist, as described in Japanese Patent Publication No. 50-9177. . As a result, the problem of the plating resist peeling off from the underlying layer has been significantly improved.

〔発明が解決しようとする課題〕[Problem to be solved by the invention]

しかし、従来技術はベンゾトリアゾールを適用した場合
の化学銅めっきに対する悪影響について十分な記述がな
されていなかった。例えば、適用する量を多くするとめ
つき速度を局部、あるいは。
However, the prior art does not sufficiently describe the adverse effects on chemical copper plating when benzotriazole is applied. For example, increase the amount applied and increase the plating speed locally, or.

全体にわたって低下させたり、めっき膜の物性を低下さ
せたりする問題があった。
There was a problem in that the overall strength of the plating film deteriorated or the physical properties of the plating film deteriorated.

これはベンゾトリアゾールが化学銅めっき液に溶は出し
たためと推定される。このような現象が生じると、十分
な信頼性が得られないばかりか、場合によっては2回路
形成そのものが不可能になってしまうという欠点があっ
た。この問題が生じないようにコントロールするためベ
ンゾトリアゾールのレジスト中や下地表面での適切な濃
度管理が不可欠であると考えられるが、実質的には表面
状態等、他因子のばらつきがあるため回路形成は難しい
という面があった。
This is presumed to be because benzotriazole was dissolved into the chemical copper plating solution. When such a phenomenon occurs, there is a drawback that not only sufficient reliability cannot be obtained, but also that formation of two circuits itself becomes impossible in some cases. In order to prevent this problem from occurring, it is thought that appropriate concentration control of benzotriazole in the resist and on the underlying surface is essential, but since there are variations in other factors such as the surface condition, circuit formation was difficult in some respects.

本発明の目的は、微細回路形成ができるパターン化学銅
めっき法を提供するにある。具体的には、めっきレジス
トが下地金属層へ十分密着していて、めっき時に剥離す
ることがなく、且つ、めっき特性に悪影響を及ぼさない
微細回路形成に適した方法を泥供することにある。
An object of the present invention is to provide a patterned chemical copper plating method that allows formation of fine circuits. Specifically, the objective is to provide a method suitable for forming fine circuits in which the plating resist adheres sufficiently to the base metal layer, does not peel off during plating, and does not adversely affect the plating characteristics.

〔課題°を解決するための手段〕[Means to solve the problem]

上記目的は絶縁板上に設けた銅層の表面に第二金属層を
設け、次いで、必要個所にめっきレジストを形成した後
、パターン化学銅めっきを行うプリント板の製造方法に
おいて、パターン化学銅めっきを標準水素電極(以下N
HE)に対して一550mVより責の電位でめっきする
ことにより達成される。
The above purpose is to provide a second metal layer on the surface of a copper layer provided on an insulating board, then to form a plating resist in the required areas, and then to perform patterned chemical copper plating in a printed board manufacturing method. Standard hydrogen electrode (hereinafter N
This is achieved by plating at a potential lower than -550 mV vs. HE.

〔作用〕 パターン化学銅めっきにおいて、めっきレジストが剥離
する現象を調べたところ、めっきレジス1〜が下地とは
完全に密着しておらず、すき間に化学銅めっき液が浸み
込むために起こるものとかんかえられ、化学銅めっき反
応がその隙間で生じることと関係すると推定された。本
発明では、この点を考慮し、標準水素電極に対して一5
50mVより貴の電位で化学銅めっきすることが、めっ
きレジストの剥離を防止する観点から有効であり、良好
なパターン形成が可能になることを見出した。
[Function] When we investigated the phenomenon in which the plating resist peels off in patterned chemical copper plating, we found that it occurs because the plating resists 1 to 1 are not in complete contact with the base, and the chemical copper plating solution seeps into the gaps. It was assumed that this was related to the fact that a chemical copper plating reaction occurred in the gap. In the present invention, taking this point into consideration, we have developed a
It has been found that chemical copper plating at a potential higher than 50 mV is effective from the viewpoint of preventing peeling of the plating resist, and enables good pattern formation.

