JPH1010429A - 2回結像光学系 - Google Patents
2回結像光学系Info
- Publication number
- JPH1010429A JPH1010429A JP8179881A JP17988196A JPH1010429A JP H1010429 A JPH1010429 A JP H1010429A JP 8179881 A JP8179881 A JP 8179881A JP 17988196 A JP17988196 A JP 17988196A JP H1010429 A JPH1010429 A JP H1010429A
- Authority
- JP
- Japan
- Prior art keywords
- optical system
- image
- imaging optical
- lens
- aspherical
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Classifications
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/70—Microphotolithographic exposure; Apparatus therefor
- G03F7/70216—Mask projection systems
- G03F7/70225—Optical aspects of catadioptric systems, i.e. comprising reflective and refractive elements
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/70—Microphotolithographic exposure; Apparatus therefor
- G03F7/70216—Mask projection systems
- G03F7/70275—Multiple projection paths, e.g. array of projection systems, microlens projection systems or tandem projection systems
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Lenses (AREA)
- Exposure And Positioning Against Photoresist Photosensitive Materials (AREA)
- Exposure Of Semiconductors, Excluding Electron Or Ion Beam Exposure (AREA)
Priority Applications (4)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP8179881A JPH1010429A (ja) | 1996-06-19 | 1996-06-19 | 2回結像光学系 |
| US08/877,920 US6157498A (en) | 1996-06-19 | 1997-06-18 | Dual-imaging optical system |
| US09/679,267 US6392822B1 (en) | 1996-06-19 | 2000-10-04 | Dual-imaging optical system |
| US10/086,472 US6867931B2 (en) | 1996-06-19 | 2002-02-28 | Dual-imaging optical system |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP8179881A JPH1010429A (ja) | 1996-06-19 | 1996-06-19 | 2回結像光学系 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPH1010429A true JPH1010429A (ja) | 1998-01-16 |
| JPH1010429A5 JPH1010429A5 (enExample) | 2004-10-21 |
Family
ID=16073540
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP8179881A Pending JPH1010429A (ja) | 1996-06-19 | 1996-06-19 | 2回結像光学系 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPH1010429A (enExample) |
Cited By (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| EP0869383A3 (en) * | 1997-04-01 | 1999-09-08 | Nikon Corporation | Catadioptric optical system |
| WO1999052004A1 (en) * | 1998-04-07 | 1999-10-14 | Nikon Corporation | Projection exposure apparatus and method, and reflection refraction optical system |
| US6512641B2 (en) | 1998-06-08 | 2003-01-28 | Nikon Corporation | Projection exposure apparatus and method |
| JP2003504687A (ja) * | 1999-07-07 | 2003-02-04 | ケーエルエー−テンカー テクノロジィース コーポレイション | ブロードバンド紫外線カタディオプトリックイメージングシステム |
| US6717746B2 (en) | 2001-05-22 | 2004-04-06 | Carl Zeiss Semiconductor Manufacturing Technologies Ag | Catadioptric reduction lens |
| US7046459B1 (en) | 2001-12-18 | 2006-05-16 | Carl Zeiss Smt Ag | Catadioptric reductions lens |
-
1996
- 1996-06-19 JP JP8179881A patent/JPH1010429A/ja active Pending
Cited By (10)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| EP0869383A3 (en) * | 1997-04-01 | 1999-09-08 | Nikon Corporation | Catadioptric optical system |
| WO1999052004A1 (en) * | 1998-04-07 | 1999-10-14 | Nikon Corporation | Projection exposure apparatus and method, and reflection refraction optical system |
| US6707616B1 (en) | 1998-04-07 | 2004-03-16 | Nikon Corporation | Projection exposure apparatus, projection exposure method and catadioptric optical system |
| US6512641B2 (en) | 1998-06-08 | 2003-01-28 | Nikon Corporation | Projection exposure apparatus and method |
| US6639732B2 (en) | 1998-06-08 | 2003-10-28 | Nikon Corporation | Projection exposure apparatus and method |
| JP2003504687A (ja) * | 1999-07-07 | 2003-02-04 | ケーエルエー−テンカー テクノロジィース コーポレイション | ブロードバンド紫外線カタディオプトリックイメージングシステム |
| JP4761684B2 (ja) * | 1999-07-07 | 2011-08-31 | ケーエルエー−テンカー コーポレイション | ブロードバンド紫外線カタディオプトリックイメージングシステム |
| US6717746B2 (en) | 2001-05-22 | 2004-04-06 | Carl Zeiss Semiconductor Manufacturing Technologies Ag | Catadioptric reduction lens |
| US7006304B2 (en) | 2001-05-22 | 2006-02-28 | Carl Zeiss Smt Ag | Catadioptric reduction lens |
| US7046459B1 (en) | 2001-12-18 | 2006-05-16 | Carl Zeiss Smt Ag | Catadioptric reductions lens |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| A977 | Report on retrieval |
Free format text: JAPANESE INTERMEDIATE CODE: A971007 Effective date: 20041112 |
|
| A131 | Notification of reasons for refusal |
Free format text: JAPANESE INTERMEDIATE CODE: A131 Effective date: 20050223 |
|
| A521 | Request for written amendment filed |
Free format text: JAPANESE INTERMEDIATE CODE: A523 Effective date: 20050419 |
|
| A02 | Decision of refusal |
Free format text: JAPANESE INTERMEDIATE CODE: A02 Effective date: 20060509 |