JPH0969535A - Sealing die for resin sealed semiconductor device and production thereof - Google Patents
Sealing die for resin sealed semiconductor device and production thereofInfo
- Publication number
- JPH0969535A JPH0969535A JP7223367A JP22336795A JPH0969535A JP H0969535 A JPH0969535 A JP H0969535A JP 7223367 A JP7223367 A JP 7223367A JP 22336795 A JP22336795 A JP 22336795A JP H0969535 A JPH0969535 A JP H0969535A
- Authority
- JP
- Japan
- Prior art keywords
- resin
- mounting piece
- sealing
- mold
- semiconductor device
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/42—Wire connectors; Manufacturing methods related thereto
- H01L2224/47—Structure, shape, material or disposition of the wire connectors after the connecting process
- H01L2224/48—Structure, shape, material or disposition of the wire connectors after the connecting process of an individual wire connector
- H01L2224/4805—Shape
- H01L2224/4809—Loop shape
- H01L2224/48091—Arched
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/42—Wire connectors; Manufacturing methods related thereto
- H01L2224/47—Structure, shape, material or disposition of the wire connectors after the connecting process
- H01L2224/48—Structure, shape, material or disposition of the wire connectors after the connecting process of an individual wire connector
- H01L2224/481—Disposition
- H01L2224/48151—Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive
- H01L2224/48221—Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked
- H01L2224/48245—Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being metallic
- H01L2224/48247—Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being metallic connecting the wire to a bond pad of the item
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/15—Details of package parts other than the semiconductor or other solid state devices to be connected
- H01L2924/181—Encapsulation
- H01L2924/1815—Shape
Landscapes
- Encapsulation Of And Coatings For Semiconductor Or Solid State Devices (AREA)
- Moulds For Moulding Plastics Or The Like (AREA)
- Injection Moulding Of Plastics Or The Like (AREA)
Abstract
Description
【0001】[0001]
【発明の属する技術分野】本発明は、表面に半導体チッ
プが搭載された載置片の裏面を封止樹脂表面から露出さ
せてなる放熱構造を備えた樹脂封止型半導体装置の封止
用金型およびこれを用いた製造方法に関するものであ
る。BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a sealing metal for a resin-sealed semiconductor device having a heat dissipation structure in which the back surface of a mounting piece having a semiconductor chip mounted on the front surface is exposed from the sealing resin surface. The present invention relates to a mold and a manufacturing method using the mold.
【0002】[0002]
【従来の技術】以下、図7乃至図10にしたがって、従
来の樹脂封止型半導体装置の封止用金型およびこれを用
いた製造方法について説明する。2. Description of the Related Art A conventional mold for sealing a resin-sealed semiconductor device and a manufacturing method using the same will be described below with reference to FIGS.
【0003】図7は、リードフレームへの半導体チップ
のダイボンド,ワイヤーボンド工程を説明するための図
であり、(a)は平面図であり、(b)は破線部の拡大
図である。図8は、従来の樹脂封止工程及び封止用金型
を説明するための図であり、(a)は側面断面図であ
り、(b)は上面側からの透視図である。図9は、従来
の樹脂封止後のリードフレームを示す図であり、(a)
は平面図であり、(b)は側面図である。図10は、従
来の完成品である樹脂封止型半導体装置を示す図であ
り、(a)は平面図であり、(b)は側面図である。7A and 7B are views for explaining a die bonding and wire bonding process of a semiconductor chip to a lead frame, FIG. 7A is a plan view, and FIG. 7B is an enlarged view of a broken line portion. 8A and 8B are views for explaining a conventional resin sealing step and a sealing mold, FIG. 8A is a side sectional view, and FIG. 8B is a perspective view from the upper surface side. FIG. 9 is a diagram showing a conventional lead frame after resin encapsulation.
Is a plan view and (b) is a side view. 10A and 10B are diagrams showing a conventional resin-encapsulated semiconductor device which is a finished product, in which FIG. 10A is a plan view and FIG. 10B is a side view.
【0004】まず、樹脂封止型半導体装置の封止用金型
の構造について、以下説明する。First, the structure of the sealing die of the resin-sealed semiconductor device will be described below.
【0005】従来の封止用金型は、図8に示すように、
上面モールド金型11と下面モールド金型12とを備
え、両モールド金型11,12の所定の位置に凹部が形
成され、該凹部を対向させて両モールド金型11,12
を重ね合わせることにより、キャビティ(封止用空間
部)13及び樹脂注入ゲート14並びにゲート口15が
形成されてなる構造からなる。As shown in FIG. 8, a conventional sealing die is
An upper surface molding die 11 and a lower surface molding die 12 are provided, and recesses are formed at predetermined positions of both the molding dies 11 and 12, and the recesses are opposed to each other.
Are stacked, the cavity (sealing space) 13, the resin injection gate 14, and the gate port 15 are formed.
【0006】次に、樹脂封止型半導体装置の製造方法に
ついて、以下説明する。Next, a method of manufacturing the resin-sealed semiconductor device will be described below.
【0007】図7に示すリードフレーム1は、複数個の
載置片2及びそれぞれ複数個のリード端子3,4,5が
一方向に多連状に一体的に形成され、前記載置片2とリ
ード端子4とは直接連結されてた構造をなし、該リード
端子4の連結部分近傍に折り曲げ加工(図示せず)が施
されてなるものである。このようなリードフレーム1
に、まず、その各載置片2にそれぞれ半導体チップ6を
半田,銀ペースト等にてダイボンドし、該半導体チップ
6とリード端子3,5とをボンディングワイヤ7により
内部結線して回路形成する。なお、図中、8は第1支持
タイバーであり、9はリードタイバーであり、10は第
2支持タイバーである。In the lead frame 1 shown in FIG. 7, a plurality of mounting pieces 2 and a plurality of lead terminals 3, 4, and 5 are integrally formed in a unidirectional manner in a multi-striped manner. The lead terminal 4 and the lead terminal 4 are directly connected to each other, and a bending process (not shown) is performed in the vicinity of the connecting portion of the lead terminal 4. Such a lead frame 1
First, the semiconductor chip 6 is die-bonded to each mounting piece 2 with solder, silver paste or the like, and the semiconductor chip 6 and the lead terminals 3 and 5 are internally connected by the bonding wires 7 to form a circuit. In the figure, 8 is a first support tie bar, 9 is a lead tie bar, and 10 is a second support tie bar.