その明らかな理由は不明であるが、めっき反応電位が十
分卑であると第二金属層表面の酸化物が還元されて、め
っきレジスト界面が破壊されることが予想される。めっ
き反応電位がより貴であれば、このような還元反応は起
こらず破壊されることがない。第二金I′iII層とし
て特に有効なニッケル、亜鉛、すず、クロムを用いたと
き、標準水素電極に対して約−550mVより貴のめっ
き反応電位であれば、本発明の目的を実質的に達成でき
ることがわかった。
Although the exact reason for this is unknown, it is expected that if the plating reaction potential is sufficiently base, the oxide on the surface of the second metal layer will be reduced and the plating resist interface will be destroyed. If the plating reaction potential is more noble, such a reduction reaction will not occur and destruction will not occur. When using nickel, zinc, tin, and chromium, which are particularly effective as the ferric gold I'iII layer, a plating reaction potential of about -550 mV or more nobler than a standard hydrogen electrode will substantially accomplish the purpose of the present invention. I found out that it can be achieved.

本発明ではベンゾトリアゾールなどのような処理剤を金
属表面に適用しなくてもすむため、めっき膜の品質低下
や、めっきした回路の欠けなどが生じる問題はない。
In the present invention, there is no need to apply a treatment agent such as benzotriazole to the metal surface, so there are no problems such as deterioration of the quality of the plated film or chipping of the plated circuit.

以下、第1図により本発明の製造工程を説明する。Hereinafter, the manufacturing process of the present invention will be explained with reference to FIG.

本発明では絶縁板1上の銅2層に第二金属層3を設ける
が、本発明の目的を十分に達成するために、第二金属層
3の形成前に銅2の表面を十分に粗化することがのぞま
しい(A)、粗化の方法は、塩化第二銅水溶液、過硫酸
アンモニウム水溶液などに浸漬して粗化する方法が可能
である1次に、酸化膜層を形成してさらに微細な凹凸を
形成するが、ここではアルカリ性亜塩素酸塩水溶液など
が適用できる。さらに、酸化膜層を電気的、あるいは、
ジメチルアミンボランなどの還元剤入り溶液で処理する
。このような処理により良好な粗化面を得ることができ
る。ひき続き粗化した銅2の上に第二の金属層3を形成
する。(B)この第二の金属層3は卑な電位の金属が適
している。例えば。
In the present invention, the second metal layer 3 is provided on the second copper layer on the insulating plate 1, but in order to fully achieve the purpose of the present invention, the surface of the copper 2 is sufficiently roughened before forming the second metal layer 3. (A), it is possible to roughen the surface by immersing it in a cupric chloride aqueous solution, ammonium persulfate aqueous solution, etc. However, an alkaline chlorite aqueous solution or the like can be applied here. Furthermore, the oxide film layer can be electrically or
Treat with a solution containing a reducing agent such as dimethylamine borane. A good roughened surface can be obtained by such treatment. Subsequently, a second metal layer 3 is formed on the roughened copper 2. (B) A metal with a base potential is suitable for this second metal layer 3. for example.

ニッケル、亜鉛、すず、クロムなどが挙げられる。Examples include nickel, zinc, tin, and chromium.

