JP3235618B2 - Liquid crystal display panel manufacturing method - Google Patents
Liquid crystal display panel manufacturing methodInfo
- Publication number
- JP3235618B2 JP3235618B2 JP2000208113A JP2000208113A JP3235618B2 JP 3235618 B2 JP3235618 B2 JP 3235618B2 JP 2000208113 A JP2000208113 A JP 2000208113A JP 2000208113 A JP2000208113 A JP 2000208113A JP 3235618 B2 JP3235618 B2 JP 3235618B2
- Authority
- JP
- Japan
- Prior art keywords
- liquid crystal
- crystal display
- display panel
- video signal
- scanning signal
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
Landscapes
- Liquid Crystal (AREA)
- Devices For Indicating Variable Information By Combining Individual Elements (AREA)
Description
【0001】[0001]
【発明の属する技術分野】本発明は、液晶表示パネルの
製造方法及びその製造装置に関する。The present invention relates to a method for manufacturing a liquid crystal display panel and an apparatus for manufacturing the same.
【0002】[0002]
【従来の技術】図4に示したように、液晶表示パネル1
0は複数の走査信号配線1aと映像信号配線2aの交差
する位置にある画素一つ一つの液晶セルに印加する電圧
を制御して画像表示をしているが、その製造工程ではダ
ストによるパターニング異常や静電気等による素子破壊
等様々な原因で不良が発生するため、製造課程で複数回
の検査を実施し、後工程への不良品の流出を防止してい
る。特に液晶セルを形成したパネル完成後の画像表示検
査は重要で、図5に示したように走査信号配線1aの駆
動用LSIを実装する電極1bの全数に検査用プローブ
電極1cを、映像信号配線2aの駆動用LSIを実装す
る電極2bの全数に検査用プローブ電極2cを、接触し
て液晶表示パネル検査用コントロール回路20からの信
号でそれぞれ走査信号配線駆動回路22と、映像信号配
線駆動回路21bを制御して液晶表示パネルを画像表示
し、その良否を判定している。こうして以降の液晶駆動
用LSI実装工程に不良パネルを流出しないことが、ロ
スコストの削減、生産性向上のため不可欠である。2. Description of the Related Art As shown in FIG.
0 indicates an image display by controlling a voltage applied to each liquid crystal cell of each pixel at a position where a plurality of scanning signal lines 1a and video signal lines 2a intersect. Since defects occur due to various causes such as device destruction due to static electricity or static electricity, inspections are performed a plurality of times during the manufacturing process to prevent defective products from flowing out to subsequent processes. In particular, image display inspection after completion of the panel on which the liquid crystal cell is formed is important. As shown in FIG. 5, the inspection probe electrodes 1c are connected to all the electrodes 1b on which the driving LSIs of the scanning signal lines 1a are mounted, and the video signal lines are connected. The inspection probe electrodes 2c are brought into contact with all of the electrodes 2b on which the driving LSIs 2a are mounted, and the scanning signal wiring driving circuit 22 and the video signal wiring driving circuit 21b are respectively driven by signals from the liquid crystal display panel inspection control circuit 20. Is controlled to display an image on the liquid crystal display panel, and its quality is determined. Thus, it is indispensable to prevent the defective panel from flowing out into the subsequent liquid crystal driving LSI mounting process in order to reduce the loss cost and improve the productivity.
【0003】[0003]
【発明が解決しようとする課題】しかしながら、表示品
位の向上のため高精細化して画素数が増加すればするほ
ど液晶駆動用LSIの実装電極間隔は狭まり、したがっ
て、検査用プローブ電極の接触間隔も狭まり、上記構成
のように映像信号配線や走査信号配線の一本一本にプロ
ーブ電極を接触することは、その作製費用が非常に高価
である。また、作製期間も長くなる上、プローブ電極の
接触の安定性やプローブ電極の保守がたいへん困難であ
る。特に、液晶駆動用LSIドライバーICを直接ガラ
ス基板上に実装するチップオングラス工法を用いた場合
は、電極パッドへの直接のコンタクトが不可能になって
くる。その中で特に映像信号配線は走査信号配線に比べ
本数が多く、製造時に不具合が生じ易い。However, as the number of pixels increases due to higher definition in order to improve the display quality, the distance between the mounting electrodes of the LSI for driving the liquid crystal becomes narrower. When the probe electrode is brought into contact with each of the video signal wiring and the scanning signal wiring as in the above configuration, the manufacturing cost is extremely high. In addition, the fabrication period becomes long, and the stability of the contact of the probe electrode and the maintenance of the probe electrode are very difficult. In particular, when a chip-on-glass method in which an LSI driver IC for driving a liquid crystal is directly mounted on a glass substrate is used, direct contact with an electrode pad becomes impossible. Among them, in particular, the number of video signal wirings is larger than that of scanning signal wirings, and defects are likely to occur during manufacturing.