【0008】次に、半導体チップ6が搭載されたリード
フレーム1を、図8に示すように、封止用金型内に配置
する。即ち、リードフレーム1のリード端子3,4,5
及び第1支持タイバー8の樹脂注入ゲート14に対応す
る部分を除く各タイバー8,9,10を上面モールド金
型11と下面モールド金型12との間で挟持すると共
に、載置片2を両モールド金型11,12を重ね合わせ
ることによって形成されたキャビティ13に配置する。
ここで、前記載置片2はその裏面が前記下面モールド金
型12の表面と接触した状態で配置される。Next, the lead frame 1 on which the semiconductor chip 6 is mounted is placed in a sealing mold as shown in FIG. That is, the lead terminals 3, 4, 5 of the lead frame 1
And each of the tie bars 8, 9 and 10 except the portion corresponding to the resin injection gate 14 of the first support tie bar 8 is sandwiched between the upper surface mold die 11 and the lower surface mold die 12, and the mounting piece 2 is placed on both sides. The molds 11 and 12 are placed in the cavity 13 formed by superimposing them.
Here, the mounting piece 2 is arranged with its back surface in contact with the front surface of the lower surface molding die 12.
【0009】この後、樹脂注入ゲート14からエポキシ
樹脂,ポリイミド樹脂等からなる封止樹脂(図示せず)
が導かれ、ゲート口15を介してキャビティ13内に充
填する。After this, a sealing resin (not shown) made of epoxy resin, polyimide resin, or the like is applied from the resin injection gate 14
Is introduced into the cavity 13 through the gate port 15 and is filled.
【0010】そして、前記封止樹脂が硬化した後、樹脂
封止されてなるリードフレーム1が封止用金型から取り
出される。該樹脂封止後のリードフレーム1を図9に示
す。図中、16は封止樹脂体である。After the sealing resin is hardened, the resin-sealed lead frame 1 is taken out from the sealing mold. FIG. 9 shows the lead frame 1 after the resin sealing. In the figure, 16 is a sealing resin body.
【0011】最後に、リードフレーム1のタイバー8,
9,10の所定部分が切断され、リードフォーミングさ
れることにより、図10に示すような樹脂封止型半導体
装置が完成する。Finally, the tie bar 8 of the lead frame 1,
By cutting predetermined portions of 9 and 10 and performing lead forming, a resin-sealed semiconductor device as shown in FIG. 10 is completed.
【0012】[0012]
【発明が解決しようとする課題】しかしながら、従来の
製造方法及び封止用金型では、リードフレーム1の載置
片2にソリ,曲がり,うねり若しくは表面粗度が大きい
場合、下面モールド金型12表面に異物付着の場合、又
は封止樹脂の樹脂注入圧により載置片2が封止用空間部
13内で上下に動いた場合、図11に示すように、放熱
部である載置片2裏面に樹脂の薄バリ16aが発生する
こととなった。However, in the conventional manufacturing method and the molding die, when the mounting piece 2 of the lead frame 1 has a large amount of warp, bending, waviness or surface roughness, the lower surface molding die 12 is used. When foreign matter adheres to the surface or when the mounting piece 2 moves up and down in the sealing space 13 due to the resin injection pressure of the sealing resin, as shown in FIG. A thin resin burr 16a is generated on the back surface.
【0013】本樹脂封止型半導体装置は、面実装デバイ
スで載置片2裏面をプリント基板に直接半田付けするた
め、この部分に樹脂の薄バリ16aがあると、プリント
基板との半田付け不良,載置片2裏面からの放熱不良等
が発生することとなる。In this resin-encapsulated semiconductor device, the back surface of the mounting piece 2 is directly soldered to the printed circuit board by a surface mounting device. Therefore, if there is a thin resin burr 16a in this portion, soldering failure with the printed circuit board occurs. Therefore, heat radiation failure from the back surface of the mounting piece 2 will occur.
【0014】このため、従来ではこの薄バリ16aを取
り除くために、樹脂封止工程の後工程として物理的に除
去する手法又は化学的に除去するなどの薄バリ除去工程
を付加しており、該薄バリ除去工程はコストアップを招
くと共に樹脂封止型半導体装置の信頼性の低下を招くこ
ととなった。Therefore, conventionally, in order to remove the thin burr 16a, a thin burr removing step such as a physical removing method or a chemical removing step is added after the resin sealing step. The thin burr removal process causes an increase in cost and a decrease in reliability of the resin-sealed semiconductor device.
【0015】本発明は、上記課題に鑑み、樹脂封止工程
において載置片裏面に薄バリが発生することを防止し、
製造工程の簡素化及び信頼性の向上並びにコスト低減が
図れる樹脂封止型半導体装置の封止用金型およびこれを
用いた製造方法の提供を目的とするものである。In view of the above problems, the present invention prevents the occurrence of thin burrs on the back surface of the mounting piece in the resin sealing step,
An object of the present invention is to provide a mold for encapsulating a resin-encapsulated semiconductor device that can simplify the manufacturing process, improve reliability, and reduce cost, and a manufacturing method using the same.
