JPH0860349A - Sputtering target material for forming ito thin film having high strength and high conductivity - Google Patents
Sputtering target material for forming ito thin film having high strength and high conductivityInfo
- Publication number
- JPH0860349A JPH0860349A JP6219531A JP21953194A JPH0860349A JP H0860349 A JPH0860349 A JP H0860349A JP 6219531 A JP6219531 A JP 6219531A JP 21953194 A JP21953194 A JP 21953194A JP H0860349 A JPH0860349 A JP H0860349A
- Authority
- JP
- Japan
- Prior art keywords
- target material
- thin film
- zno
- sputtering target
- ito thin
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Withdrawn
Links
Abstract
Description
【0001】[0001]
【産業上の利用分野】この発明は、強度と導電性にすぐ
れたITO薄膜形成用スパッタリングターゲット材に関
するものである。BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a sputtering target material for forming an ITO thin film, which is excellent in strength and conductivity.
【0002】[0002]
【従来の技術】近年、ITO薄膜の液晶ディスプレーや
エレクトロルミネッセンス、さらに太陽電池などの透明
電極などとしての需要が高まりつつあり、このITO薄
膜が、InとSnの2成分複合酸化物からなり、かつ前
記2成分複合酸化物の構成成分を、In2 O3 およびS
nO2 で表わした場合、SnO2 :5〜20重量%を含
有し、残りがIn2 O3 と不可避不純物からなる組成を
有するターゲット材を用い、スパッタリング法により形
成されることは良く知られるところである。2. Description of the Related Art In recent years, demand for ITO thin films as liquid crystal displays and electroluminescence, as well as transparent electrodes for solar cells and the like is increasing, and the ITO thin films are composed of a binary oxide compound of In and Sn, and The constituents of the two-component composite oxide are In 2 O 3 and S
When represented by nO 2 , it is well known that it is formed by a sputtering method using a target material containing SnO 2 : 5 to 20% by weight, and the balance of In 2 O 3 and inevitable impurities. is there.
【0003】[0003]
【発明が解決しようとする課題】一方、近年スパッタリ
ング装置は大型化の傾向にあり、これに伴ない、これに
用いられるターゲット材にも大型のものが要求される
が、上記の従来スパッタリングターゲット材は、これを
大型化すると、十分な強度をもつものでないためにスパ
ッタ中や取扱い中に割れが発生し易く、また導電性の点
でも満足するものでないために成膜速度が低下するよう
になるという問題が生じる。On the other hand, in recent years, a sputtering apparatus tends to be large in size, and accordingly, a large target material is required for the sputtering apparatus. However, if it is made large, cracks are likely to occur during sputtering or handling because it does not have sufficient strength, and the film formation rate decreases because it is not satisfactory in terms of conductivity. The problem arises.
【0004】[0004]
【課題を解決するための手段】そこで、本発明者等は、
上述のような観点から、強度と導電性にすぐれたITO
薄膜形成用スパッタリングターゲット材を開発すべく研
究を行なった結果、上記の従来ITO薄膜形成用スパッ
タリングターゲット材に、Zn酸化物とNb酸化物を含
有させてIn,Sn,Zn、およびNbの4成分複合酸
化物とすると、この結果のターゲット材は、前記Zn酸
化物とNb酸化物の共存作用で強度と導電性が向上する
ようになり、大型化に十分満足に対応できるようになる
という研究結果を得たのである。Therefore, the present inventors have
From the above viewpoints, ITO is excellent in strength and conductivity.
As a result of conducting research to develop a sputtering target material for forming a thin film, the above-mentioned conventional sputtering target material for forming an ITO thin film was made to contain Zn oxide and Nb oxide, and four components of In, Sn, Zn, and Nb were added. When a complex oxide is used, the resulting target material has improved strength and conductivity due to the coexisting action of the Zn oxide and the Nb oxide, and is sufficiently satisfactorily adaptable to increase in size. Is obtained.