【0004】そこで、映像信号配線を共通バス配線に接
続することで、検査用プローブ電極および検査方法を簡
略化できるが、何らかの不具合原因で隣合う映像信号配
線の間または隣合う走査信号配線の間のショートが生じ
ると、液晶表示パネルの全面が表示異常の状態となり、
検査信号の入力による画像表示がショートのある映像信
号配線または走査信号配線に限定される液晶表示パネル
の表示異常として特定できなくなるという課題を有して
いた。そこで、上記ショートでも液晶表示パネルの全面
表示異常とならない液晶表示パネルの製造方法を提供す
ることを目的とする。Therefore, by connecting the video signal wiring to the common bus wiring, the inspection probe electrode and the inspection method can be simplified, but between the adjacent video signal wiring or between the adjacent scanning signal wirings due to some trouble. If a short circuit occurs, the entire LCD panel will display abnormally,
There is a problem that the image display due to the input of the inspection signal cannot be specified as a display abnormality of the liquid crystal display panel limited to the video signal wiring or the scanning signal wiring having a short circuit. Accordingly, it is an object of the present invention to provide a method of manufacturing a liquid crystal display panel which does not cause an abnormal display on the entire surface of the liquid crystal display panel even with the short circuit.
【0005】[0005]
【課題を解決するための手段】本発明の液晶表示パネル
の製造方法は、液晶表示パネルに複数の映像信号配線と
複数の走査信号配線とを有し、上記走査信号配線の各々
は複数のグループに分けられ、記走査信号配線の各々に
接続される複数の共通バス配線を有する。 According to a method of manufacturing a liquid crystal display panel of the present invention, a liquid crystal display panel has a plurality of video signal wirings and a plurality of scanning signal wirings, and each of the scanning signal wirings has a plurality of groups. is divided into, for have a plurality of common bus lines connected to each of the serial scanning signal lines.
【0006】そして、上記映像信号配線の各々の一端部
は映像信号配線の映像信号の入力用の電極を有し、上記
走査信号配線の各々の一端部は走査信号の入力用の電極
を有し、上記共通バス配線の各々と上記走査信号配線各
々の他端部とが同一グループごとに接続される抵抗を有
し、さらに上記共通バス配線の各々の一端部に電極パッ
ドを有し、上記映像信号の入力用の電極の各々と上記電
極パッド各々とに検査信号を入力させ液晶表示パネルに
画像表示させる。 [0006] One end portion of each of the video signal lines has an electrode for input of the video signal of the video signal lines, one end of each of the scanning signal lines has an electrode for the input of the scanning signals Wherein each of the common bus lines and the other end of each of the scanning signal lines has a resistor connected to each of the same groups, and further has an electrode pad at one end of each of the common bus lines. An inspection signal is input to each of the signal input electrodes and each of the electrode pads, and an image is displayed on the liquid crystal display panel .
【0007】さらに、上記抵抗の抵抗値は、隣合う上記
走査信号配線のショートの時でも、上記検査信号の入力
による画像表示が上記ショートのある走査信号配線に限
定される液晶表示パネルの表示異常となる抵抗値であ
り、上記ショートで液晶表示パネルの全面表示異常とな
らない抵抗値であることを特徴とする。 Further, even if the adjacent scanning signal wiring is short-circuited, the resistance value of the resistor is such that display of an image due to the input of the inspection signal is limited to the scanning signal wiring having the short-circuit. And a resistance value that does not cause an abnormal display on the entire surface of the liquid crystal display panel due to the short circuit .