【0016】[0016]
【課題を解決するための手段】本発明の請求項1記載の
樹脂封止型半導体装置の封止用金型は、表面に半導体チ
ップが搭載された載置片とリード端子とを備えたリード
フレームの前記載置片及び半導体チップを封止樹脂にて
封止するとともに前記載置片裏面が前記封止樹脂表面か
ら露出するよう封止するものであって、上面金型と下面
金型とを有し、該上面金型と下面金型とを重ね合わすこ
とにより両金型間に封止用空間部が形成され、該封止用
空間部に前記載置片を配置すると共に前記リード端子を
上面金型と下面金型とで挟持し、前記封止用空間部に封
止樹脂を充填して前記載置片及び半導体チップを封止す
る樹脂封止型半導体装置の封止用金型において、前記上
面金型を挿通し、前記載置片表面を所定圧力で下面金型
に押し付けて該載置片を押圧固定する可動棒を設けてな
ることを特徴とするものである。According to a first aspect of the present invention, there is provided a mold for sealing a resin-sealed semiconductor device, wherein a lead is provided with a mounting piece having a semiconductor chip mounted on its surface and a lead terminal. The above-mentioned mounting piece of a frame and a semiconductor chip are sealed with a sealing resin and the back surface of the mounting piece is sealed so as to be exposed from the surface of the sealing resin. A sealing space is formed between the upper and lower molds by overlapping the upper mold and the lower mold, and the placing piece is arranged in the sealing space and the lead terminal is provided. A mold for sealing a resin-sealed semiconductor device, in which the upper mold and the lower mold are sandwiched, and the space for sealing is filled with a sealing resin to seal the mounting piece and the semiconductor chip. In the above, the upper surface mold is inserted, and the surface of the placing piece is pressed against the lower surface mold with a predetermined pressure to perform the mounting. And it is characterized in that formed by providing a moveable plate that presses and fixes the strip.
【0017】また、本発明の請求項2記載の樹脂封止型
半導体装置の封止用金型は、前記可動棒の先端を錐状と
したことを特徴とするものである。Further, a sealing die of a resin-sealed semiconductor device according to a second aspect of the present invention is characterized in that the tip of the movable rod has a conical shape.
【0018】さらに、本発明の請求項3記載の樹脂封止
型半導体装置の製造方法は、上記封止用金型を用いた樹
脂封止型半導体装置の製造方法であって、半導体チップ
が搭載された載置片を上面金型と下面金型との間で形成
された封止用空間部に配置するとともに、リード端子を
上面金型と下面金型とで挟持する工程と、前記載置片を
可動棒にて下面金型に押し付け押圧固定する工程と、該
押圧固定した状態で前記封止用空間部に封止樹脂を充填
する工程と、前記封止樹脂の硬化後に前記可動棒を載置
片表面から離間させる工程とを備えてなることを特徴と
するものである。Further, a method of manufacturing a resin-encapsulated semiconductor device according to a third aspect of the present invention is a method of manufacturing a resin-encapsulated semiconductor device using the encapsulating mold, in which a semiconductor chip is mounted. Placing the placed mounting piece in a sealing space formed between the upper surface mold and the lower surface mold, and sandwiching the lead terminal between the upper surface mold and the lower surface mold; A step of pressing the piece against the lower surface mold with a movable rod to press and fix it; a step of filling the sealing space with a sealing resin in the pressed and fixed state; And a step of separating it from the surface of the mounting piece.
【0019】上記構成によれば、本発明の請求項1記載
の樹脂封止型半導体装置の封止用金型は、上面金型を挿
通し、前記載置片表面を所定圧力で下面金型に押し付け
て該載置片を押圧固定する可動棒を設けてなる構成なの
で、該可動棒により載置片を押圧して該載置片自身のソ
リ,曲がり,うねり等を矯正し且つ載置片裏面と下面金
型表面との間に発生する隙間をなくすことができ、これ
により樹脂封止工程にて発生する薄バリの抑制が可能な
樹脂封止型半導体装置の封止用金型を提供することがで
きる。また、本発明の請求項2記載の樹脂封止型半導体
装置の封止用金型は、前記可動棒の先端を錐状としたの
で、封止樹脂の可動棒跡より載置片表面が露出する面積
を低減することができる。According to the above structure, the resin-molded semiconductor device according to claim 1 of the present invention has a mold for encapsulation, in which the upper mold is inserted, and the surface of the mounting piece is under-molded at a predetermined pressure. Since the movable rod for pressing the mounting piece against the mounting piece is fixed to the mounting piece, the mounting piece is pressed by the movable rod to correct warpage, bending, undulation, etc. of the mounting piece itself and to mount the mounting piece. A mold for encapsulating a resin-encapsulated semiconductor device capable of eliminating a gap generated between a back surface and a surface of a lower surface mold, thereby suppressing a thin burr generated in a resin encapsulation process. can do. Further, in the sealing die of the resin-encapsulated semiconductor device according to claim 2 of the present invention, since the tip of the movable rod is formed into a pyramid shape, the surface of the mounting piece is exposed from the trace of the movable rod of the sealing resin. It is possible to reduce the area to be used.
