JPH09281515A - Production of liquid crystal element - Google Patents

Production of liquid crystal element

Info

Publication number
JPH09281515A
JPH09281515A JP8089096A JP8909696A JPH09281515A JP H09281515 A JPH09281515 A JP H09281515A JP 8089096 A JP8089096 A JP 8089096A JP 8909696 A JP8909696 A JP 8909696A JP H09281515 A JPH09281515 A JP H09281515A
Authority
JP
Japan
Prior art keywords
liquid crystal
large substrate
substrates
electrode
substrate
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP8089096A
Other languages
Japanese (ja)
Inventor
Masaya Tomita
昌也 冨田
Masayuki Takahashi
政之 高橋
Shigeru Kurata
繁 倉田
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Casio Computer Co Ltd
Original Assignee
Casio Computer Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Casio Computer Co Ltd filed Critical Casio Computer Co Ltd
Priority to JP8089096A priority Critical patent/JPH09281515A/en
Publication of JPH09281515A publication Critical patent/JPH09281515A/en
Pending legal-status Critical Current

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  • Liquid Crystal (AREA)
  • Testing Electric Properties And Detecting Electric Faults (AREA)

Abstract

PROBLEM TO BE SOLVED: To provide a method for holding large substrates effective under a reduced pressure as well and a method for executing simple lighting inspection of liquid crystal elements in a process for production for obtaining the plural liquid crystal elements for a pair of the large substrates. SOLUTION: The large substrates 20, 30 having the plural electrode substrates constituting the liquid crystal elements are stuck to each other via frame-shaped sealing materials 41 enclosing the electrode substrates in such a manner that the parts (test terminal substrate parts) not superposing on each other are obtainable with the large substrates 20, 30 by sealing a liquid crystal material into the frame. The sure holding of the respective substrates 20, 30 to the holding table of an apparatus for production of sticking to each other is made possible even under the reduced pressure by fixing such test terminal parts. The adjacent signal electrodes of the respective electrode substrates are connected to connection wirings 22U, 22D and are connected by sorting the scanning electrodes 31 by one piece each to connection wirings 32L, 32R and are drawn out as test terminals 22Ut, 22Dt, 32Lt, 32Rt to the test terminal substrate parts. The lighting inspection of the liquid crystal elements is executed by impressing driving signals without cutting the large substrates.

Description

【発明の詳細な説明】Detailed Description of the Invention

【0001】[0001]

【発明の属する技術分野】本発明は貼り合わせた2枚の
大基板より複数の液晶素子を製造する方法であって、貼
り合わせ位置の精度向上と、点灯検査つまり駆動電極の
断線や短絡の有無の検査を簡便に行うことができる製造
方法に関するものである。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a method for manufacturing a plurality of liquid crystal elements from two large substrates which are bonded together, and improves the accuracy of bonding positions and a lighting test, that is, whether or not a drive electrode is broken or short-circuited. The present invention relates to a manufacturing method capable of easily performing the inspection.

【0002】[0002]

【従来の技術】従来の単純マトリクス型液晶表示素子の
製造工程で2枚の大基板を貼り合わせた状態を図7,図
8に示す。(図中の基板の角の切りかきは基板の方向・
向きを表す)図7は2枚の大基板を貼り合わせ、複数の
液晶表示素子を構成する状態(以下、この状態をユニッ
トと称する)を示す平面図であり、図8は図7における
A−A部分の断面図である。
2. Description of the Related Art FIG. 7 and FIG. 8 show a state in which two large substrates are bonded together in the manufacturing process of a conventional simple matrix type liquid crystal display device. (The corners of the board in the figure are not
FIG. 7 is a plan view showing a state in which two large substrates are bonded together to form a plurality of liquid crystal display elements (hereinafter, this state is referred to as a unit), and FIG. 8 is A- in FIG. It is sectional drawing of A part.

【0003】複数のガラス等の透明材料からなり、複数
の領域に区画された大基板1,2には、それぞれの区画
領域内に駆動電極である信号電極3,走査電極4を敷設
した複数の電極基板が形成されている。それら電極基板
上に液晶物質を配向させるための配向膜(図示せず)が
形成されている。そして、大基板1と大基板2は、前述
の電極基板を取り囲むように配置された枠状のシール材
5を介して一定の間隔で貼り合わされている。これら一
対の電極基板とシール材5で囲まれた空間内に液晶物質
が封入される。そして、大基板1,2を図中、二点鎖線
C1で示す大基板1の分割線、及び二点鎖線C2で示す
大基板2の分割線でそれぞれ切断し、目的とする液晶表
示素子を得る。
On large substrates 1 and 2 made of a transparent material such as a plurality of glass and divided into a plurality of regions, a plurality of signal electrodes 3 as scanning electrodes and scanning electrodes 4 are laid in the respective divided regions. An electrode substrate is formed. An alignment film (not shown) for aligning the liquid crystal substance is formed on the electrode substrates. The large substrate 1 and the large substrate 2 are attached to each other at regular intervals via a frame-shaped sealing material 5 arranged so as to surround the electrode substrate. A liquid crystal substance is enclosed in a space surrounded by the pair of electrode substrates and the sealing material 5. Then, the large substrates 1 and 2 are respectively cut along a dividing line of the large substrate 1 indicated by a chain double-dashed line C1 and a dividing line of the large substrate 2 indicated by a double-dashed chain line C2 in the drawing to obtain a target liquid crystal display element. .

【0004】[0004]

【発明が解決しようとする課題】上記のような従来の液
晶表示素子の製造方法においては、前述のユニットを分
割した後、シール材5に設けられた注入口より液晶物質
を封入する手法を用いてきた。しかし、より生産性を高
めるために、ユニットを形成するときに複数のセルに液
晶物質を封入する方法が試みられている。
In the conventional method of manufacturing a liquid crystal display element as described above, a method of dividing the above-mentioned unit and then enclosing the liquid crystal substance through the injection port provided in the sealing material 5 is used. Came. However, in order to further increase productivity, a method of encapsulating a liquid crystal substance in a plurality of cells when forming a unit has been attempted.