これらの金属は電気めっき、あるいは、化学めっき等で
形成することができる0次いで1回路形成部以外をめっ
きレジスト4でマスクする。(C)めっきレジスト4に
は市販の感光性のものが適用できる。例えば、デュポン
社のリストンフィルムR−1220,T−168,チオ
コールダイナケム社のラミナーGSI、日立化成工業社
のフォテック5R−3200などがある。これらのめっ
きレジスト4はフィルムタイプであり、ホットロールな
どで基板表面にラミネートされる。また、本発明ではフ
ィルムタイプ以外にも液状のものも適用できる。基板表
面の必要個所にめっきレジス1−4を形成するため、通
常の露光、現象を行うことにより達成できる。引き続い
て、所望の回路形成部分にパターン銅めっきを行う。こ
こでは1回路形成部分に露出している第二金属層3を除
去することが望ましい。(D)パターン銅めっきには優
れためつき膜品質を与える厚付は用化学銅めっき5が適
している。(E)このパターン化学銅めっき5でめっき
反応電位を標準水素電極に対して一550mVより貴に
するが、めっき反応電位を貴にシフトさせる方法として
、銅イオン濃度を高くする。還元剤濃度及びpHを低く
する方法などがある。また、めっき反応生成物である硫
酸イオンやぎ酸イオン、あるいは、他の各種イオンを添
加する方法などがある。その他に溶存酸素濃度を高くす
る方法、ホルマリンの酸化反応抑制剤や銅イオンの還元
反応促進剤を添加する方法がある。
These metals can be formed by electroplating or chemical plating, etc. All parts other than the 0 and 1 circuit forming portions are masked with a plating resist 4. (C) A commercially available photosensitive resist can be used as the plating resist 4. Examples include Riston Film R-1220 and T-168 from DuPont, Laminar GSI from Thiokol Dynachem, and Fotec 5R-3200 from Hitachi Chemical. These plating resists 4 are of film type and are laminated onto the substrate surface using a hot roll or the like. Furthermore, in the present invention, liquid types can also be applied in addition to film types. In order to form the plating resists 1-4 at necessary locations on the substrate surface, this can be achieved by performing normal exposure and phenomena. Subsequently, patterned copper plating is performed on desired circuit forming portions. Here, it is desirable to remove the second metal layer 3 exposed in one circuit forming portion. (D) Thick chemical copper plating 5 is suitable for patterned copper plating, which provides excellent matte film quality. (E) In this patterned chemical copper plating 5, the plating reaction potential is made nobler than -550 mV with respect to the standard hydrogen electrode, but as a method of shifting the plating reaction potential to a nobler state, the copper ion concentration is increased. There are methods of lowering the reducing agent concentration and pH. Further, there are methods of adding sulfate ions, formate ions, which are plating reaction products, or various other ions. Other methods include increasing the dissolved oxygen concentration and adding a formalin oxidation reaction inhibitor or a copper ion reduction reaction promoter.

この方法により、めっきレジスト4の剥離などが実質的
に生じない良好なパターンめっき後は、通常の方法で、
半田めっき6によりエツチングレジストを形成しくF)
、次いで、めっきレジスト4を除去しくG)だ後、エツ
チングにより、めっきレジスト4が被覆されていた部分
の第二金属層3と銅勃2を除去する。(F()最終的に
は半田めっき6層を除去し、(I)プリント板の回路パ
ターンを形成することができる。
By this method, after plating a good pattern in which peeling of the plating resist 4 does not substantially occur,
Form an etching resist by solder plating 6F)
Then, after removing the plating resist 4 (G), the second metal layer 3 and the copper ribs 2 in the portions covered with the plating resist 4 are removed by etching. (F() Finally, the 6 layers of solder plating are removed, and (I) the circuit pattern of the printed board can be formed.

〔実施例〕〔Example〕

本発明を実施例により具体的に説明する。 The present invention will be specifically explained with reference to Examples.

〈実施例1〉 工程1 : L、6Il+m厚の両面銅張ガラスエポキ
シ積層板(銅W3厚18μm)に0.4mm径のドリル
で孔をあけた。表面をブラシ研磨した後、高圧水洗で孔
内を洗浄した。次いで、過硫酸アンモニウム水溶液によ
って表面のソフトエツチングを行い。
<Example 1> Step 1: A hole was drilled with a 0.4 mm diameter drill in a double-sided copper-clad glass epoxy laminate (copper W3 thickness: 18 μm) having a thickness of L, 6Il+m. After polishing the surface with a brush, the inside of the hole was cleaned with high-pressure water. Next, the surface was soft etched using an aqueous ammonium persulfate solution.