【0008】なお、抵抗の抵抗値の下限値が1KΩで、
その上限値が90KΩとしてもよい。[0008] In addition, the lower limit of the resistance value of the resistor is at 1KΩ,
The upper limit value may be 90Keiomega.
【0009】なお、抵抗の抵抗体を切断手段で切断し
て、共通バス配線と抵抗の接続を開放状態としてもよ
い。[0009] In addition, the resistance of the resistance was cut with the cutting means, as well as open the connection of resistance to the common bus line
No.
【0010】なお、上記の液晶表示パネルの製造方法を
有する製造装置としてもよい。A manufacturing apparatus having the above-described method for manufacturing a liquid crystal display panel may be used .
【0011】このようにして、隣合う走査信号配線の間
のショートの時でも、検査信号の入力による画像表示が
ショートのある走査信号配線に限定される液晶表示パネ
ルの表示異常に特定でき、上記ショートでも液晶表示パ
ネルの全面表示異常とならない、ので液晶表示パネルの
画像表示の検査の際に走査信号配線の間のショートが有
っても不具合が生じることがないがなく、液晶表示パネ
ルの製造方法の品質向上ができる。[0011] In this way, even when the short-circuit between the Tonarigo cormorant run scanning signal No. wiring, display of the liquid crystal display panel that the image display by the input of the test signal is limited to Oh Ru run scanning signal No. wiring of short abnormally It can be specified, and even if the above short circuit occurs, the entire display of the liquid crystal display panel does not become abnormal.Therefore, when inspecting the image display of the liquid crystal display panel, there is no problem even if there is a short circuit between the scanning signal wirings. The quality of the display panel manufacturing method can be improved.
【0012】[0012]
【発明の実施の形態】液晶表示パネルに複数の映像信号
配線と複数の走査信号配線の少なくとも一方に接続する
共通バス配線を設け、この共通バス配線に検査用信号を
供給して液晶表示パネルの画像表示を制御する液晶表示
パネルの検査方法であり、共通バス配線を設けて検査用
信号を供給する。DESCRIPTION OF THE PREFERRED EMBODIMENTS A liquid crystal display panel is provided with a common bus wiring connected to at least one of a plurality of video signal wirings and a plurality of scanning signal wirings. This is a method of inspecting a liquid crystal display panel for controlling image display, in which a common bus wiring is provided to supply an inspection signal.
【0013】また、複数の映像信号配線の同一色ごとに
接続する共通バス配線を設け、また、共通バス配線と、
複数の映像信号配線及び走査信号配線の少なくとも一方
との間に、電圧ドロップを制御する抵抗を接続し、共通
バス配線に検査用信号を供給して液晶表示パネルの画像
表示を制御することにより、線欠陥による、映像信号配
線の不良個所の特定ができる。In addition, a common bus line for connecting a plurality of video signal lines for each same color is provided.
By connecting a resistor for controlling voltage drop between at least one of the plurality of video signal wirings and the scanning signal wiring, and supplying an inspection signal to the common bus wiring to control the image display of the liquid crystal display panel, Defective portions of video signal wiring due to line defects can be specified.
【0014】また、液晶表示パネルに複数の映像信号配
線と複数の走査信号配線の少なくとも一方に接続する共
通バス配線を設け、この共通バス配線に検査用信号を供
給して液晶表示パネルの検査をした後、共通バス配線と
映像信号配線や走査信号配線とを接続させている抵抗の
抵抗体を切断してする。共通バス配線と映像信号配線や
走査信号配線との接続を切断手段で切断して断ってい
る。抵抗の切断手段は、レ−ザ−光等を抵抗の抵抗体に
照射することで行う。Further, a common bus line connected to at least one of the plurality of video signal lines and the plurality of scanning signal lines is provided on the liquid crystal display panel, and an inspection signal is supplied to the common bus line to inspect the liquid crystal display panel. After that, the resistor of the resistor connecting the common bus wiring and the video signal wiring or the scanning signal wiring is cut off. The connection between the common bus wiring and the video signal wiring or the scanning signal wiring is cut off by cutting means. The cutting means of the resistor is performed by irradiating the resistor with a laser beam or the like.