【0020】さらに、本発明の請求項3記載の樹脂封止
型半導体装置の製造方法は、載置片を可動棒にて下面金
型に押し付け押圧固定する工程と、該押圧固定した状態
で前記封止用空間部に封止樹脂を充填する工程と、前記
封止樹脂の硬化後に前記可動棒を載置片表面から離間さ
せる工程とを備えてなる構成なので、前記可動棒にて樹
脂注入前に載置片を押圧して押圧固定することにより、
該載置片のソリ,曲がり,うねり等を矯正し且つ載置片
裏面と下面金型表面との間に発生する隙間をなくすこと
ができ、この状態で樹脂充填,樹脂硬化を行うため、樹
脂封止工程にて発生する載置片裏面の薄バリの形成を抑
制することができる。これにより、従来、樹脂封止工程
の後工程に必要であった物理的又は化学的な薄バリ除去
工程を削減することが可能となり、製造工程の簡素化、
信頼性の向上及びコスト低減が可能である。Further, in the method of manufacturing a resin-encapsulated semiconductor device according to claim 3 of the present invention, a step of pressing the mounting piece against the lower surface mold with a movable rod and pressing and fixing the mounting piece, Since the structure includes a step of filling the sealing space with the sealing resin and a step of separating the movable rod from the surface of the mounting piece after the sealing resin is cured, before the resin is injected into the movable rod. By pressing and fixing the mounting piece to
It is possible to correct warping, bending, waviness, etc. of the mounting piece and to eliminate a gap generated between the back surface of the mounting piece and the front surface of the lower surface mold, and resin filling and resin curing are performed in this state, so that the resin It is possible to suppress the formation of thin burrs on the back surface of the mounting piece that occurs in the sealing step. As a result, it is possible to reduce the physical or chemical thin burr removal process that was conventionally required in the subsequent process of the resin sealing process, simplifying the manufacturing process,
It is possible to improve reliability and reduce cost.
【0021】[0021]
【発明の実施の形態】以下、図1乃至図4にしたがっ
て、本発明の一実施例よりなる樹脂封止型半導体装置の
封止用金型およびこれを用いた製造方法について説明す
る。本実施例について、従来例と相違する点のみ説明す
る。BEST MODE FOR CARRYING OUT THE INVENTION A mold for encapsulating a resin-encapsulated semiconductor device according to an embodiment of the present invention and a manufacturing method using the same will be described below with reference to FIGS. Only the points of this embodiment different from the conventional example will be described.
【0022】図1は同実施例の樹脂封止工程及び封止用
金型の構造を説明するための図であり、(a)は載置片
を押圧固定する前の状態を示す断面図であり、(b)は
載置片を押圧固定した状態を示す断面図であり、(c)
は載置片を押圧固定した状態を示す上面側からの透視図
である。図2は、同実施例の樹脂封止後のリードフレー
ムを示す図であり、(a)は平面図であり、(b)は側
面図である。図3は、同実施例にて製造された樹脂封止
型半導体装置の完成品を示す図であり、(a)は平面図
であり、(b)は側面図であり、(c)は底面図であ
る。図4は同実施例と従来例との製造工程フローチャー
トの対比図であり、(a)は同実施例を示し、(b)は
従来例を示す。FIG. 1 is a view for explaining the resin sealing process and the structure of a sealing die of the embodiment, and FIG. 1A is a sectional view showing a state before the mounting piece is pressed and fixed. And (b) is a cross-sectional view showing a state in which the mounting piece is pressed and fixed, and (c).
[Fig. 4] is a perspective view from the upper surface side showing a state where the placing piece is pressed and fixed. 2A and 2B are views showing the lead frame after resin sealing of the embodiment, where FIG. 2A is a plan view and FIG. 2B is a side view. 3A and 3B are diagrams showing a finished product of the resin-encapsulated semiconductor device manufactured in the same example, FIG. 3A is a plan view, FIG. 3B is a side view, and FIG. It is a figure. 4A and 4B are comparison diagrams of manufacturing process flowcharts of the same embodiment and the conventional example. FIG. 4A shows the same embodiment and FIG. 4B shows the conventional example.
【0023】まず、樹脂封止型半導体装置の封止用金型
の構造について、以下説明する。First, the structure of the sealing die of the resin-sealed semiconductor device will be described below.
【0024】本実施例の封止用金型は、図1に示すよう
に、従来の封止用金型に、さらに前記上面モールド金型
11を挿通して前記封止用空間部13内を上下動する可
動棒17を設けてなる構造からなる。As shown in FIG. 1, the sealing die of the present embodiment is configured such that the upper surface molding die 11 is further inserted into the conventional sealing die so that the inside of the sealing space 13 is closed. It has a structure in which a movable rod 17 that moves up and down is provided.
【0025】該可動棒17は、後述する載置片2をその
表面から下面モールド金型12表面に強制的に押圧する
ものであり、油圧,バネ圧若しくはモーター制御等によ
り駆動制御される。The movable rod 17 is for forcibly pressing the mounting piece 2 described later from the surface thereof to the surface of the lower mold 12 and is driven and controlled by hydraulic pressure, spring pressure or motor control.
【0026】前記可動棒17の動作については後述する
製造工程において説明する。The operation of the movable rod 17 will be described in the manufacturing process described later.
【0027】次に、樹脂封止型半導体装置の製造方法に
ついて、以下説明する。Next, a method of manufacturing the resin-sealed semiconductor device will be described below.
【0028】本実施例の製造方法は、上述した封止用金
型を用いてなる樹脂封止方法が、従来の製造方法におけ
る樹脂封止方法と相異する。In the manufacturing method of this embodiment, the resin sealing method using the above-mentioned sealing mold is different from the resin sealing method in the conventional manufacturing method.