さらに、酸洗いした。ひき続き、化学銅めっきのための
触媒(日立化成社製増感剤H8101B)に浸漬して活
性化した6次に、酸洗いをしてから下記組成の化学銅め
っき液に70℃で二時間浸漬し、約6μmの厚さの化学
銅めっき層を形成した。
Furthermore, it was pickled. Subsequently, the product was activated by immersing it in a catalyst for chemical copper plating (Sensitizer H8101B manufactured by Hitachi Chemical Co., Ltd.) Next, it was pickled and then immersed in a chemical copper plating solution with the following composition at 70°C for 2 hours. A chemical copper plating layer having a thickness of about 6 μm was formed by dipping.

工程2:工程1を終了した後、表面を酸洗いし、過硫酸
アンモニウム水溶液(200g/Ω)で軽く粗化した。
Step 2: After completing Step 1, the surface was pickled and lightly roughened with an aqueous ammonium persulfate solution (200 g/Ω).

次いで、下記の組成の液で70℃。Next, a solution with the following composition was heated to 70°C.

2分間処理し微細凹凸をもつ酸化膜層を形成した。The treatment was carried out for 2 minutes to form an oxide film layer with fine irregularities.

さらに下記組成の処理液で上記酸化膜を還元した。Furthermore, the above oxide film was reduced with a treatment liquid having the following composition.

さらに、水洗を行って十分表面をきれいにした後、0.
05A/dmで4分間無光沢の電気ニッケルめっき液で
めっきした。水洗乾燥後、デュポン社製の感光性ドライ
フィルム、リストン1220を110℃に加熱したホッ
トロールによりラミネートした。さらに、露光現像を行
うことによって、回路形成部分以外にめっきレジストを
形成した。
Furthermore, after thoroughly cleaning the surface by washing with water, 0.
It was plated with a matte electrolytic nickel plating solution at 0.05 A/dm for 4 minutes. After washing with water and drying, it was laminated with a photosensitive dry film, Riston 1220 manufactured by DuPont, using a hot roll heated to 110°C. Furthermore, by performing exposure and development, a plating resist was formed in areas other than the circuit forming area.

次に、140℃で1時間加熱してエージングした。Next, it was heated and aged at 140° C. for 1 hour.

工程3:次に、過硫酸アンモニウム水溶液(200g/
Q)に浸漬し、表面に露出しているニッケルめっき層を
銅とともにエツチングして除去した。酸洗、水洗を行っ
た後、下記の組成の化学銅めっき液に72℃で浸漬して
めっき反応電位−550〜−500mV vs NHE
で約30μmの厚さのパターン化学銅めっきを行った。
Step 3: Next, ammonium persulfate aqueous solution (200g/
Q), and the nickel plating layer exposed on the surface was etched and removed along with the copper. After pickling and washing with water, immerse in a chemical copper plating solution with the following composition at 72°C to obtain a plating reaction potential of -550 to -500 mV vs. NHE.
Patterned chemical copper plating with a thickness of approximately 30 μm was performed.

めっき終了後、十分水洗し、パターン化学銅めっきまで
の工程を完了した。
After plating was completed, the product was thoroughly washed with water and the process up to patterned chemical copper plating was completed.

〈実施例2〉 実施例1において、工程3のパターン化学銅めっき液の
硫酸銅(5水和量)量を15 g / Q 、ホルマリ
ン(37%)量を1.5g/Qにしてめっき反応電位を
−520〜−480mV vs NHEとした以外は実
施例1と全く同様の方法でパターン化学銅めっきまでの
工程を完了した。
<Example 2> In Example 1, the plating reaction was carried out by changing the amount of copper sulfate (pentahydration amount) in the patterned chemical copper plating solution in step 3 to 15 g/Q and the amount of formalin (37%) to 1.5 g/Q. The steps up to patterned chemical copper plating were completed in exactly the same manner as in Example 1, except that the potential was set to -520 to -480 mV vs. NHE.