【0015】また、基板(ガラスパネル)を割断するこ
とによって切断して、共通バス配線と映像信号配線や走
査信号配線とを接続を断つようにしてもよい。基板(ガ
ラスパネル)の端部が切り離れるため、液晶パネルをよ
り小型にする場合に適している。Further, the substrate (glass panel) may be cut by cutting to disconnect the common bus wiring from the video signal wiring or the scanning signal wiring. Since the edge of the substrate (glass panel) is cut off, it is suitable for making the liquid crystal panel smaller.
【0016】(実施の形態)本発明の実施の形態につい
て説明する。図1は検査用液晶表示パネルの構成概略図
を示す。なお、図3に示した液晶表示パネルと、同一構
成部分には同一番号を付して詳細な説明を省略する。(Embodiment) An embodiment of the present invention will be described. FIG. 1 is a schematic view of the configuration of a liquid crystal display panel for inspection. Note that the same components as those of the liquid crystal display panel shown in FIG. 3 are denoted by the same reference numerals, and detailed description will be omitted.
【0017】図1に示した液晶表示パネル8は、アクテ
ィブマトリクス駆動方式の液晶表示パネルを用いた場合
の例であり、一対のガラス基板間に液晶が封入され、ガ
ラス基板間の一方に備えた対向電極と、ガラス基板間の
他方に備えた複数の走査信号配線1a及び複数の映像信
号配線2aと、上記複数の走査信号配線1aと複数の映
像信号配線2aが交差する部分に設けた画素電極と、複
数の映像信号配線2aまたは複数の走査信号配線1aに
接続する共通バス配線3a、4a、5aとを備える。The liquid crystal display panel 8 shown in FIG. 1 is an example in which a liquid crystal display panel of an active matrix driving system is used. Liquid crystal is sealed between a pair of glass substrates and provided on one of the glass substrates. A plurality of scanning signal lines 1a and a plurality of video signal lines 2a provided on the other side between the counter electrode and the glass substrate; and a pixel electrode provided at a portion where the plurality of scanning signal lines 1a and the plurality of video signal lines 2a intersect. And common bus lines 3a, 4a, 5a connected to the plurality of video signal lines 2a or the plurality of scanning signal lines 1a.
【0018】ここで、映像信号配線2aと走査信号配線
1aを備えるガラス基板を説明すると、複数の映像信号
配線2aの駆動用LSIの実装するための電極と反対の
端にある共通バス配線3a、4a、5aはそれぞれが赤
(R)、緑(G)、青(B)の画素配列を持つ映像信号
配線2aと接続して形成する。すなわち、3本毎に共通
バス配線に映像信号配線2aを接続し、それぞれの共通
バス配線3a、4a、5aは検査用電極パッド3b、4
b、5bに接続している。このような構成により、各映
像信号配線2aの駆動用LSIの実装電極2bにブロー
ブを接続しなくても、各映像信号配線2aに接続した共
通バス配線3a、4a、5aと対局電極にブローブを接
続することにより画像検査が可能であるので、画像表示
の検査を容易に行うことができる。Here, a glass substrate having the video signal wiring 2a and the scanning signal wiring 1a will be described. A common bus wiring 3a at an end opposite to an electrode for mounting a driving LSI for the plurality of video signal wirings 2a, 4a and 5a are formed by being connected to the video signal wiring 2a having a pixel arrangement of red (R), green (G) and blue (B), respectively. That is, the video signal wiring 2a is connected to the common bus wiring every three lines, and the common bus wirings 3a, 4a, 5a are connected to the inspection electrode pads 3b, 4a.
b, 5b. With such a configuration, even if the probe is not connected to the mounting electrode 2b of the driving LSI of each video signal wiring 2a, the probe is applied to the common bus wirings 3a, 4a, 5a connected to each video signal wiring 2a and the counter electrode. Since the image inspection is possible by connecting, the image display inspection can be easily performed.