【0005】しかし、この方法は次のような製造工程上
の問題がある。それは、貼り合わせ時に液晶層内に気泡
を発生させないために、大基板1,2の貼り合わせが減
圧下で行われることに起因する。すなわち、通常、大基
板は真空吸着により保持台に保持されるが、その吸着力
は、その時の表面と裏面の気圧差と大基板の面積に比例
するから、減圧下では大気中の場合に比べてきわめて弱
くなるため、真空吸着法により保持台に保持した後、位
置合わせマークにより大基板の位置を合わせて貼り合わ
せる方法によると、大基板1,2の位置がずれやすい。
However, this method has the following problems in the manufacturing process. This is because the large substrates 1 and 2 are bonded together under reduced pressure in order to prevent bubbles from being generated in the liquid crystal layer during bonding. That is, normally, a large substrate is held on a holding table by vacuum suction, but the suction force is proportional to the pressure difference between the front surface and the back surface at that time and the area of the large substrate. Since it becomes extremely weak, the positions of the large substrates 1 and 2 are likely to be displaced according to a method in which the substrates are held on a holding table by a vacuum suction method and then the large substrates are aligned and bonded by the alignment mark.

【0006】また、ユニットの状態では信号電極3,走
査電極4が外部に露出していないため、個々の液晶素子
に分割するまで、駆動電極の断線および短絡を調べる点
灯検査を実施できなかった。
Further, since the signal electrodes 3 and the scanning electrodes 4 are not exposed to the outside in the state of the unit, the lighting inspection for checking the disconnection and the short circuit of the drive electrodes cannot be carried out until the liquid crystal elements are divided.

【0007】そこで本発明では、減圧下でも有効な大基
板の保持方法と、分割前の液晶素子の簡便な点灯検査の
実施方法を提供することを課題とする。
Therefore, it is an object of the present invention to provide a method for holding a large substrate that is effective even under reduced pressure and a method for performing a simple lighting inspection of a liquid crystal element before division.

【0008】[0008]

【課題を解決するための手段】上記課題は、複数のスト
ライプ状の駆動電極がそれぞれの表面に形成された一対
の電極基板のいづれか一方に液晶を供給した後これら一
対の前記電極基板をシール材を介して接合してなる液晶
素子の製造方法において、第1の大基板の表面を複数の
領域に区画し、個々の前記領域内に前記駆動電極を敷設
して複数の前記電極基板の一方を形成し、第2の大基板
の表面を複数の領域に区画し、個々の前記領域内に前記
駆動電極を敷設して複数の前記電極基板の他方を前記第
1の大基板上の前記電極基板の一方に対応させて形成
し、前記第1の大基板と前記第2の大基板に、互いに他
の大基板と重ならせないテスト端子基板部を形成し、前
記第1の大基板と前記第2の大基板を接合する際に、各
大基板を保持する保持台に前記テスト端子基板部を治具
により固定し、各前記大基板全体を前記保持台に保持す
ることを特徴とする液晶素子の製造方法によって解決さ
れる。
Means for Solving the Problems The above-mentioned problem is to supply a liquid crystal to either one of a pair of electrode substrates having a plurality of stripe-shaped drive electrodes formed on their respective surfaces, and then seal the pair of electrode substrates with a sealing material. In the method for manufacturing a liquid crystal element, the surface of the first large substrate is divided into a plurality of regions, and the drive electrodes are laid in the individual regions to form one of the plurality of electrode substrates. The second large substrate, the surface of the second large substrate is divided into a plurality of regions, the drive electrodes are laid in the individual regions, and the other of the plurality of electrode substrates is formed on the first large substrate. Corresponding to one of the first large substrate and the second large substrate, a test terminal substrate portion is formed on the first large substrate and the second large substrate so as not to overlap with each other. Holds each large substrate when joining the second large substrate. Stand the test terminal board section is fixed by a jig to be solved by a method of manufacturing a liquid crystal device characterized by holding each said entire large substrate to the holding table.

【0009】また、上記課題は、複数のストライプ状の
駆動電極がそれぞれの表面に形成された一対の電極基板
のいづれか一方に液晶を供給した後これら一対の前記電
極基板をシール材を介して接合してなる液晶素子の製造
方法において、第1の大基板の表面を複数の領域に区画
し、個々の前記領域内に前記駆動電極を敷設して複数の
前記電極基板の一方を形成し、第2の大基板の表面を複
数の領域に区画し、個々の前記領域内に前記駆動電極を
敷設して複数の前記電極基板の他方を前記第1の大基板
上の前記電極基板の一方に対応させて形成し、前記第1
の大基板と前記第2の大基板に、互いに他の大基板と重
ならせないテスト端子基板部を形成し、前記第1の大基
板と前記第2の大基板に、隣接する前記駆動電極を1本
おきに共通接続する2本の接続配線を前記電極基板毎に
形成し、各電極基板の対応する前記駆動電極を接続し前
記テスト端子基板部に引き出して第1のテスト端子と第
2のテスト端子をそれぞれ形成し、対向する前記電極基
板間に液晶が充填されて接合された前記第1の大基板と
前記第2の大基板の全ての前記テスト端子に駆動信号を
印加して前記駆動電極の断線の有無を検査し、前記第1
の大基板の前記第1または第2のテスト端子のうちいず
れか一方と前記第2の大基板の前記第1または第2のテ
スト端子のうちいずれか一方のみに駆動信号を印加して
前記駆動電極間の短絡の有無を検査することを特徴とす
る液晶素子の製造方法によっても解決される。
Further, the above problem is that a liquid crystal is supplied to either one of a pair of electrode substrates having a plurality of stripe-shaped drive electrodes formed on their respective surfaces, and then the pair of electrode substrates are bonded via a sealant. In the method for manufacturing a liquid crystal element, the surface of the first large substrate is divided into a plurality of regions, and the drive electrodes are laid in the respective regions to form one of the plurality of electrode substrates. The surface of the second large substrate is divided into a plurality of regions, and the drive electrodes are laid in the individual regions so that the other of the plurality of electrode substrates corresponds to one of the electrode substrates on the first large substrate. To form the first
Of the drive electrodes adjacent to the first large substrate and the second large substrate by forming test terminal substrate portions on the large substrate and the second large substrate that do not overlap with each other. Two common wirings for connecting every other one are formed for each of the electrode substrates, the corresponding drive electrodes of each electrode substrate are connected, and are drawn out to the test terminal substrate portion to form the first test terminal and the second test terminal. The test terminals are formed respectively, and a drive signal is applied to all the test terminals of the first large substrate and the second large substrate which are bonded and filled with liquid crystal between the opposing electrode substrates, The presence or absence of disconnection of the drive electrode is inspected, and the first
Of the first or second test terminal of the large substrate and the drive of applying the drive signal to only one of the first or second test terminal of the second large substrate. The problem can also be solved by a method for manufacturing a liquid crystal element, which is characterized by inspecting for a short circuit between electrodes.

