JPH086290Y2 - 分析装置 - Google Patents

分析装置

Info

Publication number
JPH086290Y2
JPH086290Y2 JP40270090U JP40270090U JPH086290Y2 JP H086290 Y2 JPH086290 Y2 JP H086290Y2 JP 40270090 U JP40270090 U JP 40270090U JP 40270090 U JP40270090 U JP 40270090U JP H086290 Y2 JPH086290 Y2 JP H086290Y2
Authority
JP
Japan
Prior art keywords
sample
support shaft
axis
vertical
angle
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
JP40270090U
Other languages
English (en)
Japanese (ja)
Other versions
JPH0494556U (OSRAM
Inventor
宝裕 後藤
勲 加藤
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Shimadzu Corp
Original Assignee
Shimadzu Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Shimadzu Corp filed Critical Shimadzu Corp
Priority to JP40270090U priority Critical patent/JPH086290Y2/ja
Publication of JPH0494556U publication Critical patent/JPH0494556U/ja
Application granted granted Critical
Publication of JPH086290Y2 publication Critical patent/JPH086290Y2/ja
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Landscapes

  • Analysing Materials By The Use Of Radiation (AREA)
JP40270090U 1990-12-28 1990-12-28 分析装置 Expired - Lifetime JPH086290Y2 (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP40270090U JPH086290Y2 (ja) 1990-12-28 1990-12-28 分析装置

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP40270090U JPH086290Y2 (ja) 1990-12-28 1990-12-28 分析装置

Publications (2)

Publication Number Publication Date
JPH0494556U JPH0494556U (OSRAM) 1992-08-17
JPH086290Y2 true JPH086290Y2 (ja) 1996-02-21

Family

ID=31880572

Family Applications (1)

Application Number Title Priority Date Filing Date
JP40270090U Expired - Lifetime JPH086290Y2 (ja) 1990-12-28 1990-12-28 分析装置

Country Status (1)

Country Link
JP (1) JPH086290Y2 (OSRAM)

Also Published As

Publication number Publication date
JPH0494556U (OSRAM) 1992-08-17

Similar Documents

Publication Publication Date Title
US4627009A (en) Microscope stage assembly and control system
US6106152A (en) X-ray exposure system and method for operating same
CN222146135U (zh) 一种适用于多角度观测的扫描电镜样品台
JPH086290Y2 (ja) 分析装置
CN218601187U (zh) 一种锥形束ct成像装置
IL32247A (en) X-ray diffractometer
US5093575A (en) Dual rotatable head gamma camera
JP2001013095A (ja) 試料の無機物分析装置ならびに試料の無機物および／または有機物分析装置
CN216144427U (zh) 一种红外热像仪和红外光谱辐射计联合测试装置
US4829547A (en) Method and apparatus for taking tomographic X-rays
EP0608288A1 (en) X-ray diffractometer
JP2520576Y2 (ja) 分析装置
JPH1137958A (ja) 結晶軸の傾き角度測定方法
KR100532849B1 (ko) 엑스선 검사장치의 피검사물용 테이블
JP2539394Y2 (ja) 表面分析装置
JPH02262086A (ja) リングｅｃｔ装置の感度補正装置
JP4211192B2 (ja) Ｘ線回折装置
JPH0291553A (ja) 産業用ｃｔ装置
JP3462910B2 (ja) 微小角入射ｘ線装置のｘ線入射角設定方法及びその機構
JPH08166361A (ja) θ−θスキャン型Ｘ線装置及びそのＸ線装置のためのゴニオ初期位置設定方法
JPH0666738A (ja) Ｅｘａｆｓ測定装置
JP3516028B2 (ja) 蛍光ｘ線分析方法および装置
CN222762101U (zh) 一种可多向调节的工业ct用x射线光栅设备
CN120801374A (zh) 一种方便移动显微ct测量机
JP2508884Y2 (ja) Ｘ線回折装置の試料台