【0019】図2は検査方法を示した信号回路ブロック
図であり、これについて説明する。検査信号となす映像
信号R、G、Bを共通バス配線駆動回路21aで発生さ
せ、3本の検査用プローブ電極3c、4c、5cから入
力させ、検査信号となす走査信号を通常の画像表示の場
合と同様1本ずつ入力する。そして、対向電極にも検査
信号を入力して。通常の液晶駆動方法と同一の方法で
白、黒、R、G、Bのそれぞれの画像表示をし、画像異
常を検出し、良否判定検査を実施する。FIG. 2 is a signal circuit block diagram showing the inspection method, which will be described. The video signals R, G, and B serving as test signals are generated by the common bus wiring drive circuit 21a, input from the three test probe electrodes 3c, 4c, and 5c, and the scan signals serving as test signals are used for normal image display. Input one by one as in the case. Then, an inspection signal is also input to the counter electrode. The respective images of white, black, R, G, and B are displayed by the same method as a normal liquid crystal driving method, an image abnormality is detected, and a pass / fail test is performed.
【0020】この検査は液晶表示パネル8のパネル工程
完了後の時点であり、その後の工程で、最終検査前に図
1に示した画素領域11の外側で、映像信号配線2aを
これらと共通バス配線3a、4a、5aの間に設けた切
断部分6でレーザー光により切断することで1本1本の
映像信号配線2aが分離した最終の液晶表示パネルを形
成する。ここでは、レーザー光を用いて配線のみを切断
することにより簡素に液晶表示パネルを形成することが
できる。This inspection is performed after the panel process of the liquid crystal display panel 8 is completed. In the subsequent process, before the final inspection, the video signal wiring 2a is connected to the common bus outside the pixel region 11 shown in FIG. A final liquid crystal display panel in which each video signal wiring 2a is separated is formed by cutting with laser light at a cutting portion 6 provided between the wirings 3a, 4a, and 5a. Here, a liquid crystal display panel can be simply formed by cutting only the wiring using laser light.
【0021】なお、レーザー光などによる切断は、パネ
ル工程完了後の検査以降なら、どの工程で実施してもよ
い。また、本実施例では1本の映像信号配線は同一の色
を表示する画素に接続するストライプ配列であるが、複
数の色の繰り返しとなるデルタ配列等においても同様の
構成で同様の画像表示が可能であることは言うまでもな
い。The cutting by a laser beam or the like may be performed at any step after the inspection after the completion of the panel step. In this embodiment, one video signal line has a stripe arrangement connected to pixels displaying the same color. However, even in a delta arrangement or the like in which a plurality of colors are repeated, similar image display can be performed with the same configuration. It goes without saying that it is possible.
【0022】また、映像信号配線と共通バス配線の切断
はレーザー光を用いてあるが、バス配線位置をパネルシ
ール材の外側に配置することでガラス基板の割断等によ
る配線の切断および除去をしてもよい。このように、ガ
ラス割断を行うことにより、パネルの端部は削られるの
で、液晶表示パネルの小型化が図られる。このようにし
て、本発明はR、G、Bそれぞれの色の画素に接続する
映像信号配線2aを同一の共通バス配線3a、4a、5
aに接続することで、パネル工程完了後の検査は液晶表
示パネル8の検査を映像信号入力がR、G、Bの3入力
だけにすることができ、簡易な検査回路およびプローブ
での検査が可能となる。つまり、共通バス配線3a、4
a、5aの電極パッド3a、4a、5aにブローブ21
aを接続して液晶表示パネルを画像表示し、その良否を
判定することが可能である。Although laser light is used to cut the video signal wiring and the common bus wiring, the wiring is cut and removed by cutting the glass substrate or the like by arranging the bus wiring outside the panel sealing material. You may. As described above, by performing glass cutting, the edge of the panel is shaved, so that the size of the liquid crystal display panel can be reduced. In this manner, the present invention provides the video signal wiring 2a connected to the pixels of R, G, and B with the same common bus wiring 3a, 4a, 5a.
By connecting to (a), the inspection after the panel process is completed, the inspection of the liquid crystal display panel 8 can be performed with only three inputs of the video signal input of R, G, and B, and the inspection with the simple inspection circuit and the probe can be performed. It becomes possible. That is, the common bus wirings 3a, 4
The probe 21 is connected to the electrode pads 3a, 4a, 5a
The liquid crystal display panel can be image-displayed by connecting a, and its quality can be determined.