【0010】[0010]

【発明の実施の形態】本発明の実施の形態を単純マトリ
クス型の液晶表示素子に適用した例に基づき説明する。
本例では2枚の大基板を貼り合わせた状態から2行×3
列の計6個の液晶表示素子が形成される。
BEST MODE FOR CARRYING OUT THE INVENTION An embodiment of the present invention will be described based on an example applied to a simple matrix type liquid crystal display element.
In this example, 2 rows × 3 from the state where two large substrates are bonded together
A total of 6 liquid crystal display elements in a row are formed.

【0011】図1は2枚の大基板を貼り合わせた状態
(以下、ユニットと称する)の平面図である。一対の透
明基板からなる大基板20,30は長方形である。図2
は図1でもう一方の大基板30に隠されている大基板2
0のみの平面図である。これらの液晶表示素子の駆動電
極は、信号電極21と走査電極31により構成される。
FIG. 1 is a plan view of a state in which two large substrates are bonded together (hereinafter referred to as a unit). The large substrates 20 and 30 made of a pair of transparent substrates are rectangular. FIG.
Is a large substrate 2 hidden in the other large substrate 30 in FIG.
It is a plan view of only 0. The drive electrodes of these liquid crystal display elements are composed of signal electrodes 21 and scan electrodes 31.

【0012】大基板20には、図2に示すように、複数
の透明導電膜からなるストライプ状の信号電極21が、
複数に区画された領域毎に平行に形成されている。一方
の大基板30には、複数の透明導電膜からなるストライ
プ状の走査電極31が、複数に区画された領域毎に平行
に形成されている。大基板20,30におけるこれらの
領域を以後、電極基板と称する。
As shown in FIG. 2, the large substrate 20 is provided with stripe-shaped signal electrodes 21 made of a plurality of transparent conductive films.
It is formed in parallel for each of the regions divided into a plurality. On one of the large substrates 30, stripe-shaped scan electrodes 31 made of a plurality of transparent conductive films are formed in parallel in each of a plurality of divided regions. These regions on the large substrates 20 and 30 are hereinafter referred to as electrode substrates.

【0013】信号電極21,走査電極31を形成した大
基板20,30には、液晶分子の配向を規制するための
配向膜(図示せず)が表示画面となる領域の表示部40
に形成されている。
On the large substrates 20 and 30 on which the signal electrodes 21 and the scanning electrodes 31 are formed, an alignment film (not shown) for controlling the alignment of liquid crystal molecules serves as a display screen in a display section 40.
Is formed.

【0014】そして、一方側の電極基板の各表示部40
を囲むように複数の枠状シール材41を形成し、予めそ
の枠内に液晶物質(図示せず)を所定量滴下しておき、
その枠を介して大基板20と大基板30を貼り合わせ
る。貼り合わせた後はシール材41の枠内に液晶物質が
封入された状態となっている。このとき、2枚の大基板
の貼り合わせる方向は、各大基板20,30の短辺同士
が重なり合わないように長辺同士を直交させて、かつ表
示部40では、信号電極21と走査電極31は直交する
ような方向とする。こうして、大基板20,30上に、
もう一方の大基板とは重ならないテスト端子基板部の領
域がそれぞれ発生する(大基板20,30がともに正方
形の場合は、本例の貼り合わせ方法ではなく後述する別
の方法で対応可能である)。
Then, each display section 40 of the electrode substrate on one side
A plurality of frame-shaped sealing materials 41 are formed so as to surround the, and a predetermined amount of liquid crystal substance (not shown) is dropped in advance in the frame,
The large substrate 20 and the large substrate 30 are bonded together via the frame. After the bonding, the liquid crystal substance is sealed in the frame of the sealing material 41. At this time, in the bonding direction of the two large substrates, the long sides are orthogonal to each other so that the short sides of the large substrates 20 and 30 do not overlap each other, and in the display section 40, the signal electrode 21 and the scanning electrode are arranged. The direction 31 is orthogonal. Thus, on the large substrates 20 and 30,
Regions of the test terminal board portion that do not overlap with the other large board are generated respectively (when the large boards 20 and 30 are both square, it is possible to cope with the method described later instead of the bonding method of this example. ).

【0015】図2では、大基板20には、複数の電極基
板の信号電極21が、表示部40に図中縦方向にならぶ
ストライプ状に複数本平行に形成されている。隣接する
信号電極21は、信号電極21より幅が広く、透明導電
膜あるいはその上にCr,Al等のより低抵抗な他の金
属膜を積層した接続配線22U,22Dにより接続され
ている。この構成を図2の一部分を拡大した図3に示
す。
In FIG. 2, a plurality of signal electrodes 21 of a plurality of electrode substrates are formed in parallel on the large substrate 20 in a stripe shape in the display section 40 so as to be aligned in the vertical direction in the figure. Adjacent signal electrodes 21 are wider than the signal electrodes 21 and are connected by connection wirings 22U and 22D in which a transparent conductive film or another metal film having a lower resistance such as Cr or Al is laminated thereon. This configuration is shown in FIG. 3, which is an enlarged view of a portion of FIG.