【0005】この発明は、上記の研究結果にもとづいて
なされたものであって、In,Sn,Zn、およびNb
の4成分複合酸化物からなり、前記4成分複合酸化物の
構成成分を、In2 O3 ,SnO2 ,ZnO、およびN
a2 O5 で表わした場合、重量%で(以下、%は重量%
を示す)、SnO2 :5〜20%、 ZnO:
0.3〜7%、Nb2 O5 :0.3〜7%、(ただし、
ZnO+Nb2 O5 :1〜10%)、を含有し、残りが
In2 O3 と不可避不純物からなる組成を有する、強度
および導電性のすぐれたITO薄膜形成用スパッタリン
グターゲット材に特徴を有するものである。The present invention has been made based on the above-mentioned research results, and includes In, Sn, Zn, and Nb.
Of the four-component composite oxide, wherein the constituent components of the four-component composite oxide are In 2 O 3 , SnO 2 , ZnO, and N.
When expressed by a 2 O 5, it is expressed in% by weight (hereinafter,% means% by weight).
), SnO 2 : 5 to 20%, ZnO:
0.3 to 7%, Nb 2 O 5 : 0.3 to 7% (however,
ZnO + Nb 2 O 5 : 1 to 10%) and the balance is a composition consisting of In 2 O 3 and inevitable impurities, and is characterized by a sputtering target material for forming an ITO thin film having excellent strength and conductivity. is there.
【0006】つぎに、この発明のターゲット材におい
て、成分組成を上記の通りに限定した理由を説明する。 (a) SnO2 SnO2 成分には、薄膜に導電性を付与する作用がある
が、その割合が5%未満では所望の導電性を確保するこ
とができず、一方その割合が20%を越えると薄膜の透
明性が損なわれるようになることから、その割合を5〜
20%、望ましくは7〜13%と定めた。Next, the reason why the component composition of the target material of the present invention is limited as described above will be explained. (A) SnO 2 SnO 2 component has a function of imparting conductivity to the thin film, but if the proportion is less than 5%, desired conductivity cannot be secured, while the proportion exceeds 20%. Since the transparency of the thin film will be impaired, the ratio should be 5
It was set to 20%, preferably 7 to 13%.
【0007】(b) ZnOおよびNb2 O5 これらの成分は、共存した状態でターゲット材の強度と
導電性を向上させる作用があり、特にZnOはNb2 O
5 の存在下で結晶粒を微細化して強度を向上させる作用
を発揮し、さらにNb2 O5 が導電性を向上させるが、
いずれかの成分の割合が0.3%未満で、かつその合量
が1%未満では前記作用に所望の効果が得られず、一方
いずれかの成分の割合が7%を越え、かつ合量で10%
を越えると、特に薄膜の透明性が損なわれるようになる
ことから、その含有割合をZnO:0.3〜7%、望ま
しくは0.5〜3%、Nb2 O5 :0.3〜7%、望ま
しくは0.5〜2%、ZnO+Nb2 O5 :1〜10
%、望ましくは1〜5%と定めた。(B) ZnO and Nb 2 O 5 These components have the function of improving the strength and conductivity of the target material in the coexisting state. Particularly, ZnO is Nb 2 O 5.
In the presence of 5 , it has the effect of refining the crystal grains to improve the strength, and Nb 2 O 5 further improves the conductivity.
If the proportion of any of the components is less than 0.3% and the total amount thereof is less than 1%, the desired effect cannot be obtained, whereas the proportion of any component exceeds 7% and the total amount is At 10%
By weight, in particular from becoming as transparency of the thin film is impaired, the content ratio ZnO: 0.3 to 7%, preferably 0.5~3%, Nb 2 O 5: 0.3~7 %, Preferably 0.5 to 2%, ZnO + Nb 2 O 5 : 1 to 10
%, Preferably 1 to 5%.