【0023】このような構成にすることにより、特別小
型用の検査用ブローブを開発する必要もなく、検査用プ
ローブの開発費用の削減、開発期間の短縮、プローブコ
ンタクトの安定性が確保でき、プローブの保守も容易に
なる。また、COG工法(チップ・オン・グラス工法)
になどの、液晶駆動用LSIチップをガラス基板上へ直
接実装する実装電極は、駆動用LSIチップと接続する
ためのLSI実装するための電極2bが密なため、特に
ブローブを接触させて、検査することは困難である。本
発明は、COG工法などで駆動用LSIチップが実装さ
れる液晶表示パネルの画素の検査に適していることはい
うまでもない。By adopting such a configuration, it is not necessary to develop an inspection probe for a special small size, the development cost of the inspection probe can be reduced, the development period can be shortened, and the stability of the probe contact can be secured. Maintenance becomes easier. COG method (chip-on-glass method)
In the case of a mounting electrode for directly mounting a liquid crystal driving LSI chip on a glass substrate, the electrodes 2b for mounting the LSI for connection to the driving LSI chip are dense. It is difficult to do. It is needless to say that the present invention is suitable for inspection of pixels of a liquid crystal display panel on which a driving LSI chip is mounted by a COG method or the like.
【0024】また、映像信号配線1aと共通バス配線3
a、4a、5aの切断を液晶表示パネルの製造工程の最
終検査直前に実施することで共通バス配線を静電気破壊
防止のショートリングとしても利用でき、静電気による
素子破壊を防止、歩留り向上を実現できる。The video signal wiring 1a and the common bus wiring 3
By performing the cutting of a, 4a, and 5a immediately before the final inspection in the manufacturing process of the liquid crystal display panel, the common bus wiring can be used as a short ring for preventing electrostatic destruction, thereby preventing element destruction due to static electricity and improving the yield. .
【0025】なお、ここでは同一ガラス基板上に映像信
号配線と走査信号配線を形成する薄膜トランジスタ等を
利用したアクティブマトリクス駆動方式の液晶表示パネ
ルを用いる場合の説明であるが、これらの配線を別々の
ガラス基板に形成する単純マトリクス駆動方式の液晶表
示パネルにも同様に適用することができる。Here, the description is for the case of using an active matrix driving type liquid crystal display panel using thin film transistors or the like for forming video signal wirings and scanning signal wirings on the same glass substrate. The present invention can be similarly applied to a simple matrix drive type liquid crystal display panel formed on a glass substrate.
【0026】上記のアクティブマトリクス駆動方式と同
様な方法で複数の映像信号配線または複数の走査信号配
線に接続する共通バス配線とを設ければ、共通バス配線
にブローブを接続をすることが容易となる。そして、映
像信号配線及び走査信号配線に検査信号を入力して検査
用液晶表示パネルを画像表示し、その良否を判定するこ
とが可能である。By providing a plurality of video signal wirings or a common bus wiring connected to a plurality of scanning signal wirings in the same manner as in the above active matrix driving method, it is easy to connect a probe to the common bus wiring. Become. Then, it is possible to input an inspection signal to the video signal wiring and the scanning signal wiring, display an image on the inspection liquid crystal display panel, and determine the quality.
【0027】図3で本発明の液晶表示パネルの製造方法
を説明する。図3に示す液晶表示パネルは、図1に示し
た検査用液晶表示パネル8と基本的に同じ構成であるの
で、同一構成部分には同一番号を付して詳細な説明を省
略する。映像信号配線2aと共通バス配線間3a、4
a、5aに数KΩから数十KΩの抵抗7を有している。
抵抗7の抵抗値は、1Kから90KΩであるが、TFT
(薄膜トランジスタ)などを有するアクティブマトリク
ス型の液晶表示パネルの一部には、抵抗7の抵抗値が数
百KΩから数MΩと高い値の場合もある。FIG. 3 illustrates a method of manufacturing a liquid crystal display panel according to the present invention. Since the liquid crystal display panel shown in FIG. 3 has basically the same configuration as the inspection liquid crystal display panel 8 shown in FIG. 1, the same components are denoted by the same reference numerals and detailed description will be omitted. 3a, 4 between the video signal wiring 2a and the common bus wiring
a, 5a have a resistance 7 of several KΩ to several tens KΩ.
The resistance value of the resistor 7 is 1K to 90KΩ,
In some active matrix type liquid crystal display panels having a (thin film transistor) or the like, the resistance value of the resistor 7 may be as high as several hundred KΩ to several MΩ.