【0016】図3では、信号電極21は電極基板の端子
側(図中、上方向)と電極基板の反端子側(図中、下方
向)に、1本おきに異なる接続配線22U(端子側),
接続配線22D(反端子側)に振り分けて接続される。
これら接続配線22U,22Dは、大基板20の2辺の
短辺部に位置するテスト端子基板部に配置されたテスト
端子22Ut,22Dtと接続される。
In FIG. 3, the signal electrodes 21 are connected to the terminal side of the electrode substrate (upward in the figure) and the opposite terminal side of the electrode substrate (downward in the figure) every other different connection wiring 22U (terminal side). ),
It is distributed and connected to the connection wiring 22D (non-terminal side).
The connection wirings 22U and 22D are connected to the test terminals 22Ut and 22Dt arranged on the test terminal board portion located on the two short sides of the large board 20.

【0017】もう一方の大基板30については、図1に
より説明を行う、ただし、図1は大基板30上を裏面側
より見た状態を示している。大基板30には、複数の電
極基板の走査電極31が、表示部40に図中横方向にな
らぶストライプ状に複数本平行に形成されている。隣接
する走査電極31は、走査電極31より幅が広く、透明
導電膜あるいはその上にCr,Al等のより低抵抗な他
の金属膜を積層した接続配線32L,32Rにより接続
される。この構成を図1の一部分を拡大した図4に示す
(図1同様、大基板30上の配線を裏面側から見てい
る)。
The other large substrate 30 will be described with reference to FIG. 1, but FIG. 1 shows a state in which the large substrate 30 is viewed from the back side. On the large substrate 30, the scanning electrodes 31 of a plurality of electrode substrates are formed in parallel in a plurality of stripes arranged in the display unit 40 in the horizontal direction in the drawing. Adjacent scan electrodes 31 are wider than the scan electrodes 31 and are connected by connection wirings 32L and 32R in which a transparent conductive film or another metal film having a lower resistance such as Cr or Al is laminated thereon. This configuration is shown in FIG. 4, which is an enlarged view of a part of FIG. 1 (the wiring on the large substrate 30 is viewed from the back surface side, as in FIG. 1).

【0018】図4では、表示部40内での走査電極31
は1本おきに電極基板の左右の端子に振り分けて接続さ
れており、図中、左端子は左側の接続配線32L、右端
子は右側の接続配線32Rに分けて接続される。接続配
線32L,32Rは、大基板30の2辺の短辺に位置す
るテスト端子基板に配置されたテスト端子32Lt,3
2Rtと接続される。
In FIG. 4, the scanning electrodes 31 in the display section 40 are shown.
Are alternately connected to the left and right terminals of the electrode substrate, and in the figure, the left terminal is connected to the left connection wiring 32L and the right terminal is connected to the right connection wiring 32R. The connection wirings 32L and 32R are the test terminals 32Lt and 3L arranged on the test terminal board located on the two short sides of the large board 30.
It is connected to 2Rt.

【0019】こうして、図1のように貼り合わせたユニ
ットに、駆動信号を前述のテスト端子22Ut,22D
t,32Lt,32Rtより入力して、ユニットに含ま
れるすべての液晶表示素子に対して、点灯検査を実施し
液晶表示素子の駆動電極の断線及び短絡を調べることが
可能である。このときに、液晶表示素子の入射光や出射
光についての光学的条件を整えるための偏光板や位相差
板等の光学素子などは点灯検査機側で準備する。
In this way, the drive signal is applied to the above-mentioned test terminals 22Ut and 22D to the unit bonded as shown in FIG.
By inputting from t, 32Lt, 32Rt, it is possible to carry out a lighting inspection for all the liquid crystal display elements included in the unit and check for disconnection and short circuit of the drive electrodes of the liquid crystal display elements. At this time, optical elements such as a polarizing plate and a retardation plate for adjusting optical conditions for incident light and emitted light of the liquid crystal display element are prepared on the lighting inspection machine side.

【0020】なお、本実施形態では、大基板20のテス
ト端子22Ut,22Dtや大基板30のテスト端子3
2Lt,32Rtを各2辺に設置したが、各1辺のみで
もよい。あるいは、一方の大基板20の信号電極21の
接続配線22U,22Dを各大基板20,30の所定位
置で導電性樹脂等を対向する大基板20,30間に介し
て、他方の大基板30へ接続配線22U,22Dを導
き、大基板30に信号電極21のテスト端子22Ut,
22Dtと走査電極31のテスト端子32Lt,32R
tの両方を敷設してもよい。
In this embodiment, the test terminals 22Ut and 22Dt of the large board 20 and the test terminals 3 of the large board 30 are used.
Although 2Lt and 32Rt are installed on each two sides, only one side may be provided. Alternatively, the connection wirings 22U and 22D of the signal electrode 21 of one large board 20 are interposed between the large boards 20 and 30 facing each other with a conductive resin or the like at a predetermined position of the large boards 20 and 30, and the other large board 30. The connection wirings 22U and 22D are guided to the large substrate 30 and the test terminals 22Ut and
22Dt and test terminals 32Lt and 32R of the scan electrode 31
Both t may be laid.

【0021】上述のように構成された液晶素子の製造方
法について記述する。2枚の大基板20,30につい
て、透明導電膜、金属膜の順に積層し、信号電極21,
接続配線22U,22D,走査電極31,接続配線32
L,32Rを敷設する。そして、表示部40内の信号電
極21と走査電極31の金属膜を除去する。これによ
り、信号電極21,走査電極31は透明導電膜による配
線、接続配線22U,22D,32L,32Rは透明導
電膜と金属膜からなる2層の配線で敷設される。なお、
小型の液晶表示素子や駆動電極の幅が広い液晶表示素子
などの場合は、透明導電膜のみの単一層で形成したほう
が工程も単純化される。
A method of manufacturing the liquid crystal element having the above structure will be described. With respect to the two large substrates 20 and 30, the transparent conductive film and the metal film are laminated in this order, and the signal electrodes 21 and
Connection wirings 22U, 22D, scan electrodes 31, connection wiring 32
Lay L and 32R. Then, the metal films of the signal electrodes 21 and the scanning electrodes 31 in the display section 40 are removed. As a result, the signal electrode 21 and the scanning electrode 31 are laid by wiring made of a transparent conductive film, and the connection wirings 22U, 22D, 32L, 32R are laid by two-layer wiring made of a transparent conductive film and a metal film. In addition,
In the case of a small liquid crystal display element or a liquid crystal display element having a wide driving electrode, the process is simplified if it is formed of a single layer of a transparent conductive film.