〈実施例3〉 実施例1における工程3の化学銅めっき液に硫酸ナトリ
ウム30g/ρ、ぎ酸ナトリウム30g/ρ添加してめ
っき反応電位を一500mVvsNHEとした以外は実
施例1と全く同様の方法でパターン化学銅めっきまでの
工程を完了した6〈実施例4〉 実施例1における工程2で5電気ニツケルめっきの代わ
りに酸性亜鉛めっき洛中で0.3A/dボ。
<Example 3> Completely the same method as Example 1 except that 30 g/ρ of sodium sulfate and 30 g/ρ of sodium formate were added to the chemical copper plating solution in Step 3 of Example 1 to set the plating reaction potential to -500 mV vs NHE. 6 (Example 4) In step 2 of Example 1, acid zinc plating was performed at 0.3 A/d in place of electrolytic nickel plating.

6分間亜鉛めっきをした以外は実施例1と全く同様の方
法でパターン化学銅めつきまでの工程を完了した。
The process up to patterned chemical copper plating was completed in exactly the same manner as in Example 1, except that zinc plating was carried out for 6 minutes.

〈実施例5〉 実施例1における工程2で、電気ニッケルめっきの代わ
りに電気すずめつき洛中で0 、3 A / d rr
? 。
<Example 5> In step 2 of Example 1, electrolytic nickel plating was performed at 0,3 A/drr instead of electrolytic nickel plating.
? .

6分間すずめつきをした以外は実施例1と全く同様の方
法でパターン化学銅めっきまでの工程を完了した。
The steps up to patterned chemical copper plating were completed in exactly the same manner as in Example 1, except that plating was carried out for 6 minutes.

〈比較例1〉 実施例1の工程3における化学銅めっき液を硫酸@(5
水和物)量を5 g / Q 、 p H12、9とし
て、めっき反応電位を−630〜−580mVBvsN
HE  とした以外は実施例1と同様の方法でパターン
化学銅めっきまでの工程を完了した。
<Comparative Example 1> The chemical copper plating solution in Step 3 of Example 1 was mixed with sulfuric acid @ (5
Hydrate) amount was 5 g/Q, pH 12,9, and the plating reaction potential was -630 to -580 mVBvsN.
The steps up to patterned chemical copper plating were completed in the same manner as in Example 1 except that HE was used.

〈比較例2〉 実施例1の工程3における化学銅めっき液を硫酸銅(5
水和物)量を3.5g/12として、めっき反応電位を
−650〜−600mV vs  NHEとした以外は
実施例1と同様の方法でパターン化学銅めっきまでの工
程を完了した。
<Comparative Example 2> The chemical copper plating solution in Step 3 of Example 1 was mixed with copper sulfate (5
The steps up to patterned chemical copper plating were completed in the same manner as in Example 1, except that the amount of hydrate was 3.5 g/12 and the plating reaction potential was -650 to -600 mV vs. NHE.

く比較例3〉 比較例1における電気ニッケルめっきを電気亜鉛めっき
(0,3A/drrr、6分)に代えた以外は比較例1
と全く同様の方法でパターン化学銅めっきまでの工程を
完了した。
Comparative Example 3 Comparative Example 1 except that the electrolytic nickel plating in Comparative Example 1 was replaced with electrolytic zinc plating (0.3 A/drrr, 6 minutes)
The process up to patterned chemical copper plating was completed in exactly the same manner as above.