【0028】これにより、検査用液晶表示パネル8にパ
ターン異常等によるショート不良箇所30および31が
ある場合、前者は共通バス配線3aと4aのショートで
あり、検査用液晶表示パネル全面で表示異常が生じる
が、後者は映像信号配線2a間のショートであり、付加
抵抗7を介しての共通バス配線のショートであるため、
共通バス配線上付加の電圧ドロップが制限され液晶表示
パネル10の全面表示異常には至らず、ショート不良が
発生している映像信号配線1aに限定された表示異常が
起こる。Thus, when the inspection liquid crystal display panel 8 has short defective portions 30 and 31 due to a pattern abnormality or the like, the former is a short circuit of the common bus wirings 3a and 4a, and the display abnormality occurs on the entire surface of the inspection liquid crystal display panel. However, since the latter is a short circuit between the video signal lines 2a and a short circuit of the common bus line via the additional resistor 7,
The additional voltage drop on the common bus line is limited, and the entire display of the liquid crystal display panel 10 does not become abnormal, and the display abnormality limited to the video signal line 1a in which the short-circuit failure occurs occurs.
【0029】すなわち線欠陥として認識できるため、不
良箇所の特定ができる。そして、不良箇所のレーザーカ
ット等による液晶表示パネルの不具合箇所の手直し作業
が可能となる。That is, since it can be recognized as a line defect, a defective portion can be specified. Then, it is possible to repair a defective portion of the liquid crystal display panel due to laser cutting or the like of the defective portion.
【0030】アクティブマトリクス駆動方式、又は単純
マトリクス駆動方式の液晶表示パネルにおいて、複数の
走査信号配線の駆動用LSIの実装電極の反対側に、複
数の走査信号配線に接続する共通バス配線を形成する。
そして、この共通バス配線に設けた電極パッドにブロー
ブを接続すれば、一本一本の走査信号配線に接続するブ
ローブを接続しなくても、各走査線信号配線に接続した
共通バス配線にブローブを接続することにより画像検査
が可能である。In a liquid crystal display panel of an active matrix drive system or a simple matrix drive system, a common bus line connected to a plurality of scanning signal lines is formed on a side opposite to a mounting electrode of a driving LSI for a plurality of scanning signal lines. .
By connecting the probe to the electrode pad provided on the common bus wiring, the probe is connected to the common bus wiring connected to each scanning line signal wiring without connecting the probe connected to each scanning signal wiring. The image inspection is possible by connecting.
【0031】[0031]
【発明の効果】以上説明したように本発明によれば、隣
合う映像信号配線の間または隣合う走査信号配線の間の
ショートの時でも、検査信号の入力による画像表示がシ
ョートのある映像信号配線または走査信号配線に限定さ
れる液晶表示パネルの表示異常に特定でき、上記ショー
トでも液晶表示パネルの全面表示異常とならない、ので
液晶表示パネルの画像表示の検査の際に映像信号配線の
間のショートが有っても不具合が生じることがない、と
いう顕著な作用効果を奏し、液晶表示パネルの製造方法
の品質向上が図れ、産業的価値が大きい。As described above, according to the present invention, even when a short circuit occurs between adjacent video signal wirings or between adjacent scanning signal wirings, a video signal having a short-circuited image display due to the input of an inspection signal is provided. The display error of the liquid crystal display panel limited to the wiring or the scanning signal wiring can be specified, and the entire display of the liquid crystal display panel does not become abnormal even in the above short circuit. This has a remarkable effect that no problem occurs even if there is a short circuit, and the quality of the manufacturing method of the liquid crystal display panel can be improved, which is of great industrial value.
【図1】本発明の実施の形態1の液晶表示パネルの構成
図FIG. 1 is a configuration diagram of a liquid crystal display panel according to Embodiment 1 of the present invention.
【図2】同検査方法の信号入力回路を示す図FIG. 2 is a diagram showing a signal input circuit of the inspection method.
【図3】本発明の実施の形態2の検査方法の信号入力回
路を示す図FIG. 3 is a diagram showing a signal input circuit of an inspection method according to a second embodiment of the present invention.