【0022】次に、大基板20,30に対して、表示部
40に配向膜(図示せず)を形成し、配向処理を実施す
る。そして、2枚の大基板を貼り合わせるために、一方
の大基板20上の各電極基板を取り囲むように枠状のシ
ール材41を一定の厚さでそれぞれ形成する。そして、
シール材41の枠内に液晶物質をディスペンサー等によ
り滴下する。
Next, an alignment film (not shown) is formed on the display section 40 for the large substrates 20 and 30, and an alignment process is performed. Then, in order to bond the two large substrates, a frame-shaped sealing material 41 is formed with a constant thickness so as to surround each electrode substrate on one large substrate 20. And
A liquid crystal substance is dropped into the frame of the sealing material 41 by a dispenser or the like.

【0023】この液晶物質を滴下した大基板20と前述
の大基板30を真空容器の中に移し、貼り合わせ装置の
保持台にテスト電極基板を治具で固定し、そして、大基
板20,30を前述の装置の保持台に保持する。このと
き真空下で実施するのは、大基板20,30の貼り合わ
せ時に、シール材41の枠内に液晶を封入するために枠
内の空気を排除するためである。そして、保持台上で位
置合わせマーク等により位置を確認修正した後、大基板
30の長辺をもう一方の大基板20の長辺と直交させて
貼り合わせる。
The large substrate 20 onto which the liquid crystal substance has been dropped and the large substrate 30 described above are transferred into a vacuum container, and the test electrode substrate is fixed to the holding table of the bonding apparatus with a jig. Are held on the holding table of the above apparatus. At this time, it is performed under vacuum in order to exclude air in the frame to seal the liquid crystal in the frame of the sealing material 41 when the large substrates 20 and 30 are bonded together. Then, after confirming and correcting the position on the holding table with a positioning mark or the like, the long side of the large substrate 30 is attached so that the long side thereof is orthogonal to the long side of the other large substrate 20.

【0024】この貼り合わせ工程において、本実施例の
構造が新たな効果をもたらす。大基板に重ならない部分
を設けずに貼り合わせる従来の手法では、大基板を製造
装置の保持台に保持するのは裏面での真空吸着によるも
のであった。しかし、この裏面を吸着する方法は、真空
下では吸着力が弱いので、確実に保持できず位置決め及
び貼り合わせの際に所定位置からずれやすい。
In this bonding step, the structure of this embodiment brings a new effect. In the conventional method of bonding without providing a portion that does not overlap the large substrate, the large substrate is held on the holding table of the manufacturing apparatus by vacuum suction on the back surface. However, this method of sucking the back surface has a weak suction force under vacuum, and therefore cannot reliably hold the back surface, and is easily displaced from a predetermined position during positioning and bonding.

【0025】そこで本実施形態では、大基板20,30
の長辺同士を直交させて、短辺同士が重なり合わないよ
うにシール材41を介して貼り合わせることにより、大
基板同士が重なり合わないテスト端子基板部を生じさ
せ、この部分を治具で挟んで固定し、前述の製造装置の
保持台上に大基板20,30を確実に保持できる構成と
なっている。
Therefore, in this embodiment, the large substrates 20, 30 are used.
The long sides are orthogonalized and the short sides are adhered to each other via the sealing material 41 so that the short sides do not overlap each other, thereby generating a test terminal board portion in which the large boards do not overlap each other, and this portion is formed by a jig. It is sandwiched and fixed, and the large substrates 20, 30 can be securely held on the holding table of the above-described manufacturing apparatus.

【0026】本実施形態での保持方法による製造装置の
保持台の断面図を図5に示す。貼り合わせの製造装置は
保持台50,51と大基板20,30を保持する治具5
2により構成される。
FIG. 5 shows a sectional view of the holding table of the manufacturing apparatus according to the holding method of this embodiment. The bonding manufacturing device is a jig 5 for holding the holding bases 50 and 51 and the large substrates 20 and 30.
2.

【0027】大基板20は、対向する大基板30とは重
ならせないテスト端子基板部を少なくとも2カ所で治具
52により保持台50に固定することで保持される。こ
のとき、テスト端子基板を固定する場所は前述のテスト
端子22Ut,22Dtを避ける。
The large board 20 is held by fixing the test terminal board portions, which are not overlapped with the facing large board 30, to the holding table 50 by jigs 52 at least at two places. At this time, avoid the aforementioned test terminals 22Ut and 22Dt in the place where the test terminal board is fixed.

【0028】一方の大基板30は保持台51に大基板2
0と同様の手法で保持した後、上下を反転させ大基板3
0を下向きにする。(図はすでに反転している)そし
て、大基板20,30にあらかじめ設けた位置合わせマ
ークを確認し、保持台51の移動により調整した後、貼
り合わせる。
On the other hand, the large substrate 30 is attached to the holding base 51 by the large substrate 2
After holding by the same method as 0, turn it upside down
Turn 0 downwards. (The drawing has already been inverted.) Then, the alignment marks provided in advance on the large substrates 20 and 30 are confirmed, the holders 51 are adjusted by movement, and then the substrates are bonded.