〈比較例4〉 比較例1における電気ニッケルめっきを電気亜鉛めっき
(0,3A/drrl’、6分)に代えた以外は比較例
1と全く同様の方法でパターン化学銅めっきまでの工程
を完了した。
<Comparative Example 4> The process up to patterned chemical copper plating was completed in exactly the same manner as Comparative Example 1, except that the electrolytic nickel plating in Comparative Example 1 was replaced with electrolytic zinc plating (0.3 A/drrl', 6 minutes). did.

上述した実施例1〜5について、めっきレジストの剥離
やふくれをvA察した結果、それらの発生はごくわずか
であり、パターン形成上全く支障がなかった。これに対
して、比較例1〜3ではめつきレジストの剥離やふくれ
が数多く認められ1次の工程で半田めっきを行ったとこ
ろ、レジストの剥れたところにも半田めっきがついてし
まい1回路形成上不都合が生じた。
Regarding Examples 1 to 5 described above, the peeling and blistering of the plating resist was observed by vA, and as a result, the occurrence thereof was very slight, and there was no problem at all in pattern formation. On the other hand, in Comparative Examples 1 to 3, a lot of peeling and blistering of the plating resist was observed, and when solder plating was performed in the first step, solder plating was also attached to the places where the resist had peeled off, forming one circuit. An inconvenience arose.

〔発明の効果〕〔Effect of the invention〕

本発明によれば、めっきレジストの局部的な剥離やふく
れを実質的に防止できるので、微細パターンを形成する
上で大きな効果がある。
According to the present invention, local peeling and blistering of the plating resist can be substantially prevented, which is highly effective in forming fine patterns.

【図面の簡単な説明】[Brief explanation of drawings]

第1図は本発明の一実施例のプリント配線板製造工程の
断面図である。
FIG. 1 is a sectional view of a printed wiring board manufacturing process according to an embodiment of the present invention.

Claims (3)

【特許請求の範囲】[Claims] 1.絶縁板上に設けた銅層の表面に第二金属層を設け、
次いで必要個所にめつきレジストを形成した後、パター
ン化学銅めつきを行うプリント基板の製造方法において
、 前記パターン化学銅めつきを標準水素電極に対して−5
50mVより貴の電位でめつきすることを特徴とするプ
リント基板の製造方法。
1. A second metal layer is provided on the surface of the copper layer provided on the insulating plate,
Next, in a method for manufacturing a printed circuit board in which a plating resist is formed at necessary locations and then patterned chemical copper plating is performed, the patterned chemical copper plating is performed at a temperature of -5 with respect to a standard hydrogen electrode.
A method for manufacturing a printed circuit board, characterized by plating at a potential higher than 50 mV.
2.特許請求の範囲第1項において、 前記二金属層がニッケル,亜鉛,すず,クロムのうち、
少なくとも一種またはその合金からなることを特徴とす
るプリント基板の製造方法。
2. In claim 1, the bimetallic layer is made of nickel, zinc, tin, or chromium.
A method for manufacturing a printed circuit board, characterized in that it is made of at least one kind or an alloy thereof.
3.特許請求の範囲第2項において、 前記第二金属層を形成するに先立ち、銅層表面を粗化し
てから酸化膜層を表面に形成し、さらに、微細な凹凸を
作成し、次いで、前記表面の前記酸化膜層を還元するこ
とを特徴とするプリント基板の製造方法。
3. In claim 2, prior to forming the second metal layer, the surface of the copper layer is roughened, an oxide film layer is formed on the surface, fine irregularities are created, and then the surface is roughened. A method for manufacturing a printed circuit board, comprising reducing the oxide film layer.
JP1132615A 1989-05-29 1989-05-29 Printed circuit board manufacturing method Expired - Fee Related JP2664246B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP1132615A JP2664246B2 (en) 1989-05-29 1989-05-29 Printed circuit board manufacturing method

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP1132615A JP2664246B2 (en) 1989-05-29 1989-05-29 Printed circuit board manufacturing method

Publications (2)