【0029】以下、前記樹脂封止方法について図1にし
たがって説明すると、図7に示すように各載置片2にそ
れぞれ半導体チップ6がダイボンドされ、該半導体チッ
プ6がリード端子3,5にワイヤーボンドされたリード
フレーム1を、まず、図1(a)に示すように、封止用
金型内に配置する。即ち、リードフレーム1のリード端
子3,4,5及び第1支持タイバー8の樹脂注入ゲート
14に対応する部分を除く各タイバー8,9,10を上
面モールド金型11と下面モールド金型12との間で挟
持すると共に載置片2を両モールド金型11,12を重
ね合わせることによって形成されたキャビティ13に前
記載置片2の裏面を下面モールド金型12表面に接触さ
せた状態で配置する。この時、可動棒17の位置は、作
業効率を考慮し上面モールド金型11の表面から突出し
ない位置に配置しておく。The resin sealing method will be described below with reference to FIG. 1. As shown in FIG. 7, the semiconductor chips 6 are die-bonded to the mounting pieces 2, respectively, and the semiconductor chips 6 are connected to the lead terminals 3 and 5 by wires. First, the bonded lead frame 1 is placed in a sealing mold as shown in FIG. That is, the tie bars 8, 9, 10 except for the lead terminals 3, 4, 5 of the lead frame 1 and the portion of the first support tie bar 8 corresponding to the resin injection gate 14 are connected to the upper mold die 11 and the lower mold die 12, respectively. And placing the mounting piece 2 in a state in which the back surface of the mounting piece 2 is in contact with the surface of the lower surface molding die 12 in a cavity 13 formed by overlapping the molding dies 11 and 12 with each other. To do. At this time, the movable rod 17 is placed at a position where it does not protrude from the surface of the upper surface molding die 11 in consideration of work efficiency.
【0030】次に、図1(b),(c)に示すように、
可動棒17を下降させ、該可動棒17にて載置片2を下
面モールド金型12に押し付け、該載置片2を可動棒1
7と下面モールド金型12との間で押圧固定する。ここ
で、可動棒17により載置片2に与える圧力としては、
載置片2自身のソリ,曲がり,うねり等を矯正できうる
圧力及び載置片2の裏面と下面モールド金型12の表面
との微妙なクリアランスをなくすことができる圧力が必
要となる。Next, as shown in FIGS. 1 (b) and 1 (c),
The movable rod 17 is lowered, and the mounting piece 2 is pressed against the lower surface molding die 12 by the movable rod 17, and the mounting piece 2 is moved.
7 and the lower surface mold 12 are pressed and fixed. Here, as the pressure applied to the mounting piece 2 by the movable rod 17,
A pressure capable of correcting warping, bending, undulation, etc. of the mounting piece 2 itself and pressure capable of eliminating a delicate clearance between the back surface of the mounting piece 2 and the surface of the lower surface molding die 12 are required.
【0031】次に、載置片2を押圧固定した状態で、樹
脂注入ゲート14からエポキシ樹脂,ポリイミド樹脂等
からなる封止樹脂(図示せず)が導かれゲート口15を
介してキャビティ13内に充填する。Next, while the mounting piece 2 is being pressed and fixed, a sealing resin (not shown) made of epoxy resin, polyimide resin or the like is guided from the resin injection gate 14 into the cavity 13 through the gate port 15. To fill.
【0032】ここで、載置片2は可動棒17により載置
片2自身のソリ,曲がり,うねり等を矯正できうる圧力
及び載置片2の裏面と下面モールド金型12の表面との
微妙なクリアランスをなくすことができる圧力にて押圧
固定されているので、載置片2裏面と下面モールド金型
12表面との隙間がなく、載置片2と下面モールド金型
12との間に封止樹脂が入ることがない。Here, the mounting piece 2 has a pressure capable of correcting warping, bending, undulation, etc. of the mounting piece 2 itself by the movable rod 17, and a slight difference between the back surface of the mounting piece 2 and the surface of the lower surface molding die 12. Since it is pressed and fixed with a pressure that can eliminate such a clearance, there is no gap between the back surface of the mounting piece 2 and the surface of the lower surface mold 12 and there is a seal between the mounting piece 2 and the lower surface mold 12. Stop resin does not enter.
【0033】そして、前記封止樹脂が硬化した後、可動
棒17を上面モールド金型11の表面から突出しない位
置まで上昇させ、続いて両モールド金型11,12を開
いて樹脂封止されたリードフレーム1が取り出される。
樹脂封止後のリードフレーム1を図2に示す。図中、1
6は封止樹脂体であり、17aは可動棒17の抜け跡か
らなる可動棒跡である。After the sealing resin is hardened, the movable rod 17 is raised to a position where it does not project from the surface of the upper surface molding die 11, and subsequently both molding dies 11 and 12 are opened for resin sealing. The lead frame 1 is taken out.
The lead frame 1 after resin sealing is shown in FIG. In the figure, 1
Reference numeral 6 is a sealing resin body, and 17a is a movable rod mark which is a trace of the movable rod 17.
【0034】なお、前記樹脂封止されたリードフレーム
1は、この後タイバーカット,フォーミング工程を経
て、図3に示すような樹脂封止型半導体装置の完成品と
なる。このように、上記封止用金型によれば、載置片2
を押圧して該載置片2自身のソリ,曲がり,うねり等を
矯正し且つ載置片2裏面と下面モールド金型12表面と
の間に発生する隙間をなくすことができ、これにより樹
脂封止工程にて発生する薄バリの抑制が可能となる。The resin-sealed lead frame 1 is completed as a resin-sealed semiconductor device as shown in FIG. 3 through tie bar cutting and forming steps. As described above, according to the sealing mold, the mounting piece 2
Can be pressed to correct warpage, bending, undulation, etc. of the mounting piece 2 itself, and to eliminate a gap generated between the back surface of the mounting piece 2 and the surface of the lower surface molding die 12, thereby making it possible to seal the resin. It is possible to suppress thin burrs generated in the stopping process.
【0035】また、上記樹脂封止工程によれば、従来の
樹脂封止工程において発生していた載置片2裏面の薄バ
リが発生することがなくなり、これにより従来の樹脂封
止工程の後処理工程として必要であった薄バリ除去工程
が不要となる。Further, according to the above resin sealing step, the thin burr on the back surface of the mounting piece 2 which has been generated in the conventional resin sealing step is not generated, and thus, after the conventional resin sealing step. The thin burr removal step, which was necessary as a processing step, becomes unnecessary.