【0029】いづれの保持台50,51も治具52の部
分が凸部になるが、対向する保持台51,50の治具5
2に対応する位置を保持台の凹部52’のように掘り込
んでおけば制約を受けるものではない(保持台50側は
図示せず)。なお、上記の手法は、減圧下のみではな
く、常圧下でも有効である。
The jig 52 of each of the holding bases 50 and 51 has a convex portion, but the jig 5 of the holding bases 51 and 50 facing each other is convex.
No restriction is imposed if the position corresponding to 2 is dug in like a recess 52 'of the holding table (the holding table 50 side is not shown). The above method is effective not only under reduced pressure but also under normal pressure.

【0030】上述のように貼り合わせられたユニット
は、次のような点灯検査を実施することが可能である。
従来の製造方法による図7に示すようなユニットには重
ならない部分がないので、この状態では各電極に駆動信
号を供給することができなかった。
The following lighting inspection can be performed on the units bonded as described above.
Since there is no non-overlapping portion in the unit shown in FIG. 7 manufactured by the conventional manufacturing method, the drive signal could not be supplied to each electrode in this state.

【0031】点灯検査は、各液晶表示素子に対応する4
つのテスト端子22Ut、22Dt,32Lt,32R
tに駆動信号を印加して実施され、全ての電極に駆動信
号を印加する全点灯検査と半数の電極のみに駆動信号を
印加する半点灯検査に分けられる。この検査では、駆動
信号を印加しない状態を黒表示とし、印加した場合を白
表示とする。
The lighting inspection is performed for each liquid crystal display element.
Two test terminals 22Ut, 22Dt, 32Lt, 32R
It is performed by applying a drive signal to t, and is divided into a full lighting test in which the drive signal is applied to all electrodes and a half lighting test in which the drive signal is applied to only half of the electrodes. In this inspection, the state in which the drive signal is not applied is displayed in black, and the state in which it is applied is displayed in white.

【0032】全点灯検査は以下のように実施して、断線
や信号電極21と走査電極31の間の短絡(対向する電
極基板間の短絡)などを検査する。信号電極21へ接続
されるテスト端子22Ut,22Dtに駆動信号を印加
し、走査電極31へ接続されるテスト端子32Lt,3
2Rtに駆動信号を印加する。
The all-lighting inspection is carried out as follows to inspect for a disconnection, a short circuit between the signal electrode 21 and the scanning electrode 31 (a short circuit between opposing electrode substrates), and the like. A drive signal is applied to the test terminals 22Ut, 22Dt connected to the signal electrode 21, and the test terminals 32Lt, 3 connected to the scan electrode 31.
A drive signal is applied to 2Rt.

【0033】この状態で各表示部40毎に観察して、も
し、線状の黒線が観察されれば、その方向の駆動電極の
断線である。また、十字状の黒線が観察されれば、信号
電極21と走査電極31間の短絡、すなわち対向する電
極基板間の短絡である。さらに、この検査で液晶物質の
配向不良等に起因する白点や黒点などの点欠陥も観察さ
れる。
In this state, each display section 40 is observed, and if a linear black line is observed, it means that the drive electrode is broken in that direction. If a cross-shaped black line is observed, it means that the signal electrode 21 and the scanning electrode 31 are short-circuited, that is, the electrode substrates facing each other are short-circuited. Further, in this inspection, point defects such as white spots and black spots caused by defective alignment of the liquid crystal substance are also observed.

【0034】半点灯検査は以下のように実施して、信号
電極21間あるいは走査電極31間の短絡などを検査す
る。大基板20上の複数の電極基板に接続された2つの
テスト端子22Ut,22Dtのうち一方と、大基板3
0上の複数の電極基板に接続された2つのテスト端子3
2Lt,32Rtのうち一方に、駆動信号を印加する。
このとき、信号電極21や走査電極31は1本おきに駆
動信号が入力されている状態となる。
The semi-lighting inspection is carried out as follows to inspect for a short circuit between the signal electrodes 21 or the scanning electrodes 31. One of the two test terminals 22Ut and 22Dt connected to the plurality of electrode substrates on the large substrate 20 and the large substrate 3
Two test terminals 3 connected to multiple electrode substrates on
A drive signal is applied to one of 2Lt and 32Rt.
At this time, every other one of the signal electrodes 21 and the scanning electrodes 31 is in a state where the drive signal is input.

【0035】この状態で、各表示部40毎に観察して、
通常、1本おきに点灯すべきであるが、もし、連続した
3本の駆動電極が点灯した白表示となる場合、そのスト
ライプ間での短絡と考えられる。また、駆動信号を印加
している電極での前述のような黒線や黒十字線、点状の
異常は、前述の全点灯検査で観察される不良の一部であ
る。
In this state, each display section 40 is observed,
Normally, every other line should be lit, but if three consecutive drive electrodes are lit, white display is considered to be a short circuit between the stripes. Further, the above-described black line, black cross line, and dot-like abnormality in the electrode to which the drive signal is applied are some of the defects observed in the above all-lighting inspection.

【0036】この点灯検査の後、ユニットは次の工程に
進む。そして、ユニットは図1や図2で二点鎖線C20
(大基板20),C30(大基板30)で示される分割
線(図1は大基板30、図2は大基板20の分割線を示
す)でそれぞれ切断されて、個々の液晶表示素子に分割
される。そして、良品は次の検査工程へと進み液晶表示
素子の製造工程を終了する。
After this lighting inspection, the unit proceeds to the next step. The unit is the chain double-dashed line C20 in FIG. 1 and FIG.
(Large substrate 20), C30 (Large substrate 30) dividing line (FIG. 1 shows the large substrate 30, FIG. 2 shows the dividing line of the large substrate 20) is divided into individual liquid crystal display elements. To be done. Then, the non-defective product advances to the next inspection process, and the manufacturing process of the liquid crystal display element is completed.

【0037】なお、本例では、2枚の大基板の長辺同士
が直交したものについて説明したが、他の方法もある。
図6にその方法を示す。大基板20,30を重ねた状態
から図のように斜め方向に移動させたものでもよく、こ
の場合は、正方形の大基板同士の場合にも適用できる。
In this example, the long sides of the two large substrates are orthogonal to each other, but there are other methods.
FIG. 6 shows the method. The large substrates 20 and 30 may be moved in an oblique direction as shown in the drawing, and this case can also be applied to the case of square large substrates.