【0008】[0008]
【実施例】この発明のターゲット材を実施例により具体
的に説明する。まず、所定配合割合の硝酸インジウムと
塩化スズの溶解液にアンモニア水を加えてInとSnの
水酸化物を沈澱させ、これを乾燥した後、900〜12
00℃の範囲内の所定温度に5時間保持の条件で仮焼
し、粉砕して、いずれも純度:99.9%、平均粒径:
2μmを有し、かつ所定割合のIn2 O3 とSnO2 か
らなるITO粉末を調製し、このITO粉末に、いずれ
も平均粒径:1μmを有する純度:99.99%のZn
O粉末とNb2 O5 粉末を所定割合に配合し、これに
0.5%のエタノールを加えてポリプロピレン製ボール
ミルにて24時間撹拌混合し、乾燥した後、400kg/
cm2 の圧力で圧粉体にプレス成形し、この圧粉体に、1
500kgf /cm2 の圧力でCIP(冷間静水圧プレス)
成形を施した状態で、酸素分圧:600torrの酸化性雰
囲気中、1400〜1600℃の範囲内の所定温度に
1.5時間保持の条件で焼結することによりいずれも平
面寸法:18mm×18mm、厚さ:6mmの寸法をもち、か
つ表1に示される成分組成の4成分複合酸化物で構成さ
れた本発明ターゲット材1〜7、並びに2成分複合酸化
物で構成された従来ターゲット材1〜3をそれぞれ製造
した。この結果得られた各種のターゲット材について、
強度および導電性を評価する目的で3点曲げ強度と比抵
抗をそれぞれ測定した。これらの測定結果を表1に示し
た。EXAMPLES The target material of the present invention will be specifically described by way of examples. First, ammonia water is added to a solution of indium nitrate and tin chloride in a predetermined mixing ratio to precipitate hydroxides of In and Sn, which are dried, and then 900 to 12
It is calcined at a predetermined temperature within a range of 00 ° C. for 5 hours, pulverized, and has a purity of 99.9%, and an average particle diameter:
An ITO powder having a particle size of 2 μm and consisting of In 2 O 3 and SnO 2 in a predetermined ratio was prepared, and this ITO powder had an average particle size of 1 μm and a purity of 99.99% Zn.
O powder and Nb 2 O 5 powder were mixed in a predetermined ratio, 0.5% ethanol was added thereto, and the mixture was stirred and mixed for 24 hours in a polypropylene ball mill and dried, and then 400 kg /
Press forming into a green compact with a pressure of cm 2
CIP (cold isostatic press) at a pressure of 500 kgf / cm 2
In the as-molded state, by sintering in an oxidizing atmosphere with an oxygen partial pressure of 600 torr at a predetermined temperature within the range of 1400 to 1600 ° C. for 1.5 hours, the planar dimensions are 18 mm × 18 mm. , Thickness: 6 mm, and the target materials 1 to 7 of the present invention composed of the four-component composite oxide having the composition shown in Table 1 and the conventional target material 1 composed of the two-component composite oxide. ~ 3 were produced respectively. For the various target materials obtained as a result,
Three-point bending strength and specific resistance were measured for the purpose of evaluating strength and conductivity. The results of these measurements are shown in Table 1.
【0009】[0009]
【表1】 [Table 1]
【0010】[0010]
【発明の効果】表1に示される結果から、本発明ターゲ
ット材1〜7は、いずれもZnOおよびNb2 O5 の含
有によって、これら2成分の含有のない従来ターゲット
材1〜3に比して著しく高い強度と導電性を具備するこ
とが明らかである。上述のように、この発明のターゲッ
ト材は、高強度と高導電性を有するので、スパッタリン
グ装置の大型化にも十分満足に対応でき、長期に亘って
すぐれた性能を発揮するのである。From the results shown in Table 1, the target materials 1 to 7 of the present invention are all contained in ZnO and Nb 2 O 5 as compared with the conventional target materials 1 to 3 which do not contain these two components. It is clear that it has extremely high strength and conductivity. As described above, since the target material of the present invention has high strength and high conductivity, it can satisfactorily cope with an increase in the size of a sputtering apparatus and exhibit excellent performance over a long period of time.