【0036】したがって、本実施例よりなる樹脂封止型
半導体装置の製造方法としては、図4(a)に示すよう
な製造工程となり、図4(b)に示す従来の製造工程と
比較して製造工程の簡素化が可能となる。Therefore, the manufacturing method of the resin-encapsulated semiconductor device according to this embodiment is as shown in FIG. 4 (a), which is different from the conventional manufacturing process shown in FIG. 4 (b). It is possible to simplify the manufacturing process.
【0037】また、物理的または化学的な従来の薄バリ
除去工程が削除されることから、樹脂封止型半導体装置
の信頼性の向上及びコスト低減が図れる。Further, since the physical or chemical conventional thin burr removing step is eliminated, the reliability and cost of the resin-sealed semiconductor device can be improved.
【0038】本発明よりなる封止用金型は、上記実施例
に限らず、以下に示すような構造としても良い。図5及
び図6はそれぞれ他の実施例よりなる封止用金型にて形
成されてなる樹脂封止型半導体装置の完成品を示す図で
ある。図5中、(a)は平面図であり、(b)は側面図
であり、(c)は裏面図である。また、図6中、(a)
は平面図であり、(b)は側面図である。図中、17
b,17cは可動棒跡である。The sealing die according to the present invention is not limited to the above embodiment, but may have the following structure. FIG. 5 and FIG. 6 are views showing a finished product of a resin-encapsulated semiconductor device formed by a sealing die according to another embodiment, respectively. In FIG. 5, (a) is a plan view, (b) is a side view, and (c) is a back view. Further, in FIG. 6, (a)
Is a plan view and (b) is a side view. In the figure, 17
b and 17c are movable rod marks.
【0039】即ち、封止用金型の可動棒を4本にしても
良く(図5の可動棒跡17b参照)、また、各可動棒の
先端を錘状としても良い(図6の可動棒跡17c参
照)。That is, the movable die of the sealing die may be four (see the movable rod mark 17b in FIG. 5), or the tip of each movable rod may be in the shape of a cone (the movable rod in FIG. 6). Trace 17c).
【0040】ここで、可動棒の先端を錘状とすることに
より載置片表面の露出が点露出となり、先端を平面にし
た場合に比べて載置片表面の露出面積を低減することが
可能となり、樹脂封止型半導体装置内への水分の侵入を
防止することができ、耐湿性の低下が防止される。Here, by making the tip of the movable rod into a cone shape, the exposure of the surface of the mounting piece becomes point exposure, and it is possible to reduce the exposed area of the surface of the mounting piece as compared with the case where the tip is flat. Therefore, it is possible to prevent moisture from entering the resin-encapsulated semiconductor device and prevent the moisture resistance from being lowered.
【0041】なお、この他、可動棒を円柱に代わって多
角柱としても良い。Besides, the movable rod may be a polygonal column instead of the column.
【0042】[0042]
【発明の効果】以上説明したように、本発明の請求項1
記載の樹脂封止型半導体装置の封止用金型によれば、可
動棒により載置片を押圧して該載置片自身のソリ,曲が
り,うねり等を矯正し且つ載置片裏面と下面金型表面と
の間に発生する隙間をなくすことができ、これにより樹
脂封止工程にて発生する薄バリの抑制が可能な樹脂封止
型半導体装置の封止用金型を提供できる。また、本発明
の請求項2記載の樹脂封止型半導体装置の封止用金型に
よれば、前記可動棒の先端を錐状としたので、封止樹脂
の可動棒跡より載置片表面が露出する面積を低減するこ
とが可能となり、樹脂封止型半導体装置の耐湿性の低下
を防止することも可能となる。As described above, according to the first aspect of the present invention.
According to the molding die for the resin-encapsulated semiconductor device described above, the mounting piece is pressed by the movable rod to correct warpage, bending, undulation, etc. of the mounting piece itself, and the back and bottom surfaces of the mounting piece. It is possible to eliminate a gap generated between the mold surface and the mold surface, thereby providing a mold for sealing a resin-sealed semiconductor device capable of suppressing thin burrs generated in a resin sealing process. Further, according to the sealing die of the resin-encapsulated semiconductor device according to claim 2 of the present invention, since the tip of the movable rod is formed in a pyramid shape, the surface of the mounting piece is separated from the trace of the movable rod of the sealing resin. It is possible to reduce the exposed area, and it is also possible to prevent deterioration of the moisture resistance of the resin-sealed semiconductor device.
【0043】さらに、本発明の請求項3記載の樹脂封止
型半導体装置の製造方法によれば、前記可動棒により載
置片のソリ,曲がり,うねり等を矯正し且つ載置片裏面
と下面金型表面との間に発生する隙間をなくすことがで
き、この状態で樹脂注入,樹脂硬化を行うため、樹脂封
止工程にて発生する載置片裏面の薄バリの形成を抑制す
ることができる。これにより、従来、樹脂封止工程の後
工程に必要であった物理的又は化学的な薄バリ除去工程
を削減することが可能となり、製造工程の簡素化、信頼
性の向上及びコスト低減が図れる。Further, according to the method of manufacturing a resin-sealed semiconductor device according to claim 3 of the present invention, the movable rod corrects warp, bending, undulation, etc. of the mounting piece, and the back and bottom surfaces of the mounting piece. It is possible to eliminate the gap generated between the mold surface and the resin injection and resin curing in this state, so it is possible to suppress the formation of thin burrs on the back surface of the mounting piece that occurs in the resin sealing process. it can. As a result, it is possible to reduce the physical or chemical thin burr removal step that was conventionally required in the subsequent step of the resin sealing step, and to simplify the manufacturing step, improve the reliability, and reduce the cost. .