【0038】また、本発明の実施に関して、貼り合わせ
る2枚の大基板は同じ形状をしている必要性はなく、異
なる形状でも適用できる。
Further, regarding the implementation of the present invention, it is not necessary that the two large substrates to be bonded have the same shape, and different shapes can be applied.

【0039】[0039]

【発明の効果】本製造方法により製造された液晶素子
は、従来の液晶素子に比べて、2つの点で製造者側にと
って有利に製造できる。
The liquid crystal device manufactured by the manufacturing method of the present invention is advantageous to the manufacturer in two respects as compared with the conventional liquid crystal device.

【0040】第1点は、大基板の位置合わせ精度の向上
をもたらすことである。本製造方法によれば、治具によ
り大基板を確実に保持することが可能になる。したがっ
て、一対の大基板のそれぞれに位置合わせマーク等をあ
らかじめ設置することで、大基板を保持台に保持した状
態で、そのマークを確認して位置を修正した後、貼り合
わせることができる。これにより、貼り合わせの位置精
度を従来の基板の外形による精度(数百μmレベル)か
らマークの位置や保持台の位置精度(数十μm以下)に
向上させることができる。
The first point is to improve the alignment accuracy of a large substrate. According to this manufacturing method, it is possible to reliably hold the large substrate by the jig. Therefore, by previously setting the alignment marks and the like on each of the pair of large substrates, it is possible to confirm the marks and correct the positions while the large substrates are held on the holding table, and then bond them together. As a result, the positional accuracy of bonding can be improved from the conventional accuracy of the outer shape of the substrate (several hundreds of μm level) to the position accuracy of the mark and the holding table (several tens of μm or less).

【0041】第2点は、点灯検査の実施の簡便化であ
る。ユニットの状態で点灯検査を行うから、分割された
個々の液晶素子毎に行う場合に比べ検査回数が削減さ
れ、ユニットを分割する前の段階で不良品の存在を把握
可能となる。
The second point is the simplification of implementation of the lighting inspection. Since the lighting inspection is performed in the unit state, the number of inspections is reduced as compared with the case where each divided liquid crystal element is performed, and the existence of defective products can be grasped at a stage before dividing the unit.

【図面の簡単な説明】[Brief description of drawings]

【図1】本発明の実施形態としての液晶素子製造方法に
おける貼り合わせられた2枚の大基板を示す平面図であ
る。
FIG. 1 is a plan view showing two bonded large substrates in a liquid crystal element manufacturing method according to an embodiment of the present invention.

【図2】本発明の図1の2枚の大基板のうちの一方の大
基板を除去した平面図である。
FIG. 2 is a plan view of the present invention, in which one of the two large substrates of FIG. 1 is removed.

【図3】本発明の図2の部分拡大図である。FIG. 3 is a partially enlarged view of FIG. 2 of the present invention.

【図4】本発明の図1の部分拡大図である。FIG. 4 is a partially enlarged view of FIG. 1 of the present invention.

【図5】本発明の実施形態としての液晶素子製造方法に
おける貼り合わせ製造装置の保持台の断面図である。
FIG. 5 is a cross-sectional view of a holding base of a bonding manufacturing apparatus in a liquid crystal element manufacturing method as an embodiment of the present invention.

【図6】本発明の実施形態とは別の実施例を示す平面図
である。
FIG. 6 is a plan view showing another example different from the embodiment of the present invention.

【図7】従来技術の液晶素子製造方法における貼り合わ
せられた2枚の大基板を示す平面図である。
FIG. 7 is a plan view showing two large substrates that are bonded together in a conventional liquid crystal element manufacturing method.

【図8】従来技術の図7のA−A断面を示した断面図で
ある。
8 is a cross-sectional view showing a cross section taken along the line AA of FIG. 7 of the related art.

【符号の説明】[Explanation of symbols]

1,2,20,30・・・大基板 3,21・・・信号電極 4,31・・・走査電極 40・・・表示部 5,41・・・シール材 22U,22D,32L,32R・・・接続配線 22Ut,22Dt,32Lt,32Rt・・・テスト
端子 50,51・・・保持台 52・・・治具 52’・・・保持台の凹部 C1,C2,C20,C30・・・分割線
1, 2, 20, 30 ... Large substrate 3,21 ... Signal electrode 4,31 ... Scan electrode 40 ... Display unit 5,41 ... Seal material 22U, 22D, 32L, 32R. ..Connecting wirings 22Ut, 22Dt, 32Lt, 32Rt ... Test terminals 50, 51 ... Holding table 52 ... Jig 52 '... Recessed portion C1, C2, C20, C30 ... Split line

Claims (2)