───────────────────────────────────────────────────── フロントページの続き (51)Int.Cl.6 識別記号 庁内整理番号 FI 技術表示箇所 H01B 13/00 503 Z // H01L 21/203 S 9545−4M ─────────────────────────────────────────────────── ─── Continuation of the front page (51) Int.Cl. 6 Identification code Internal reference number FI Technical indication H01B 13/00 503 Z // H01L 21/203 S 9545-4M
Claims (1)
複合酸化物からなり、前記4成分複合酸化物の構成成分
を、In2 O3 ,SnO2 ,ZnO、およびNb2 O5
で表わした場合、重量%で、 SnO2 :5〜20%、 ZnO:0.3〜7
%、 Nb2 O5 :0.3〜7%、(ただし、ZnO+Nb2
O5 :1〜10%)、を含有し、残りがIn2 O3 と不
可避不純物からなる組成を有することを特徴とする高強
度および高導電性を有するITO薄膜形成用スパッタリ
ングターゲット材。1. A four-component composite oxide of In, Sn, Zn, and Nb, wherein the constituent components of the four-component composite oxide are In 2 O 3 , SnO 2 , ZnO, and Nb 2 O 5
When expressed, in wt%, SnO 2: 5~20%, ZnO: 0.3~7
%, Nb 2 O 5 : 0.3 to 7% (however, ZnO + Nb 2
O 5 : 1 to 10%), and the rest has a composition consisting of In 2 O 3 and unavoidable impurities. A sputtering target material for forming an ITO thin film having high strength and high conductivity.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP6219531A JPH0860349A (en) | 1994-08-22 | 1994-08-22 | Sputtering target material for forming ito thin film having high strength and high conductivity |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP6219531A JPH0860349A (en) | 1994-08-22 | 1994-08-22 | Sputtering target material for forming ito thin film having high strength and high conductivity |
Publications (1)
Publication Number | Publication Date |
---|---|
JPH0860349A true JPH0860349A (en) | 1996-03-05 |
Family
ID=16736947
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP6219531A Withdrawn JPH0860349A (en) | 1994-08-22 | 1994-08-22 | Sputtering target material for forming ito thin film having high strength and high conductivity |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPH0860349A (en) |
Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
EP1033355A1 (en) * | 1998-08-31 | 2000-09-06 | Idemitsu Kosan Company Limited | Target for transparent electroconductive film, transparent electroconductive material, transparent electroconductive glass and transparent electroconductive film |
WO2007070249A2 (en) * | 2005-12-14 | 2007-06-21 | Cardinal Cg Company | Sputtering and methods for depositing a film containing tin and niobium |
US7342637B2 (en) * | 2002-03-29 | 2008-03-11 | Lg.Philips Lcd Co., Ltd. | Liquid crystal display device and method for manufacturing the same |
-
1994
- 1994-08-22 JP JP6219531A patent/JPH0860349A/en not_active Withdrawn
Cited By (8)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
EP1033355A1 (en) * | 1998-08-31 | 2000-09-06 | Idemitsu Kosan Company Limited | Target for transparent electroconductive film, transparent electroconductive material, transparent electroconductive glass and transparent electroconductive film |
EP1033355A4 (en) * | 1998-08-31 | 2010-12-01 | Idemitsu Kosan Co | Target for transparent electroconductive film, transparent electroconductive material, transparent electroconductive glass and transparent electroconductive film |
EP2610229A2 (en) * | 1998-08-31 | 2013-07-03 | Idemitsu Kosan Co., Ltd. | Transparent electroconductive glass coated with transparent electroconductive film containing IZTO |
EP2610229A3 (en) * | 1998-08-31 | 2015-02-18 | Idemitsu Kosan Co., Ltd. | Transparent electroconductive glass coated with transparent electroconductive film containing IZTO |
US7342637B2 (en) * | 2002-03-29 | 2008-03-11 | Lg.Philips Lcd Co., Ltd. | Liquid crystal display device and method for manufacturing the same |
WO2007070249A2 (en) * | 2005-12-14 | 2007-06-21 | Cardinal Cg Company | Sputtering and methods for depositing a film containing tin and niobium |
WO2007070249A3 (en) * | 2005-12-14 | 2007-08-30 | Cardinal Cg Co | Sputtering and methods for depositing a film containing tin and niobium |
EP2293320A3 (en) * | 2005-12-14 | 2011-05-04 | Cardinal CG Company | Sputtering targets and methods for depositing a film containing tin and niobium |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
A300 | Withdrawal of application because of no request for examination |
Free format text: JAPANESE INTERMEDIATE CODE: A300 Effective date: 20011106 |