【図1】本発明の一実施例よりなる樹脂封止型半導体装
置の封止用金型および封止方法を説明するための図であ
る。FIG. 1 is a diagram for explaining a sealing die and a sealing method for a resin-sealed semiconductor device according to an embodiment of the present invention.
【図2】同実施例の樹脂封止後のリードフレームを示す
図である。FIG. 2 is a diagram showing a lead frame after resin sealing of the embodiment.
【図3】同実施例にて製造された樹脂封止型半導体装置
の完成品を示す図である。FIG. 3 is a diagram showing a finished product of a resin-encapsulated semiconductor device manufactured in the same example.
【図4】同実施例と従来例との樹脂封止型半導体装置の
製造工程の対比図であり、(a)は同実施例であり、
(b)は従来例である。FIG. 4 is a comparison diagram of the manufacturing process of the resin-encapsulated semiconductor device of the same example and the conventional example, FIG. 4A is the same example;
(B) is a conventional example.
【図5】他の封止用金型にて製造された樹脂封止型半導
体装置を示す図である。FIG. 5 is a view showing a resin-sealed semiconductor device manufactured by another sealing die.
【図6】さらに他の封止用金型にて製造された樹脂封止
型半導体装置を示す図である。FIG. 6 is a view showing a resin-sealed semiconductor device manufactured by still another sealing die.
【図7】リードフレームへの半導体チップのダイボン
ド,ワイヤーボンド工程を説明するための図である。FIG. 7 is a diagram for explaining a die bonding process and a wire bonding process of a semiconductor chip on a lead frame.
【図8】従来の樹脂封止型半導体装置の封止用金型およ
び封止方法を説明するための図である。FIG. 8 is a diagram for explaining a conventional mold and method for sealing a resin-sealed semiconductor device.
【図9】従来の樹脂封止後のリードフレームを示す図で
ある。FIG. 9 is a view showing a conventional lead frame after resin sealing.
【図10】従来の樹脂封止型半導体装置の完成品を示す
図である。FIG. 10 is a diagram showing a completed product of a conventional resin-encapsulated semiconductor device.
【図11】従来の問題点を説明するための図である。FIG. 11 is a diagram for explaining a conventional problem.
1 リードフレーム 2 載置片 3,4,5 リード端子 6 半導体チップ 7 ボンディングワイヤー 8 第1支持タイバー 9 リードタイバー 10 第2支持タイバー 11 上面モールド金型 12 下面モールド金型 13 キャビティ(封止用空間部) 14 樹脂注入ゲート 15 ゲート口 16 封止樹脂体 17 可動棒 1 Lead Frame 2 Mounting Piece 3, 4, 5 Lead Terminal 6 Semiconductor Chip 7 Bonding Wire 8 First Support Tie Bar 9 Lead Tie Bar 10 Second Support Tie Bar 11 Top Mold Die 12 Bottom Mold Die 13 Cavity (Sealing Space) Part) 14 resin injection gate 15 gate opening 16 sealing resin body 17 movable rod
Claims (3)
とリード端子とを備えたリードフレームの前記載置片及
び半導体チップを封止樹脂にて封止するとともに前記載
置片裏面が前記封止樹脂表面から露出するよう封止する
ものであって、 上面金型と下面金型とを有し、該上面金型と下面金型と
を重ね合わすことにより両金型間に封止用空間部が形成
され、該封止用空間部に前記載置片を配置すると共に前
記リード端子を上面金型と下面金型とで挟持し、前記封
止用空間部に封止樹脂を充填して前記載置片及び半導体
チップを封止する樹脂封止型半導体装置の封止用金型に
おいて、 前記上面金型を挿通し、前記載置片表面を所定圧力で下
面金型に押し付けて該載置片を押圧固定する可動棒を設
けてなることを特徴とする樹脂封止型半導体装置の封止
用金型。1. A lead frame comprising a mounting piece having a semiconductor chip mounted on the front surface and a lead terminal, wherein the mounting piece and the semiconductor chip are sealed with a sealing resin and the back surface of the mounting piece is Sealing is to be exposed from the surface of the sealing resin, and has an upper surface mold and a lower surface mold, and by sealing the upper surface mold and the lower surface mold, a seal is provided between both molds. A space portion is formed, the placing piece is arranged in the sealing space portion, and the lead terminal is sandwiched between an upper surface mold and a lower surface mold, and the sealing space portion is filled with a sealing resin. In a mold for sealing a resin-sealed semiconductor device that seals the mounting piece and the semiconductor chip, the upper surface mold is inserted, and the surface of the mounting piece is pressed against the lower surface mold with a predetermined pressure. A resin-encapsulated semiconductor device comprising a movable rod for pressing and fixing the mounting piece. Sealing mold.
徴とする請求項1記載の樹脂封止型半導体装置の封止用
金型。2. The mold for encapsulating a resin-encapsulated semiconductor device according to claim 1, wherein the tip of the movable rod has a conical shape.