【特許請求の範囲】[Claims] 【請求項1】 複数のストライプ状の駆動電極がそれぞ
れの表面に形成された一対の電極基板のいづれか一方に
液晶を供給した後これら一対の前記電極基板をシール材
を介して接合してなる液晶素子の製造方法において、 第1の大基板の表面を複数の領域に区画し、個々の前記
領域内に前記駆動電極を敷設して複数の前記電極基板の
一方を形成し、第2の大基板の表面を複数の領域に区画
し、個々の前記領域内に前記駆動電極を敷設して複数の
前記電極基板の他方を前記第1の大基板上の前記電極基
板の一方に対応させて形成し、 前記第1の大基板と前記第2の大基板に、互いに他の大
基板と重ならせないテスト端子基板部を形成し、 前記第1の大基板と前記第2の大基板を接合する際に、
各大基板を保持する保持台に前記テスト端子基板部を治
具により固定し、各前記大基板全体を前記保持台に保持
することを特徴とする液晶素子の製造方法。
1. A liquid crystal obtained by supplying a liquid crystal to one of a pair of electrode substrates having a plurality of stripe-shaped drive electrodes formed on their respective surfaces and then joining the pair of electrode substrates through a sealant. In the device manufacturing method, the surface of the first large substrate is divided into a plurality of regions, and the drive electrodes are laid in each of the regions to form one of the plurality of electrode substrates, and the second large substrate is formed. The surface of each of the electrodes is divided into a plurality of regions, the drive electrodes are laid in the respective regions, and the other of the plurality of electrode substrates is formed so as to correspond to one of the electrode substrates on the first large substrate. , A test terminal board portion is formed on the first large substrate and the second large substrate so as not to overlap with each other, and the first large substrate and the second large substrate are joined together. When
A method for manufacturing a liquid crystal element, comprising: fixing the test terminal board portion to a holding table for holding each large substrate by a jig, and holding each of the large boards on the holding table.
【請求項2】 複数のストライプ状の駆動電極がそれぞ
れの表面に形成された一対の電極基板のいづれか一方に
液晶を供給した後これら一対の前記電極基板をシール材
を介して接合してなる液晶素子の製造方法において、 第1の大基板の表面を複数の領域に区画し、個々の前記
領域内に前記駆動電極を敷設して複数の前記電極基板の
一方を形成し、第2の大基板の表面を複数の領域に区画
し、個々の前記領域内に前記駆動電極を敷設して複数の
前記電極基板の他方を前記第1の大基板上の前記電極基
板の一方に対応させて形成し、 前記第1の大基板と前記第2の大基板に、互いに他の大
基板と重ならせないテスト端子基板部を形成し、 前記第1の大基板と前記第2の大基板に、隣接する前記
駆動電極を1本おきに共通接続する2本の接続配線を前
記電極基板毎に形成し、各電極基板の対応する前記駆動
電極を接続し前記テスト端子基板部に引き出して第1の
テスト端子と第2のテスト端子をそれぞれ形成し、 対向する前記電極基板間に液晶が充填されて接合された
前記第1の大基板と前記第2の大基板の全ての前記テス
ト端子に駆動信号を印加して前記駆動電極の断線の有無
を検査し、 前記第1の大基板の前記第1または第2のテスト端子の
うちいずれか一方と前記第2の大基板の前記第1または
第2のテスト端子のうちいずれか一方のみに駆動信号を
印加して前記駆動電極間の短絡の有無を検査することを
特徴とする液晶素子の製造方法。
2. A liquid crystal formed by supplying a liquid crystal to either one of a pair of electrode substrates having a plurality of stripe-shaped drive electrodes formed on their respective surfaces and then joining the pair of the electrode substrates through a sealing material. In the device manufacturing method, the surface of the first large substrate is divided into a plurality of regions, and the drive electrodes are laid in each of the regions to form one of the plurality of electrode substrates, and the second large substrate is formed. The surface of each of the electrodes is divided into a plurality of regions, the drive electrodes are laid in the respective regions, and the other of the plurality of electrode substrates is formed so as to correspond to one of the electrode substrates on the first large substrate. A test terminal board portion is formed on the first large substrate and the second large substrate so as not to overlap with each other, and adjacent to the first large substrate and the second large substrate. Two connection wirings for connecting every other drive electrode in common Is formed for each of the electrode substrates, and the corresponding drive electrodes of each electrode substrate are connected and drawn out to the test terminal substrate portion to form a first test terminal and a second test terminal, respectively, and the opposite electrode substrate A drive signal is applied to all the test terminals of the first large substrate and the second large substrate, which are filled with a liquid crystal and bonded to each other, and the presence or absence of disconnection of the drive electrode is inspected. Of the first or second test terminal of the large substrate and the drive of applying the drive signal to only one of the first or second test terminal of the second large substrate. A method for manufacturing a liquid crystal element, which comprises inspecting for a short circuit between electrodes.
JP8089096A 1996-04-11 1996-04-11 Production of liquid crystal element Pending JPH09281515A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP8089096A JPH09281515A (en) 1996-04-11 1996-04-11 Production of liquid crystal element

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP8089096A JPH09281515A (en) 1996-04-11 1996-04-11 Production of liquid crystal element

Publications (1)

Publication Number Publication Date
JPH09281515A true JPH09281515A (en) 1997-10-31

Family

ID=13961360

Family Applications (1)

Application Number Title Priority Date Filing Date
JP8089096A Pending JPH09281515A (en) 1996-04-11 1996-04-11 Production of liquid crystal element

Country Status (1)

Country Link
JP (1) JPH09281515A (en)

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6246253B1 (en) 1998-06-18 2001-06-12 Hyundai Electronics Industries Co., Ltd. System for testing liquid crystal and end seal of LCD cell
JP2007232767A (en) * 2006-02-27 2007-09-13 Bridgestone Corp Mother substrate for information display
WO2008007485A1 (en) * 2006-07-11 2008-01-17 Sharp Kabushiki Kaisha Process for producing liquid-crystal display and liquid-crystal panel base material
US7320900B2 (en) 2002-02-22 2008-01-22 Sharp Kabushiki Kaisha Method of manufacturing liquid crystal display panels
US20110053451A1 (en) * 2006-04-28 2011-03-03 Il Ho Lee Display device module and method for manufacturing the same

Cited By (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6246253B1 (en) 1998-06-18 2001-06-12 Hyundai Electronics Industries Co., Ltd. System for testing liquid crystal and end seal of LCD cell
US7320900B2 (en) 2002-02-22 2008-01-22 Sharp Kabushiki Kaisha Method of manufacturing liquid crystal display panels
JP2007232767A (en) * 2006-02-27 2007-09-13 Bridgestone Corp Mother substrate for information display
US20110053451A1 (en) * 2006-04-28 2011-03-03 Il Ho Lee Display device module and method for manufacturing the same
US8157605B2 (en) * 2006-04-28 2012-04-17 Lg Display Co., Ltd. Method for manufacturing display device module
WO2008007485A1 (en) * 2006-07-11 2008-01-17 Sharp Kabushiki Kaisha Process for producing liquid-crystal display and liquid-crystal panel base material
US8248575B2 (en) 2006-07-11 2012-08-21 Sharp Kabushiki Kaisha Process for producing liquid-crystal display and liquid-crystal panel base material

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