Publication Number Publication Date
JPH02312295A true JPH02312295A (en) 1990-12-27
JP2664246B2 JP2664246B2 (en) 1997-10-15

Family

ID=15085473

Family Applications (1)

Application Number Title Priority Date Filing Date
JP1132615A Expired - Fee Related JP2664246B2 (en) 1989-05-29 1989-05-29 Printed circuit board manufacturing method

Country Status (1)

Country Link
JP (1) JP2664246B2 (en)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH05121860A (en) * 1991-10-25 1993-05-18 Nec Corp Printed wiring board and its manufacture
KR20020026639A (en) * 2000-10-02 2002-04-12 듀흐 마리 에스. A Method of Forming Cylindrical Bumps on a Substrate for Intergrated Circuits
US8372253B2 (en) 2009-12-07 2013-02-12 Kabushiki Kaisha Toshiba Perpendicular magnetic recording medium, method of manufacturing the same, and magnetic read/write apparatus

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN106548952B (en) * 2015-09-21 2019-06-28 深南电路股份有限公司 A kind of production method of fine-line

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6096767A (en) * 1983-10-31 1985-05-30 インタ−ナショナル ビジネス マシ−ンズ コ−ポレ−ション Copper plating process
JPS6413794A (en) * 1987-07-08 1989-01-18 Hitachi Ltd Forming method for circuit

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6096767A (en) * 1983-10-31 1985-05-30 インタ−ナショナル ビジネス マシ−ンズ コ−ポレ−ション Copper plating process
JPS6413794A (en) * 1987-07-08 1989-01-18 Hitachi Ltd Forming method for circuit

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH05121860A (en) * 1991-10-25 1993-05-18 Nec Corp Printed wiring board and its manufacture
KR20020026639A (en) * 2000-10-02 2002-04-12 듀흐 마리 에스. A Method of Forming Cylindrical Bumps on a Substrate for Intergrated Circuits
US8372253B2 (en) 2009-12-07 2013-02-12 Kabushiki Kaisha Toshiba Perpendicular magnetic recording medium, method of manufacturing the same, and magnetic read/write apparatus

Also Published As

Publication number Publication date
JP2664246B2 (en) 1997-10-15

Similar Documents

Publication Publication Date Title
EP0337465B1 (en) Process for producing printed circuit board
TWI395531B (en) Printed circuit board, manufacturing method thereof, and semiconductor device
JP2007158362A (en) Method for forming resistor on insulating substrate
JP2760952B2 (en) Circuit board manufacturing method
JP2009010398A (en) Method of manufacturing printed wiring board
JP3650514B2 (en) Method for manufacturing printed circuit board with plated resistor
JPH02312295A (en) Manufacture of printed board
KR910000079B1 (en) Forming method for circuit
JP2000178752A (en) Palladium catalyst removing agent for electroless plating
JPH07268640A (en) Electroless gold plating method
US5792248A (en) Sensitizing solution
JP3928392B2 (en) Method for manufacturing printed wiring board
JPH09246732A (en) Multilayer printed wiring board and manufacturing method thereof
JP2624068B2 (en) Manufacturing method of printed wiring board
JPH0710028B2 (en) Printed board manufacturing method
JPH036089A (en) Manufacture of printed board
JPH02264497A (en) Manufacture of printed board
JP2003204138A (en) Manufacturing method for printed wiring board
JP2001342574A (en) Method for removing plating catalist residue and manufacturing board
JP2002266087A (en) Etchant for copper and method for manufacturing printed circuit board using the same
JPS61163693A (en) Manufacture of printed wiring board
JPH02292893A (en) Manufacture of printed board
JPH10126057A (en) Manufacture of multilayer interconnection board
JPH02244789A (en) Printed board and manufacture thereof
JPH1140951A (en) Manufacture of multilayred wiring board

Legal Events

Date Code Title Description
LAPS Cancellation because of no payment of annual fees