体装置の製造方法であって、 半導体チップが搭載された載置片を上面金型と下面金型
との間で形成された封止用空間部に配置するとともに、
リード端子を上面金型と下面金型とで挟持する工程と、 前記載置片を可動棒にて下面金型に押し付け押圧固定す
る工程と、 該押圧固定した状態で前記封止用空間部に封止樹脂を充
填する工程と、 前記封止樹脂の硬化後に前記可動棒を載置片表面から離
間させる工程と、を備えてなることを特徴とする樹脂封
止型半導体装置の製造方法。3. A method of manufacturing a resin-encapsulated semiconductor device using the encapsulating mold, wherein a mounting piece on which a semiconductor chip is mounted is formed between an upper mold and a lower mold. It is placed in the sealed space and
The step of sandwiching the lead terminal between the upper surface mold and the lower surface mold, the step of pressing the placing piece against the lower surface mold with the movable rod, and pressing and fixing the above-mentioned mounting piece in the sealing space portion in the pressed and fixed state. A method of manufacturing a resin-encapsulated semiconductor device, comprising: a step of filling an encapsulating resin; and a step of separating the movable rod from the surface of the mounting piece after the encapsulating resin is cured.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP07223367A JP3127104B2 (en) | 1995-08-31 | 1995-08-31 | Mold for sealing resin-encapsulated semiconductor device and manufacturing method using the same |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP07223367A JP3127104B2 (en) | 1995-08-31 | 1995-08-31 | Mold for sealing resin-encapsulated semiconductor device and manufacturing method using the same |
Publications (2)
Publication Number | Publication Date |
---|---|
JPH0969535A true JPH0969535A (en) | 1997-03-11 |
JP3127104B2 JP3127104B2 (en) | 2001-01-22 |
Family
ID=16797039
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP07223367A Expired - Fee Related JP3127104B2 (en) | 1995-08-31 | 1995-08-31 | Mold for sealing resin-encapsulated semiconductor device and manufacturing method using the same |
Country Status (1)
Country | Link |
---|---|
JP (1) | JP3127104B2 (en) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2007273884A (en) * | 2006-03-31 | 2007-10-18 | Mitsubishi Electric Corp | Semiconductor device, semiconductor module, and manufacturing method thereof |
-
1995
- 1995-08-31 JP JP07223367A patent/JP3127104B2/en not_active Expired - Fee Related
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2007273884A (en) * | 2006-03-31 | 2007-10-18 | Mitsubishi Electric Corp | Semiconductor device, semiconductor module, and manufacturing method thereof |
JP4680816B2 (en) * | 2006-03-31 | 2011-05-11 | 三菱電機株式会社 | Semiconductor device |
Also Published As
Publication number | Publication date |
---|---|
JP3127104B2 (en) | 2001-01-22 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
KR101054602B1 (en) | Method of manufacturing semiconductor device | |
US5091341A (en) | Method of sealing semiconductor device with resin by pressing a lead frame to a heat sink using an upper mold pressure member | |
US20020037604A1 (en) | Lead frame, semiconductor package having lead frame, and method of manufacturing semiconductor package | |
JPH11260856A (en) | Semiconductor device and its manufacture and mounting structure of the device | |
US20040056363A1 (en) | Semiconductor device and a method of manufacturing the same | |
JPH0774195A (en) | Manufacture of resin-sealed semiconductor device | |
JP2001053094A (en) | Resin sealing method and device | |
US6893898B2 (en) | Semiconductor device and a method of manufacturing the same | |
JP2003282809A (en) | Semiconductor device and its manufacturing method | |
JP3879823B2 (en) | Thin semiconductor device molding method and mold | |
US7781259B2 (en) | Method of manufacturing a semiconductor using a rigid substrate | |
JP3259377B2 (en) | Semiconductor device | |
US6303983B1 (en) | Apparatus for manufacturing resin-encapsulated semiconductor devices | |
JP2003197663A (en) | Semiconductor device and its manufacturing method, circuit board, and electronic instrument | |
JP3127104B2 (en) | Mold for sealing resin-encapsulated semiconductor device and manufacturing method using the same | |
JPH088375A (en) | Semiconductor device, lead frame and mold for manufacturing semiconductor device | |
JP2973901B2 (en) | Mold for semiconductor resin sealing | |
JP2621814B2 (en) | Resin-sealed semiconductor device | |
JPH06252188A (en) | Method and device for manufacturing resin-encapsulated semiconductor chip | |
US11862540B2 (en) | Mold flow balancing for a matrix leadframe | |
KR100567129B1 (en) | Molding die for manufacturing semiconductor package and method for molding semiconductor package using the same | |
JP2527503B2 (en) | Lead frame and manufacturing method thereof | |
JP2007294637A (en) | Method for manufacturing semiconductor device | |
JP2001196401A (en) | Resin package forming method for semiconductor device | |
JPH09129803A (en) | Hall element and its manufacture |
Legal Events
Date | Code | Title | Description |
---|---|---|---|
FPAY | Renewal fee payment (prs date is renewal date of database) |
Free format text: PAYMENT UNTIL: 20081102 Year of fee payment: 8 |
|
FPAY | Renewal fee payment (prs date is renewal date of database) |
Free format text: PAYMENT UNTIL: 20091102 Year of fee payment: 9 |
|
FPAY | Renewal fee payment (prs date is renewal date of database) |
Free format text: PAYMENT UNTIL: 20091102 Year of fee payment: 9 |
|
FPAY | Renewal fee payment (prs date is renewal date of database) |
Free format text: PAYMENT UNTIL: 20101102 Year of fee payment: 10 |
|
FPAY | Renewal fee payment (prs date is renewal date of database) |
Free format text: PAYMENT UNTIL: 20111102 Year of fee payment: 11 |
|
FPAY | Renewal fee payment (prs date is renewal date of database) |
Free format text: PAYMENT UNTIL: 20111102 Year of fee payment: 11 |
|
FPAY | Renewal fee payment (prs date is renewal date of database) |
Free format text: PAYMENT UNTIL: 20121102 Year of fee payment: 12 |
|
FPAY | Renewal fee payment (prs date is renewal date of database) |
Free format text: PAYMENT UNTIL: 20121102 Year of fee payment: 12 |
|
FPAY | Renewal fee payment (prs date is renewal date of database) |
Free format text: PAYMENT UNTIL: 20131102 Year of fee payment: 13 |
|
LAPS | Cancellation because of no payment of annual fees |