【図4】本発明の製造方法によって得られる液晶パネル
を示す図FIG. 4 is a diagram showing a liquid crystal panel obtained by the manufacturing method of the present invention.
【図5】従来例の液晶表示装置の構成概略図FIG. 5 is a schematic diagram of a configuration of a conventional liquid crystal display device.
1a 走査信号配線 1b 電極 2a 映像信号配線 2b 電極 3a 共通バス配線(R信号入力) 3b 電極パッド(R信号入力) 4a 共通バス配線(G信号入力) 4b 電極パッド(G信号入力) 5a 共通バス配線(B信号入力) 5b 電極パッド(B信号入力) 6 切断部分 8 液晶表示パネル 1a scanning signal wiring 1b electrode 2a video signal wiring 2b electrode 3a common bus wiring (R signal input) 3b electrode pad (R signal input) 4a common bus wiring (G signal input) 4b electrode pad (G signal input) 5a common bus wiring (B signal input) 5b Electrode pad (B signal input) 6 Cutting part 8 Liquid crystal display panel
───────────────────────────────────────────────────── フロントページの続き (58)調査した分野(Int.Cl.7,DB名) G02F 1/13 101 G02F 1/1343 G09F 9/00 352 ──────────────────────────────────────────────────続 き Continued on the front page (58) Field surveyed (Int.Cl. 7 , DB name) G02F 1/13 101 G02F 1/1343 G09F 9/00 352
Claims (1)
複数の走査信号配線とを有し、前記走査信号配線の各々
は複数のグループに分けられ、記走査信号配線の各々に
接続される複数の共通バス配線を有し、前記映像信号配
線の各々の一端部は映像信号配線の映像信号の入力用の
電極を有し、前記走査信号配線の各々の一端部は走査信
号の入力用の電極を有し、前記共通バス配線の各々と前
記走査信号配線各々の他端部とが同一グループごとに接
続される抵抗を有し、さらに前記共通バス配線の各々の
一端部に電極パッドを有し、前記映像信号の入力用の電
極の各々と前記電極パッド各々とに検査信号を入力させ
液晶表示パネルに画像表示させ、 前記抵抗の抵抗値は、隣合う前記走査信号配線のショー
トの時でも、前記検査信号の入力による画像表示が前記
ショートのある走査信号配線に限定される液晶表示パネ
ルの表示異常となる抵抗値であり、前記ショートで液晶
表示パネルの全面表示異常とならない抵抗値であること
を特徴とする液晶表示パネルの製造方法。1. A liquid crystal display panel having a plurality of video signal wirings and a plurality of scanning signal wirings, wherein each of the scanning signal wirings is divided into a plurality of groups and connected to each of the scanning signal wirings. One end of each of the video signal wirings has an electrode for inputting a video signal of the video signal wiring, and one end of each of the scanning signal wirings has an electrode for inputting a scanning signal. Having a resistor connected to each of the common bus lines and the other end of each of the scanning signal lines in the same group, and further having an electrode pad at one end of each of the common bus lines. A test signal is input to each of the video signal input electrodes and each of the electrode pads to display an image on a liquid crystal display panel, and the resistance value of the resistor is set even when the adjacent scanning signal wiring is short-circuited. According to the input of the inspection signal A liquid crystal display characterized in that the image display is a resistance value that causes display abnormality of the liquid crystal display panel limited to the scanning signal wiring having the short circuit, and the resistance value does not cause an abnormal display of the entire liquid crystal display panel due to the short circuit. Panel manufacturing method.
Priority Applications (1)
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Applications Claiming Priority (1)
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JP2000208113A JP3235618B2 (en) | 1995-12-28 | 2000-07-10 | Liquid crystal display panel manufacturing method |
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JP34283595A Division JP3210234B2 (en) | 1995-12-28 | 1995-12-28 | Liquid crystal display panel manufacturing method |
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JP2001042277A JP2001042277A (en) | 2001-02-16 |
JP3235618B2 true JP3235618B2 (en) | 2001-12-04 |
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ID=18704752
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CN100371721C (en) * | 2005-03-08 | 2008-02-27 | 友达光电股份有限公司 | Display test system and method |
CN109637372B (en) * | 2019-01-28 | 2021-07-30 | 武汉天马微电子有限公司 | Display panel and display device |
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